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ORCIDBibTeX records: Seongmoon Wang
@inproceedings{DBLP:conf/vts/Wang11,
author = {Seongmoon Wang},
title = {An efficient method to screen resistive opens under presence of process
variation},
booktitle = {29th {IEEE} {VLSI} Test Symposium, {VTS} 2011, May 1-5, 2011, Dana
Point, California, {USA}},
pages = {122--127},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/VTS.2011.5783771},
doi = {10.1109/VTS.2011.5783771},
timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
biburl = {https://dblp.org/rec/conf/vts/Wang11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/TangW10,
author = {Xiangyu Tang and
Seongmoon Wang},
title = {A Low Hardware Overhead Self-Diagnosis Technique Using Reed-Solomon
Codes for Self-Repairing Chips},
journal = {{IEEE} Trans. Computers},
volume = {59},
number = {10},
pages = {1309--1319},
year = {2010},
url = {https://doi.org/10.1109/TC.2009.182},
doi = {10.1109/TC.2009.182},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/TangW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/WangWW10,
author = {Seongmoon Wang and
Wenlong Wei and
Zhanglei Wang},
title = {A Low Overhead High Test Compression Technique Using Pattern Clustering
With {\textdollar}n{\textdollar}-Detection Test Support},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {18},
number = {12},
pages = {1672--1685},
year = {2010},
url = {https://doi.org/10.1109/TVLSI.2009.2026420},
doi = {10.1109/TVLSI.2009.2026420},
timestamp = {Wed, 11 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tvlsi/WangWW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/WangCW09,
author = {Zhanglei Wang and
Krishnendu Chakrabarty and
Seongmoon Wang},
title = {Integrated {LFSR} Reseeding, Test-Access Optimization, and Test Scheduling
for Core-Based System-on-Chip},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {28},
number = {8},
pages = {1251--1264},
year = {2009},
url = {https://doi.org/10.1109/TCAD.2009.2021731},
doi = {10.1109/TCAD.2009.2021731},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/WangCW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/WangW09,
author = {Seongmoon Wang and
Wenlong Wei},
editor = {Luca Benini and
Giovanni De Micheli and
Bashir M. Al{-}Hashimi and
Wolfgang M{\"{u}}ller},
title = {Machine learning-based volume diagnosis},
booktitle = {Design, Automation and Test in Europe, {DATE} 2009, Nice, France,
April 20-24, 2009},
pages = {902--905},
publisher = {{IEEE}},
year = {2009},
url = {https://doi.org/10.1109/DATE.2009.5090792},
doi = {10.1109/DATE.2009.5090792},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/date/WangW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsn/TangW09,
author = {Xiangyu Tang and
Seongmoon Wang},
title = {A self-diagnosis technique using Reed-Solomon codes for self-repairing
chips},
booktitle = {Proceedings of the 2009 {IEEE/IFIP} International Conference on Dependable
Systems and Networks, {DSN} 2009, Estoril, Lisbon, Portugal, June
29 - July 2, 2009},
pages = {265--274},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/DSN.2009.5270327},
doi = {10.1109/DSN.2009.5270327},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsn/TangW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/WangBW08,
author = {Seongmoon Wang and
Kedarnath J. Balakrishnan and
Wenlong Wei},
title = {X-Block: An Efficient {LFSR} Reseeding-Based Method to Block Unknowns
for Temporal Compactors},
journal = {{IEEE} Trans. Computers},
volume = {57},
number = {7},
pages = {978--989},
year = {2008},
url = {https://doi.org/10.1109/TC.2007.70833},
doi = {10.1109/TC.2007.70833},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/WangBW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/WangW08,
author = {Seongmoon Wang and
Wenlong Wei},
title = {An Efficient Unknown BlockingScheme for Low Control Data Volume and
High Observability},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {27},
number = {11},
pages = {2039--2052},
year = {2008},
url = {https://doi.org/10.1109/TCAD.2008.2006093},
doi = {10.1109/TCAD.2008.2006093},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/WangW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangW08,
author = {Seongmoon Wang and
Wenlong Wei},
title = {Cost Efficient Methods to Improve Performance of Broadcast Scan},
booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November
24-27, 2008},
pages = {163--169},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ATS.2008.72},
doi = {10.1109/ATS.2008.72},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WangW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/WangW08,
author = {Seongmoon Wang and
Wenlong Wei},
title = {Low Overhead Partial Enhanced Scan Technique for Compact and High
Fault Coverage Transition Delay Test Patterns},
booktitle = {13th European Test Symposium, {ETS} 2008, Verbania, Italy, May 25-29,
2008},
pages = {125--130},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/ETS.2008.12},
doi = {10.1109/ETS.2008.12},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/WangW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/Wang07a,
author = {Seongmoon Wang},
title = {A {BIST} {TPG} for Low Power Dissipation and High Fault Coverage},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {15},
number = {7},
pages = {777--789},
year = {2007},
url = {https://doi.org/10.1109/TVLSI.2007.899234},
doi = {10.1109/TVLSI.2007.899234},
timestamp = {Wed, 11 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tvlsi/Wang07a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/WangW07,
author = {Seongmoon Wang and
Wenlong Wei},
title = {A Technique to Reduce Peak Current and Average Power Dissipation in
Scan Designs by Limited Capture},
booktitle = {Proceedings of the 12th Conference on Asia South Pacific Design Automation,
{ASP-DAC} 2007, Yokohama, Japan, January 23-26, 2007},
pages = {810--816},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/ASPDAC.2007.358089},
doi = {10.1109/ASPDAC.2007.358089},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/aspdac/WangW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangWC07,
author = {Seongmoon Wang and
Wenlong Wei and
Srimat T. Chakradhar},
title = {A High Compression and Short Test Sequence Test Compression Technique
to Enhance Compressions of {LFSR} Reseeding},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {79--86},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.52},
doi = {10.1109/ATS.2007.52},
timestamp = {Wed, 09 Nov 2022 21:30:34 +0100},
biburl = {https://dblp.org/rec/conf/ats/WangWC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/WangWC07,
author = {Seongmoon Wang and
Wenlong Wei and
Srimat T. Chakradhar},
editor = {Rudy Lauwereins and
Jan Madsen},
title = {Unknown blocking scheme for low control data volume and high observability},
booktitle = {2007 Design, Automation and Test in Europe Conference and Exposition,
{DATE} 2007, Nice, France, April 16-20, 2007},
pages = {33--38},
publisher = {{EDA} Consortium, San Jose, CA, {USA}},
year = {2007},
url = {https://doi.org/10.1109/DATE.2007.364563},
doi = {10.1109/DATE.2007.364563},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/WangWC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/WangCW07,
author = {Zhanglei Wang and
Krishnendu Chakrabarty and
Seongmoon Wang},
editor = {Rudy Lauwereins and
Jan Madsen},
title = {SoC testing using {LFSR} reseeding, and scan-slice-based {TAM} optimization
and test scheduling},
booktitle = {2007 Design, Automation and Test in Europe Conference and Exposition,
{DATE} 2007, Nice, France, April 16-20, 2007},
pages = {201--206},
publisher = {{EDA} Consortium, San Jose, CA, {USA}},
year = {2007},
url = {https://doi.org/10.1109/DATE.2007.364591},
doi = {10.1109/DATE.2007.364591},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/WangCW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/ChaoCWCW07,
author = {Mango Chia{-}Tso Chao and
Kwang{-}Ting Cheng and
Seongmoon Wang and
Srimat T. Chakradhar and
Wenlong Wei},
editor = {Georges G. E. Gielen},
title = {A hybrid scheme for compacting test responses with unknown values},
booktitle = {2007 International Conference on Computer-Aided Design, {ICCAD} 2007,
San Jose, CA, USA, November 5-8, 2007},
pages = {513--519},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/ICCAD.2007.4397316},
doi = {10.1109/ICCAD.2007.4397316},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/ChaoCWCW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangWWC07,
author = {Seongmoon Wang and
Zhanglei Wang and
Wenlong Wei and
Srimat T. Chakradhar},
editor = {Jill Sibert and
Janusz Rajski},
title = {A low cost test data compression technique for high n-detection fault
coverage},
booktitle = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
California, USA, October 21-26, 2007},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/TEST.2007.4437612},
doi = {10.1109/TEST.2007.4437612},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WangWWC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/SethuramWCB07,
author = {Rajamani Sethuram and
Seongmoon Wang and
Srimat T. Chakradhar and
Michael L. Bushnell},
title = {Zero Cost Test Point Insertion Technique for Structured ASICs},
booktitle = {20th International Conference on {VLSI} Design {(VLSI} Design 2007),
Sixth International Conference on Embedded Systems {(ICES} 2007),
6-10 January 2007, Bangalore, India},
pages = {357--363},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/VLSID.2007.181},
doi = {10.1109/VLSID.2007.181},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/SethuramWCB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/WangC06,
author = {Seongmoon Wang and
Srimat T. Chakradhar},
title = {A scalable scan-path test point insertion technique to enhance delay
fault coverage for standard scan designs},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {25},
number = {8},
pages = {1555--1564},
year = {2006},
url = {https://doi.org/10.1109/TCAD.2005.855929},
doi = {10.1109/TCAD.2005.855929},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/WangC06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/WangG06,
author = {Seongmoon Wang and
Sandeep K. Gupta},
title = {{LT-RTPG:} a new test-per-scan {BIST} {TPG} for low switching activity},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {25},
number = {8},
pages = {1565--1574},
year = {2006},
url = {https://doi.org/10.1109/TCAD.2005.855927},
doi = {10.1109/TCAD.2005.855927},
timestamp = {Fri, 22 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/WangG06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SethuramWCB06,
author = {Rajamani Sethuram and
Seongmoon Wang and
Srimat T. Chakradhar and
Michael L. Bushnell},
title = {Zero Cost Test Point Insertion Technique to Reduce Test Set Size and
Test Generation Time for Structured ASICs},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {339--348},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.260953},
doi = {10.1109/ATS.2006.260953},
timestamp = {Mon, 07 Nov 2022 17:39:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SethuramWCB06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/ChaoCWCW06,
author = {Mango Chia{-}Tso Chao and
Kwang{-}Ting Cheng and
Seongmoon Wang and
Srimat T. Chakradhar and
Wenlong Wei},
editor = {Ellen Sentovich},
title = {Unknown-tolerance analysis and test-quality control for test response
compaction using space compactors},
booktitle = {Proceedings of the 43rd Design Automation Conference, {DAC} 2006,
San Francisco, CA, USA, July 24-28, 2006},
pages = {1083--1088},
publisher = {{ACM}},
year = {2006},
url = {https://doi.org/10.1145/1146909.1147183},
doi = {10.1145/1146909.1147183},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/ChaoCWCW06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/WangBC06,
author = {Seongmoon Wang and
Kedarnath J. Balakrishnan and
Srimat T. Chakradhar},
editor = {Georges G. E. Gielen},
title = {Efficient unknown blocking using {LFSR} reseeding},
booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe,
{DATE} 2006, Munich, Germany, March 6-10, 2006},
pages = {1051--1052},
publisher = {European Design and Automation Association, Leuven, Belgium},
year = {2006},
url = {https://doi.org/10.1109/DATE.2006.243929},
doi = {10.1109/DATE.2006.243929},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/WangBC06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/ChaoWCWC06,
author = {Mango Chia{-}Tso Chao and
Seongmoon Wang and
Srimat T. Chakradhar and
Wenlong Wei and
Kwang{-}Ting Cheng},
editor = {Georges G. E. Gielen},
title = {Coverage loss by using space compactors in presence of unknown values},
booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe,
{DATE} 2006, Munich, Germany, March 6-10, 2006},
pages = {1053--1054},
publisher = {European Design and Automation Association, Leuven, Belgium},
year = {2006},
url = {https://doi.org/10.1109/DATE.2006.243930},
doi = {10.1109/DATE.2006.243930},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/ChaoWCWC06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/BalakrishnanWC06,
author = {Kedarnath J. Balakrishnan and
Seongmoon Wang and
Srimat T. Chakradhar},
title = {{PIDISC:} Pattern Independent Design Independent Seed Compression
Technique},
booktitle = {19th International Conference on {VLSI} Design {(VLSI} Design 2006),
3-7 January 2006, Hyderabad, India},
pages = {811--817},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VLSID.2006.135},
doi = {10.1109/VLSID.2006.135},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/BalakrishnanWC06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/ChaoWCC05,
author = {Mango Chia{-}Tso Chao and
Seongmoon Wang and
Srimat T. Chakradhar and
Kwang{-}Ting Cheng},
title = {Response shaper: a novel technique to enhance unknown tolerance for
output response compaction},
booktitle = {2005 International Conference on Computer-Aided Design, {ICCAD} 2005,
San Jose, CA, USA, November 6-10, 2005},
pages = {80--87},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/ICCAD.2005.1560044},
doi = {10.1109/ICCAD.2005.1560044},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/ChaoWCC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccd/ChaoWCC05,
author = {Mango Chia{-}Tso Chao and
Seongmoon Wang and
Srimat T. Chakradhar and
Kwang{-}Ting Cheng},
title = {ChiYun Compact: {A} Novel Test Compaction Technique for Responses
with Unknown Values},
booktitle = {23rd International Conference on Computer Design {(ICCD} 2005), 2-5
October 2005, San Jose, CA, {USA}},
pages = {147--152},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/ICCD.2005.38},
doi = {10.1109/ICCD.2005.38},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccd/ChaoWCC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangBC05,
author = {Seongmoon Wang and
Kedarnath J. Balakrishnan and
Srimat T. Chakradhar},
title = {{XWRC:} externally-loaded weighted random pattern testing for input
test data compression},
booktitle = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005,
Austin, TX, USA, November 8-10, 2005},
pages = {10},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/TEST.2005.1584018},
doi = {10.1109/TEST.2005.1584018},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WangBC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/LiWCR05,
author = {Wei Li and
Seongmoon Wang and
Srimat T. Chakradhar and
Sudhakar M. Reddy},
title = {Distance Restricted Scan Chain Reordering to Enhance Delay Fault Coverage},
booktitle = {18th International Conference on {VLSI} Design {(VLSI} Design 2005),
with the 4th International Conference on Embedded Systems Design,
3-7 January 2005, Kolkata, India},
pages = {471--478},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/ICVD.2005.83},
doi = {10.1109/ICVD.2005.83},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/LiWCR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/WangCK04,
author = {Seongmoon Wang and
Srimat T. Chakradhar and
Kedarnath J. Balakrishnan},
editor = {Masaharu Imai},
title = {Re-configurable embedded core test protocol},
booktitle = {Proceedings of the 2004 Conference on Asia South Pacific Design Automation:
Electronic Design and Solution Fair 2004, Yokohama, Japan, January
27-30, 2004},
pages = {234--237},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.ieeecomputersociety.org/10.1109/ASPDAC.2004.170},
doi = {10.1109/ASPDAC.2004.170},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/aspdac/WangCK04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/WangLC04,
author = {Seongmoon Wang and
Xiao Liu and
Srimat T. Chakradhar},
title = {Hybrid Delay Scan: {A} Low Hardware Overhead Scan-Based Delay Test
Technique for High Fault Coverage and Compact Test Sets},
booktitle = {2004 Design, Automation and Test in Europe Conference and Exposition
{(DATE} 2004), 16-20 February 2004, Paris, France},
pages = {1296--1301},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/DATE.2004.1269074},
doi = {10.1109/DATE.2004.1269074},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/WangLC04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangC03,
author = {Seongmoon Wang and
Srimat T. Chakradhar},
title = {A Scalable Scan-Path Test Point Insertion Technique to Enhance Delay
Fault Coverage for Standard Scan Designs},
booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
NC, {USA}},
pages = {574--583},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/TEST.2003.1270884},
doi = {10.1109/TEST.2003.1270884},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WangC03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/WangG02,
author = {Seongmoon Wang and
Sandeep K. Gupta},
title = {{DS-LFSR:} a {BIST} {TPG} for low switching activity},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {21},
number = {7},
pages = {842--851},
year = {2002},
url = {https://doi.org/10.1109/TCAD.2002.1013896},
doi = {10.1109/TCAD.2002.1013896},
timestamp = {Fri, 22 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/WangG02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/WangG02a,
author = {Seongmoon Wang and
Sandeep K. Gupta},
title = {An automatic test pattern generator for minimizing switching activity
during scan testing activity},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {21},
number = {8},
pages = {954--968},
year = {2002},
url = {https://doi.org/10.1109/TCAD.2002.800460},
doi = {10.1109/TCAD.2002.800460},
timestamp = {Fri, 22 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/WangG02a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Wang02,
author = {Seongmoon Wang},
title = {Generation of Low Power Dissipation and High Fault Coverage Patterns
for Scan-Based {BIST}},
booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
MD, USA, October 7-10, 2002},
pages = {834--843},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/TEST.2002.1041837},
doi = {10.1109/TEST.2002.1041837},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Wang02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SWangG99,
author = {Seongmoon Wang and
Sandeep K. Gupta},
title = {{LT-RTPG:} a new test-per-scan {BIST} {TPG} for low heat dissipation},
booktitle = {Proceedings {IEEE} International Test Conference 1999, Atlantic City,
NJ, USA, 27-30 September 1999},
pages = {85--94},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/TEST.1999.805617},
doi = {10.1109/TEST.1999.805617},
timestamp = {Fri, 22 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/SWangG99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/WangG98,
author = {Seongmoon Wang and
Sandeep K. Gupta},
title = {{ATPG} for Heat Dissipation Minimization During Test Application},
journal = {{IEEE} Trans. Computers},
volume = {47},
number = {2},
pages = {256--262},
year = {1998},
url = {https://doi.org/10.1109/12.663775},
doi = {10.1109/12.663775},
timestamp = {Fri, 22 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/WangG98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/WangG97,
author = {Seongmoon Wang and
Sandeep K. Gupta},
editor = {Ellen J. Yoffa and
Giovanni De Micheli and
Jan M. Rabaey},
title = {{ATPG} for Heat Dissipation Minimization During Scan Testing},
booktitle = {Proceedings of the 34st Conference on Design Automation, Anaheim,
California, USA, Anaheim Convention Center, June 9-13, 1997},
pages = {614--619},
publisher = {{ACM} Press},
year = {1997},
url = {https://doi.org/10.1145/266021.266298},
doi = {10.1145/266021.266298},
timestamp = {Fri, 22 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dac/WangG97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangG97,
author = {Seongmoon Wang and
Sandeep K. Gupta},
title = {{DS-LFSR:} {A} New {BIST} {TPG} for Low Heat Dissipation},
booktitle = {Proceedings {IEEE} International Test Conference 1997, Washington,
DC, USA, November 3-5, 1997},
pages = {848--857},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/TEST.1997.639699},
doi = {10.1109/TEST.1997.639699},
timestamp = {Fri, 22 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/WangG97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangG94,
author = {Seongmoon Wang and
Sandeep K. Gupta},
title = {{ATPG} for Heat Dissipation Minimization During Test Application},
booktitle = {Proceedings {IEEE} International Test Conference 1994, {TEST:} The
Next 25 Years, Washington, DC, USA, October 2-6, 1994},
pages = {250--258},
publisher = {{IEEE} Computer Society},
year = {1994},
url = {https://doi.org/10.1109/TEST.1994.527956},
doi = {10.1109/TEST.1994.527956},
timestamp = {Fri, 22 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/WangG94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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