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ORCIDBibTeX records: Hans-Joachim Wunderlich
@article{DBLP:journals/et/NajafiHaghiW23,
author = {Zahra Paria Najafi{-}Haghi and
Hans{-}Joachim Wunderlich},
title = {Identifying Resistive Open Defects in Embedded Cells under Variations},
journal = {J. Electron. Test.},
volume = {39},
number = {1},
pages = {27--40},
year = {2023},
url = {https://doi.org/10.1007/s10836-023-06044-z},
doi = {10.1007/S10836-023-06044-Z},
timestamp = {Wed, 17 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/NajafiHaghiW23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KohanRHW23,
author = {Somayeh Sadeghi Kohan and
Jan Dennis Reimer and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
title = {Optimizing the Streaming of Sensor Data with Approximate Communication},
booktitle = {32nd {IEEE} Asian Test Symposium, {ATS} 2023, Beijing, China, October
14-17, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ATS59501.2023.10317958},
doi = {10.1109/ATS59501.2023.10317958},
timestamp = {Fri, 08 Dec 2023 20:28:22 +0100},
biburl = {https://dblp.org/rec/conf/ats/KohanRHW23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/NajafiHaghiKJAW23,
author = {Zahra Paria Najafi{-}Haghi and
Florian Klemme and
Hanieh Jafarzadeh and
Hussam Amrouch and
Hans{-}Joachim Wunderlich},
title = {Robust Resistive Open Defect Identification Using Machine Learning
with Efficient Feature Selection},
booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
{DATE} 2023, Antwerp, Belgium, April 17-19, 2023},
pages = {1--2},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.23919/DATE56975.2023.10136961},
doi = {10.23919/DATE56975.2023.10136961},
timestamp = {Wed, 07 Jun 2023 22:08:03 +0200},
biburl = {https://dblp.org/rec/conf/date/NajafiHaghiKJAW23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsn/LylinaHJKW23,
author = {Natalia Lylina and
Stefan Holst and
Hanieh Jafarzadeh and
Alexandra Kourfali and
Hans{-}Joachim Wunderlich},
title = {Guardband Optimization for the Preconditioned Conjugate Gradient Algorithm},
booktitle = {53rd Annual {IEEE/IFIP} International Conference on Dependable Systems
and Networks, {DSN} 2023 - Workshops, Porto, Portugal, June 27-30,
2023},
pages = {195--198},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DSN-W58399.2023.00054},
doi = {10.1109/DSN-W58399.2023.00054},
timestamp = {Thu, 17 Aug 2023 15:16:15 +0200},
biburl = {https://dblp.org/rec/conf/dsn/LylinaHJKW23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsn/KohanHW23,
author = {Somayeh Sadeghi Kohan and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
title = {Low Power Streaming of Sensor Data Using Gray Code-Based Approximate
Communication},
booktitle = {53rd Annual {IEEE/IFIP} International Conference on Dependable Systems
and Networks, {DSN} 2023 - Workshops, Porto, Portugal, June 27-30,
2023},
pages = {203--206},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DSN-W58399.2023.00056},
doi = {10.1109/DSN-W58399.2023.00056},
timestamp = {Thu, 17 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dsn/KohanHW23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/HabibyLWWHD23,
author = {Payam Habiby and
Natalia Lylina and
Chih{-}Hao Wang and
Hans{-}Joachim Wunderlich and
Sebastian Huhn and
Rolf Drechsler},
title = {Synthesis of {IJTAG} Networks for Multi-Power Domain Systems on Chips},
booktitle = {{IEEE} European Test Symposium, {ETS} 2023, Venezia, Italy, May 22-26,
2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ETS56758.2023.10174127},
doi = {10.1109/ETS56758.2023.10174127},
timestamp = {Fri, 14 Jul 2023 22:01:39 +0200},
biburl = {https://dblp.org/rec/conf/ets/HabibyLWWHD23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/LylinaHJKW23,
author = {Natalia Lylina and
Stefan Holst and
Hanieh Jafarzadeh and
Alexandra Kourfali and
Hans{-}Joachim Wunderlich},
editor = {Alessandro Savino and
Michail Maniatakos and
Stefano Di Carlo and
Dimitris Gizopoulos},
title = {Exploiting the Error Resilience of the Preconditioned Conjugate Gradient
Method for Energy and Delay Optimization},
booktitle = {29th International Symposium on On-Line Testing and Robust System
Design, {IOLTS} 2023, Crete, Greece, July 3-5, 2023},
pages = {1--7},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/IOLTS59296.2023.10224885},
doi = {10.1109/IOLTS59296.2023.10224885},
timestamp = {Wed, 06 Sep 2023 08:09:40 +0200},
biburl = {https://dblp.org/rec/conf/iolts/LylinaHJKW23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JafarzadehKRNAH23,
author = {Hanieh Jafarzadeh and
Florian Klemme and
Jan Dennis Reimer and
Zahra Paria Najafi{-}Haghi and
Hussam Amrouch and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
title = {Robust Pattern Generation for Small Delay Faults Under Process Variations},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {111--116},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00026},
doi = {10.1109/ITC51656.2023.00026},
timestamp = {Tue, 09 Jan 2024 17:03:11 +0100},
biburl = {https://dblp.org/rec/conf/itc/JafarzadehKRNAH23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/WunderlichJKLN23,
author = {Hans{-}Joachim Wunderlich and
Hanieh Jafarzadeh and
Alexandra Kourfali and
Natalia Lylina and
Zahra Paria Najafi{-}Haghi},
title = {Test Aspects of System Health State Monitoring},
booktitle = {24th {IEEE} Latin American Test Symposium, {LATS} 2023, Veracruz,
Mexico, March 21-24, 2023},
pages = {1--2},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/LATS58125.2023.10154480},
doi = {10.1109/LATS58125.2023.10154480},
timestamp = {Wed, 28 Jun 2023 16:25:05 +0200},
biburl = {https://dblp.org/rec/conf/latw/WunderlichJKLN23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LylinaWW22,
author = {Natalia Lylina and
Chih{-}Hao Wang and
Hans{-}Joachim Wunderlich},
title = {A Complete Design-for-Test Scheme for Reconfigurable Scan Networks},
journal = {J. Electron. Test.},
volume = {38},
number = {6},
pages = {603--621},
year = {2022},
url = {https://doi.org/10.1007/s10836-022-06038-3},
doi = {10.1007/S10836-022-06038-3},
timestamp = {Tue, 28 Feb 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/LylinaWW22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/LylinaWW22,
author = {Natalia Lylina and
Chih{-}Hao Wang and
Hans{-}Joachim Wunderlich},
title = {{SCAR:} Security Compliance Analysis and Resynthesis of Reconfigurable
Scan Networks},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {41},
number = {12},
pages = {5644--5656},
year = {2022},
url = {https://doi.org/10.1109/TCAD.2022.3158250},
doi = {10.1109/TCAD.2022.3158250},
timestamp = {Mon, 28 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/LylinaWW22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LylinaWW22,
author = {Natalia Lylina and
Chih{-}Hao Wang and
Hans{-}Joachim Wunderlich},
title = {Online Periodic Test of Reconfigurable Scan Networks},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {78--83},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00026},
doi = {10.1109/ATS56056.2022.00026},
timestamp = {Wed, 11 Jan 2023 14:55:55 +0100},
biburl = {https://dblp.org/rec/conf/ats/LylinaWW22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/AmrouchABBBDEEG22,
author = {Hussam Amrouch and
Jens Anders and
Steffen Becker and
Maik Betka and
Gerd Bleher and
Peter Domanski and
Nourhan Elhamawy and
Thomas Ertl and
Athanasios Gatzastras and
Paul R. Genssler and
Sebastian Hasler and
Martin Heinrich and
Andr{\'{e}} van Hoorn and
Hanieh Jafarzadeh and
Ingmar Kallfass and
Florian Klemme and
Steffen Koch and
Ralf K{\"{u}}sters and
Andr{\'{e}}s Lalama and
Rapha{\"{e}}l Latty and
Yiwen Liao and
Natalia Lylina and
Zahra Paria Najafi{-}Haghi and
Dirk Pfl{\"{u}}ger and
Ilia Polian and
Jochen Rivoir and
Matthias Sauer and
Denis Schwachhofer and
Steffen Templin and
Christian Volmer and
Stefan Wagner and
Daniel Weiskopf and
Hans{-}Joachim Wunderlich and
Bin Yang and
Martin Zimmermann},
editor = {Cristiana Bolchini and
Ingrid Verbauwhede and
Ioana Vatajelu},
title = {Intelligent Methods for Test and Reliability},
booktitle = {2022 Design, Automation {\&} Test in Europe Conference {\&}
Exhibition, {DATE} 2022, Antwerp, Belgium, March 14-23, 2022},
pages = {969--974},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.23919/DATE54114.2022.9774526},
doi = {10.23919/DATE54114.2022.9774526},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/AmrouchABBBDEEG22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/LylinaWW22,
author = {Natalia Lylina and
Chih{-}Hao Wang and
Hans{-}Joachim Wunderlich},
editor = {Cristiana Bolchini and
Ingrid Verbauwhede and
Ioana Vatajelu},
title = {Robust Reconfigurable Scan Networks},
booktitle = {2022 Design, Automation {\&} Test in Europe Conference {\&}
Exhibition, {DATE} 2022, Antwerp, Belgium, March 14-23, 2022},
pages = {1149--1152},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.23919/DATE54114.2022.9774770},
doi = {10.23919/DATE54114.2022.9774770},
timestamp = {Wed, 25 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/LylinaWW22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/Najafi-HaghiKAW22,
author = {Zahra Paria Najafi{-}Haghi and
Florian Klemme and
Hussam Amrouch and
Hans{-}Joachim Wunderlich},
title = {On Extracting Reliability Information from Speed Binning},
booktitle = {{IEEE} European Test Symposium, {ETS} 2022, Barcelona, Spain, May
23-27, 2022},
pages = {1--4},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ETS54262.2022.9810443},
doi = {10.1109/ETS54262.2022.9810443},
timestamp = {Tue, 05 Jul 2022 16:47:06 +0200},
biburl = {https://dblp.org/rec/conf/ets/Najafi-HaghiKAW22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiaoNWY22,
author = {Yiwen Liao and
Zahra Paria Najafi{-}Haghi and
Hans{-}Joachim Wunderlich and
Bin Yang},
title = {Efficient and Robust Resistive Open Defect Detection Based on Unsupervised
Deep Learning},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {185--193},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00026},
doi = {10.1109/ITC50671.2022.00026},
timestamp = {Thu, 11 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiaoNWY22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/KohanHW21,
author = {Somayeh Sadeghi Kohan and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
title = {Stress-Aware Periodic Test of Interconnects},
journal = {J. Electron. Test.},
volume = {37},
number = {5},
pages = {715--728},
year = {2021},
url = {https://doi.org/10.1007/s10836-021-05979-5},
doi = {10.1007/S10836-021-05979-5},
timestamp = {Fri, 13 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/KohanHW21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/WangLAHW21,
author = {Chih{-}Hao Wang and
Natalia Lylina and
Ahmed Atteya and
Tong{-}Yu Hsieh and
Hans{-}Joachim Wunderlich},
title = {Concurrent Test of Reconfigurable Scan Networks for Self-Aware Systems},
booktitle = {27th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2021, Torino, Italy, June 28-30, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IOLTS52814.2021.9486710},
doi = {10.1109/IOLTS52814.2021.9486710},
timestamp = {Wed, 04 Aug 2021 13:58:42 +0200},
biburl = {https://dblp.org/rec/conf/iolts/WangLAHW21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LylinaWW21,
author = {Natalia Lylina and
Chih{-}Hao Wang and
Hans{-}Joachim Wunderlich},
title = {Testability-Enhancing Resynthesis of Reconfigurable Scan Networks},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {20--29},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00009},
doi = {10.1109/ITC50571.2021.00009},
timestamp = {Mon, 29 Nov 2021 13:19:22 +0100},
biburl = {https://dblp.org/rec/conf/itc/LylinaWW21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/Najafi-HaghiW21,
author = {Zahra Paria Najafi{-}Haghi and
Hans{-}Joachim Wunderlich},
title = {Resistive Open Defect Classification of Embedded Cells under Variations},
booktitle = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
Este, Uruguay, October 27-29, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/LATS53581.2021.9651857},
doi = {10.1109/LATS53581.2021.9651857},
timestamp = {Mon, 03 Jan 2022 22:26:06 +0100},
biburl = {https://dblp.org/rec/conf/latw/Najafi-HaghiW21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LylinaAW21,
author = {Natalia Lylina and
Ahmed Atteya and
Hans{-}Joachim Wunderlich},
title = {A Hybrid Protection Scheme for Reconfigurable Scan Networks},
booktitle = {39th {IEEE} {VLSI} Test Symposium, {VTS} 2021, San Diego, CA, USA,
April 25-28, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/VTS50974.2021.9441029},
doi = {10.1109/VTS50974.2021.9441029},
timestamp = {Wed, 09 Jun 2021 08:59:55 +0200},
biburl = {https://dblp.org/rec/conf/vts/LylinaAW21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/BrandhoferKW20,
author = {Sebastian Brandhofer and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Synthesis of Fault-Tolerant Reconfigurable Scan Networks},
booktitle = {2020 Design, Automation {\&} Test in Europe Conference {\&}
Exhibition, {DATE} 2020, Grenoble, France, March 9-13, 2020},
pages = {798--803},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.23919/DATE48585.2020.9116525},
doi = {10.23919/DATE48585.2020.9116525},
timestamp = {Thu, 25 Jun 2020 12:55:44 +0200},
biburl = {https://dblp.org/rec/conf/date/BrandhoferKW20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/0010SW20,
author = {Chang Liu and
Eric Schneider and
Hans{-}Joachim Wunderlich},
title = {Using Programmable Delay Monitors for Wear-Out and Early Life Failure
Prediction},
booktitle = {2020 Design, Automation {\&} Test in Europe Conference {\&}
Exhibition, {DATE} 2020, Grenoble, France, March 9-13, 2020},
pages = {804--809},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.23919/DATE48585.2020.9116284},
doi = {10.23919/DATE48585.2020.9116284},
timestamp = {Thu, 25 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/0010SW20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/SchneiderW20,
author = {Eric Schneider and
Hans{-}Joachim Wunderlich},
title = {GPU-accelerated Time Simulation of Systems with Adaptive Voltage and
Frequency Scaling},
booktitle = {2020 Design, Automation {\&} Test in Europe Conference {\&}
Exhibition, {DATE} 2020, Grenoble, France, March 9-13, 2020},
pages = {879--884},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.23919/DATE48585.2020.9116256},
doi = {10.23919/DATE48585.2020.9116256},
timestamp = {Thu, 25 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/SchneiderW20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/Najafi-HaghiHW20,
author = {Zahra Paria Najafi{-}Haghi and
Marzieh Hashemipour{-}Nazari and
Hans{-}Joachim Wunderlich},
title = {Variation-Aware Defect Characterization at Cell Level},
booktitle = {{IEEE} European Test Symposium, {ETS} 2020, Tallinn, Estonia, May
25-29, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ETS48528.2020.9131600},
doi = {10.1109/ETS48528.2020.9131600},
timestamp = {Wed, 15 Jul 2020 13:23:41 +0200},
biburl = {https://dblp.org/rec/conf/ets/Najafi-HaghiHW20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HolstKSRHWW20,
author = {Stefan Holst and
Matthias Kampmann and
Alexander Sprenger and
Jan Dennis Reimer and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich and
Xiaoqing Wen},
title = {Logic Fault Diagnosis of Hidden Delay Defects},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325234},
doi = {10.1109/ITC44778.2020.9325234},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HolstKSRHWW20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LylinaAWW20,
author = {Natalia Lylina and
Ahmed Atteya and
Chih{-}Hao Wang and
Hans{-}Joachim Wunderlich},
title = {Security Preserving Integration and Resynthesis of Reconfigurable
Scan Networks},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325227},
doi = {10.1109/ITC44778.2020.9325227},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LylinaAWW20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SchneiderW20,
author = {Eric Schneider and
Hans{-}Joachim Wunderlich},
title = {Switch Level Time Simulation of {CMOS} Circuits with Adaptive Voltage
and Frequency Scaling},
booktitle = {38th {IEEE} {VLSI} Test Symposium, {VTS} 2020, San Diego, CA, USA,
April 5-8, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/VTS48691.2020.9107642},
doi = {10.1109/VTS48691.2020.9107642},
timestamp = {Thu, 25 Jun 2020 15:32:49 +0200},
biburl = {https://dblp.org/rec/conf/vts/SchneiderW20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/integration/SchneiderW19,
author = {Eric Schneider and
Hans{-}Joachim Wunderlich},
title = {Multi-level timing and fault simulation on GPUs},
journal = {Integr.},
volume = {64},
pages = {78--91},
year = {2019},
url = {https://doi.org/10.1016/j.vlsi.2018.08.005},
doi = {10.1016/J.VLSI.2018.08.005},
timestamp = {Thu, 20 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/integration/SchneiderW19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/SchneiderW19,
author = {Eric Schneider and
Hans{-}Joachim Wunderlich},
title = {{SWIFT:} Switch-Level Fault Simulation on GPUs},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {38},
number = {1},
pages = {122--135},
year = {2019},
url = {https://doi.org/10.1109/TCAD.2018.2802871},
doi = {10.1109/TCAD.2018.2802871},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/SchneiderW19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/KampmannK0SHW19,
author = {Matthias Kampmann and
Michael A. Kochte and
Chang Liu and
Eric Schneider and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
title = {Built-In Test for Hidden Delay Faults},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {38},
number = {10},
pages = {1956--1968},
year = {2019},
url = {https://doi.org/10.1109/TCAD.2018.2864255},
doi = {10.1109/TCAD.2018.2864255},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/KampmannK0SHW19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/RaiolaTBALW0019,
author = {Pascal Raiola and
Benjamin Thiemann and
Jan Burchard and
Ahmed Atteya and
Natalia Lylina and
Hans{-}Joachim Wunderlich and
Bernd Becker and
Matthias Sauer},
editor = {J{\"{u}}rgen Teich and
Franco Fummi},
title = {On Secure Data Flow in Reconfigurable Scan Networks},
booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
{DATE} 2019, Florence, Italy, March 25-29, 2019},
pages = {1016--1021},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.23919/DATE.2019.8715172},
doi = {10.23919/DATE.2019.8715172},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/RaiolaTBALW0019.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HolstSKWW19,
author = {Stefan Holst and
Eric Schneider and
Michael A. Kochte and
Xiaoqing Wen and
Hans{-}Joachim Wunderlich},
title = {Variation-Aware Small Delay Fault Diagnosis on Compressed Test Responses},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000143},
doi = {10.1109/ITC44170.2019.9000143},
timestamp = {Mon, 24 Feb 2020 17:28:46 +0100},
biburl = {https://dblp.org/rec/conf/itc/HolstSKWW19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LylinaARSBW19,
author = {Natalia Lylina and
Ahmed Atteya and
Pascal Raiola and
Matthias Sauer and
Bernd Becker and
Hans{-}Joachim Wunderlich},
title = {Security Compliance Analysis of Reconfigurable Scan Networks},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--9},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000114},
doi = {10.1109/ITC44170.2019.9000114},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LylinaARSBW19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/WunderlichZ18,
author = {Hans{-}Joachim Wunderlich and
Yervant Zorian},
title = {Guest Editor's Introduction},
journal = {{IEEE} Des. Test},
volume = {35},
number = {3},
pages = {5--6},
year = {2018},
url = {https://doi.org/10.1109/MDAT.2018.2799806},
doi = {10.1109/MDAT.2018.2799806},
timestamp = {Fri, 13 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/dt/WunderlichZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/KochteW18,
author = {Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Self-Test and Diagnosis for Self-Aware Systems},
journal = {{IEEE} Des. Test},
volume = {35},
number = {5},
pages = {7--18},
year = {2018},
url = {https://doi.org/10.1109/MDAT.2017.2762903},
doi = {10.1109/MDAT.2017.2762903},
timestamp = {Fri, 13 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/dt/KochteW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/esl/HellebrandHRW18,
author = {Sybille Hellebrand and
J{\"{o}}rg Henkel and
Anand Raghunathan and
Hans{-}Joachim Wunderlich},
title = {Guest Editors' Introduction},
journal = {{IEEE} Embed. Syst. Lett.},
volume = {10},
number = {1},
pages = {1},
year = {2018},
url = {https://doi.org/10.1109/LES.2018.2789942},
doi = {10.1109/LES.2018.2789942},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/esl/HellebrandHRW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/SchneiderKW18,
author = {Eric Schneider and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
editor = {Youngsoo Shin},
title = {Multi-level timing simulation on GPUs},
booktitle = {23rd Asia and South Pacific Design Automation Conference, {ASP-DAC}
2018, Jeju, Korea (South), January 22-25, 2018},
pages = {470--475},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ASPDAC.2018.8297368},
doi = {10.1109/ASPDAC.2018.8297368},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/aspdac/SchneiderKW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/0010SKHW18,
author = {Chang Liu and
Eric Schneider and
Matthias Kampmann and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
title = {Extending Aging Monitors for Early Life and Wear-Out Failure Prevention},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {92--97},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00028},
doi = {10.1109/ATS.2018.00028},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/0010SKHW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhangWHMKWQ18,
author = {Yucong Zhang and
Xiaoqing Wen and
Stefan Holst and
Kohei Miyase and
Seiji Kajihara and
Hans{-}Joachim Wunderlich and
Jun Qian},
title = {Clock-Skew-Aware Scan Chain Grouping for Mitigating Shift Timing Failures
in Low-Power Scan Testing},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {149--154},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00037},
doi = {10.1109/ATS.2018.00037},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhangWHMKWQ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/AtteyaK0R0W18,
author = {Ahmed Atteya and
Michael A. Kochte and
Matthias Sauer and
Pascal Raiola and
Bernd Becker and
Hans{-}Joachim Wunderlich},
title = {Online prevention of security violations in reconfigurable scan networks},
booktitle = {23rd {IEEE} European Test Symposium, {ETS} 2018, Bremen, Germany,
May 28 - June 1, 2018},
pages = {1--6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ETS.2018.8400685},
doi = {10.1109/ETS.2018.8400685},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/AtteyaK0R0W18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/KraakTHWCCSWK18,
author = {Daniel Kraak and
Mottaqiallah Taouil and
Said Hamdioui and
Pieter Weckx and
Francky Catthoor and
Abhijit Chatterjee and
Adit D. Singh and
Hans{-}Joachim Wunderlich and
Naghmeh Karimi},
title = {Device aging: {A} reliability and security concern},
booktitle = {23rd {IEEE} European Test Symposium, {ETS} 2018, Bremen, Germany,
May 28 - June 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ETS.2018.8400702},
doi = {10.1109/ETS.2018.8400702},
timestamp = {Fri, 06 Jul 2018 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/KraakTHWCCSWK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/RaiolaKAGW0018,
author = {Pascal Raiola and
Michael A. Kochte and
Ahmed Atteya and
Laura Rodr{\'{\i}}guez G{\'{o}}mez and
Hans{-}Joachim Wunderlich and
Bernd Becker and
Matthias Sauer},
editor = {Dimitris Gizopoulos and
Dan Alexandrescu and
Mihalis Maniatakos and
Panagiota Papavramidou},
title = {Detecting and Resolving Security Violations in Reconfigurable Scan
Networks},
booktitle = {24th {IEEE} International Symposium on On-Line Testing And Robust
System Design, {IOLTS} 2018, Platja D'Aro, Spain, July 2-4, 2018},
pages = {91--96},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IOLTS.2018.8474188},
doi = {10.1109/IOLTS.2018.8474188},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/RaiolaKAGW0018.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/SchleyDEHWR17,
author = {Gert Schley and
Atefe Dalirsani and
Marcus Eggenberger and
Nadereh Hatami and
Hans{-}Joachim Wunderlich and
Martin Radetzki},
title = {Multi-Layer Diagnosis for Fault-Tolerant Networks-on-Chip},
journal = {{IEEE} Trans. Computers},
volume = {66},
number = {5},
pages = {848--861},
year = {2017},
url = {https://doi.org/10.1109/TC.2016.2628058},
doi = {10.1109/TC.2016.2628058},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/SchleyDEHWR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/ZhangBKSWH17,
author = {Hongyan Zhang and
Lars Bauer and
Michael A. Kochte and
Eric Schneider and
Hans{-}Joachim Wunderlich and
J{\"{o}}rg Henkel},
title = {Aging Resilience and Fault Tolerance in Runtime Reconfigurable Architectures},
journal = {{IEEE} Trans. Computers},
volume = {66},
number = {6},
pages = {957--970},
year = {2017},
url = {https://doi.org/10.1109/TC.2016.2616405},
doi = {10.1109/TC.2016.2616405},
timestamp = {Tue, 24 Apr 2018 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/ZhangBKSWH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/SchneiderKHWW17,
author = {Eric Schneider and
Michael A. Kochte and
Stefan Holst and
Xiaoqing Wen and
Hans{-}Joachim Wunderlich},
title = {GPU-Accelerated Simulation of Small Delay Faults},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {36},
number = {5},
pages = {829--841},
year = {2017},
url = {https://doi.org/10.1109/TCAD.2016.2598560},
doi = {10.1109/TCAD.2016.2598560},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/SchneiderKHWW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/UllKW17,
author = {Dominik Ull and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Structure-Oriented Test of Reconfigurable Scan Networks},
booktitle = {26th {IEEE} Asian Test Symposium, {ATS} 2017, Taipei City, Taiwan,
November 27-30, 2017},
pages = {127--132},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/ATS.2017.34},
doi = {10.1109/ATS.2017.34},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/UllKW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/KochteSGR0W17,
author = {Michael A. Kochte and
Matthias Sauer and
Laura Rodr{\'{\i}}guez G{\'{o}}mez and
Pascal Raiola and
Bernd Becker and
Hans{-}Joachim Wunderlich},
title = {Specification and verification of security in reconfigurable scan
networks},
booktitle = {22nd {IEEE} European Test Symposium, {ETS} 2017, Limassol, Cyprus,
May 22-26, 2017},
pages = {1--6},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ETS.2017.7968247},
doi = {10.1109/ETS.2017.7968247},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/KochteSGR0W17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/WagnerW17,
author = {Marcus Wagner and
Hans{-}Joachim Wunderlich},
title = {Probabilistic sensitization analysis for variation-aware path delay
fault test evaluation},
booktitle = {22nd {IEEE} European Test Symposium, {ETS} 2017, Limassol, Cyprus,
May 22-26, 2017},
pages = {1--6},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ETS.2017.7968226},
doi = {10.1109/ETS.2017.7968226},
timestamp = {Thu, 13 Jul 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/WagnerW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/SchollBW17,
author = {Alexander Sch{\"{o}}ll and
Claus Braun and
Hans{-}Joachim Wunderlich},
title = {Energy-efficient and error-resilient iterative solvers for approximate
computing},
booktitle = {23rd {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2017, Thessaloniki, Greece, July 3-5, 2017},
pages = {237--239},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/IOLTS.2017.8046244},
doi = {10.1109/IOLTS.2017.8046244},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/iolts/SchollBW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HolstSKKMWKW17,
author = {Stefan Holst and
Eric Schneider and
Koshi Kawagoe and
Michael A. Kochte and
Kohei Miyase and
Hans{-}Joachim Wunderlich and
Seiji Kajihara and
Xiaoqing Wen},
title = {Analysis and mitigation or IR-Drop induced scan shift-errors},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--8},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242055},
doi = {10.1109/TEST.2017.8242055},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/itc/HolstSKKMWKW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/KochteBW17,
author = {Michael A. Kochte and
Rafal Baranowski and
Hans{-}Joachim Wunderlich},
title = {Trustworthy reconfigurable access to on-chip infrastructure},
booktitle = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
September 13-15, 2017},
pages = {119--124},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ITC-ASIA.2017.8097125},
doi = {10.1109/ITC-ASIA.2017.8097125},
timestamp = {Mon, 09 Aug 2021 14:54:04 +0200},
biburl = {https://dblp.org/rec/conf/itc-asia/KochteBW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/DeshmukhKWH17,
author = {Jyotirmoy V. Deshmukh and
Wolfgang Kunz and
Hans{-}Joachim Wunderlich and
Sybille Hellebrand},
title = {Special session on early life failures},
booktitle = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
April 9-12, 2017},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/VTS.2017.7928933},
doi = {10.1109/VTS.2017.7928933},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/DeshmukhKWH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LiuKW17,
author = {Chang Liu and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Aging monitor reuse for small delay fault testing},
booktitle = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
April 9-12, 2017},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/VTS.2017.7928921},
doi = {10.1109/VTS.2017.7928921},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LiuKW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/ErbSKSWB16,
author = {Dominik Erb and
Karsten Scheibler and
Michael A. Kochte and
Matthias Sauer and
Hans{-}Joachim Wunderlich and
Bernd Becker},
title = {Mixed 01X-RSL-Encoding for fast and accurate {ATPG} with unknowns},
booktitle = {21st Asia and South Pacific Design Automation Conference, {ASP-DAC}
2016, Macao, Macao, January 25-28, 2016},
pages = {749--754},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/ASPDAC.2016.7428101},
doi = {10.1109/ASPDAC.2016.7428101},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/aspdac/ErbSKSWB16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HolstSWKYWK16,
author = {Stefan Holst and
Eric Schneider and
Xiaoqing Wen and
Seiji Kajihara and
Yuta Yamato and
Hans{-}Joachim Wunderlich and
Michael A. Kochte},
title = {Timing-Accurate Estimation of IR-Drop Impact on Logic- and Clock-Paths
During At-Speed Scan Test},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {19--24},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.49},
doi = {10.1109/ATS.2016.49},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HolstSWKYWK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KochteBSW16,
author = {Michael A. Kochte and
Rafal Baranowski and
Marcel Schaal and
Hans{-}Joachim Wunderlich},
title = {Test Strategies for Reconfigurable Scan Networks},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {113--118},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.35},
doi = {10.1109/ATS.2016.35},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KochteBSW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GomezW16,
author = {Laura Rodr{\'{\i}}guez G{\'{o}}mez and
Hans{-}Joachim Wunderlich},
title = {A Neural-Network-Based Fault Classifier},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {144--149},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.46},
doi = {10.1109/ATS.2016.46},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GomezW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SchneiderW16,
author = {Eric Schneider and
Hans{-}Joachim Wunderlich},
title = {High-Throughput Transistor-Level Fault Simulation on GPUs},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {150--155},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.9},
doi = {10.1109/ATS.2016.9},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SchneiderW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YeKLW16,
author = {Jin{-}Cun Ye and
Michael A. Kochte and
Kuen{-}Jong Lee and
Hans{-}Joachim Wunderlich},
title = {Autonomous Testing for 3D-ICs with {IEEE} Std. 1687},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {215--220},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.56},
doi = {10.1109/ATS.2016.56},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YeKLW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DalirsaniW16,
author = {Atefe Dalirsani and
Hans{-}Joachim Wunderlich},
title = {Functional Diagnosis for Graceful Degradation of NoC Switches},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {246--251},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.18},
doi = {10.1109/ATS.2016.18},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DalirsaniW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SchollBW16,
author = {Alexander Sch{\"{o}}ll and
Claus Braun and
Hans{-}Joachim Wunderlich},
title = {Applying efficient fault tolerance to enable the preconditioned conjugate
gradient solver on approximate computing hardware},
booktitle = {2016 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2016, Storrs, CT, USA,
September 19-20, 2016},
pages = {21--26},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/DFT.2016.7684063},
doi = {10.1109/DFT.2016.7684063},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/SchollBW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsn/SchollBKW16,
author = {Alexander Sch{\"{o}}ll and
Claus Braun and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Efficient Algorithm-Based Fault Tolerance for Sparse Matrix Operations},
booktitle = {46th Annual {IEEE/IFIP} International Conference on Dependable Systems
and Networks, {DSN} 2016, Toulouse, France, June 28 - July 1, 2016},
pages = {251--262},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/DSN.2016.31},
doi = {10.1109/DSN.2016.31},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsn/SchollBKW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/KochteBSBW16,
author = {Michael A. Kochte and
Rafal Baranowski and
Matthias Sauer and
Bernd Becker and
Hans{-}Joachim Wunderlich},
title = {Formal verification of secure reconfigurable scan network infrastructure},
booktitle = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
May 23-27, 2016},
pages = {1--6},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/ETS.2016.7519290},
doi = {10.1109/ETS.2016.7519290},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/KochteBSBW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/WunderlichM16,
author = {Hans{-}Joachim Wunderlich and
Peter C. Maxwell},
title = {{ETS} 2015 best paper},
booktitle = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
May 23-27, 2016},
pages = {1},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/ETS.2016.7519278},
doi = {10.1109/ETS.2016.7519278},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/WunderlichM16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/WunderlichBS16,
author = {Hans{-}Joachim Wunderlich and
Claus Braun and
Alexander Sch{\"{o}}ll},
title = {Pushing the limits: How fault tolerance extends the scope of approximate
computing},
booktitle = {22nd {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2016, Sant Feliu de Guixols, Spain, July 4-6,
2016},
pages = {133--136},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/IOLTS.2016.7604686},
doi = {10.1109/IOLTS.2016.7604686},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/iolts/WunderlichBS16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/KochteW16,
author = {Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Dependable on-chip infrastructure for dependable MPSOCs},
booktitle = {17th Latin-American Test Symposium, {LATS} 2016, Foz do Iguacu, Brazil,
April 6-8, 2016},
pages = {183--188},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/LATW.2016.7483366},
doi = {10.1109/LATW.2016.7483366},
timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
biburl = {https://dblp.org/rec/conf/latw/KochteW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/WunderlichBS16,
author = {Hans{-}Joachim Wunderlich and
Claus Braun and
Alexander Sch{\"{o}}ll},
title = {Fault tolerance of approximate compute algorithms},
booktitle = {34th {IEEE} {VLSI} Test Symposium, {VTS} 2016, Las Vegas, NV, USA,
April 25-27, 2016},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/VTS.2016.7477307},
doi = {10.1109/VTS.2016.7477307},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/WunderlichBS16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/it/BauerHHKKRSWWWW15,
author = {Lars Bauer and
J{\"{o}}rg Henkel and
Andreas Herkersdorf and
Michael A. Kochte and
Johannes Maximilian K{\"{u}}hn and
Wolfgang Rosenstiel and
Thomas Schweizer and
Stefan Wallentowitz and
Volker Wenzel and
Thomas Wild and
Hans{-}Joachim Wunderlich and
Hongyan Zhang},
title = {Adaptive multi-layer techniques for increased system dependability},
journal = {it Inf. Technol.},
volume = {57},
number = {3},
pages = {149--158},
year = {2015},
url = {https://doi.org/10.1515/itit-2014-1082},
doi = {10.1515/ITIT-2014-1082},
timestamp = {Mon, 28 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/it/BauerHHKKRSWWWW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/BaranowskiKW15,
author = {Rafal Baranowski and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Fine-Grained Access Management in Reconfigurable Scan Networks},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {34},
number = {6},
pages = {937--946},
year = {2015},
url = {https://doi.org/10.1109/TCAD.2015.2391266},
doi = {10.1109/TCAD.2015.2391266},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/BaranowskiKW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/ErbKRSWB15,
author = {Dominik Erb and
Michael A. Kochte and
Sven Reimer and
Matthias Sauer and
Hans{-}Joachim Wunderlich and
Bernd Becker},
title = {Accurate QBF-Based Test Pattern Generation in Presence of Unknown
Values},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {34},
number = {12},
pages = {2025--2038},
year = {2015},
url = {https://doi.org/10.1109/TCAD.2015.2440315},
doi = {10.1109/TCAD.2015.2440315},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/ErbKRSWB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/todaes/BaranowskiKW15,
author = {Rafal Baranowski and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Reconfigurable Scan Networks: Modeling, Verification, and Optimal
Pattern Generation},
journal = {{ACM} Trans. Design Autom. Electr. Syst.},
volume = {20},
number = {2},
pages = {30:1--30:27},
year = {2015},
url = {https://doi.org/10.1145/2699863},
doi = {10.1145/2699863},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/todaes/BaranowskiKW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/todaes/HolstIW15,
author = {Stefan Holst and
Michael E. Imhof and
Hans{-}Joachim Wunderlich},
title = {High-Throughput Logic Timing Simulation on GPGPUs},
journal = {{ACM} Trans. Design Autom. Electr. Syst.},
volume = {20},
number = {3},
pages = {37:1--37:22},
year = {2015},
url = {https://doi.org/10.1145/2714564},
doi = {10.1145/2714564},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/todaes/HolstIW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AsadaWHMKKSWQ15,
author = {Koji Asada and
Xiaoqing Wen and
Stefan Holst and
Kohei Miyase and
Seiji Kajihara and
Michael A. Kochte and
Eric Schneider and
Hans{-}Joachim Wunderlich and
Jun Qian},
title = {Logic/Clock-Path-Aware At-Speed Scan Test Generation for Avoiding
False Capture Failures and Reducing Clock Stretch},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {103--108},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.25},
doi = {10.1109/ATS.2015.25},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/AsadaWHMKKSWQ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KampmannKSIHW15,
author = {Matthias Kampmann and
Michael A. Kochte and
Eric Schneider and
Thomas Indlekofer and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
title = {Optimized Selection of Frequencies for Faster-Than-at-Speed Test},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {109--114},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.26},
doi = {10.1109/ATS.2015.26},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/KampmannKSIHW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KochteDBOMW15,
author = {Michael A. Kochte and
Atefe Dalirsani and
Andrea Bernabei and
Martin Oma{\~{n}}a and
Cecilia Metra and
Hans{-}Joachim Wunderlich},
title = {Intermittent and Transient Fault Diagnosis on Sparse Code Signatures},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {157--162},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.34},
doi = {10.1109/ATS.2015.34},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KochteDBOMW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/BaranowskiFKLTW15,
author = {Rafal Baranowski and
Farshad Firouzi and
Saman Kiamehr and
Chang Liu and
Mehdi Baradaran Tahoori and
Hans{-}Joachim Wunderlich},
editor = {Wolfgang Nebel and
David Atienza},
title = {On-line prediction of NBTI-induced aging rates},
booktitle = {Proceedings of the 2015 Design, Automation {\&} Test in Europe
Conference {\&} Exhibition, {DATE} 2015, Grenoble, France, March
9-13, 2015},
pages = {589--592},
publisher = {{ACM}},
year = {2015},
url = {http://dl.acm.org/citation.cfm?id=2755886},
timestamp = {Mon, 09 Aug 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/BaranowskiFKLTW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/SchneiderHKWW15,
author = {Eric Schneider and
Stefan Holst and
Michael A. Kochte and
Xiaoqing Wen and
Hans{-}Joachim Wunderlich},
editor = {Wolfgang Nebel and
David Atienza},
title = {GPU-accelerated small delay fault simulation},
booktitle = {Proceedings of the 2015 Design, Automation {\&} Test in Europe
Conference {\&} Exhibition, {DATE} 2015, Grenoble, France, March
9-13, 2015},
pages = {1174--1179},
publisher = {{ACM}},
year = {2015},
url = {http://dl.acm.org/citation.cfm?id=2757084},
timestamp = {Mon, 09 Aug 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/SchneiderHKWW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SchollBKW15,
author = {Alexander Sch{\"{o}}ll and
Claus Braun and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Low-overhead fault-tolerance for the preconditioned conjugate gradient
solver},
booktitle = {2015 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2015, Amherst, MA, USA,
October 12-14, 2015},
pages = {60--65},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/DFT.2015.7315136},
doi = {10.1109/DFT.2015.7315136},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/SchollBKW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/Wunderlich15,
author = {Hans{-}Joachim Wunderlich},
title = {Testing visions},
booktitle = {20th {IEEE} European Test Symposium, {ETS} 2015, Cluj-Napoca, Romania,
25-29 May, 2015},
pages = {1},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/ETS.2015.7138750},
doi = {10.1109/ETS.2015.7138750},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/ets/Wunderlich15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/ZhangKSBWH15,
author = {Hongyan Zhang and
Michael A. Kochte and
Eric Schneider and
Lars Bauer and
Hans{-}Joachim Wunderlich and
J{\"{o}}rg Henkel},
editor = {Diana Marculescu and
Frank Liu},
title = {{STRAP:} Stress-Aware Placement for Aging Mitigation in Runtime Reconfigurable
Architectures},
booktitle = {Proceedings of the {IEEE/ACM} International Conference on Computer-Aided
Design, {ICCAD} 2015, Austin, TX, USA, November 2-6, 2015},
pages = {38--45},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/ICCAD.2015.7372547},
doi = {10.1109/ICCAD.2015.7372547},
timestamp = {Mon, 26 Jun 2023 16:43:56 +0200},
biburl = {https://dblp.org/rec/conf/iccad/ZhangKSBWH15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/SchollBKW15,
author = {Alexander Sch{\"{o}}ll and
Claus Braun and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Efficient on-line fault-tolerance for the preconditioned conjugate
gradient method},
booktitle = {21st {IEEE} International On-Line Testing Symposium, {IOLTS} 2015,
Halkidiki, Greece, July 6-8, 2015},
pages = {95--100},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IOLTS.2015.7229839},
doi = {10.1109/IOLTS.2015.7229839},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/iolts/SchollBKW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/LiuKW15,
author = {Chang Liu and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Efficient observation point selection for aging monitoring},
booktitle = {21st {IEEE} International On-Line Testing Symposium, {IOLTS} 2015,
Halkidiki, Greece, July 6-8, 2015},
pages = {176--181},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IOLTS.2015.7229855},
doi = {10.1109/IOLTS.2015.7229855},
timestamp = {Wed, 28 Feb 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/LiuKW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/nocs/WunderlichR15,
author = {Hans{-}Joachim Wunderlich and
Martin Radetzki},
editor = {Andr{\'{e}} Ivanov and
Diana Marculescu and
Partha Pratim Pande and
Jos{\'{e}} Flich and
Karthik Pattabiraman},
title = {Multi-Layer Test and Diagnosis for Dependable NoCs},
booktitle = {Proceedings of the 9th International Symposium on Networks-on-Chip,
{NOCS} 2015, Vancouver, BC, Canada, September 28-30, 2015},
pages = {5:1--5:8},
publisher = {{ACM}},
year = {2015},
url = {https://doi.org/10.1145/2786572.2788708},
doi = {10.1145/2786572.2788708},
timestamp = {Tue, 06 Nov 2018 11:06:50 +0100},
biburl = {https://dblp.org/rec/conf/nocs/WunderlichR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/TranVBDGPW14,
author = {D. A. Tran and
Arnaud Virazel and
Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Serge Pravossoudovitch and
Hans{-}Joachim Wunderlich},
title = {A New Hybrid Fault-Tolerant Architecture for Digital {CMOS} Circuits
and Systems},
journal = {J. Electron. Test.},
volume = {30},
number = {4},
pages = {401--413},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5459-3},
doi = {10.1007/S10836-014-5459-3},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/TranVBDGPW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GomezCIHW14,
author = {Laura Rodr{\'{\i}}guez G{\'{o}}mez and
Alejandro Cook and
Thomas Indlekofer and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
title = {Adaptive Bayesian Diagnosis of Intermittent Faults},
journal = {J. Electron. Test.},
volume = {30},
number = {5},
pages = {527--540},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5477-1},
doi = {10.1007/S10836-014-5477-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/GomezCIHW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BaranowskiKW14,
author = {Rafal Baranowski and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Access Port Protection for Reconfigurable Scan Networks},
journal = {J. Electron. Test.},
volume = {30},
number = {6},
pages = {711--723},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5484-2},
doi = {10.1007/S10836-014-5484-2},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/BaranowskiKW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/it/HellebrandW14,
author = {Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
title = {SAT-based {ATPG} beyond stuck-at fault testing},
journal = {it Inf. Technol.},
volume = {56},
number = {4},
pages = {165--172},
year = {2014},
url = {https://doi.org/10.1515/itit-2013-1043},
doi = {10.1515/ITIT-2013-1043},
timestamp = {Mon, 28 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/it/HellebrandW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HerkersdorfAEGGHKKKMNRRSSTTWWW14,
author = {Andreas Herkersdorf and
Hananeh Aliee and
Michael Engel and
Michael Gla{\ss} and
Christina Gimmler{-}Dumont and
J{\"{o}}rg Henkel and
Veit Kleeberger and
Michael A. Kochte and
Johannes Maximilian K{\"{u}}hn and
Daniel Mueller{-}Gritschneder and
Sani R. Nassif and
Holm Rauchfuss and
Wolfgang Rosenstiel and
Ulf Schlichtmann and
Muhammad Shafique and
Mehdi Baradaran Tahoori and
J{\"{u}}rgen Teich and
Norbert Wehn and
Christian Weis and
Hans{-}Joachim Wunderlich},
title = {Resilience Articulation Point {(RAP):} Cross-layer dependability modeling
for nanometer system-on-chip resilience},
journal = {Microelectron. Reliab.},
volume = {54},
number = {6-7},
pages = {1066--1074},
year = {2014},
url = {https://doi.org/10.1016/j.microrel.2013.12.012},
doi = {10.1016/J.MICROREL.2013.12.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HerkersdorfAEGGHKKKMNRRSSTTWWW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/todaes/ErbKSHSWB14,
author = {Dominik Erb and
Michael A. Kochte and
Matthias Sauer and
Stefan Hillebrecht and
Tobias Schubert and
Hans{-}Joachim Wunderlich and
Bernd Becker},
title = {Exact Logic and Fault Simulation in Presence of Unknowns},
journal = {{ACM} Trans. Design Autom. Electr. Syst.},
volume = {19},
number = {3},
pages = {28:1--28:17},
year = {2014},
url = {https://doi.org/10.1145/2611760},
doi = {10.1145/2611760},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/todaes/ErbKSHSWB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/todaes/HatamiBPW14,
author = {Nadereh Hatami and
Rafal Baranowski and
Paolo Prinetto and
Hans{-}Joachim Wunderlich},
title = {Multilevel Simulation of Nonfunctional Properties by Piecewise Evaluation},
journal = {{ACM} Trans. Design Autom. Electr. Syst.},
volume = {19},
number = {4},
pages = {37:1--37:21},
year = {2014},
url = {https://doi.org/10.1145/2647955},
doi = {10.1145/2647955},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/todaes/HatamiBPW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DalirsaniHIESRW14,
author = {Atefe Dalirsani and
Nadereh Hatami and
Michael E. Imhof and
Marcus Eggenberger and
Gert Schley and
Martin Radetzki and
Hans{-}Joachim Wunderlich},
title = {On Covering Structural Defects in NoCs by Functional Tests},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {87--92},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.27},
doi = {10.1109/ATS.2014.27},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DalirsaniHIESRW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/JutmanRW14,
author = {Artur Jutman and
Matteo Sonza Reorda and
Hans{-}Joachim Wunderlich},
title = {High Quality System Level Test and Diagnosis},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {298--305},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.62},
doi = {10.1109/ATS.2014.62},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/JutmanRW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/bibm/SchollBDSW14,
author = {Alexander Sch{\"{o}}ll and
Claus Braun and
Markus Daub and
Guido Schneider and
Hans{-}Joachim Wunderlich},
editor = {Huiru Jane Zheng and
Werner Dubitzky and
Xiaohua Hu and
Jin{-}Kao Hao and
Daniel P. Berrar and
Kwang{-}Hyun Cho and
Yadong Wang and
David R. Gilbert},
title = {Adaptive parallel simulation of a two-timescale model for apoptotic
receptor-clustering on GPUs},
booktitle = {2014 {IEEE} International Conference on Bioinformatics and Biomedicine,
{BIBM} 2014, Belfast, United Kingdom, November 2-5, 2014},
pages = {424--431},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/BIBM.2014.6999195},
doi = {10.1109/BIBM.2014.6999195},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/bibm/SchollBDSW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/ZhangKIBWH14,
author = {Hongyan Zhang and
Michael A. Kochte and
Michael E. Imhof and
Lars Bauer and
Hans{-}Joachim Wunderlich and
J{\"{o}}rg Henkel},
title = {{GUARD:} GUAranteed Reliability in Dynamically Reconfigurable Systems},
booktitle = {The 51st Annual Design Automation Conference 2014, {DAC} '14, San
Francisco, CA, USA, June 1-5, 2014},
pages = {32:1--32:6},
publisher = {{ACM}},
year = {2014},
url = {https://doi.org/10.1145/2593069.2593146},
doi = {10.1145/2593069.2593146},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/ZhangKIBWH14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/ReimannGTCGUWEA14,
author = {Felix Reimann and
Michael Gla{\ss} and
J{\"{u}}rgen Teich and
Alejandro Cook and
Laura Rodr{\'{\i}}guez G{\'{o}}mez and
Dominik Ull and
Hans{-}Joachim Wunderlich and
Piet Engelke and
Ulrich Abelein},
title = {Advanced Diagnosis: {SBST} and {BIST} Integration in Automotive {E/E}
Architectures},
booktitle = {The 51st Annual Design Automation Conference 2014, {DAC} '14, San
Francisco, CA, USA, June 1-5, 2014},
pages = {96:1--96:9},
publisher = {{ACM}},
year = {2014},
url = {https://doi.org/10.1145/2593069.2602971},
doi = {10.1145/2593069.2602971},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/ReimannGTCGUWEA14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/AbeleinCEGRGRTUW14,
author = {Ulrich Abelein and
Alejandro Cook and
Piet Engelke and
Michael Gla{\ss} and
Felix Reimann and
Laura Rodr{\'{\i}}guez G{\'{o}}mez and
Thomas Russ and
J{\"{u}}rgen Teich and
Dominik Ull and
Hans{-}Joachim Wunderlich},
editor = {Gerhard P. Fettweis and
Wolfgang Nebel},
title = {Non-intrusive integration of advanced diagnosis features in automotive
E/E-architectures},
booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
{DATE} 2014, Dresden, Germany, March 24-28, 2014},
pages = {1--6},
publisher = {European Design and Automation Association},
year = {2014},
url = {https://doi.org/10.7873/DATE.2014.373},
doi = {10.7873/DATE.2014.373},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/date/AbeleinCEGRGRTUW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/ImhofW14,
author = {Michael E. Imhof and
Hans{-}Joachim Wunderlich},
editor = {Gerhard P. Fettweis and
Wolfgang Nebel},
title = {Bit-Flipping Scan - {A} unified architecture for fault tolerance and
offline test},
booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
{DATE} 2014, Dresden, Germany, March 24-28, 2014},
pages = {1--6},
publisher = {European Design and Automation Association},
year = {2014},
url = {https://doi.org/10.7873/DATE.2014.206},
doi = {10.7873/DATE.2014.206},
timestamp = {Tue, 23 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/ImhofW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsn/BraunHW14,
author = {Claus Braun and
Sebastian Halder and
Hans{-}Joachim Wunderlich},
title = {{A-ABFT:} Autonomous Algorithm-Based Fault Tolerance for Matrix Multiplications
on Graphics Processing Units},
booktitle = {44th Annual {IEEE/IFIP} International Conference on Dependable Systems
and Networks, {DSN} 2014, Atlanta, GA, USA, June 23-26, 2014},
pages = {443--454},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/DSN.2014.48},
doi = {10.1109/DSN.2014.48},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsn/BraunHW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/CookW14,
author = {Alejandro Cook and
Hans{-}Joachim Wunderlich},
editor = {Giorgio Di Natale},
title = {Diagnosis of multiple faults with highly compacted test responses},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847796},
doi = {10.1109/ETS.2014.6847796},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/ets/CookW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/SauerPIMSCWB14,
author = {Matthias Sauer and
Ilia Polian and
Michael E. Imhof and
Abdullah Mumtaz and
Eric Schneider and
Alexander Czutro and
Hans{-}Joachim Wunderlich and
Bernd Becker},
editor = {Giorgio Di Natale},
title = {Variation-aware deterministic {ATPG}},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847806},
doi = {10.1109/ETS.2014.6847806},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/SauerPIMSCWB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/WagnerW14,
author = {Marcus Wagner and
Hans{-}Joachim Wunderlich},
editor = {Giorgio Di Natale},
title = {Incremental computation of delay fault detection probability for variation-aware
test generation},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847805},
doi = {10.1109/ETS.2014.6847805},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/WagnerW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/SchneiderHWW14,
author = {Eric Schneider and
Stefan Holst and
Xiaoqing Wen and
Hans{-}Joachim Wunderlich},
editor = {Yao{-}Wen Chang},
title = {Data-parallel simulation for fast and accurate timing validation of
{CMOS} circuits},
booktitle = {The {IEEE/ACM} International Conference on Computer-Aided Design,
{ICCAD} 2014, San Jose, CA, USA, November 3-6, 2014},
pages = {17--23},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ICCAD.2014.7001324},
doi = {10.1109/ICCAD.2014.7001324},
timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
biburl = {https://dblp.org/rec/conf/iccad/SchneiderHWW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/DalirsaniKW14,
author = {Atefe Dalirsani and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Area-efficient synthesis of fault-secure NoC switches},
booktitle = {2014 {IEEE} 20th International On-Line Testing Symposium, {IOLTS}
2014, Platja d'Aro, Girona, Spain, July 7-9, 2014},
pages = {13--18},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/IOLTS.2014.6873662},
doi = {10.1109/IOLTS.2014.6873662},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/iolts/DalirsaniKW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ErbSKSWB14,
author = {Dominik Erb and
Karsten Scheibler and
Michael A. Kochte and
Matthias Sauer and
Hans{-}Joachim Wunderlich and
Bernd Becker},
title = {Test pattern generation in presence of unknown values based on restricted
symbolic logic},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035350},
doi = {10.1109/TEST.2014.7035350},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ErbSKSWB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HellebrandIKKLW14,
author = {Sybille Hellebrand and
Thomas Indlekofer and
Matthias Kampmann and
Michael A. Kochte and
Chang Liu and
Hans{-}Joachim Wunderlich},
title = {{FAST-BIST:} Faster-than-at-Speed {BIST} targeting hidden delay defects},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035360},
doi = {10.1109/TEST.2014.7035360},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HellebrandIKKLW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/mbmv/BaranowskiKW14,
author = {Rafal Baranowski and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
editor = {J{\"{u}}rgen Ruf and
Dirk Allmendinger and
Matteo Michel},
title = {Verifikation Rekonfigurierbarer Scan-Netze},
booktitle = {Methoden und Beschreibungssprachen zur Modellierung und Verifikation
von Schaltungen und Systemen, {MBMV} 2014, B{\"{o}}blingen, Germany},
pages = {137--146},
publisher = {Cuvillier},
year = {2014},
timestamp = {Thu, 13 Mar 2014 18:26:03 +0100},
biburl = {https://dblp.org/rec/conf/mbmv/BaranowskiKW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/DalirsaniIW14,
author = {Atefe Dalirsani and
Michael E. Imhof and
Hans{-}Joachim Wunderlich},
title = {Structural Software-Based Self-Test of Network-on-Chip},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818754},
doi = {10.1109/VTS.2014.6818754},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/DalirsaniIW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/BauerBIKSZHW13,
author = {Lars Bauer and
Claus Braun and
Michael E. Imhof and
Michael A. Kochte and
Eric Schneider and
Hongyan Zhang and
J{\"{o}}rg Henkel and
Hans{-}Joachim Wunderlich},
title = {Test Strategies for Reliable Runtime Reconfigurable Architectures},
journal = {{IEEE} Trans. Computers},
volume = {62},
number = {8},
pages = {1494--1507},
year = {2013},
url = {https://doi.org/10.1109/TC.2013.53},
doi = {10.1109/TC.2013.53},
timestamp = {Tue, 24 Apr 2018 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/BauerBIKSZHW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ErbKSWB13,
author = {Dominik Erb and
Michael A. Kochte and
Matthias Sauer and
Hans{-}Joachim Wunderlich and
Bernd Becker},
title = {Accurate Multi-cycle {ATPG} in Presence of X-Values},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {245--250},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.53},
doi = {10.1109/ATS.2013.53},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ErbKSWB13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BaranowskiKW13,
author = {Rafal Baranowski and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Securing Access to Reconfigurable Scan Networks},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {295--300},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.61},
doi = {10.1109/ATS.2013.61},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BaranowskiKW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/WagnerW13,
author = {Marcus Wagner and
Hans{-}Joachim Wunderlich},
editor = {Enrico Macii},
title = {Efficient variation-aware statistical dynamic timing analysis for
delay test applications},
booktitle = {Design, Automation and Test in Europe, {DATE} 13, Grenoble, France,
March 18-22, 2013},
pages = {276--281},
publisher = {{EDA} Consortium San Jose, CA, {USA} / {ACM} {DL}},
year = {2013},
url = {https://doi.org/10.7873/DATE.2013.069},
doi = {10.7873/DATE.2013.069},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/date/WagnerW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/HillebrechtKEWB13,
author = {Stefan Hillebrecht and
Michael A. Kochte and
Dominik Erb and
Hans{-}Joachim Wunderlich and
Bernd Becker},
editor = {Enrico Macii},
title = {Accurate QBF-based test pattern generation in presence of unknown
values},
booktitle = {Design, Automation and Test in Europe, {DATE} 13, Grenoble, France,
March 18-22, 2013},
pages = {436--441},
publisher = {{EDA} Consortium San Jose, CA, {USA} / {ACM} {DL}},
year = {2013},
url = {https://doi.org/10.7873/DATE.2013.098},
doi = {10.7873/DATE.2013.098},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/HillebrechtKEWB13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/DalirsaniKW13,
author = {Atefe Dalirsani and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {SAT-based code synthesis for fault-secure circuits},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {39--44},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653580},
doi = {10.1109/DFT.2013.6653580},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/DalirsaniKW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/BaranowskiCILW13,
author = {Rafal Baranowski and
Alejandro Cook and
Michael E. Imhof and
Chang Liu and
Hans{-}Joachim Wunderlich},
title = {Synthesis of workload monitors for on-line stress prediction},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {137--142},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653596},
doi = {10.1109/DFT.2013.6653596},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/BaranowskiCILW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/BaranowskiKW13,
author = {Rafal Baranowski and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Scan pattern retargeting and merging with reduced access time},
booktitle = {18th {IEEE} European Test Symposium, {ETS} 2013, Avignon, France,
May 27-30, 2013},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ETS.2013.6569354},
doi = {10.1109/ETS.2013.6569354},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/BaranowskiKW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/WunderlichBH13,
author = {Hans{-}Joachim Wunderlich and
Claus Braun and
Sebastian Halder},
title = {Efficacy and efficiency of algorithm-based fault-tolerance on GPUs},
booktitle = {2013 {IEEE} 19th International On-Line Testing Symposium (IOLTS),
Chania, Crete, Greece, July 8-10, 2013},
pages = {240--243},
publisher = {{IEEE}},
year = {2013},
url = {https://doi.org/10.1109/IOLTS.2013.6604090},
doi = {10.1109/IOLTS.2013.6604090},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/iolts/WunderlichBH13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhangBKSBIWH13,
author = {Hongyan Zhang and
Lars Bauer and
Michael A. Kochte and
Eric Schneider and
Claus Braun and
Michael E. Imhof and
Hans{-}Joachim Wunderlich and
J{\"{o}}rg Henkel},
title = {Module diversification: Fault tolerance and aging mitigation for runtime
reconfigurable architectures},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651926},
doi = {10.1109/TEST.2013.6651926},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZhangBKSBIWH13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/DalirsaniHEW12,
author = {Atefe Dalirsani and
Stefan Holst and
Melanie Elm and
Hans{-}Joachim Wunderlich},
title = {Structural Test and Diagnosis for Graceful Degradation of NoC Switches},
journal = {J. Electron. Test.},
volume = {28},
number = {6},
pages = {831--841},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5329-9},
doi = {10.1007/S10836-012-5329-9},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/DalirsaniHEW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/KochteEW12,
author = {Michael A. Kochte and
Melanie Elm and
Hans{-}Joachim Wunderlich},
title = {Accurate X-Propagation for Test Applications by SAT-Based Reasoning},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {31},
number = {12},
pages = {1908--1919},
year = {2012},
url = {https://doi.org/10.1109/TCAD.2012.2210422},
doi = {10.1109/TCAD.2012.2210422},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/KochteEW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ahs/BauerBIKZWH12,
author = {Lars Bauer and
Claus Braun and
Michael E. Imhof and
Michael A. Kochte and
Hongyan Zhang and
Hans{-}Joachim Wunderlich and
J{\"{o}}rg Henkel},
editor = {Umeshkumar D. Patel and
Khaled Benkrid and
David Merodio},
title = {{OTERA:} Online test strategies for reliable reconfigurable architectures
- Invited paper for the {AHS-2012} special session "Dependability
by reconfigurable hardware"},
booktitle = {2012 {NASA/ESA} Conference on Adaptive Hardware and Systems, {AHS}
2012, Erlangen, Germany, June 25-28, 2012},
pages = {38--45},
publisher = {{IEEE}},
year = {2012},
url = {https://doi.org/10.1109/AHS.2012.6268667},
doi = {10.1109/AHS.2012.6268667},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/ahs/BauerBIKZWH12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HolstSW12,
author = {Stefan Holst and
Eric Schneider and
Hans{-}Joachim Wunderlich},
title = {Scan Test Power Simulation on GPGPUs},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {155--160},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.23},
doi = {10.1109/ATS.2012.23},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HolstSW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/CookUEWRD12,
author = {Alejandro Cook and
Dominik Ull and
Melanie Elm and
Hans{-}Joachim Wunderlich and
Helmut Randoll and
Stefan Dohren},
title = {Reuse of Structural Volume Test Methods for In-System Testing of Automotive
ASICs},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {214--219},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.32},
doi = {10.1109/ATS.2012.32},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/CookUEWRD12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/CzutroIJMSBPW12,
author = {Alexander Czutro and
Michael E. Imhof and
J. Jiang and
Abdullah Mumtaz and
Matthias Sauer and
Bernd Becker and
Ilia Polian and
Hans{-}Joachim Wunderlich},
title = {Variation-Aware Fault Grading},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {344--349},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.14},
doi = {10.1109/ATS.2012.14},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/CzutroIJMSBPW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/bibm/BraunDSSW12,
author = {Claus Braun and
Markus Daub and
Alexander Sch{\"{o}}ll and
Guido Schneider and
Hans{-}Joachim Wunderlich},
title = {Parallel simulation of apoptotic receptor-clustering on {GPGPU} many-core
architectures},
booktitle = {2012 {IEEE} International Conference on Bioinformatics and Biomedicine,
{BIBM} 2012, Philadelphia, PA, USA, October 4-7, 2012},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/BIBM.2012.6392661},
doi = {10.1109/BIBM.2012.6392661},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/bibm/BraunDSSW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/CookHW12,
author = {Alejandro Cook and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
title = {Built-in self-diagnosis exploiting strong diagnostic windows in mixed-mode
test},
booktitle = {17th {IEEE} European Test Symposium, {ETS} 2012, Annecy, France, May
28 - June 1 2012},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ETS.2012.6233025},
doi = {10.1109/ETS.2012.6233025},
timestamp = {Tue, 28 Apr 2020 11:43:43 +0200},
biburl = {https://dblp.org/rec/conf/ets/CookHW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/HatamiBPW12,
author = {Nadereh Hatami and
Rafal Baranowski and
Paolo Prinetto and
Hans{-}Joachim Wunderlich},
title = {Efficient system-level aging prediction},
booktitle = {17th {IEEE} European Test Symposium, {ETS} 2012, Annecy, France, May
28 - June 1 2012},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ETS.2012.6233028},
doi = {10.1109/ETS.2012.6233028},
timestamp = {Tue, 28 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/HatamiBPW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/HillebrechtKWB12,
author = {Stefan Hillebrecht and
Michael A. Kochte and
Hans{-}Joachim Wunderlich and
Bernd Becker},
title = {Exact stuck-at fault classification in presence of unknowns},
booktitle = {17th {IEEE} European Test Symposium, {ETS} 2012, Annecy, France, May
28 - June 1 2012},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ETS.2012.6233017},
doi = {10.1109/ETS.2012.6233017},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/HillebrechtKWB12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccd/BraunHWCG12,
author = {Claus Braun and
Stefan Holst and
Hans{-}Joachim Wunderlich and
Juan Manuel Castillo{-}Sanchez and
Joachim Gross},
title = {Acceleration of Monte-Carlo molecular simulations on hybrid computing
architectures},
booktitle = {30th International {IEEE} Conference on Computer Design, {ICCD} 2012,
Montreal, QC, Canada, September 30 - Oct. 3, 2012},
pages = {207--212},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ICCD.2012.6378642},
doi = {10.1109/ICCD.2012.6378642},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccd/BraunHWCG12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/AbdelfattahBBIKZHW12,
author = {Mohamed Abdelfattah and
Lars Bauer and
Claus Braun and
Michael E. Imhof and
Michael A. Kochte and
Hongyan Zhang and
J{\"{o}}rg Henkel and
Hans{-}Joachim Wunderlich},
title = {Transparent structural online test for reconfigurable systems},
booktitle = {18th {IEEE} International On-Line Testing Symposium, {IOLTS} 2012,
Sitges, Spain, June 27-29, 2012},
pages = {37--42},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/IOLTS.2012.6313838},
doi = {10.1109/IOLTS.2012.6313838},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/AbdelfattahBBIKZHW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BaranowskiKW12,
author = {Rafal Baranowski and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Modeling, verification and pattern generation for reconfigurable scan
networks},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401555},
doi = {10.1109/TEST.2012.6401555},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BaranowskiKW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/CookHIMW12,
author = {Alejandro Cook and
Sybille Hellebrand and
Michael E. Imhof and
Abdullah Mumtaz and
Hans{-}Joachim Wunderlich},
title = {Built-in self-diagnosis targeting arbitrary defects with partial pseudo-exhaustive
test},
booktitle = {13th Latin American Test Workshop, {LATW} 2012, Quito, Ecuador, April
10-13, 2012},
pages = {1--4},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/LATW.2012.6261229},
doi = {10.1109/LATW.2012.6261229},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/CookHIMW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/TranVBDGTIW12,
author = {D. A. Tran and
Arnaud Virazel and
Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Aida Todri and
Michael E. Imhof and
Hans{-}Joachim Wunderlich},
title = {A pseudo-dynamic comparator for error detection in fault tolerant
architectures},
booktitle = {30th {IEEE} {VLSI} Test Symposium, {VTS} 2012, Maui, Hawaii, USA,
23-26 April 2012},
pages = {50--55},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/VTS.2012.6231079},
doi = {10.1109/VTS.2012.6231079},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/TranVBDGTIW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/chinaf/BaranowskiCHIKPWZ11,
author = {Rafal Baranowski and
Stefano Di Carlo and
Nadereh Hatami and
Michael E. Imhof and
Michael A. Kochte and
Paolo Prinetto and
Hans{-}Joachim Wunderlich and
Christian G. Zoellin},
title = {Efficient multi-level fault simulation of {HW/SW} systems for structural
faults},
journal = {Sci. China Inf. Sci.},
volume = {54},
number = {9},
pages = {1784--1796},
year = {2011},
url = {https://doi.org/10.1007/s11432-011-4366-9},
doi = {10.1007/S11432-011-4366-9},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/chinaf/BaranowskiCHIKPWZ11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/chinaf/HopschBHPSVW11,
author = {Fabian Hopsch and
Bernd Becker and
Sybille Hellebrand and
Ilia Polian and
Bernd Straube and
Wolfgang Vermeiren and
Hans{-}Joachim Wunderlich},
title = {Variation-aware fault modeling},
journal = {Sci. China Inf. Sci.},
volume = {54},
number = {9},
pages = {1813--1826},
year = {2011},
url = {https://doi.org/10.1007/s11432-011-4367-8},
doi = {10.1007/S11432-011-4367-8},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/chinaf/HopschBHPSVW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TranVBDGPW11,
author = {D. A. Tran and
Arnaud Virazel and
Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Serge Pravossoudovitch and
Hans{-}Joachim Wunderlich},
title = {A Hybrid Fault Tolerant Architecture for Robustness Improvement of
Digital Circuits},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {136--141},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.89},
doi = {10.1109/ATS.2011.89},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TranVBDGPW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MumtazIHW11,
author = {Abdullah Mumtaz and
Michael E. Imhof and
Stefan Holst and
Hans{-}Joachim Wunderlich},
title = {Embedded Test for Highly Accurate Defect Localization},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {213--218},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.60},
doi = {10.1109/ATS.2011.60},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MumtazIHW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/CookHIW11,
author = {Alejandro Cook and
Sybille Hellebrand and
Thomas Indlekofer and
Hans{-}Joachim Wunderlich},
title = {Diagnostic Test of Robust Circuits},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {285--290},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.55},
doi = {10.1109/ATS.2011.55},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/CookHIW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KochteKMWW11,
author = {Michael A. Kochte and
Sandip Kundu and
Kohei Miyase and
Xiaoqing Wen and
Hans{-}Joachim Wunderlich},
title = {Efficient BDD-based Fault Simulation in Presence of Unknown Values},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {383--388},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.52},
doi = {10.1109/ATS.2011.52},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KochteKMWW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/codes/HenkelBBBBCEEHHHKLMPRSSTTWW11,
author = {J{\"{o}}rg Henkel and
Lars Bauer and
Joachim Becker and
Oliver Bringmann and
Uwe Brinkschulte and
Samarjit Chakraborty and
Michael Engel and
Rolf Ernst and
Hermann H{\"{a}}rtig and
Lars Hedrich and
Andreas Herkersdorf and
R{\"{u}}diger Kapitza and
Daniel Lohmann and
Peter Marwedel and
Marco Platzner and
Wolfgang Rosenstiel and
Ulf Schlichtmann and
Olaf Spinczyk and
Mehdi Baradaran Tahoori and
J{\"{u}}rgen Teich and
Norbert Wehn and
Hans{-}Joachim Wunderlich},
editor = {Robert P. Dick and
Jan Madsen},
title = {Design and architectures for dependable embedded systems},
booktitle = {Proceedings of the 9th International Conference on Hardware/Software
Codesign and System Synthesis, {CODES+ISSS} 2011, part of ESWeek '11
Seventh Embedded Systems Week, Taipei, Taiwan, 9-14 October, 2011},
pages = {69--78},
publisher = {{ACM}},
year = {2011},
url = {https://doi.org/10.1145/2039370.2039384},
doi = {10.1145/2039370.2039384},
timestamp = {Sun, 25 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/codes/HenkelBBBBCEEHHHKLMPRSSTTWW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/KochteW11,
author = {Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {SAT-based fault coverage evaluation in the presence of unknown values},
booktitle = {Design, Automation and Test in Europe, {DATE} 2011, Grenoble, France,
March 14-18, 2011},
pages = {1303--1308},
publisher = {{IEEE}},
year = {2011},
url = {https://doi.org/10.1109/DATE.2011.5763209},
doi = {10.1109/DATE.2011.5763209},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/KochteW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/CookEWA11,
author = {Alejandro Cook and
Melanie Elm and
Hans{-}Joachim Wunderlich and
Ulrich Abelein},
title = {Structural In-Field Diagnosis for Random Logic Circuits},
booktitle = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27,
2011},
pages = {111--116},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ETS.2011.25},
doi = {10.1109/ETS.2011.25},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/CookEWA11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/DalirsaniHEW11,
author = {Atefe Dalirsani and
Stefan Holst and
Melanie Elm and
Hans{-}Joachim Wunderlich},
title = {Structural Test for Graceful Degradation of NoC Switches},
booktitle = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27,
2011},
pages = {183--188},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ETS.2011.33},
doi = {10.1109/ETS.2011.33},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/DalirsaniHEW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/PolianBHWM11,
author = {Ilia Polian and
Bernd Becker and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich and
Peter C. Maxwell},
title = {Towards Variation-Aware Test Methods},
booktitle = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27,
2011},
pages = {219--225},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ETS.2011.51},
doi = {10.1109/ETS.2011.51},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/PolianBHWM11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/ImhofW11,
author = {Michael E. Imhof and
Hans{-}Joachim Wunderlich},
title = {Soft error correction in embedded storage elements},
booktitle = {17th {IEEE} International On-Line Testing Symposium {(IOLTS} 2011),
13-15 July, 2011, Athens, Greece},
pages = {169--174},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/IOLTS.2011.5993832},
doi = {10.1109/IOLTS.2011.5993832},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/ImhofW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/BaranowskiW11,
author = {Rafal Baranowski and
Hans{-}Joachim Wunderlich},
title = {Fail-safety in core-based system design},
booktitle = {17th {IEEE} International On-Line Testing Symposium {(IOLTS} 2011),
13-15 July, 2011, Athens, Greece},
pages = {276--281},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/IOLTS.2011.5994542},
doi = {10.1109/IOLTS.2011.5994542},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/BaranowskiW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/islped/KochteMWKYEW11,
author = {Michael A. Kochte and
Kohei Miyase and
Xiaoqing Wen and
Seiji Kajihara and
Yuta Yamato and
Kazunari Enokimoto and
Hans{-}Joachim Wunderlich},
editor = {Naehyuck Chang and
Hiroshi Nakamura and
Koji Inoue and
Kenichi Osada and
Massimo Poncino},
title = {SAT-based capture-power reduction for at-speed broadcast-scan-based
test compression architectures},
booktitle = {Proceedings of the 2011 International Symposium on Low Power Electronics
and Design, 2011, Fukuoka, Japan, August 1-3, 2011},
pages = {33--38},
publisher = {{IEEE/ACM}},
year = {2011},
url = {http://portal.acm.org/citation.cfm?id=2016812\&\#38;CFID=34981777\&\#38;CFTOKEN=25607807},
timestamp = {Mon, 13 Aug 2012 09:40:34 +0200},
biburl = {https://dblp.org/rec/conf/islped/KochteMWKYEW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MumtazIW11,
author = {Abdullah Mumtaz and
Michael E. Imhof and
Hans{-}Joachim Wunderlich},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {{P-PET:} Partial pseudo-exhaustive test for high defect coverage},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139130},
doi = {10.1109/TEST.2011.6139130},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MumtazIW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/KochteZW10,
author = {Michael A. Kochte and
Christian G. Zoellin and
Hans{-}Joachim Wunderlich},
title = {Efficient Concurrent Self-Test with Partially Specified Patterns},
journal = {J. Electron. Test.},
volume = {26},
number = {5},
pages = {581--594},
year = {2010},
url = {https://doi.org/10.1007/s10836-010-5167-6},
doi = {10.1007/S10836-010-5167-6},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/KochteZW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/it/BraunW10,
author = {Claus Braun and
Hans{-}Joachim Wunderlich},
title = {Algorithmen-basierte Fehlertoleranz f{\"{u}}r Many-Core-Architekturen
(Algorithm-based Fault-Tolerance on Many-Core Architectures)},
journal = {it Inf. Technol.},
volume = {52},
number = {4},
pages = {209--215},
year = {2010},
url = {https://doi.org/10.1524/itit.2010.0593},
doi = {10.1524/ITIT.2010.0593},
timestamp = {Fri, 06 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/it/BraunW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KochteZBIWHCP10,
author = {Michael A. Kochte and
Christian G. Zoellin and
Rafal Baranowski and
Michael E. Imhof and
Hans{-}Joachim Wunderlich and
Nadereh Hatami and
Stefano Di Carlo and
Paolo Prinetto},
title = {Efficient Simulation of Structural Faults for the Reliability Evaluation
at System-Level},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {3--8},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.10},
doi = {10.1109/ATS.2010.10},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KochteZBIWHCP10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ElmKW10,
author = {Melanie Elm and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {On Determining the Real Output Xs by SAT-Based Reasoning},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {39--44},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.16},
doi = {10.1109/ATS.2010.16},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ElmKW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HopschBHPSVW10,
author = {Fabian Hopsch and
Bernd Becker and
Sybille Hellebrand and
Ilia Polian and
Bernd Straube and
Wolfgang Vermeiren and
Hans{-}Joachim Wunderlich},
title = {Variation-Aware Fault Modeling},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {87--93},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.24},
doi = {10.1109/ATS.2010.24},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HopschBHPSVW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/KochteSWZ10,
author = {Michael A. Kochte and
Marcel Schaal and
Hans{-}Joachim Wunderlich and
Christian G. Zoellin},
editor = {Sachin S. Sapatnekar},
title = {Efficient fault simulation on many-core processors},
booktitle = {Proceedings of the 47th Design Automation Conference, {DAC} 2010,
Anaheim, California, USA, July 13-18, 2010},
pages = {380--385},
publisher = {{ACM}},
year = {2010},
url = {https://doi.org/10.1145/1837274.1837369},
doi = {10.1145/1837274.1837369},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/KochteSWZ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/ElmW10,
author = {Melanie Elm and
Hans{-}Joachim Wunderlich},
editor = {Giovanni De Micheli and
Bashir M. Al{-}Hashimi and
Wolfgang M{\"{u}}ller and
Enrico Macii},
title = {{BISD:} Scan-based Built-In self-diagnosis},
booktitle = {Design, Automation and Test in Europe, {DATE} 2010, Dresden, Germany,
March 8-12, 2010},
pages = {1243--1248},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/DATE.2010.5456997},
doi = {10.1109/DATE.2010.5456997},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/date/ElmW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsn/BeckerHPSVW10,
author = {Bernd Becker and
Sybille Hellebrand and
Ilia Polian and
Bernd Straube and
Wolfgang Vermeiren and
Hans{-}Joachim Wunderlich},
title = {Massive statistical process variations: {A} grand challenge for testing
nanoelectronic circuits},
booktitle = {{IEEE/IFIP} International Conference on Dependable Systems and Networks
Workshops {(DSN-W} 2010), Chicago, Illinois, USA, June 28 - July 1,
2010},
pages = {95--100},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/DSNW.2010.5542612},
doi = {10.1109/DSNW.2010.5542612},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsn/BeckerHPSVW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/BraunW10,
author = {Claus Braun and
Hans{-}Joachim Wunderlich},
title = {Algorithm-based fault tolerance for many-core architectures},
booktitle = {15th European Test Symposium, {ETS} 2010, Prague, Czech Republic,
May 24-28, 2010},
pages = {253},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ETSYM.2010.5512738},
doi = {10.1109/ETSYM.2010.5512738},
timestamp = {Tue, 28 Apr 2020 11:43:44 +0200},
biburl = {https://dblp.org/rec/conf/ets/BraunW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KochteZBIWHCP10,
author = {Michael A. Kochte and
Christian G. Zoellin and
Rafal Baranowski and
Michael E. Imhof and
Hans{-}Joachim Wunderlich and
Nadereh Hatami and
Stefano Di Carlo and
Paolo Prinetto},
editor = {Ron Press and
Erik H. Volkerink},
title = {System reliability evaluation using concurrent multi-level simulation
of structural faults},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {817},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699309},
doi = {10.1109/TEST.2010.5699309},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KochteZBIWHCP10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TranVBDGPW10,
author = {D. A. Tran and
Arnaud Virazel and
Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Serge Pravossoudovitch and
Hans{-}Joachim Wunderlich},
editor = {Ron Press and
Erik H. Volkerink},
title = {Parity prediction synthesis for nano-electronic gate designs},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {820},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699312},
doi = {10.1109/TEST.2010.5699312},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TranVBDGPW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ZoellinW10,
author = {Christian G. Zoellin and
Hans{-}Joachim Wunderlich},
title = {Low-power test planning for arbitrary at-speed delay-test clock schemes},
booktitle = {28th {IEEE} {VLSI} Test Symposium, {VTS} 2010, April 19-22, 2010,
Santa Cruz, California, {USA}},
pages = {93--98},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/VTS.2010.5469607},
doi = {10.1109/VTS.2010.5469607},
timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
biburl = {https://dblp.org/rec/conf/vts/ZoellinW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/HolstW09,
author = {Stefan Holst and
Hans{-}Joachim Wunderlich},
title = {Adaptive Debug and Diagnosis Without Fault Dictionaries},
journal = {J. Electron. Test.},
volume = {25},
number = {4-5},
pages = {259--268},
year = {2009},
url = {https://doi.org/10.1007/s10836-009-5109-3},
doi = {10.1007/S10836-009-5109-3},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/HolstW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/KochteZIKRWCP09,
author = {Michael A. Kochte and
Christian G. Zoellin and
Michael E. Imhof and
Rauf Salimi Khaligh and
Martin Radetzki and
Hans{-}Joachim Wunderlich and
Stefano Di Carlo and
Paolo Prinetto},
editor = {Luca Benini and
Giovanni De Micheli and
Bashir M. Al{-}Hashimi and
Wolfgang M{\"{u}}ller},
title = {Test exploration and validation using transaction level models},
booktitle = {Design, Automation and Test in Europe, {DATE} 2009, Nice, France,
April 20-24, 2009},
pages = {1250--1253},
publisher = {{IEEE}},
year = {2009},
url = {https://doi.org/10.1109/DATE.2009.5090856},
doi = {10.1109/DATE.2009.5090856},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/date/KochteZIKRWCP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/HolstW09,
author = {Stefan Holst and
Hans{-}Joachim Wunderlich},
editor = {Luca Benini and
Giovanni De Micheli and
Bashir M. Al{-}Hashimi and
Wolfgang M{\"{u}}ller},
title = {A diagnosis algorithm for extreme space compaction},
booktitle = {Design, Automation and Test in Europe, {DATE} 2009, Nice, France,
April 20-24, 2009},
pages = {1355--1360},
publisher = {{IEEE}},
year = {2009},
url = {https://doi.org/10.1109/DATE.2009.5090875},
doi = {10.1109/DATE.2009.5090875},
timestamp = {Tue, 23 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/HolstW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/Wunderlich09,
author = {Hans{-}Joachim Wunderlich},
editor = {Dimitris Gizopoulos and
Susumu Horiguchi and
Spyros Tragoudas and
Mohammad Tehranipoor},
title = {Software-Based Hardware Fault Tolerance for Many-Core Architectures},
booktitle = {24th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} Systems, {DFT} 2009, Chicago, Illinois, USA, October 7-9,
2009},
pages = {223--223},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/DFT.2009.36},
doi = {10.1109/DFT.2009.36},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/Wunderlich09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/KochteZW09,
author = {Michael A. Kochte and
Christian G. Zoellin and
Hans{-}Joachim Wunderlich},
title = {Concurrent Self-Test with Partially Specified Patterns for Low Test
Latency and Overhead},
booktitle = {14th {IEEE} European Test Symposium, {ETS} 2009, Sevilla, Spain, May
25-29, 2009},
pages = {53--58},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ETS.2009.26},
doi = {10.1109/ETS.2009.26},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/KochteZW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/KochteHEW09,
author = {Michael A. Kochte and
Stefan Holst and
Melanie Elm and
Hans{-}Joachim Wunderlich},
title = {Test Encoding for Extreme Response Compaction},
booktitle = {14th {IEEE} European Test Symposium, {ETS} 2009, Sevilla, Spain, May
25-29, 2009},
pages = {155--160},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ETS.2009.22},
doi = {10.1109/ETS.2009.22},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/KochteHEW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HakmiHWSHG09,
author = {Abdul Wahid Hakmi and
Stefan Holst and
Hans{-}Joachim Wunderlich and
J{\"{u}}rgen Schl{\"{o}}ffel and
Friedrich Hapke and
Andreas Glowatz},
title = {Restrict Encoding for Mixed-Mode {BIST}},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {179--184},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.43},
doi = {10.1109/VTS.2009.43},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/HakmiHWSHG09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/ElmWIZLM08,
author = {Melanie Elm and
Hans{-}Joachim Wunderlich and
Michael E. Imhof and
Christian G. Zoellin and
Jens Leenstra and
Nicolas M{\"{a}}ding},
editor = {Limor Fix},
title = {Scan chain clustering for test power reduction},
booktitle = {Proceedings of the 45th Design Automation Conference, {DAC} 2008,
Anaheim, CA, USA, June 8-13, 2008},
pages = {828--833},
publisher = {{ACM}},
year = {2008},
url = {https://doi.org/10.1145/1391469.1391680},
doi = {10.1145/1391469.1391680},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/ElmWIZLM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/ElmW08,
author = {Melanie Elm and
Hans{-}Joachim Wunderlich},
editor = {Donatella Sciuto},
title = {Scan Chain Organization for Embedded Diagnosis},
booktitle = {Design, Automation and Test in Europe, {DATE} 2008, Munich, Germany,
March 10-14, 2008},
pages = {468--473},
publisher = {{ACM}},
year = {2008},
url = {https://doi.org/10.1109/DATE.2008.4484725},
doi = {10.1109/DATE.2008.4484725},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/ElmW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/delta/KochteZIW08,
author = {Michael A. Kochte and
Christian G. Zoellin and
Michael E. Imhof and
Hans{-}Joachim Wunderlich},
title = {Test Set Stripping Limiting the Maximum Number of Specified Bits},
booktitle = {4th {IEEE} International Symposium on Electronic Design, Test and
Applications, {DELTA} 2008, Hong Kong, January 23-25, 2008},
pages = {581--586},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/DELTA.2008.64},
doi = {10.1109/DELTA.2008.64},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/delta/KochteZIW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/ZoellinWPB08,
author = {Christian G. Zoellin and
Hans{-}Joachim Wunderlich and
Ilia Polian and
Bernd Becker},
title = {Selective Hardening in Early Design Steps},
booktitle = {13th European Test Symposium, {ETS} 2008, Verbania, Italy, May 25-29,
2008},
pages = {185--190},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ETS.2008.30},
doi = {10.1109/ETS.2008.30},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/ZoellinWPB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/HolstW08,
author = {Stefan Holst and
Hans{-}Joachim Wunderlich},
title = {Adaptive Debug and Diagnosis without Fault Dictionaries},
booktitle = {13th European Test Symposium, {ETS} 2008, Verbania, Italy, May 25-29,
2008},
pages = {199--204},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ETS.2008.40},
doi = {10.1109/ETS.2008.40},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/HolstW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/ImhofWZ08,
author = {Michael E. Imhof and
Hans{-}Joachim Wunderlich and
Christian G. Zoellin},
title = {Integrating Scan Design and Soft Error Correction in Low-Power Applications},
booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008),
7-9 July 2008, Rhodes, Greece},
pages = {59--64},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/IOLTS.2008.31},
doi = {10.1109/IOLTS.2008.31},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/ImhofWZ08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AmgalanHHW08,
author = {Uranmandakh Amgalan and
Christian Hachmann and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
title = {Signature Rollback - {A} Technique for Testing Robust Circuits},
booktitle = {26th {IEEE} {VLSI} Test Symposium {(VTS} 2008), April 27 - May 1,
2008, San Diego, California, {USA}},
pages = {125--130},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/VTS.2008.34},
doi = {10.1109/VTS.2008.34},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AmgalanHHW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/iet-cdt/GhermanWSG07,
author = {Valentin Gherman and
Hans{-}Joachim Wunderlich and
J{\"{u}}rgen Schl{\"{o}}ffel and
Michael Garbers},
title = {Deterministic logic {BIST} for transition fault testing},
journal = {{IET} Comput. Digit. Tech.},
volume = {1},
number = {3},
pages = {180--186},
year = {2007},
url = {https://doi.org/10.1049/iet-cdt:20060131},
doi = {10.1049/IET-CDT:20060131},
timestamp = {Tue, 14 Jul 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/iet-cdt/GhermanWSG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/ImhofZWML07,
author = {Michael E. Imhof and
Christian G. Zoellin and
Hans{-}Joachim Wunderlich and
Nicolas M{\"{a}}ding and
Jens Leenstra},
title = {Scan Test Planning for Power Reduction},
booktitle = {Proceedings of the 44th Design Automation Conference, {DAC} 2007,
San Diego, CA, USA, June 4-8, 2007},
pages = {521--526},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1145/1278480.1278614},
doi = {10.1145/1278480.1278614},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/ImhofZWML07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/OhlerHW07,
author = {Philipp {\"{O}}hler and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
editor = {Patrick Girard and
Andrzej Krasniewski and
Elena Gramatov{\'{a}} and
Adam Pawlak and
Tomasz Garbolino},
title = {Analyzing Test and Repair Times for 2D Integrated Memory Built-in
Test and Repair},
booktitle = {Proceedings of the 10th {IEEE} Workshop on Design {\&} Diagnostics
of Electronic Circuits {\&} Systems {(DDECS} 2007), Krak{\'{o}}w,
Poland, April 11-13, 2007},
pages = {185--190},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/DDECS.2007.4295278},
doi = {10.1109/DDECS.2007.4295278},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/OhlerHW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/HellebrandZWLCS07,
author = {Sybille Hellebrand and
Christian G. Zoellin and
Hans{-}Joachim Wunderlich and
Stefan Ludwig and
Torsten Coym and
Bernd Straube},
editor = {Cristiana Bolchini and
Yong{-}Bin Kim and
Adelio Salsano and
Nur A. Touba},
title = {A Refined Electrical Model for Particle Strikes and its Impact on
{SEU} Prediction},
booktitle = {22nd {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2007), 26-28 September 2007, Rome, Italy},
pages = {50--58},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/DFT.2007.43},
doi = {10.1109/DFT.2007.43},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/HellebrandZWLCS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/HolstW07,
author = {Stefan Holst and
Hans{-}Joachim Wunderlich},
title = {Adaptive Debug and Diagnosis without Fault Dictionaries},
booktitle = {12th European Test Symposium, {ETS} 2007, Freiburg, Germany, May 20,
2007},
pages = {7--12},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/ETS.2007.9},
doi = {10.1109/ETS.2007.9},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/HolstW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/OhlerHW07,
author = {Philipp {\"{O}}hler and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
title = {An Integrated Built-In Test and Repair Approach for Memories with
2D Redundancy},
booktitle = {12th European Test Symposium, {ETS} 2007, Freiburg, Germany, May 20,
2007},
pages = {91--96},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/ETS.2007.10},
doi = {10.1109/ETS.2007.10},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/OhlerHW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/glvlsi/GhermanWMSG07,
author = {Valentin Gherman and
Hans{-}Joachim Wunderlich and
R. D. Mascarenhas and
J{\"{u}}rgen Schl{\"{o}}ffel and
Michael Garbers},
editor = {Hai Zhou and
Enrico Macii and
Zhiyuan Yan and
Yehia Massoud},
title = {Synthesis of irregular combinational functions with large don't care
sets},
booktitle = {Proceedings of the 17th {ACM} Great Lakes Symposium on {VLSI} 2007,
Stresa, Lago Maggiore, Italy, March 11-13, 2007},
pages = {287--292},
publisher = {{ACM}},
year = {2007},
url = {https://doi.org/10.1145/1228784.1228856},
doi = {10.1145/1228784.1228856},
timestamp = {Wed, 16 Aug 2023 21:16:32 +0200},
biburl = {https://dblp.org/rec/conf/glvlsi/GhermanWMSG07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HakmiWZGHSS07,
author = {Abdul Wahid Hakmi and
Hans{-}Joachim Wunderlich and
Christian G. Zoellin and
Andreas Glowatz and
Friedrich Hapke and
J{\"{u}}rgen Schl{\"{o}}ffel and
Laurent Souef},
editor = {Jill Sibert and
Janusz Rajski},
title = {Programmable deterministic Built-In Self-Test},
booktitle = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
California, USA, October 21-26, 2007},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/TEST.2007.4437611},
doi = {10.1109/TEST.2007.4437611},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HakmiWZGHSS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/it/BeckerPHSW06,
author = {Bernd Becker and
Ilia Polian and
Sybille Hellebrand and
Bernd Straube and
Hans{-}Joachim Wunderlich},
title = {DFG-Projekt RealTest - Test und Zuverl{\"{a}}ssigkeit nanoelektronischer
Systeme (DFG-Project - Test and Reliability of Nano-Electronic Systems)},
journal = {it Inf. Technol.},
volume = {48},
number = {5},
pages = {304},
year = {2006},
url = {https://doi.org/10.1524/itit.2006.48.5.304},
doi = {10.1524/ITIT.2006.48.5.304},
timestamp = {Mon, 28 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/it/BeckerPHSW06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/TangWEPBSHW06,
author = {Yuyi Tang and
Hans{-}Joachim Wunderlich and
Piet Engelke and
Ilia Polian and
Bernd Becker and
J{\"{u}}rgen Schl{\"{o}}ffel and
Friedrich Hapke and
Michael Wittke},
title = {X-masking during logic {BIST} and its impact on defect coverage},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {14},
number = {2},
pages = {193--202},
year = {2006},
url = {https://doi.org/10.1109/TVLSI.2005.863742},
doi = {10.1109/TVLSI.2005.863742},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tvlsi/TangWEPBSHW06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/ZhouW06,
author = {Jun Zhou and
Hans{-}Joachim Wunderlich},
editor = {Georges G. E. Gielen},
title = {Software-based self-test of processors under power constraints},
booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe,
{DATE} 2006, Munich, Germany, March 6-10, 2006},
pages = {430--435},
publisher = {European Design and Automation Association, Leuven, Belgium},
year = {2006},
url = {https://doi.org/10.1109/DATE.2006.243798},
doi = {10.1109/DATE.2006.243798},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/ZhouW06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/delta/ArnaoutBW06,
author = {Talal Arnaout and
Gunter Bartsch and
Hans{-}Joachim Wunderlich},
title = {Some Common Aspects of Design Validation, Debug and Diagnosis},
booktitle = {Third {IEEE} International Workshop on Electronic Design, Test and
Applications {(DELTA} 2006), 17-19 January 2006, Kuala Lumpur, Malaysia},
pages = {3--10},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/DELTA.2006.79},
doi = {10.1109/DELTA.2006.79},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/delta/ArnaoutBW06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/GhermanWSG06,
author = {Valentin Gherman and
Hans{-}Joachim Wunderlich and
J{\"{u}}rgen Schl{\"{o}}ffel and
Michael Garbers},
title = {Deterministic Logic {BIST} for Transition Fault Testing},
booktitle = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
2006},
pages = {123--130},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/ETS.2006.12},
doi = {10.1109/ETS.2006.12},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/GhermanWSG06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZoellinWML06,
author = {Christian G. Zoellin and
Hans{-}Joachim Wunderlich and
Nicolas M{\"{a}}ding and
Jens Leenstra},
editor = {Scott Davidson and
Anne Gattiker},
title = {{BIST} Power Reduction Using Scan-Chain Disable in the Cell Processor},
booktitle = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
CA, USA, October 22-27, 2006},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/TEST.2006.297695},
doi = {10.1109/TEST.2006.297695},
timestamp = {Tue, 12 Dec 2023 09:46:27 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZoellinWML06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/BadereddineGPLVW06,
author = {Nabil Badereddine and
Patrick Girard and
Serge Pravossoudovitch and
Christian Landrault and
Arnaud Virazel and
Hans{-}Joachim Wunderlich},
title = {Structural-Based Power-Aware Assignment of Don't Cares for Peak Power
Reduction during Scan Testing},
booktitle = {{IFIP} VLSI-SoC 2006, {IFIP} {WG} 10.5 International Conference on
Very Large Scale Integration of System-on-Chip, Nice, France, 16-18
October 2006},
pages = {403--408},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/VLSISOC.2006.313222},
doi = {10.1109/VLSISOC.2006.313222},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vlsi/BadereddineGPLVW06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/Wunderlich05,
author = {Hans{-}Joachim Wunderlich},
title = {From embedded test to embedded diagnosis},
booktitle = {10th European Test Symposium, {ETS} 2005, Tallinn, Estonia, May 22-25,
2005},
pages = {216--221},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/ETS.2005.26},
doi = {10.1109/ETS.2005.26},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/Wunderlich05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/fpl/HeronAW05,
author = {Olivier H{\'{e}}ron and
Talal Arnaout and
Hans{-}Joachim Wunderlich},
editor = {Tero Rissa and
Steven J. E. Wilton and
Philip Heng Wai Leong},
title = {On the Reliability Evaluation of SRAM-Based {FPGA} Designs},
booktitle = {Proceedings of the 2005 International Conference on Field Programmable
Logic and Applications (FPL), Tampere, Finland, August 24-26, 2005},
pages = {403--408},
publisher = {{IEEE}},
year = {2005},
url = {https://doi.org/10.1109/FPL.2005.1515755},
doi = {10.1109/FPL.2005.1515755},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/fpl/HeronAW05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/gi/ZhouW05,
author = {Jun Zhou and
Hans{-}Joachim Wunderlich},
editor = {Armin B. Cremers and
Rainer Manthey and
Peter Martini and
Volker Steinhage},
title = {Software-basierender Selbsttest von Prozessorkernen unter Verlustleistungsbeschr{\"{a}}nkung},
booktitle = {35. Jahrestagung der Gesellschaft f{\"{u}}r Informatik, Informatik
LIVE!, {INFORMATIK} 2005, Bonn, Germany, September 19-22, 2005, Band
1},
series = {{LNI}},
volume = {{P-67}},
pages = {441},
publisher = {{GI}},
year = {2005},
url = {https://dl.gi.de/handle/20.500.12116/28079},
timestamp = {Tue, 04 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/gi/ZhouW05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iscas/KiatiseviADW05,
author = {Pattara Kiatisevi and
Luis Leonardo Azuara{-}Gomez and
Rainer Dorsch and
Hans{-}Joachim Wunderlich},
title = {Development of an audio player as system-on-a-chip using an open source
platform},
booktitle = {International Symposium on Circuits and Systems {(ISCAS} 2005), 23-26
May 2005, Kobe, Japan},
pages = {2935--2938},
publisher = {{IEEE}},
year = {2005},
url = {https://doi.org/10.1109/ISCAS.2005.1465242},
doi = {10.1109/ISCAS.2005.1465242},
timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
biburl = {https://dblp.org/rec/conf/iscas/KiatiseviADW05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HakmiWGGS05,
author = {Abdul Wahid Hakmi and
Hans{-}Joachim Wunderlich and
Valentin Gherman and
Michael Garbers and
J{\"{u}}rgen Schl{\"{o}}ffel},
title = {Implementing a Scheme for External Deterministic Self-Test},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {101--106},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.50},
doi = {10.1109/VTS.2005.50},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/HakmiWGGS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/WunderlichS04,
author = {Hans{-}Joachim Wunderlich and
Sandeep K. Shukla},
title = {Panel Summaries},
journal = {{IEEE} Des. Test Comput.},
volume = {21},
number = {1},
pages = {65--66},
year = {2004},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/WunderlichS04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/arcs/ArnaoutGWZ04,
author = {Talal Arnaout and
Peter G{\"{o}}hner and
Hans{-}Joachim Wunderlich and
Eduard Zimmer},
editor = {Uwe Brinkschulte and
J{\"{u}}rgen Becker and
Dietmar Fey and
Karl{-}Erwin Gro{\ss}pietsch and
Christian Hochberger and
Erik Maehle and
Thomas A. Runkler},
title = {Reliability Considerations forMechatronic Systems on the Basis of
a State Model},
booktitle = {{ARCS} 2004 - Organic and Pervasive Computing, Workshops Proceedings,
March 26, 2004, Augsburg, Germany},
series = {{LNI}},
volume = {{P-41}},
pages = {106--112},
publisher = {{GI}},
year = {2004},
url = {https://dl.gi.de/handle/20.500.12116/29357},
timestamp = {Tue, 04 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/arcs/ArnaoutGWZ04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/VrankenSW04,
author = {Harald P. E. Vranken and
Ferry Syafei Sapei and
Hans{-}Joachim Wunderlich},
title = {Impact of Test Point Insertion on Silicon Area and Timing during Layout},
booktitle = {2004 Design, Automation and Test in Europe Conference and Exposition
{(DATE} 2004), 16-20 February 2004, Paris, France},
pages = {810--815},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/DATE.2004.1268981},
doi = {10.1109/DATE.2004.1268981},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/VrankenSW04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/delta/FlottesBBLBNCPPW04,
author = {Marie{-}Lise Flottes and
Yves Bertrand and
Luz Balado and
Emili Lupon and
Anton Biasizzo and
Franc Novak and
Stefano Di Carlo and
Paolo Prinetto and
Nicoleta Pricopi and
Hans{-}Joachim Wunderlich},
title = {Digital, Memory and Mixed-Signal Test Engineering Education: Five
Centres of Competence in Europ},
booktitle = {2nd {IEEE} International Workshop on Electronic Design, Test and Applications
{(DELTA} 2004), 28-30 January 2004, Perth, Australia},
pages = {135--139},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/DELTA.2004.10024},
doi = {10.1109/DELTA.2004.10024},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/delta/FlottesBBLBNCPPW04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GhermanWVHWG04,
author = {Valentin Gherman and
Hans{-}Joachim Wunderlich and
Harald P. E. Vranken and
Friedrich Hapke and
Michael Wittke and
Michael Garbers},
title = {Efficient Pattern Mapping for Deterministic Logic {BIST}},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {48--56},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386936},
doi = {10.1109/TEST.2004.1386936},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GhermanWVHWG04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TangWVHWEPB04,
author = {Yuyi Tang and
Hans{-}Joachim Wunderlich and
Harald P. E. Vranken and
Friedrich Hapke and
Michael Wittke and
Piet Engelke and
Ilia Polian and
Bernd Becker},
title = {X-Masking During Logic {BIST} and Its Impact on Defect Coverage},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {442--451},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386980},
doi = {10.1109/TEST.2004.1386980},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TangWVHWEPB04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/todaes/RawatW03,
author = {Shishpal Rawat and
Hans{-}Joachim Wunderlich},
title = {Introduction},
journal = {{ACM} Trans. Design Autom. Electr. Syst.},
volume = {8},
number = {4},
pages = {397--398},
year = {2003},
url = {https://doi.org/10.1145/944027.944028},
doi = {10.1145/944027.944028},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/todaes/RawatW03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/mse/BertrandFBFBNCPPWH03,
author = {Yves Bertrand and
Marie{-}Lise Flottes and
Luz Balado and
Joan Figueras and
Anton Biasizzo and
Franc Novak and
Stefano Di Carlo and
Paolo Prinetto and
Nicoleta Pricopi and
Hans{-}Joachim Wunderlich and
Jean{-}Pierre Van der Heyden},
title = {Test Engineering Education in Europe: the EuNICE-Test Project},
booktitle = {2003 International Conference on Microelectronics Systems Education,
{MSE} 2003, Educating Tomorrow's Microsystems Designers, Anaheim,
CA, USA, June 1-2, 2003},
pages = {85--86},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/MSE.2003.1205266},
doi = {10.1109/MSE.2003.1205266},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/mse/BertrandFBFBNCPPWH03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/GirardLPVW02,
author = {Patrick Girard and
Christian Landrault and
Serge Pravossoudovitch and
Arnaud Virazel and
Hans{-}Joachim Wunderlich},
title = {High Defect Coverage with Low-Power Test Sequences in a {BIST} Environment},
journal = {{IEEE} Des. Test Comput.},
volume = {19},
number = {5},
pages = {44--52},
year = {2002},
url = {https://doi.org/10.1109/MDT.2002.1033791},
doi = {10.1109/MDT.2002.1033791},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/GirardLPVW02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LiangHW02,
author = {Huaguo Liang and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
title = {Two-Dimensional Test Data Compression for Scan-Based Deterministic
{BIST}},
journal = {J. Electron. Test.},
volume = {18},
number = {2},
pages = {159--170},
year = {2002},
url = {https://doi.org/10.1023/A:1014993509806},
doi = {10.1023/A:1014993509806},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/LiangHW02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/DorschW02,
author = {Rainer Dorsch and
Hans{-}Joachim Wunderlich},
title = {Reusing Scan Chains for Test Pattern Decompression},
journal = {J. Electron. Test.},
volume = {18},
number = {2},
pages = {231--240},
year = {2002},
url = {https://doi.org/10.1023/A:1014968930415},
doi = {10.1023/A:1014968930415},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/DorschW02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jcst/LiangHW02,
author = {Huaguo Liang and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
title = {A Mixed-Mode {BIST} Scheme Based on Folding Compression},
journal = {J. Comput. Sci. Technol.},
volume = {17},
number = {2},
pages = {203--212},
year = {2002},
url = {https://doi.org/10.1007/BF02962213},
doi = {10.1007/BF02962213},
timestamp = {Sun, 28 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jcst/LiangHW02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/HellebrandWIKY02,
author = {Sybille Hellebrand and
Hans{-}Joachim Wunderlich and
Alexander A. Ivaniuk and
Yuri V. Klimets and
Vyacheslav N. Yarmolik},
title = {Efficient Online and Offline Testing of Embedded DRAMs},
journal = {{IEEE} Trans. Computers},
volume = {51},
number = {7},
pages = {801--809},
year = {2002},
url = {https://doi.org/10.1109/TC.2002.1017700},
doi = {10.1109/TC.2002.1017700},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/HellebrandWIKY02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/SchaferDW02,
author = {Lars Sch{\"{a}}fer and
Rainer Dorsch and
Hans{-}Joachim Wunderlich},
title = {{RESPIN++} - deterministic embedded test},
booktitle = {7th European Test Workshop, {ETW} 2002, Corfu, Greece, May 26-29,
2002},
pages = {37--44},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/ETW.2002.1029637},
doi = {10.1109/ETW.2002.1029637},
timestamp = {Tue, 28 Apr 2020 10:30:50 +0200},
biburl = {https://dblp.org/rec/conf/ets/SchaferDW02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/VrankenMW02,
author = {Harald P. E. Vranken and
Florian Meister and
Hans{-}Joachim Wunderlich},
title = {Combining deterministic logic {BIST} with test point insertion},
booktitle = {7th European Test Workshop, {ETW} 2002, Corfu, Greece, May 26-29,
2002},
pages = {105--110},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/ETW.2002.1029646},
doi = {10.1109/ETW.2002.1029646},
timestamp = {Tue, 28 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/VrankenMW02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DorschRWF02,
author = {Rainer Dorsch and
Ram{\'{o}}n Huerta Rivera and
Hans{-}Joachim Wunderlich and
Martin Fischer},
title = {Adapting an SoC to {ATE} Concurrent Test Capabilities},
booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
MD, USA, October 7-10, 2002},
pages = {1169--1175},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/TEST.2002.1041875},
doi = {10.1109/TEST.2002.1041875},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DorschRWF02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/HellebrandLW01,
author = {Sybille Hellebrand and
Huaguo Liang and
Hans{-}Joachim Wunderlich},
title = {A Mixed Mode {BIST} Scheme Based on Reseeding of Folding Counters},
journal = {J. Electron. Test.},
volume = {17},
number = {3-4},
pages = {341--349},
year = {2001},
url = {https://doi.org/10.1023/A:1012279716236},
doi = {10.1023/A:1012279716236},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/HellebrandLW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/KieferVMW01,
author = {Gundolf Kiefer and
Harald P. E. Vranken and
Erik Jan Marinissen and
Hans{-}Joachim Wunderlich},
title = {Application of Deterministic Logic {BIST} on Industrial Circuits},
journal = {J. Electron. Test.},
volume = {17},
number = {3-4},
pages = {351--362},
year = {2001},
url = {https://doi.org/10.1023/A:1012283800306},
doi = {10.1023/A:1012283800306},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/KieferVMW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/IrionKVW01,
author = {Alexander Irion and
Gundolf Kiefer and
Harald P. E. Vranken and
Hans{-}Joachim Wunderlich},
editor = {Wolfgang Nebel and
Ahmed Jerraya},
title = {Circuit partitioning for efficient logic {BIST} synthesis},
booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe,
{DATE} 2001, Munich, Germany, March 12-16, 2001},
pages = {86--91},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/DATE.2001.915005},
doi = {10.1109/DATE.2001.915005},
timestamp = {Mon, 09 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/IrionKVW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/ChiusanoCPW01,
author = {Silvia Chiusano and
Stefano Di Carlo and
Paolo Prinetto and
Hans{-}Joachim Wunderlich},
editor = {Wolfgang Nebel and
Ahmed Jerraya},
title = {On applying the set covering model to reseeding},
booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe,
{DATE} 2001, Munich, Germany, March 12-16, 2001},
pages = {156--161},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/DATE.2001.915017},
doi = {10.1109/DATE.2001.915017},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/ChiusanoCPW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/DorschW01,
author = {Rainer Dorsch and
Hans{-}Joachim Wunderlich},
editor = {Wolfgang Nebel and
Ahmed Jerraya},
title = {Using mission logic for embedded testing},
booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe,
{DATE} 2001, Munich, Germany, March 12-16, 2001},
pages = {805},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/DATE.2001.915131},
doi = {10.1109/DATE.2001.915131},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/DorschW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/DorschW01,
author = {Rainer Dorsch and
Hans{-}Joachim Wunderlich},
title = {Reusing scan chains for test pattern decompression},
booktitle = {6th European Test Workshop, {ETW} 2001, Stockholm, Sweden, May 29
- June 1, 2001},
pages = {124--132},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/ETW.2001.946677},
doi = {10.1109/ETW.2001.946677},
timestamp = {Tue, 28 Apr 2020 13:03:47 +0200},
biburl = {https://dblp.org/rec/conf/ets/DorschW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KesslerKLSSW01,
author = {Michael Kessler and
Gundolf Kiefer and
Jens Leenstra and
Knut Sch{\"{u}}nemann and
Thomas Schwarz and
Hans{-}Joachim Wunderlich},
title = {Using a hierarchical DfT methodology in high frequency processor designs
for improved delay fault testability},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {461--469},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966663},
doi = {10.1109/TEST.2001.966663},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KesslerKLSSW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DorschW01,
author = {Rainer Dorsch and
Hans{-}Joachim Wunderlich},
title = {Tailoring {ATPG} for embedded testing},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {530--537},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966671},
doi = {10.1109/TEST.2001.966671},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DorschW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiangHW01,
author = {Huaguo Liang and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
title = {Two-dimensional test data compression for scan-based deterministic
{BIST}},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {894--902},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966712},
doi = {10.1109/TEST.2001.966712},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiangHW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/GirardGLPW01,
author = {Patrick Girard and
Lo{\"{\i}}s Guiller and
Christian Landrault and
Serge Pravossoudovitch and
Hans{-}Joachim Wunderlich},
title = {A Modified Clock Scheme for a Low Power {BIST} Test Pattern Generator},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {306--311},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923454},
doi = {10.1109/VTS.2001.923454},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/GirardGLPW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/KieferW00,
author = {Gundolf Kiefer and
Hans{-}Joachim Wunderlich},
title = {Deterministic {BIST} with Partial Scan},
journal = {J. Electron. Test.},
volume = {16},
number = {3},
pages = {169--177},
year = {2000},
url = {https://doi.org/10.1023/A:1008374811502},
doi = {10.1023/A:1008374811502},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/KieferW00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GerstendorferW00,
author = {Stefan Gerstend{\"{o}}rfer and
Hans{-}Joachim Wunderlich},
title = {Minimized Power Consumption for Scan-Based {BIST}},
journal = {J. Electron. Test.},
volume = {16},
number = {3},
pages = {203--212},
year = {2000},
url = {https://doi.org/10.1023/A:1008383013319},
doi = {10.1023/A:1008383013319},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/GerstendorferW00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/CataldoCPW00,
author = {Silvia Cataldo and
Silvia Chiusano and
Paolo Prinetto and
Hans{-}Joachim Wunderlich},
editor = {Ivo Bolsens},
title = {Optimal Hardware Pattern Generation for Functional {BIST}},
booktitle = {2000 Design, Automation and Test in Europe {(DATE} 2000), 27-30 March
2000, Paris, France},
pages = {292--297},
publisher = {{IEEE} Computer Society / {ACM}},
year = {2000},
url = {https://doi.org/10.1109/DATE.2000.840286},
doi = {10.1109/DATE.2000.840286},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/CataldoCPW00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KieferWVM00,
author = {Gundolf Kiefer and
Hans{-}Joachim Wunderlich and
Harald P. E. Vranken and
Erik Jan Marinissen},
title = {Application of deterministic logic {BIST} on industrial circuits},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {105--114},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894197},
doi = {10.1109/TEST.2000.894197},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KieferWVM00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChiusanoPW00,
author = {Silvia Chiusano and
Paolo Prinetto and
Hans{-}Joachim Wunderlich},
title = {Non-intrusive {BIST} for systems-on-a-chip},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {644--651},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894259},
doi = {10.1109/TEST.2000.894259},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChiusanoPW00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HellebrandWL00,
author = {Sybille Hellebrand and
Hans{-}Joachim Wunderlich and
Huaguo Liang},
title = {A mixed mode {BIST} scheme based on reseeding of folding counters},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {778--784},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894274},
doi = {10.1109/TEST.2000.894274},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HellebrandWL00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/KieferW99,
author = {Gundolf Kiefer and
Hans{-}Joachim Wunderlich},
title = {Deterministic {BIST} with Multiple Scan Chains},
journal = {J. Electron. Test.},
volume = {14},
number = {1-2},
pages = {85--93},
year = {1999},
url = {https://doi.org/10.1023/A:1008353423305},
doi = {10.1023/A:1008353423305},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/KieferW99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/HellebrandWY99,
author = {Sybille Hellebrand and
Hans{-}Joachim Wunderlich and
Vyacheslav N. Yarmolik},
title = {Symmetric Transparent {BIST} for RAMs},
booktitle = {1999 Design, Automation and Test in Europe {(DATE} '99), 9-12 March
1999, Munich, Germany},
pages = {702--707},
publisher = {{IEEE} Computer Society / {ACM}},
year = {1999},
url = {https://doi.org/10.1109/DATE.1999.761206},
doi = {10.1109/DATE.1999.761206},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/HellebrandWY99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/edcc/YarmolikBHW99,
author = {Vyacheslav N. Yarmolik and
I. V. Bykov and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
editor = {Jan Hlavicka and
Erik Maehle and
Andr{\'{a}}s Pataricza},
title = {Transparent Word-Oriented Memory {BIST} Based on Symmetric March Algorithms},
booktitle = {Dependable Computing - EDCC-3, Third European Dependable Computing
Conference, Prague, Czech Republic, September 15-17, 1999, Proceedings},
series = {Lecture Notes in Computer Science},
volume = {1667},
pages = {339--350},
publisher = {Springer},
year = {1999},
url = {https://doi.org/10.1007/3-540-48254-7\_23},
doi = {10.1007/3-540-48254-7\_23},
timestamp = {Tue, 14 May 2019 10:00:54 +0200},
biburl = {https://dblp.org/rec/conf/edcc/YarmolikBHW99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/KieferW99,
author = {Gundolf Kiefer and
Hans{-}Joachim Wunderlich},
title = {Deterministic {BIST} with partial scan},
booktitle = {4th European Test Workshop, {ETW} 1999, Constance, Germany, May 25-28,
1999},
pages = {110--116},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/ETW.1999.804415},
doi = {10.1109/ETW.1999.804415},
timestamp = {Tue, 28 Apr 2020 13:37:50 +0200},
biburl = {https://dblp.org/rec/conf/ets/KieferW99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GerstendorferW99,
author = {Stefan Gerstend{\"{o}}rfer and
Hans{-}Joachim Wunderlich},
title = {Minimized power consumption for scan-based {BIST}},
booktitle = {Proceedings {IEEE} International Test Conference 1999, Atlantic City,
NJ, USA, 27-30 September 1999},
pages = {77--84},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/TEST.1999.805616},
doi = {10.1109/TEST.1999.805616},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GerstendorferW99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HellebrandWIKY99,
author = {Sybille Hellebrand and
Hans{-}Joachim Wunderlich and
Alexander A. Ivaniuk and
Yuri V. Klimets and
Vyacheslav N. Yarmolik},
title = {Error Detecting Refreshment for Embedded DRAMs},
booktitle = {17th {IEEE} {VLSI} Test Symposium {(VTS} '99), 25-30 April 1999, San
Diego, CA, {USA}},
pages = {384--390},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/VTEST.1999.766693},
doi = {10.1109/VTEST.1999.766693},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/HellebrandWIKY99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/HellebrandWH98,
author = {Sybille Hellebrand and
Hans{-}Joachim Wunderlich and
Andre Hertwig},
title = {Synthesizing Fast, Online-Testable Control Units},
journal = {{IEEE} Des. Test Comput.},
volume = {15},
number = {4},
pages = {36--41},
year = {1998},
url = {https://doi.org/10.1109/54.735925},
doi = {10.1109/54.735925},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/HellebrandWH98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/HellebrandWH98,
author = {Sybille Hellebrand and
Hans{-}Joachim Wunderlich and
Andre Hertwig},
title = {Mixed-Mode {BIST} Using Embedded Processors},
journal = {J. Electron. Test.},
volume = {12},
number = {1-2},
pages = {127--138},
year = {1998},
url = {https://doi.org/10.1023/A:1008294125692},
doi = {10.1023/A:1008294125692},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/HellebrandWH98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/integration/Wunderlich98,
author = {Hans{-}Joachim Wunderlich},
title = {{BIST} for systems-on-a-chip},
journal = {Integr.},
volume = {26},
number = {1-2},
pages = {55--78},
year = {1998},
url = {https://doi.org/10.1016/S0167-9260(98)00021-2},
doi = {10.1016/S0167-9260(98)00021-2},
timestamp = {Thu, 20 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/integration/Wunderlich98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/StroeleW98,
author = {Albrecht P. Stroele and
Hans{-}Joachim Wunderlich},
title = {Hardware-optimal test register insertion},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {17},
number = {6},
pages = {531--539},
year = {1998},
url = {https://doi.org/10.1109/43.703833},
doi = {10.1109/43.703833},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/StroeleW98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KarkalaTW98,
author = {Madhavi Karkala and
Nur A. Touba and
Hans{-}Joachim Wunderlich},
title = {Special {ATPG} to Correlate Test Patterns for Low-Overhead Mixed-Mode
{BIST}},
booktitle = {7th Asian Test Symposium {(ATS} '98), 2-4 December 1998, Singapore},
pages = {492--499},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/ATS.1998.741662},
doi = {10.1109/ATS.1998.741662},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KarkalaTW98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/YarmolikHW98,
author = {Vyacheslav N. Yarmolik and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
editor = {Patrick M. Dewilde and
Franz J. Rammig and
Gerry Musgrave},
title = {Self-Adjusting Output Data Compression: An Efficient {BIST} Technique
for RAMs},
booktitle = {1998 Design, Automation and Test in Europe {(DATE} '98), February
23-26, 1998, Le Palais des Congr{\`{e}}s de Paris, Paris, France},
pages = {173--179},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/DATE.1998.655853},
doi = {10.1109/DATE.1998.655853},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/YarmolikHW98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DorschW98,
author = {Rainer Dorsch and
Hans{-}Joachim Wunderlich},
title = {Accumulator based deterministic {BIST}},
booktitle = {Proceedings {IEEE} International Test Conference 1998, Washington,
DC, USA, October 18-22, 1998},
pages = {412--421},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/TEST.1998.743181},
doi = {10.1109/TEST.1998.743181},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DorschW98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KieferW98,
author = {Gundolf Kiefer and
Hans{-}Joachim Wunderlich},
title = {Deterministic {BIST} with multiple scan chains},
booktitle = {Proceedings {IEEE} International Test Conference 1998, Washington,
DC, USA, October 18-22, 1998},
pages = {1057--1064},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/TEST.1998.743304},
doi = {10.1109/TEST.1998.743304},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KieferW98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HertwigHW98,
author = {Andre Hertwig and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
title = {Fast Self-Recovering Controllers},
booktitle = {16th {IEEE} {VLSI} Test Symposium {(VTS} '98), 28 April - 1 May 1998,
Princeton, NJ, {USA}},
pages = {296--302},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/VTEST.1998.670883},
doi = {10.1109/VTEST.1998.670883},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/HertwigHW98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ChengSW97,
author = {Kwang{-}Ting Cheng and
Kewal K. Saluja and
Hans{-}Joachim Wunderlich},
title = {Guest Editorial},
journal = {J. Electron. Test.},
volume = {11},
number = {1},
pages = {7--8},
year = {1997},
url = {https://doi.org/10.1023/A:1008239632001},
doi = {10.1023/A:1008239632001},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ChengSW97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/HertwigW97,
author = {Andre Hertwig and
Hans{-}Joachim Wunderlich},
title = {Fast controllers for data dominated applications},
booktitle = {European Design and Test Conference, ED{\&}TC '97, Paris, France,
17-20 March 1997},
pages = {84--89},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/EDTC.1997.582337},
doi = {10.1109/EDTC.1997.582337},
timestamp = {Fri, 20 May 2022 15:59:03 +0200},
biburl = {https://dblp.org/rec/conf/date/HertwigW97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KieferW97,
author = {Gundolf Kiefer and
Hans{-}Joachim Wunderlich},
title = {Using {BIST} Control for Pattern Generation},
booktitle = {Proceedings {IEEE} International Test Conference 1997, Washington,
DC, USA, November 3-5, 1997},
pages = {347--355},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/TEST.1997.639636},
doi = {10.1109/TEST.1997.639636},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KieferW97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AgrawalABFKWZ97,
author = {Vishwani D. Agrawal and
Robert C. Aitken and
J. Braden and
Joan Figueras and
S. Kumar and
Hans{-}Joachim Wunderlich and
Yervant Zorian},
title = {Power Dissipation During Testing: Should We Worry About it?},
booktitle = {15th {IEEE} {VLSI} Test Symposium (VTS'97), April 27-May 1, 1997,
Monterey, California, {USA}},
pages = {456--457},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.ieeecomputersociety.org/10.1109/VTS.1997.10012},
doi = {10.1109/VTS.1997.10012},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AgrawalABFKWZ97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/ReebW96,
author = {Birgit Reeb and
Hans{-}Joachim Wunderlich},
title = {Deterministic Pattern Generation for Weighted Random Pattern Testing},
booktitle = {1996 European Design and Test Conference, ED{\&}TC 1996, Paris,
France, March 11-14, 1996},
pages = {30--36},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/EDTC.1996.494124},
doi = {10.1109/EDTC.1996.494124},
timestamp = {Fri, 20 May 2022 15:52:30 +0200},
biburl = {https://dblp.org/rec/conf/date/ReebW96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/WunderlichK96,
author = {Hans{-}Joachim Wunderlich and
Gundolf Kiefer},
editor = {Rob A. Rutenbar and
Ralph H. J. M. Otten},
title = {Bit-flipping {BIST}},
booktitle = {Proceedings of the 1996 {IEEE/ACM} International Conference on Computer-Aided
Design, {ICCAD} 1996, San Jose, CA, USA, November 10-14, 1996},
pages = {337--343},
publisher = {{IEEE} Computer Society / {ACM}},
year = {1996},
url = {https://doi.org/10.1109/ICCAD.1996.569803},
doi = {10.1109/ICCAD.1996.569803},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/WunderlichK96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HellebrandWH96,
author = {Sybille Hellebrand and
Hans{-}Joachim Wunderlich and
Andre Hertwig},
title = {Mixed-Mode {BIST} Using Embedded Processors},
booktitle = {Proceedings {IEEE} International Test Conference 1996, Test and Design
Validity, Washington, DC, USA, October 20-25, 1996},
pages = {195--204},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/TEST.1996.556962},
doi = {10.1109/TEST.1996.556962},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HellebrandWH96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/WunderlichHFCC95,
author = {Hans{-}Joachim Wunderlich and
M. Herzog and
Joan Figueras and
Juan A. Carrasco and
Angel Calder{\'{o}}n},
title = {Synthesis of I\({}_{\mbox{DDQ}}\)-testable circuits: integrating built-in
current sensors},
booktitle = {1995 European Design and Test Conference, ED{\&}TC 1995, Paris,
France, March 6-9, 1995},
pages = {573--580},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/EDTC.1995.470342},
doi = {10.1109/EDTC.1995.470342},
timestamp = {Fri, 20 May 2022 15:41:46 +0200},
biburl = {https://dblp.org/rec/conf/date/WunderlichHFCC95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/HellebrandRTW95,
author = {Sybille Hellebrand and
Birgit Reeb and
Steffen Tarnick and
Hans{-}Joachim Wunderlich},
editor = {Richard L. Rudell},
title = {Pattern generation for a deterministic {BIST} scheme},
booktitle = {Proceedings of the 1995 {IEEE/ACM} International Conference on Computer-Aided
Design, {ICCAD} 1995, San Jose, California, USA, November 5-9, 1995},
pages = {88--94},
publisher = {{IEEE} Computer Society / {ACM}},
year = {1995},
url = {https://doi.org/10.1109/ICCAD.1995.479997},
doi = {10.1109/ICCAD.1995.479997},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/HellebrandRTW95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/StroeleW95,
author = {Albrecht P. Stroele and
Hans{-}Joachim Wunderlich},
editor = {Richard L. Rudell},
title = {Test register insertion with minimum hardware cost},
booktitle = {Proceedings of the 1995 {IEEE/ACM} International Conference on Computer-Aided
Design, {ICCAD} 1995, San Jose, California, USA, November 5-9, 1995},
pages = {95--101},
publisher = {{IEEE} Computer Society / {ACM}},
year = {1995},
url = {https://doi.org/10.1109/ICCAD.1995.479998},
doi = {10.1109/ICCAD.1995.479998},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/StroeleW95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/eurodac/HellebrandW94,
author = {Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
editor = {Robert Werner},
title = {Synthesis of Self-Testable Controllers},
booktitle = {{EDAC} - The European Conference on Design Automation, {ETC} - European
Test Conference, {EUROASIC} - The European Event in {ASIC} Design,
Proceedings, February 28 - March 3, 1994, Paris, France},
pages = {580--585},
publisher = {{IEEE} Computer Society},
year = {1994},
url = {https://doi.org/10.1109/EDTC.1994.326815},
doi = {10.1109/EDTC.1994.326815},
timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
biburl = {https://dblp.org/rec/conf/eurodac/HellebrandW94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/HellebrandW94,
author = {Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
editor = {Jochen A. G. Jess and
Richard L. Rudell},
title = {An efficient procedure for the synthesis of fast self-testable controller
structures},
booktitle = {Proceedings of the 1994 {IEEE/ACM} International Conference on Computer-Aided
Design, {ICCAD} 1994, San Jose, California, USA, November 6-10, 1994},
pages = {110--116},
publisher = {{IEEE} Computer Society / {ACM}},
year = {1994},
url = {https://doi.org/10.1109/ICCAD.1994.629752},
doi = {10.1109/ICCAD.1994.629752},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/HellebrandW94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SternW94,
author = {Olaf Stern and
Hans{-}Joachim Wunderlich},
title = {Simulation Results of an Efficient Defect-Analysis Procedure},
booktitle = {Proceedings {IEEE} International Test Conference 1994, {TEST:} The
Next 25 Years, Washington, DC, USA, October 2-6, 1994},
pages = {729--738},
publisher = {{IEEE} Computer Society},
year = {1994},
url = {https://doi.org/10.1109/TEST.1994.528019},
doi = {10.1109/TEST.1994.528019},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SternW94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StroeleW94,
author = {Albrecht P. Stroele and
Hans{-}Joachim Wunderlich},
title = {Configuring Flip-Flops to {BIST} Registers},
booktitle = {Proceedings {IEEE} International Test Conference 1994, {TEST:} The
Next 25 Years, Washington, DC, USA, October 2-6, 1994},
pages = {939--948},
publisher = {{IEEE} Computer Society},
year = {1994},
url = {https://doi.org/10.1109/TEST.1994.528043},
doi = {10.1109/TEST.1994.528043},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/StroeleW94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/insk/WunderlichS92,
author = {Hans{-}Joachim Wunderlich and
Michael H. Schulz},
title = {Pr{\"{u}}fgerechter Entwurf und Test hochintegrierter Schaltungen},
journal = {Inform. Spektrum},
volume = {15},
number = {1},
pages = {23--32},
year = {1992},
timestamp = {Thu, 13 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/insk/WunderlichS92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/WunderlichH92,
author = {Hans{-}Joachim Wunderlich and
Sybille Hellebrand},
title = {The pseudoexhaustive test of sequential circuits},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {11},
number = {1},
pages = {26--33},
year = {1992},
url = {https://doi.org/10.1109/43.108616},
doi = {10.1109/43.108616},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/WunderlichH92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/EschermannW92,
author = {Bernhard Eschermann and
Hans{-}Joachim Wunderlich},
title = {Optimized synthesis techniques for testable sequential circuits},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {11},
number = {3},
pages = {301--312},
year = {1992},
url = {https://doi.org/10.1109/43.124417},
doi = {10.1109/43.124417},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/EschermannW92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/EschermannW91,
author = {Bernhard Eschermann and
Hans{-}Joachim Wunderlich},
editor = {A. Richard Newton},
title = {A Unified Approach for the Synthesis of Self-Testable Finite State
Machines},
booktitle = {Proceedings of the 28th Design Automation Conference, San Francisco,
California, USA, June 17-21, 1991},
pages = {372--377},
publisher = {{ACM}},
year = {1991},
url = {https://doi.org/10.1145/127601.127697},
doi = {10.1145/127601.127697},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/EschermannW91.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ftcs/StroleW91,
author = {Albrecht P. Stroele and
Hans{-}Joachim Wunderlich},
title = {Signature Analysis and Test Scheduling for Self-Testable Circuits},
booktitle = {Proceedings of the 1991 International Symposium on Fault-Tolerant
Computing, Montreal, Canada},
pages = {96--103},
publisher = {{IEEE} Computer Society},
year = {1991},
url = {https://doi.org/10.1109/FTCS.1991.146640},
doi = {10.1109/FTCS.1991.146640},
timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
biburl = {https://dblp.org/rec/conf/ftcs/StroleW91.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icftcs/EschermannW91,
author = {Bernhard Eschermann and
Hans{-}Joachim Wunderlich},
editor = {Mario Dal Cin and
Wolfgang Hohl},
title = {Emulation of Scan Paths in Sequential Circuit Synthesis},
booktitle = {Fault-Tolerant Computing Systems, Tests, Diagnosis, Fault Treatment,
5th International {GI/ITG/GMA} Conference, N{\"{u}}rnberg, Germany,
September 25-27, 1991, Proceedings},
series = {Informatik-Fachberichte},
volume = {283},
pages = {136--147},
publisher = {Springer},
year = {1991},
url = {https://doi.org/10.1007/978-3-642-76930-6\_12},
doi = {10.1007/978-3-642-76930-6\_12},
timestamp = {Wed, 17 May 2017 14:24:33 +0200},
biburl = {https://dblp.org/rec/conf/icftcs/EschermannW91.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KropfW91,
author = {Thomas Kropf and
Hans{-}Joachim Wunderlich},
title = {A Common Approach to Test Generation and Hardware Verification Based
on Temporal Logic},
booktitle = {Proceedings {IEEE} International Test Conference 1991, Test: Faster,
Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
pages = {57--66},
publisher = {{IEEE} Computer Society},
year = {1991},
url = {https://doi.org/10.1109/TEST.1991.519494},
doi = {10.1109/TEST.1991.519494},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KropfW91.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/KunzmannW90,
author = {Arno Kunzmann and
Hans{-}Joachim Wunderlich},
title = {An analytical approach to the partial scan problem},
journal = {J. Electron. Test.},
volume = {1},
number = {2},
pages = {163--174},
year = {1990},
url = {https://doi.org/10.1007/BF00137392},
doi = {10.1007/BF00137392},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/KunzmannW90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/Wunderlich90,
author = {Hans{-}Joachim Wunderlich},
title = {Multiple distributions for biased random test patterns},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {9},
number = {6},
pages = {584--593},
year = {1990},
url = {https://doi.org/10.1109/43.55187},
doi = {10.1109/43.55187},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/Wunderlich90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/eurodac/HellebrandW90,
author = {Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
editor = {Gordon Adshead and
Jochen A. G. Jess},
title = {Tools and devices supporting the pseudo-exhaustive test},
booktitle = {European Design Automation Conference, {EURO-DAC} 1990, Glasgow, Scotland,
UK, March 12-15, 1990},
pages = {13--17},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/EDAC.1990.136612},
doi = {10.1109/EDAC.1990.136612},
timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
biburl = {https://dblp.org/rec/conf/eurodac/HellebrandW90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/eurodac/MaxwellW90,
author = {Peter C. Maxwell and
Hans{-}Joachim Wunderlich},
editor = {Gordon Adshead and
Jochen A. G. Jess},
title = {The effectiveness of different test sets for PLAs},
booktitle = {European Design Automation Conference, {EURO-DAC} 1990, Glasgow, Scotland,
UK, March 12-15, 1990},
pages = {628--632},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/EDAC.1990.136722},
doi = {10.1109/EDAC.1990.136722},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/eurodac/MaxwellW90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ftcs/EschermannW90,
author = {Bernhard Eschermann and
Hans{-}Joachim Wunderlich},
title = {Optimized synthesis of self-testable finite state machines},
booktitle = {Proceedings of the 20th International Symposium on Fault-Tolerant
Computing, {FTCS} 1990, Newcastle Upon Tyne, UK, 26-28 June, 1990},
pages = {390--397},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/FTCS.1990.89393},
doi = {10.1109/FTCS.1990.89393},
timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
biburl = {https://dblp.org/rec/conf/ftcs/EschermannW90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StroeleW90,
author = {Albrecht P. Stroele and
Hans{-}Joachim Wunderlich},
title = {Error masking in self-testable circuits},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {544--552},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114066},
doi = {10.1109/TEST.1990.114066},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/StroeleW90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HellebrandWH90,
author = {Sybille Hellebrand and
Hans{-}Joachim Wunderlich and
Oliver F. Haberl},
title = {Generating pseudo-exhaustive vectors for external testing},
booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington,
D.C., USA, September 10-14, 1990},
pages = {670--679},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/TEST.1990.114082},
doi = {10.1109/TEST.1990.114082},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HellebrandWH90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ftcs/Wunderlich89,
author = {Hans{-}Joachim Wunderlich},
title = {The design of random-testable sequential circuits},
booktitle = {Proceedings of the Nineteenth International Symposium on Fault-Tolerant
Computing, {FTCS} 1989, Chicago, IL, USA, 21-23 June, 1989},
pages = {110--117},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/FTCS.1989.105552},
doi = {10.1109/FTCS.1989.105552},
timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
biburl = {https://dblp.org/rec/conf/ftcs/Wunderlich89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HellebrandW89,
author = {Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
title = {The Pseudo-Exhaustive Test of Sequential Circuits},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C.,
USA, August 1989},
pages = {19--27},
publisher = {{IEEE} Computer Society},
year = {1989},
url = {https://doi.org/10.1109/TEST.1989.82273},
doi = {10.1109/TEST.1989.82273},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HellebrandW89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ftcs/WunderlichH88,
author = {Hans{-}Joachim Wunderlich and
Sybille Hellebrand},
title = {Generating pattern sequences for the pseudo-exhaustive test of MOS-circuits},
booktitle = {Proceedings of the Eighteenth International Symposium on Fault-Tolerant
Computing, {FTCS} 1988, Tokyo, Japan, 27-30 June, 1988},
pages = {36--41},
publisher = {{IEEE} Computer Society},
year = {1988},
url = {https://doi.org/10.1109/FTCS.1988.5294},
doi = {10.1109/FTCS.1988.5294},
timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
biburl = {https://dblp.org/rec/conf/ftcs/WunderlichH88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/gi/HellebrandW88,
author = {Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
editor = {R{\"{u}}diger Valk},
title = {Automatisierung des Entwurfs vollst{\"{a}}ndig testbarer Schaltungen},
booktitle = {{GI} - 18. Jahrestagung II, Vernetzte and komplexe Informatik-Systems,
Hamburg, 17.-19. Oktober 1988, Proceedings},
series = {Informatik-Fachberichte},
volume = {188},
pages = {145--159},
publisher = {Springer},
year = {1988},
url = {https://doi.org/10.1007/978-3-642-74135-7\_10},
doi = {10.1007/978-3-642-74135-7\_10},
timestamp = {Tue, 23 May 2017 01:10:32 +0200},
biburl = {https://dblp.org/rec/conf/gi/HellebrandW88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Wunderlich88,
author = {Hans{-}Joachim Wunderlich},
title = {Multiple Distributions for Biased Random Test Patterns},
booktitle = {Proceedings International Test Conference 1988, Washington, D.C.,
USA, September 1988},
pages = {236--244},
publisher = {{IEEE} Computer Society},
year = {1988},
url = {https://doi.org/10.1109/TEST.1988.207808},
doi = {10.1109/TEST.1988.207808},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/itc/Wunderlich88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@book{DBLP:books/sp/Wunderlich87,
author = {Hans{-}Joachim Wunderlich},
title = {Probabilistische Verfahren f{\"{u}}r den Test hochintegrierter
Schaltungen},
series = {Informatik-Fachberichte},
volume = {140},
publisher = {Springer},
year = {1987},
url = {https://doi.org/10.1007/978-3-642-72838-9},
doi = {10.1007/978-3-642-72838-9},
isbn = {3-540-18072-9},
timestamp = {Sat, 17 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/books/sp/Wunderlich87.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/Wunderlich87,
author = {Hans{-}Joachim Wunderlich},
editor = {A. O'Neill and
D. Thomas},
title = {On Computing Optimized Input Probabilities for Random Tests},
booktitle = {Proceedings of the 24th {ACM/IEEE} Design Automation Conference. Miami
Beach, FL, USA, June 28 - July 1, 1987},
pages = {392--398},
publisher = {{IEEE} Computer Society Press / {ACM}},
year = {1987},
url = {https://doi.org/10.1145/37888.37947},
doi = {10.1145/37888.37947},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/Wunderlich87.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/WunderlichR86,
author = {Hans{-}Joachim Wunderlich and
Wolfgang Rosenstiel},
editor = {Don Thomas},
title = {On fault modeling for dynamic {MOS} circuits},
booktitle = {Proceedings of the 23rd {ACM/IEEE} Design Automation Conference. Las
Vegas, NV, USA, June, 1986},
pages = {540--546},
publisher = {{IEEE} Computer Society Press},
year = {1986},
url = {https://doi.org/10.1145/318013.318100},
doi = {10.1145/318013.318100},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/WunderlichR86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/Wunderlich85,
author = {Hans{-}Joachim Wunderlich},
editor = {Hillel Ofek and
Lawrence A. O'Neill},
title = {{PROTEST:} a tool for probabilistic testability analysis},
booktitle = {Proceedings of the 22nd {ACM/IEEE} conference on Design automation,
{DAC} 1985, Las Vegas, Nevada, USA, 1985},
pages = {204--211},
publisher = {{ACM}},
year = {1985},
url = {https://doi.org/10.1145/317825.317858},
doi = {10.1145/317825.317858},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/Wunderlich85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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