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BibTeX records: Mahmut Yilmaz
@article{DBLP:journals/dt/YilmazJNSSS23, author = {Mahmut Yilmaz and Pavan Kumar Datla Jagannadha and Kaushik Narayanun and Shantanu Sarangi and Francisco Da Silva and Joe Sarmiento}, title = {{NVIDIA} {MATHS:} Mechanism to Access Test-Data Over High-Speed Links}, journal = {{IEEE} Des. Test}, volume = {40}, number = {4}, pages = {25--33}, year = {2023}, url = {https://doi.org/10.1109/MDAT.2023.3269391}, doi = {10.1109/MDAT.2023.3269391}, timestamp = {Fri, 07 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/dt/YilmazJNSSS23.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/MozaffariBSSFVM22, author = {Seyed Nima Mozaffari and Bonita Bhaskaran and Shantanu Sarangi and Suhas M. Satheesh and Kuo Lin Fu and Nithin Valentine and P. Manikandan and Mahmut Yilmaz}, title = {On-Die Noise Measurement During Automatic Test Equipment {(ATE)} Testing and In-System-Test {(IST)}}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--6}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794251}, doi = {10.1109/VTS52500.2021.9794251}, timestamp = {Tue, 28 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/MozaffariBSSFVM22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/YilmazJNSSSTCKS22, author = {Mahmut Yilmaz and Pavan Kumar Datla Jagannadha and Kaushik Narayanun and Shantanu Sarangi and Francisco Da Silva and Joe Sarmiento and Smbat Tonoyan and Ashwin Chintaluri and Animesh Khare and Milind Sonawane and Ashish Kumar and Anitha Kalva and Alex Hsu and Jayesh Pandey}, title = {{NVIDIA} {MATHS:} Mechanism to Access Test-Data over High-Speed Links}, booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA, April 25-27, 2022}, pages = {1--7}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/VTS52500.2021.9794146}, doi = {10.1109/VTS52500.2021.9794146}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/YilmazJNSSSTCKS22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/JagannadhaYSCSB19, author = {Pavan Kumar Datla Jagannadha and Mahmut Yilmaz and Milind Sonawane and Sailendra Chadalavada and Shantanu Sarangi and Bonita Bhaskaran and Shashank Bajpai and Venkat Abilash Reddy Nerallapally and Jayesh Pandey and Sam Jiang}, title = {Special Session: In-System-Test {(IST)} Architecture for {NVIDIA} Drive-AGX Platforms}, booktitle = {37th {IEEE} {VLSI} Test Symposium, {VTS} 2019, Monterey, CA, USA, April 23-25, 2019}, pages = {1--8}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/VTS.2019.8758636}, doi = {10.1109/VTS.2019.8758636}, timestamp = {Wed, 16 Oct 2019 14:14:54 +0200}, biburl = {https://dblp.org/rec/conf/vts/JagannadhaYSCSB19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/JagannadhaYSCSB16, author = {Pavan Kumar Datla Jagannadha and Mahmut Yilmaz and Milind Sonawane and Sailendra Chadalavada and Shantanu Sarangi and Bonita Bhaskaran and Ayub Abdollahian}, title = {Advanced test methodology for complex SoCs}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805857}, doi = {10.1109/TEST.2016.7805857}, timestamp = {Wed, 16 Oct 2019 14:14:52 +0200}, biburl = {https://dblp.org/rec/conf/itc/JagannadhaYSCSB16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/SonawaneCSSYJC16, author = {Milind Sonawane and Sailendra Chadalavada and Shantanu Sarangi and Amit Sanghani and Mahmut Yilmaz and Pavan Kumar Datla Jagannadha and Jonathon E. Colburn}, title = {Flexible scan interface architecture for complex SoCs}, booktitle = {34th {IEEE} {VLSI} Test Symposium, {VTS} 2016, Las Vegas, NV, USA, April 25-27, 2016}, pages = {1--6}, publisher = {{IEEE} Computer Society}, year = {2016}, url = {https://doi.org/10.1109/VTS.2016.7477308}, doi = {10.1109/VTS.2016.7477308}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vts/SonawaneCSSYJC16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/SonawaneJCSYSNC16, author = {Milind Sonawane and Pavan Kumar Datla Jagannadha and Sailendra Chadalavada and Shantanu Sarangi and Mahmut Yilmaz and Amit Sanghani and Karthikeyan Natarajan and Jonathon E. Colburn and Anubhav Sinha}, title = {Dynamic docking architecture for concurrent testing and peak power reduction}, booktitle = {34th {IEEE} {VLSI} Test Symposium, {VTS} 2016, Las Vegas, NV, USA, April 25-27, 2016}, pages = {1--6}, publisher = {{IEEE} Computer Society}, year = {2016}, url = {https://doi.org/10.1109/VTS.2016.7477290}, doi = {10.1109/VTS.2016.7477290}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vts/SonawaneJCSYSNC16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@incollection{DBLP:books/crc/14/PengYT14, author = {Ke Peng and Mahmut Yilmaz and Mohammad Tehranipoor}, editor = {Sandeep Kumar Goel and Krishnendu Chakrabarty}, title = {Circuit Path Grading Considering Layout, Process Variations, and Cross Talk}, booktitle = {Testing for Small-Delay Defects in Nanoscale {CMOS} Integrated Circuits}, pages = {95--118}, publisher = {{CRC} Press}, year = {2014}, timestamp = {Fri, 05 Jun 2020 14:24:01 +0200}, biburl = {https://dblp.org/rec/books/crc/14/PengYT14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@incollection{DBLP:books/crc/14/Yilmaz14, author = {Mahmut Yilmaz}, editor = {Sandeep Kumar Goel and Krishnendu Chakrabarty}, title = {Output Deviations-Based {SDD} Testing}, booktitle = {Testing for Small-Delay Defects in Nanoscale {CMOS} Integrated Circuits}, pages = {119--146}, publisher = {{CRC} Press}, year = {2014}, timestamp = {Fri, 05 Jun 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/books/crc/14/Yilmaz14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/BaoPYCWT13, author = {Fang Bao and Ke Peng and Mahmut Yilmaz and Krishnendu Chakrabarty and LeRoy Winemberg and Mohammad Tehranipoor}, title = {Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical Faults}, journal = {J. Electron. Test.}, volume = {29}, number = {1}, pages = {35--48}, year = {2013}, url = {https://doi.org/10.1007/s10836-012-5345-9}, doi = {10.1007/S10836-012-5345-9}, timestamp = {Mon, 03 Jan 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/et/BaoPYCWT13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/tvlsi/PengYCT13, author = {Ke Peng and Mahmut Yilmaz and Krishnendu Chakrabarty and Mohammad Tehranipoor}, title = {Crosstalk- and Process Variations-Aware High-Quality Tests for Small-Delay Defects}, journal = {{IEEE} Trans. Very Large Scale Integr. Syst.}, volume = {21}, number = {6}, pages = {1129--1142}, year = {2013}, url = {https://doi.org/10.1109/TVLSI.2012.2205026}, doi = {10.1109/TVLSI.2012.2205026}, timestamp = {Mon, 03 Jan 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/tvlsi/PengYCT13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/EggersglussYC12, author = {Stephan Eggersgl{\"{u}}{\ss} and Mahmut Yilmaz and Krishnendu Chakrabarty}, title = {Robust Timing-Aware Test Generation Using Pseudo-Boolean Optimization}, booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November 19-22, 2012}, pages = {290--295}, publisher = {{IEEE} Computer Society}, year = {2012}, url = {https://doi.org/10.1109/ATS.2012.35}, doi = {10.1109/ATS.2012.35}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/EggersglussYC12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/dt/YilmazTC11, author = {Mahmut Yilmaz and Mohammad Tehranipoor and Krishnendu Chakrabarty}, title = {A Metric to Target Small-Delay Defects in Industrial Circuits}, journal = {{IEEE} Des. Test Comput.}, volume = {28}, number = {2}, pages = {52--61}, year = {2011}, url = {https://doi.org/10.1109/MDT.2011.26}, doi = {10.1109/MDT.2011.26}, timestamp = {Mon, 03 Jan 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/dt/YilmazTC11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ets/BaoPYCWT11, author = {Fang Bao and Ke Peng and Mahmut Yilmaz and Krishnendu Chakrabarty and LeRoy Winemberg and Mohammad Tehranipoor}, title = {Critical Fault-Based Pattern Generation for Screening SDDs}, booktitle = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27, 2011}, pages = {177--182}, publisher = {{IEEE} Computer Society}, year = {2011}, url = {https://doi.org/10.1109/ETS.2011.26}, doi = {10.1109/ETS.2011.26}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ets/BaoPYCWT11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/tcad/YilmazCT10, author = {Mahmut Yilmaz and Krishnendu Chakrabarty and Mohammad Tehranipoor}, title = {Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits}, journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.}, volume = {29}, number = {5}, pages = {760--773}, year = {2010}, url = {https://doi.org/10.1109/TCAD.2010.2043591}, doi = {10.1109/TCAD.2010.2043591}, timestamp = {Mon, 03 Jan 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/tcad/YilmazCT10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/GoelCYPT10, author = {Sandeep Kumar Goel and Krishnendu Chakrabarty and Mahmut Yilmaz and Ke Peng and Mohammad Tehranipoor}, title = {Circuit Topology-Based Test Pattern Generation for Small-Delay Defects}, booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4 December 2010, Shanghai, China}, pages = {307--312}, publisher = {{IEEE} Computer Society}, year = {2010}, url = {https://doi.org/10.1109/ATS.2010.59}, doi = {10.1109/ATS.2010.59}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/GoelCYPT10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/PengYCT10, author = {Ke Peng and Mahmut Yilmaz and Krishnendu Chakrabarty and Mohammad Tehranipoor}, title = {A Noise-Aware Hybrid Method for {SDD} Pattern Grading and Selection}, booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4 December 2010, Shanghai, China}, pages = {331--336}, publisher = {{IEEE} Computer Society}, year = {2010}, url = {https://doi.org/10.1109/ATS.2010.63}, doi = {10.1109/ATS.2010.63}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/PengYCT10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/date/PengYTC10, author = {Ke Peng and Mahmut Yilmaz and Mohammad Tehranipoor and Krishnendu Chakrabarty}, editor = {Giovanni De Micheli and Bashir M. Al{-}Hashimi and Wolfgang M{\"{u}}ller and Enrico Macii}, title = {High-quality pattern selection for screening small-delay defects considering process variations and crosstalk}, booktitle = {Design, Automation and Test in Europe, {DATE} 2010, Dresden, Germany, March 8-12, 2010}, pages = {1426--1431}, publisher = {{IEEE} Computer Society}, year = {2010}, url = {https://doi.org/10.1109/DATE.2010.5457036}, doi = {10.1109/DATE.2010.5457036}, timestamp = {Wed, 16 Oct 2019 14:14:53 +0200}, biburl = {https://dblp.org/rec/conf/date/PengYTC10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/YilmazWROSEFGC10, author = {Mahmut Yilmaz and Baosheng Wang and Jayalakshmi Rajaraman and Tom Olsen and Kanwaldeep Sobti and Dwight Elvey and Jeff Fitzgerald and Grady Giles and Wei{-}Yu Chen}, editor = {Ron Press and Erik H. Volkerink}, title = {The scan-DFT features of AMD's next-generation microprocessor core}, booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX, USA, November 2-4, 2010}, pages = {39--48}, publisher = {{IEEE} Computer Society}, year = {2010}, url = {https://doi.org/10.1109/TEST.2010.5699203}, doi = {10.1109/TEST.2010.5699203}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/YilmazWROSEFGC10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SanyalCYF10, author = {Alodeep Sanyal and Krishnendu Chakrabarty and Mahmut Yilmaz and Hideo Fujiwara}, editor = {Ron Press and Erik H. Volkerink}, title = {RT-level design-for-testability and expansion of functional test sequences for enhanced defect coverage}, booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX, USA, November 2-4, 2010}, pages = {625--634}, publisher = {{IEEE} Computer Society}, year = {2010}, url = {https://doi.org/10.1109/TEST.2010.5699266}, doi = {10.1109/TEST.2010.5699266}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SanyalCYF10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/PengTYCT10, author = {Ke Peng and Jason Thibodeau and Mahmut Yilmaz and Krishnendu Chakrabarty and Mohammad Tehranipoor}, title = {A novel hybrid method for {SDD} pattern grading and selection}, booktitle = {28th {IEEE} {VLSI} Test Symposium, {VTS} 2010, April 19-22, 2010, Santa Cruz, California, {USA}}, pages = {45--50}, publisher = {{IEEE} Computer Society}, year = {2010}, url = {https://doi.org/10.1109/VTS.2010.5469619}, doi = {10.1109/VTS.2010.5469619}, timestamp = {Mon, 03 Jan 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vts/PengTYCT10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@phdthesis{DBLP:phd/basesearch/Yilmaz09, author = {Mahmut Yilmaz}, title = {Automated Test Grading and Pattern Selection for Small-Delay Defects}, school = {Duke University, Durham, NC, {USA}}, year = {2009}, url = {https://www.base-search.net/Record/889c5803c765d5de1af29d28b90969c3748c67e559f73fd44599d294b2e49861}, timestamp = {Wed, 04 May 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/phd/basesearch/Yilmaz09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/date/YilmazC09, author = {Mahmut Yilmaz and Krishnendu Chakrabarty}, editor = {Luca Benini and Giovanni De Micheli and Bashir M. Al{-}Hashimi and Wolfgang M{\"{u}}ller}, title = {Seed selection in LFSR-reseeding-based test compression for the detection of small-delay defects}, booktitle = {Design, Automation and Test in Europe, {DATE} 2009, Nice, France, April 20-24, 2009}, pages = {1488--1493}, publisher = {{IEEE}}, year = {2009}, url = {https://doi.org/10.1109/DATE.2009.5090898}, doi = {10.1109/DATE.2009.5090898}, timestamp = {Mon, 03 Jan 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/date/YilmazC09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/YilmazCT08, author = {Mahmut Yilmaz and Krishnendu Chakrabarty and Mohammad Tehranipoor}, editor = {Douglas Young and Nur A. Touba}, title = {Interconnect-Aware and Layout-Oriented Test-Pattern Selection for Small-Delay Defects}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700627}, doi = {10.1109/TEST.2008.4700627}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/YilmazCT08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/YilmazCT08, author = {Mahmut Yilmaz and Krishnendu Chakrabarty and Mohammad Tehranipoor}, title = {Test-Pattern Grading and Pattern Selection for Small-Delay Defects}, booktitle = {26th {IEEE} {VLSI} Test Symposium {(VTS} 2008), April 27 - May 1, 2008, San Diego, California, {USA}}, pages = {233--239}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/VTS.2008.32}, doi = {10.1109/VTS.2008.32}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vts/YilmazCT08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/YilmazMOS07, author = {Mahmut Yilmaz and Albert Meixner and Sule Ozev and Daniel J. Sorin}, editor = {Cristiana Bolchini and Yong{-}Bin Kim and Adelio Salsano and Nur A. Touba}, title = {Lazy Error Detection for Microprocessor Functional Units}, booktitle = {22nd {IEEE} International Symposium on Defect and Fault-Tolerance in {VLSI} Systems {(DFT} 2007), 26-28 September 2007, Rome, Italy}, pages = {361--369}, publisher = {{IEEE} Computer Society}, year = {2007}, url = {https://doi.org/10.1109/DFT.2007.16}, doi = {10.1109/DFT.2007.16}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dft/YilmazMOS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iccd/OzevSY07, author = {Sule Ozev and Daniel J. Sorin and Mahmut Yilmaz}, title = {Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor}, booktitle = {25th International Conference on Computer Design, {ICCD} 2007, 7-10 October 2007, Lake Tahoe, CA, USA, Proceedings}, pages = {317--324}, publisher = {{IEEE}}, year = {2007}, url = {https://doi.org/10.1109/ICCD.2007.4601919}, doi = {10.1109/ICCD.2007.4601919}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iccd/OzevSY07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/YilmazHOS06, author = {Mahmut Yilmaz and Derek Hower and Sule Ozev and Daniel J. Sorin}, editor = {Scott Davidson and Anne Gattiker}, title = {Self-Checking and Self-Diagnosing 32-bit Microprocessor Multiplier}, booktitle = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara, CA, USA, October 22-27, 2006}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2006}, url = {https://doi.org/10.1109/TEST.2006.297634}, doi = {10.1109/TEST.2006.297634}, timestamp = {Tue, 12 Dec 2023 09:46:27 +0100}, biburl = {https://dblp.org/rec/conf/itc/YilmazHOS06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/sigmetrics/BowerHYSO06, author = {Fred A. Bower and Derek Hower and Mahmut Yilmaz and Daniel J. Sorin and Sule Ozev}, editor = {Raymond A. Marie and Peter B. Key and Evgenia Smirni}, title = {Applying architectural vulnerability Analysis to hard faults in the microprocessor}, booktitle = {Proceedings of the Joint International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS/Performance 2006, Saint Malo, France, June 26-30, 2006}, pages = {375--376}, publisher = {{ACM}}, year = {2006}, url = {https://doi.org/10.1145/1140277.1140327}, doi = {10.1145/1140277.1140327}, timestamp = {Fri, 30 Jul 2021 16:13:32 +0200}, biburl = {https://dblp.org/rec/conf/sigmetrics/BowerHYSO06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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