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BibTeX records: Ron G. Walther
@inproceedings{DBLP:conf/vts/AbadirAHHNW97, author = {Magdy S. Abadir and Jacob A. Abraham and Hong Hao and C. Hunter and Wayne M. Needham and Ron G. Walther}, title = {Microprocessor Test and Validation: Any New Avenues?}, booktitle = {15th {IEEE} {VLSI} Test Symposium (VTS'97), April 27-May 1, 1997, Monterey, California, {USA}}, pages = {458--464}, publisher = {{IEEE} Computer Society}, year = {1997}, url = {https://doi.ieeecomputersociety.org/10.1109/VTS.1997.10015}, doi = {10.1109/VTS.1997.10015}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vts/AbadirAHHNW97.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dac/AbrahamKPdDLSW94, author = {Jacob A. Abraham and Sandip Kundu and Janak H. Patel and Manuel A. d'Abreu and Bulent I. Dervisoglu and Marc E. Levitt and Hector R. Sucar and Ron G. Walther}, editor = {Michael J. Lorenzetti}, title = {Microprocessor Testing: Which Technique is Best? (Panel)}, booktitle = {Proceedings of the 31st Conference on Design Automation, San Diego, California, USA, June 6-10, 1994}, pages = {294}, publisher = {{ACM} Press}, year = {1994}, url = {https://doi.org/10.1145/196244.196383}, doi = {10.1145/196244.196383}, timestamp = {Tue, 06 Nov 2018 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dac/AbrahamKPdDLSW94.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dac/DasguptaGRWW84, author = {Subrata Dasgupta and M. C. Graf and Robert A. Rasmussen and Ron G. Walther and Tom W. Williams}, editor = {Patricia H. Lambert and Hillel Ofek and Lawrence A. O'Neill and Pat O. Pistilli and Paul Losleben and J. Daniel Nash and Dennis W. Shaklee and Bryan T. Preas and Harvey N. Lerman}, title = {Chip partitioning aid: {A} design technique for partitionability and testability in {VLSI}}, booktitle = {Proceedings of the 21st Design Automation Conference, {DAC} '84, Albuquerque, New Mexico, June 25-27, 1984}, pages = {203--208}, publisher = {{ACM/IEEE}}, year = {1984}, url = {http://dl.acm.org/citation.cfm?id=800796}, timestamp = {Thu, 12 Aug 2021 08:58:02 +0200}, biburl = {https://dblp.org/rec/conf/dac/DasguptaGRWW84.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/DasGuptaGWW82, author = {Sumit DasGupta and Prabhakar Goel and Ron G. Walther and Tom W. Williams}, title = {A Variation of {LSSD} and Its Implications on Design and Test Pattern Generation in {VLSI}}, booktitle = {Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982}, pages = {63--66}, publisher = {{IEEE} Computer Society}, year = {1982}, timestamp = {Mon, 19 Jun 2006 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/DasGuptaGWW82.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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