BibTeX records: Ron G. Walther

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@inproceedings{DBLP:conf/vts/AbadirAHHNW97,
  author       = {Magdy S. Abadir and
                  Jacob A. Abraham and
                  Hong Hao and
                  C. Hunter and
                  Wayne M. Needham and
                  Ron G. Walther},
  title        = {Microprocessor Test and Validation: Any New Avenues?},
  booktitle    = {15th {IEEE} {VLSI} Test Symposium (VTS'97), April 27-May 1, 1997,
                  Monterey, California, {USA}},
  pages        = {458--464},
  publisher    = {{IEEE} Computer Society},
  year         = {1997},
  url          = {https://doi.ieeecomputersociety.org/10.1109/VTS.1997.10015},
  doi          = {10.1109/VTS.1997.10015},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/AbadirAHHNW97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dac/AbrahamKPdDLSW94,
  author       = {Jacob A. Abraham and
                  Sandip Kundu and
                  Janak H. Patel and
                  Manuel A. d'Abreu and
                  Bulent I. Dervisoglu and
                  Marc E. Levitt and
                  Hector R. Sucar and
                  Ron G. Walther},
  editor       = {Michael J. Lorenzetti},
  title        = {Microprocessor Testing: Which Technique is Best? (Panel)},
  booktitle    = {Proceedings of the 31st Conference on Design Automation, San Diego,
                  California, USA, June 6-10, 1994},
  pages        = {294},
  publisher    = {{ACM} Press},
  year         = {1994},
  url          = {https://doi.org/10.1145/196244.196383},
  doi          = {10.1145/196244.196383},
  timestamp    = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dac/AbrahamKPdDLSW94.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dac/DasguptaGRWW84,
  author       = {Subrata Dasgupta and
                  M. C. Graf and
                  Robert A. Rasmussen and
                  Ron G. Walther and
                  Tom W. Williams},
  editor       = {Patricia H. Lambert and
                  Hillel Ofek and
                  Lawrence A. O'Neill and
                  Pat O. Pistilli and
                  Paul Losleben and
                  J. Daniel Nash and
                  Dennis W. Shaklee and
                  Bryan T. Preas and
                  Harvey N. Lerman},
  title        = {Chip partitioning aid: {A} design technique for partitionability and
                  testability in {VLSI}},
  booktitle    = {Proceedings of the 21st Design Automation Conference, {DAC} '84, Albuquerque,
                  New Mexico, June 25-27, 1984},
  pages        = {203--208},
  publisher    = {{ACM/IEEE}},
  year         = {1984},
  url          = {http://dl.acm.org/citation.cfm?id=800796},
  timestamp    = {Thu, 12 Aug 2021 08:58:02 +0200},
  biburl       = {https://dblp.org/rec/conf/dac/DasguptaGRWW84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/DasGuptaGWW82,
  author       = {Sumit DasGupta and
                  Prabhakar Goel and
                  Ron G. Walther and
                  Tom W. Williams},
  title        = {A Variation of {LSSD} and Its Implications on Design and Test Pattern
                  Generation in {VLSI}},
  booktitle    = {Proceedings International Test Conference 1982, Philadelphia, PA,
                  USA, November 1982},
  pages        = {63--66},
  publisher    = {{IEEE} Computer Society},
  year         = {1982},
  timestamp    = {Mon, 19 Jun 2006 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/DasGuptaGWW82.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}