BibTeX records: L. Y. Wong

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@article{DBLP:journals/mr/TsangCKESLLW05,
  author       = {C. F. Tsang and
                  C. K. Chang and
                  A. Krishnamoorthy and
                  K. Y. Ee and
                  Y. J. Su and
                  H. Y. Li and
                  W. H. Li and
                  L. Y. Wong},
  title        = {A study of post-etch wet clean on electrical and reliability performance
                  of Cu/low k interconnections},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {3-4},
  pages        = {517--525},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2004.07.007},
  doi          = {10.1016/J.MICROREL.2004.07.007},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TsangCKESLLW05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mj/TsangLKSLWLTE04,
  author       = {C. F. Tsang and
                  C. Y. Li and
                  A. Krishnamoorthy and
                  Y. J. Su and
                  H. Y. Li and
                  L. Y. Wong and
                  W. H. Li and
                  L. J. Tang and
                  K. Y. Ee},
  title        = {Impact of barrier deposition process on electrical and reliability
                  performance of Cu/CVD low k SiOCH metallization},
  journal      = {Microelectron. J.},
  volume       = {35},
  number       = {9},
  pages        = {693--700},
  year         = {2004},
  url          = {https://doi.org/10.1016/j.mejo.2004.06.019},
  doi          = {10.1016/J.MEJO.2004.06.019},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mj/TsangLKSLWLTE04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}