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BibTeX records: Rona Yaari
@article{DBLP:journals/ibmrd/SalemWFRHFMKKFFYMB09, author = {Gerard Salem and D. W. Wittig and Thomas G. Foote and Bryan J. Robbins and C. Hirko and Donato O. Forlenza and Franco Motika and J. A. Kyle and Mary P. Kusko and Orazio P. Forlenza and R. J. Frishmuth and Rona Yaari and S. Michnowski and U. Baur}, title = {Structural and functional test of {IBM} System z10 chips}, journal = {{IBM} J. Res. Dev.}, volume = {53}, number = {1}, pages = {5}, year = {2009}, url = {https://doi.org/10.1147/JRD.2009.5388583}, doi = {10.1147/JRD.2009.5388583}, timestamp = {Fri, 03 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/ibmrd/SalemWFRHFMKKFFYMB09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/RenKKY09, author = {Haoxing Ren and Mary P. Kusko and Victor N. Kravets and Rona Yaari}, editor = {Gordon W. Roberts and Bill Eklow}, title = {Low cost test point insertion without using extra registers for high performance design}, booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX, USA, November 1-6, 2009}, pages = {1--8}, publisher = {{IEEE} Computer Society}, year = {2009}, url = {https://doi.org/10.1109/TEST.2009.5355747}, doi = {10.1109/TEST.2009.5355747}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/RenKKY09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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