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BibTeX records: Raimund Ubar
@book{DBLP:books/sp/UbarRJJ24, author = {Raimund Ubar and Jaan Raik and Maksim Jenihhin and Artur Jutman}, title = {Structural Decision Diagrams in Digital Test - Theory and Applications}, publisher = {Springer}, year = {2024}, url = {https://doi.org/10.1007/978-3-031-44734-1}, doi = {10.1007/978-3-031-44734-1}, isbn = {978-3-031-44733-4}, timestamp = {Mon, 04 Mar 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/books/sp/UbarRJJ24.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/isvlsi/OyeniranJRU22, author = {Adeboye Stephen Oyeniran and Maksim Jenihhin and Jaan Raik and Raimund Ubar}, title = {High-Level Fault Diagnosis in {RISC} Processors with Implementation-Independent Functional Test}, booktitle = {{IEEE} Computer Society Annual Symposium on VLSI, {ISVLSI} 2022, Nicosia, Cyprus, July 4-6, 2022}, pages = {32--37}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/ISVLSI54635.2022.00019}, doi = {10.1109/ISVLSI54635.2022.00019}, timestamp = {Tue, 25 Oct 2022 21:20:51 +0200}, biburl = {https://dblp.org/rec/conf/isvlsi/OyeniranJRU22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dsd/JenihhinORU21, author = {Maksim Jenihhin and Adeboye Stephen Oyeniran and Jaan Raik and Raimund Ubar}, editor = {Francesco Leporati and Salvatore Vitabile and Amund Skavhaug}, title = {Implementation-Independent Test Generation for a Large Class of Faults in {RISC} Processor Modules}, booktitle = {24th Euromicro Conference on Digital System Design, {DSD} 2021, Virtual Event / Palermo, Sicily, Italy, September 1-3, 2021}, pages = {557--561}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/DSD53832.2021.00090}, doi = {10.1109/DSD53832.2021.00090}, timestamp = {Mon, 07 Nov 2022 07:58:07 +0100}, biburl = {https://dblp.org/rec/conf/dsd/JenihhinORU21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/corr/abs-2103-05106, author = {Ahmet Cagri Bagbaba and Maksim Jenihhin and Raimund Ubar and Christian Sauer}, title = {Representing Gate-Level {SET} Faults by Multiple {SEU} Faults at {RTL}}, journal = {CoRR}, volume = {abs/2103.05106}, year = {2021}, url = {https://arxiv.org/abs/2103.05106}, eprinttype = {arXiv}, eprint = {2103.05106}, timestamp = {Mon, 15 Mar 2021 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/corr/abs-2103-05106.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/OyeniranUJR20, author = {Adeboye Stephen Oyeniran and Raimund Ubar and Maksim Jenihhin and Jaan Raik}, title = {High-Level Implementation-Independent Functional Software-Based Self-Test for {RISC} Processors}, journal = {J. Electron. Test.}, volume = {36}, number = {1}, pages = {87--103}, year = {2020}, url = {https://doi.org/10.1007/s10836-020-05856-7}, doi = {10.1007/S10836-020-05856-7}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/OyeniranUJR20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mam/JurimagiUJR20, author = {Lembit J{\"{u}}rim{\"{a}}gi and Raimund Ubar and Maksim Jenihhin and Jaan Raik}, title = {Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs}, journal = {Microprocess. Microsystems}, volume = {77}, pages = {103117}, year = {2020}, url = {https://doi.org/10.1016/j.micpro.2020.103117}, doi = {10.1016/J.MICPRO.2020.103117}, timestamp = {Thu, 08 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mam/JurimagiUJR20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dsd/OyeniranUJR20, author = {Adeboye Stephen Oyeniran and Raimund Ubar and Maksim Jenihhin and Jaan Raik}, title = {Implementation-Independent Functional Test for Transition Delay Faults in Microprocessors}, booktitle = {23rd Euromicro Conference on Digital System Design, {DSD} 2020, Kranj, Slovenia, August 26-28, 2020}, pages = {646--650}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.1109/DSD51259.2020.00105}, doi = {10.1109/DSD51259.2020.00105}, timestamp = {Wed, 14 Oct 2020 14:37:25 +0200}, biburl = {https://dblp.org/rec/conf/dsd/OyeniranUJR20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/BagbabaJU020, author = {Ahmet Cagri Bagbaba and Maksim Jenihhin and Raimund Ubar and Christian Sauer}, title = {Representing Gate-Level {SET} Faults by Multiple {SEU} Faults at {RTL}}, booktitle = {26th {IEEE} International Symposium on On-Line Testing and Robust System Design, {IOLTS} 2020, Napoli, Italy, July 13-15, 2020}, pages = {1--6}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.1109/IOLTS50870.2020.9159715}, doi = {10.1109/IOLTS50870.2020.9159715}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/iolts/BagbabaJU020.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/corr/abs-2009-11621, author = {Cemil Cem G{\"{u}}rsoy and Maksim Jenihhin and Adeboye Stephen Oyeniran and Davide Piumatti and Jaan Raik and Matteo Sonza Reorda and Raimund Ubar}, title = {New categories of Safe Faults in a processor-based Embedded System}, journal = {CoRR}, volume = {abs/2009.11621}, year = {2020}, url = {https://arxiv.org/abs/2009.11621}, eprinttype = {arXiv}, eprint = {2009.11621}, timestamp = {Wed, 30 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/corr/abs-2009-11621.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ddecs/GursoyJOPRRU19, author = {Cemil Cem G{\"{u}}rsoy and Maksim Jenihhin and Adeboye Stephen Oyeniran and Davide Piumatti and Jaan Raik and Matteo Sonza Reorda and Raimund Ubar}, title = {New categories of Safe Faults in a processor-based Embedded System}, booktitle = {22nd {IEEE} International Symposium on Design and Diagnostics of Electronic Circuits {\&} Systems, {DDECS} 2019, Cluj-Napoca, Romania, April 24-26, 2019}, pages = {1--4}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DDECS.2019.8724642}, doi = {10.1109/DDECS.2019.8724642}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ddecs/GursoyJOPRRU19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dsd/UbarJAJ19, author = {Raimund Ubar and Lembit J{\"{u}}rim{\"{a}}gi and Adeniyi Olanrewaju Adekoya and Maksim Jenihhin}, title = {True Path Tracing in Structurally Synthesized BDDs for Testability Analysis of Digital Circuits}, booktitle = {22nd Euromicro Conference on Digital System Design, {DSD} 2019, Kallithea, Greece, August 28-30, 2019}, pages = {492--499}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DSD.2019.00077}, doi = {10.1109/DSD.2019.00077}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dsd/UbarJAJ19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ets/OyeniranUJGR19, author = {Adeboye Stephen Oyeniran and Raimund Ubar and Maksim Jenihhin and Cemil Cem G{\"{u}}rsoy and Jaan Raik}, title = {High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for {RISC} Processors}, booktitle = {24th {IEEE} European Test Symposium, {ETS} 2019, Baden-Baden, Germany, May 27-31, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ETS.2019.8791526}, doi = {10.1109/ETS.2019.8791526}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ets/OyeniranUJGR19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/JurimagiUJRDO19, author = {Lembit J{\"{u}}rim{\"{a}}gi and Raimund Ubar and Maksim Jenihhin and Jaan Raik and Sergei Devadze and Adeboye Stephen Oyeniran}, editor = {Dimitris Gizopoulos and Dan Alexandrescu and Panagiota Papavramidou and Michail Maniatakos}, title = {Application Specific True Critical Paths Identification in Sequential Circuits}, booktitle = {25th {IEEE} International Symposium on On-Line Testing and Robust System Design, {IOLTS} 2019, Rhodes, Greece, July 1-3, 2019}, pages = {299--304}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/IOLTS.2019.8854442}, doi = {10.1109/IOLTS.2019.8854442}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/iolts/JurimagiUJRDO19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/OyeniranUJGR19, author = {Adeboye Stephen Oyeniran and Raimund Ubar and Maksim Jenihhin and Cemil Cem G{\"{u}}rsoy and Jaan Raik}, title = {Mixed-level identification of fault redundancy in microprocessors}, booktitle = {{IEEE} Latin American Test Symposium, {LATS} 2019, Santiago, Chile, March 11-13, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/LATW.2019.8704591}, doi = {10.1109/LATW.2019.8704591}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/OyeniranUJGR19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/meco/JurimagiUV19, author = {Lembit J{\"{u}}rim{\"{a}}gi and Raimund Ubar and Vladimir Viies}, title = {Equivalent Transformations of Structurally Synthesized BDDs and Applications}, booktitle = {8th Mediterranean Conference on Embedded Computing, {MECO} 2019, Budva, Montenegro, June 10-14, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/MECO.2019.8760283}, doi = {10.1109/MECO.2019.8760283}, timestamp = {Mon, 09 Aug 2021 14:54:01 +0200}, biburl = {https://dblp.org/rec/conf/meco/JurimagiUV19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/mixdes/OyeniranU19, author = {Adeboye Stephen Oyeniran and Raimund Ubar}, editor = {Andrzej Napieralksi}, title = {High-Level Functional Test Generation for Microprocessor Modules}, booktitle = {26th International Conference on Mixed Design of Integrated Circuits and Systems, {MIXDES} 2019, Rzesz{\'{o}}w, Poland, June 27-29, 2019}, pages = {356--361}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.23919/MIXDES.2019.8787131}, doi = {10.23919/MIXDES.2019.8787131}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/mixdes/OyeniranU19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vlsi/OyeniranUJR19a, author = {Adeboye Stephen Oyeniran and Raimund Ubar and Maksim Jenihhin and Jaan Raik}, editor = {Carolina Metzler and Pierre{-}Emmanuel Gaillardon and Giovanni De Micheli and Carlos Silva C{\'{a}}rdenas and Ricardo Reis}, title = {On Test Generation for Microprocessors for Extended Class of Functional Faults}, booktitle = {VLSI-SoC: New Technology Enabler - 27th {IFIP} {WG} 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019, Cusco, Peru, October 6-9, 2019, Revised and Extended Selected Papers}, series = {{IFIP} Advances in Information and Communication Technology}, volume = {586}, pages = {21--44}, publisher = {Springer}, year = {2019}, url = {https://doi.org/10.1007/978-3-030-53273-4\_2}, doi = {10.1007/978-3-030-53273-4\_2}, timestamp = {Mon, 27 Jul 2020 13:06:53 +0200}, biburl = {https://dblp.org/rec/conf/vlsi/OyeniranUJR19a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vlsi/OyeniranUJR19, author = {Adeboye Stephen Oyeniran and Raimund Ubar and Maksim Jenihhin and Jaan Raik}, title = {Implementation-Independent Functional Test Generation for {MSC} Microprocessors}, booktitle = {27th {IFIP/IEEE} International Conference on Very Large Scale Integration, VLSI-SoC 2019, Cuzco, Peru, October 6-9, 2019}, pages = {82--87}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/VLSI-SoC.2019.8920323}, doi = {10.1109/VLSI-SOC.2019.8920323}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vlsi/OyeniranUJR19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/corr/abs-1907-12325, author = {Adeboye Stephen Oyeniran and Raimund Ubar and Maksim Jenihhin and Cemil Cem G{\"{u}}rsoy and Jaan Raik}, title = {Mixed-level identification of fault redundancy in microprocessors}, journal = {CoRR}, volume = {abs/1907.12325}, year = {2019}, url = {http://arxiv.org/abs/1907.12325}, eprinttype = {arXiv}, eprint = {1907.12325}, timestamp = {Thu, 01 Aug 2019 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/corr/abs-1907-12325.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/corr/abs-1908-02986, author = {Adeboye Stephen Oyeniran and Raimund Ubar and Maksim Jenihhin and Cemil Cem G{\"{u}}rsoy and Jaan Raik}, title = {High-Level Combined Deterministic and Pseudoexhuastive Test Generation for {RISC} Processors}, journal = {CoRR}, volume = {abs/1908.02986}, year = {2019}, url = {http://arxiv.org/abs/1908.02986}, eprinttype = {arXiv}, eprint = {1908.02986}, timestamp = {Fri, 09 Aug 2019 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/corr/abs-1908-02986.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/UbarKJRJ18, author = {Raimund Ubar and Sergei Kostin and Maksim Jenihhin and Jaan Raik and Lembit J{\"{u}}rim{\"{a}}gi}, title = {Fast identification of true critical paths in sequential circuits}, journal = {Microelectron. Reliab.}, volume = {81}, pages = {252--261}, year = {2018}, url = {https://doi.org/10.1016/j.microrel.2017.11.027}, doi = {10.1016/J.MICROREL.2017.11.027}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/UbarKJRJ18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/aqtr/OyeniranAU18, author = {Adeboye Stephen Oyeniran and Siavoosh Payandeh Azad and Raimund Ubar}, title = {Combined pseudo-exhaustive and deterministic testing of array multipliers}, booktitle = {{IEEE} International Conference on Automation, Quality and Testing, Robotics, {AQTR} 2018, Cluj-Napoca, Romania, May 24-26, 2018}, pages = {1--6}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/AQTR.2018.8402708}, doi = {10.1109/AQTR.2018.8402708}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/aqtr/OyeniranAU18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ddecs/AzadOU18, author = {Siavoosh Payandeh Azad and Adeboye Stephen Oyeniran and Raimund Ubar}, title = {Replication-Based Deterministic Testing of 2-Dimensional Arrays with Highly Interrelated Cells}, booktitle = {21st {IEEE} International Symposium on Design and Diagnostics of Electronic Circuits {\&} Systems, {DDECS} 2018, Budapest, Hungary, April 25-27, 2018}, pages = {21--26}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/DDECS.2018.00011}, doi = {10.1109/DDECS.2018.00011}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ddecs/AzadOU18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iscas/OyeniranAU18, author = {Adeboye Stephen Oyeniran and Siavoosh Payandeh Azad and Raimund Ubar}, title = {Parallel Pseudo-Exhaustive Testing of Array Multipliers with Data-Controlled Segmentation}, booktitle = {{IEEE} International Symposium on Circuits and Systems, {ISCAS} 2018, 27-30 May 2018, Florence, Italy}, pages = {1--5}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/ISCAS.2018.8350936}, doi = {10.1109/ISCAS.2018.8350936}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/iscas/OyeniranAU18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/meco/UbarJJROV18, author = {Raimund Ubar and Lembit Jurimagi and Maksim Jenihhin and Jaan Raik and Niyi{-}Leigh Olugbenga and Vladimir Viies}, title = {Timing-critical path analysis with structurally synthesized BDDs}, booktitle = {7th Mediterranean Conference on Embedded Computing, {MECO} 2018, Budva, Montenegro, June 10-14, 2018}, pages = {1--6}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/MECO.2018.8406051}, doi = {10.1109/MECO.2018.8406051}, timestamp = {Mon, 09 Aug 2021 14:54:01 +0200}, biburl = {https://dblp.org/rec/conf/meco/UbarJJROV18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/mixdes/KousaarUKDR18, author = {Jaak Kousaar and Raimund Ubar and Sergei Kostin and Sergei Devadze and Jaan Raik}, title = {Parallel Critical Path Tracing Fault Simulation in Sequential Circuits}, booktitle = {25th International Conference "Mixed Design of Integrated Circuits and System", {MIXDES} 2018, Gdynia, Poland, June 21-23, 2018}, pages = {305--310}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.23919/MIXDES.2018.8436880}, doi = {10.23919/MIXDES.2018.8436880}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/mixdes/KousaarUKDR18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/patmos/JurimagiUJRDK18, author = {Lembit Jurimagi and Raimund Ubar and Maksim Jenihhin and Jaan Raik and Sergei Devadze and Sergei Kostin}, title = {Hierarchical Timing-Critical Paths Analysis in Sequential Circuits}, booktitle = {28th International Symposium on Power and Timing Modeling, Optimization and Simulation, {PATMOS} 2018, Platja d'Aro, Spain, July 2-4, 2018}, pages = {1--6}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/PATMOS.2018.8464176}, doi = {10.1109/PATMOS.2018.8464176}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/patmos/JurimagiUJRDK18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mam/UbarJRV17, author = {Raimund Ubar and Lembit J{\"{u}}rim{\"{a}}gi and Jaan Raik and Vladimir Viies}, title = {Modeling and simulation of circuits with shared structurally synthesized BDDs}, journal = {Microprocess. Microsystems}, volume = {48}, pages = {56--61}, year = {2017}, url = {https://doi.org/10.1016/j.micpro.2016.09.006}, doi = {10.1016/J.MICPRO.2016.09.006}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mam/UbarJRV17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ddecs/AzadNJGOPKRJUH17, author = {Siavoosh Payandeh Azad and Behrad Niazmand and Karl Janson and Nevin George and Stephen Adeboye Oyeniran and Tsotne Putkaradze and Apneet Kaur and Jaan Raik and Gert Jervan and Raimund Ubar and Thomas Hollstein}, editor = {Manfred Dietrich and Ondrej Nov{\'{a}}k}, title = {From online fault detection to fault management in Network-on-Chips: {A} ground-up approach}, booktitle = {20th {IEEE} International Symposium on Design and Diagnostics of Electronic Circuits {\&} Systems, {DDECS} 2017, Dresden, Germany, April 19-21, 2017}, pages = {48--53}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.1109/DDECS.2017.7934565}, doi = {10.1109/DDECS.2017.7934565}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ddecs/AzadNJGOPKRJUH17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ddecs/UbarKJR17, author = {Raimund Ubar and Sergei Kostin and Maksim Jenihhin and Jaan Raik}, editor = {Manfred Dietrich and Ondrej Nov{\'{a}}k}, title = {A scalable technique to identify true critical paths in sequential circuits}, booktitle = {20th {IEEE} International Symposium on Design and Diagnostics of Electronic Circuits {\&} Systems, {DDECS} 2017, Dresden, Germany, April 19-21, 2017}, pages = {152--157}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.1109/DDECS.2017.7934568}, doi = {10.1109/DDECS.2017.7934568}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ddecs/UbarKJR17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/meco/OyeniranJTU17, author = {Adeboye Stephen Oyeniran and Artjom Jasnetski and Anton Tsertov and Raimund Ubar}, title = {High-level test data generation for software-based self-test in microprocessors}, booktitle = {6th Mediterranean Conference on Embedded Computing, {MECO} 2017, Bar, Montenegro, June 11-15, 2017}, pages = {1--6}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.1109/MECO.2017.7977167}, doi = {10.1109/MECO.2017.7977167}, timestamp = {Mon, 09 Aug 2021 14:54:01 +0200}, biburl = {https://dblp.org/rec/conf/meco/OyeniranJTU17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/mixdes/JasnetskiUT17, author = {Artjom Jasnetski and Raimund Ubar and Anton Tsertov}, title = {Automated software-based self-test generation for microprocessors}, booktitle = {24th International Conference Mixed Design of Integrated Circuits and Systems, {MIXDES} 2017, Bydgoszcz, Poland, June 22-24, 2017}, pages = {453--458}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.23919/MIXDES.2017.8005252}, doi = {10.23919/MIXDES.2017.8005252}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/mixdes/JasnetskiUT17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/recosoc/OyeniranUAR17, author = {Stephen Adeboye Oyeniran and Raimund Ubar and Siavoosh Payandeh Azad and Jaan Raik}, title = {High-level test generation for processing elements in many-core systems}, booktitle = {12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip, ReCoSoC 2017, Madrid, Spain, July 12-14, 2017}, pages = {1--8}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.1109/ReCoSoC.2017.8016156}, doi = {10.1109/RECOSOC.2017.8016156}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/recosoc/OyeniranUAR17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/JenihhinSCTKGVR16, author = {Maksim Jenihhin and Giovanni Squillero and Thiago Santos Copetti and Valentin Tihhomirov and Sergei Kostin and Marco Gaudesi and Fabian Vargas and Jaan Raik and Matteo Sonza Reorda and Leticia Bolzani Poehls and Raimund Ubar and Guilherme Cardoso Medeiros}, title = {Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits}, journal = {J. Electron. Test.}, volume = {32}, number = {3}, pages = {273--289}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5589-x}, doi = {10.1007/S10836-016-5589-X}, timestamp = {Fri, 03 Sep 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/JenihhinSCTKGVR16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/aqtr/UbarO16, author = {Raimund Ubar and Stephen Adeboye Oyeniran}, title = {Multiple control fault testing in digital systems with high-level decision diagrams}, booktitle = {{IEEE} International Conference on Automation, Quality and Testing, Robotics, {AQTR} 2016, Cluj-Napoca, Romania, May 19-21, 2016}, pages = {1--6}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.ieeecomputersociety.org/10.1109/AQTR.2016.7501287}, doi = {10.1109/AQTR.2016.7501287}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/aqtr/UbarO16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/PellereyJSRRTU16, author = {Francesco Pellerey and Maksim Jenihhin and Giovanni Squillero and Jaan Raik and Matteo Sonza Reorda and Valentin Tihhomirov and Raimund Ubar}, title = {Rejuvenation of NBTI-Impacted Processors Using Evolutionary Generation of Assembler Programs}, booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November 21-24, 2016}, pages = {304--309}, publisher = {{IEEE} Computer Society}, year = {2016}, url = {https://doi.org/10.1109/ATS.2016.57}, doi = {10.1109/ATS.2016.57}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/PellereyJSRRTU16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ddecs/JasnetskiOTSU16, author = {Artjom Jasnetski and Stephen Adeboye Oyeniran and Anton Tsertov and Mario Sch{\"{o}}lzel and Raimund Ubar}, title = {High-level modeling and testing of multiple control faults in digital systems}, booktitle = {2016 {IEEE} 19th International Symposium on Design and Diagnostics of Electronic Circuits {\&} Systems (DDECS), Kosice, Slovakia, April 20-22, 2016}, pages = {144--149}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/DDECS.2016.7482445}, doi = {10.1109/DDECS.2016.7482445}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ddecs/JasnetskiOTSU16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ewme/KostinOU16, author = {Sergei Kostin and Elmet Orasson and Raimund Ubar}, title = {A tool set for teaching design-for-testability of digital circuits}, booktitle = {11th European Workshop on Microelectronics Education, {EWME} 2016, Southampton, UK, May 11-13, 2016}, pages = {1--6}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/EWME.2016.7496466}, doi = {10.1109/EWME.2016.7496466}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ewme/KostinOU16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/CopettiMPVKJRU16, author = {Thiago Copetti and Guilherme Medeiros Machado and Leticia Bolzani Poehls and Fabian Vargas and Sergei Kostin and Maksim Jenihhin and Jaan Raik and Raimund Ubar}, title = {Gate-level modelling of NBTI-induced delays under process variations}, booktitle = {17th Latin-American Test Symposium, {LATS} 2016, Foz do Iguacu, Brazil, April 6-8, 2016}, pages = {75--80}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/LATW.2016.7483343}, doi = {10.1109/LATW.2016.7483343}, timestamp = {Fri, 03 Sep 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/CopettiMPVKJRU16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/JasnetskiUT16, author = {Artjom Jasnetski and Raimund Ubar and Anton Tsertov}, title = {On automatic software-based self-test program generation based on high-level decision diagrams}, booktitle = {17th Latin-American Test Symposium, {LATS} 2016, Foz do Iguacu, Brazil, April 6-8, 2016}, pages = {177}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/LATW.2016.7483357}, doi = {10.1109/LATW.2016.7483357}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/JasnetskiUT16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/norchip/OsimiryUKR16, author = {Emmanuel Ovie Osimiry and Raimund Ubar and Sergei Kostin and Jaan Raik}, title = {A novel random approach to diagnostic test generation}, booktitle = {{IEEE} Nordic Circuits and Systems Conference, {NORCAS} 2016, Copenhagen, Denmark, November 1-2, 2016}, pages = {1--4}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/NORCHIP.2016.7792915}, doi = {10.1109/NORCHIP.2016.7792915}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/norchip/OsimiryUKR16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mam/GorevUEDRM15, author = {Maksim Gorev and Raimund Ubar and Peeter Ellervee and Sergei Devadze and Jaan Raik and Mart Min}, title = {Functional self-test of high-performance pipe-lined signal processing architectures}, journal = {Microprocess. Microsystems}, volume = {39}, number = {8}, pages = {909--918}, year = {2015}, url = {https://doi.org/10.1016/j.micpro.2014.11.002}, doi = {10.1016/J.MICPRO.2014.11.002}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mam/GorevUEDRM15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mam/KousaarUDR15, author = {Jaak Kousaar and Raimund Ubar and Sergei Devadze and Jaan Raik}, title = {Transition delay fault simulation with parallel critical path back-tracing and 7-valued algebra}, journal = {Microprocess. Microsystems}, volume = {39}, number = {8}, pages = {1130--1138}, year = {2015}, url = {https://doi.org/10.1016/j.micpro.2015.05.003}, doi = {10.1016/J.MICPRO.2015.05.003}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mam/KousaarUDR15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/date/GorevUD15, author = {Maksim Gorev and Raimund Ubar and Sergei Devadze}, editor = {Wolfgang Nebel and David Atienza}, title = {Fault simulation with parallel exact critical path tracing in multiple core environment}, booktitle = {Proceedings of the 2015 Design, Automation {\&} Test in Europe Conference {\&} Exhibition, {DATE} 2015, Grenoble, France, March 9-13, 2015}, pages = {1180--1185}, publisher = {{ACM}}, year = {2015}, url = {http://dl.acm.org/citation.cfm?id=2757085}, timestamp = {Mon, 09 Aug 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/date/GorevUD15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ddecs/KostinRUJCVP15, author = {Sergei Kostin and Jaan Raik and Raimund Ubar and Maksim Jenihhin and Thiago Copetti and Fabian Vargas and Let{\'{\i}}cia Maria Bolzani P{\"{o}}hls}, editor = {Zoran Stamenkovic and Witold A. Pleskacz and Jaan Raik and Heinrich Theodor Vierhaus}, title = {SPICE-Inspired Fast Gate-Level Computation of NBTI-induced Delays in Nanoscale Logic}, booktitle = {18th {IEEE} International Symposium on Design and Diagnostics of Electronic Circuits {\&} Systems, {DDECS} 2015, Belgrade, Serbia, April 22-24, 2015}, pages = {223--228}, publisher = {{IEEE} Computer Society}, year = {2015}, url = {https://doi.org/10.1109/DDECS.2015.53}, doi = {10.1109/DDECS.2015.53}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ddecs/KostinRUJCVP15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ddecs/JasnetskiRTU15, author = {Artjom Jasnetski and Jaan Raik and Anton Tsertov and Raimund Ubar}, editor = {Zoran Stamenkovic and Witold A. Pleskacz and Jaan Raik and Heinrich Theodor Vierhaus}, title = {New Fault Models and Self-Test Generation for Microprocessors Using High-Level Decision Diagrams}, booktitle = {18th {IEEE} International Symposium on Design and Diagnostics of Electronic Circuits {\&} Systems, {DDECS} 2015, Belgrade, Serbia, April 22-24, 2015}, pages = {251--254}, publisher = {{IEEE} Computer Society}, year = {2015}, url = {https://doi.org/10.1109/DDECS.2015.56}, doi = {10.1109/DDECS.2015.56}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ddecs/JasnetskiRTU15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dsd/UbarJOJO15, author = {Raimund Ubar and Lembit Jurimagi and Elmet Orasson and Galina Josifovska and Stephen Adeboye Oyeniran}, title = {Double Phase Fault Collapsing with Linear Complexity in Digital Circuits}, booktitle = {2015 Euromicro Conference on Digital System Design, {DSD} 2015, Madeira, Portugal, August 26-28, 2015}, pages = {700--705}, publisher = {{IEEE} Computer Society}, year = {2015}, url = {https://doi.org/10.1109/DSD.2015.43}, doi = {10.1109/DSD.2015.43}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dsd/UbarJOJO15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/idt/UbarOSV15, author = {Raimund Ubar and Stephen Adeboye Oyeniran and Mario Sch{\"{o}}lzel and Heinrich Theodor Vierhaus}, title = {Multiple fault testing in systems-on-chip with high-level decision diagrams}, booktitle = {10th International Design {\&} Test Symposium, {IDT} 2015, Dead Sea, Amman, Jordan, December 14-16, 2015}, pages = {66--71}, publisher = {{IEEE}}, year = {2015}, url = {https://doi.org/10.1109/IDT.2015.7396738}, doi = {10.1109/IDT.2015.7396738}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/idt/UbarOSV15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iscas/UbarKGD15, author = {Raimund Ubar and Jaak Kousaar and Maksim Gorev and Sergei Devadze}, title = {Combinational fault simulation in sequential circuits}, booktitle = {2015 {IEEE} International Symposium on Circuits and Systems, {ISCAS} 2015, Lisbon, Portugal, May 24-27, 2015}, pages = {2876--2879}, publisher = {{IEEE}}, year = {2015}, url = {https://doi.org/10.1109/ISCAS.2015.7169287}, doi = {10.1109/ISCAS.2015.7169287}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/iscas/UbarKGD15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/KousaarUA15, author = {Jaak Kousaar and Raimund Ubar and Igor Aleksejev}, title = {Complex delay fault reasoning with sequential 7-valued algebra}, booktitle = {16th Latin-American Test Symposium, {LATS} 2015, Puerto Vallarta, Mexico, March 25-27, 2015}, pages = {1--6}, publisher = {{IEEE} Computer Society}, year = {2015}, url = {https://doi.org/10.1109/LATW.2015.7102403}, doi = {10.1109/LATW.2015.7102403}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/latw/KousaarUA15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/norchip/UbarJR15, author = {Raimund Ubar and Lembit Jurimagi and Jaan Raik}, title = {Shared Structurally Synthesized BDDs for speeding-up parallel pattern simulation in digital circuits}, booktitle = {Nordic Circuits and Systems Conference, {NORCAS} 2015: {NORCHIP} {\&} International Symposium on System-on-Chip (SoC), Oslo, Norway, October 26-28, 2015}, pages = {1--4}, publisher = {{IEEE}}, year = {2015}, url = {https://doi.org/10.1109/NORCHIP.2015.7364406}, doi = {10.1109/NORCHIP.2015.7364406}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/norchip/UbarJR15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vlsi/UbarJOR15a, author = {Raimund Ubar and Lembit J{\"{u}}rim{\"{a}}gi and Elmet Orasson and Jaan Raik}, editor = {Youngsoo Shin and Chi{-}Ying Tsui and Jae{-}Joon Kim and Kiyoung Choi and Ricardo Reis}, title = {Fault Collapsing in Digital Circuits Using Fast Fault Dominance and Equivalence Analysis with SSBDDs}, booktitle = {VLSI-SoC: Design for Reliability, Security, and Low Power - 23rd {IFIP} {WG} 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers}, series = {{IFIP} Advances in Information and Communication Technology}, volume = {483}, pages = {23--45}, publisher = {Springer}, year = {2015}, url = {https://doi.org/10.1007/978-3-319-46097-0\_2}, doi = {10.1007/978-3-319-46097-0\_2}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vlsi/UbarJOR15a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vlsi/UbarJOR15, author = {Raimund Ubar and Lembit Jurimagi and Elmet Orasson and Jaan Raik}, title = {Scalable algorithm for structural fault collapsing in digital circuits}, booktitle = {2015 {IFIP/IEEE} International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, South Korea, October 5-7, 2015}, pages = {171--176}, publisher = {{IEEE}}, year = {2015}, url = {https://doi.org/10.1109/VLSI-SoC.2015.7314411}, doi = {10.1109/VLSI-SOC.2015.7314411}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vlsi/UbarJOR15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/dt/JenihhinTTRHUBEW14, author = {Maksim Jenihhin and Anton Tsepurov and Valentin Tihhomirov and Jaan Raik and Hanno Hantson and Raimund Ubar and Gunter Bartsch and Jorge Hern{\'{a}}n Meza Escobar and Heinz{-}Dietrich Wuttke}, title = {Automated Design Error Localization in {RTL} Designs}, journal = {{IEEE} Des. Test}, volume = {31}, number = {1}, pages = {83--92}, year = {2014}, url = {https://doi.org/10.1109/MDAT.2013.2271420}, doi = {10.1109/MDAT.2013.2271420}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/dt/JenihhinTTRHUBEW14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ddecs/UbarM14, author = {Raimund Ubar and Dmitri Mironov}, title = {Lower bounds of the size of Shared Structurally Synthesized BDDs}, booktitle = {17th International Symposium on Design and Diagnostics of Electronic Circuits {\&} Systems, {DDECS} 2014, Warsaw, Poland, 23-25 April, 2014}, pages = {77--82}, publisher = {{IEEE} Computer Society}, year = {2014}, url = {https://doi.org/10.1109/DDECS.2014.6868767}, doi = {10.1109/DDECS.2014.6868767}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ddecs/UbarM14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dsd/KousaarUDR14, author = {Jaak Kousaar and Raimund Ubar and Sergei Devadze and Jaan Raik}, title = {Critical Path Tracing Based Simulation of Transition Delay Faults}, booktitle = {17th Euromicro Conference on Digital System Design, {DSD} 2014, Verona, Italy, August 27-29, 2014}, pages = {108--113}, publisher = {{IEEE} Computer Society}, year = {2014}, url = {https://doi.org/10.1109/DSD.2014.17}, doi = {10.1109/DSD.2014.17}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dsd/KousaarUDR14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ets/MironovUR14, author = {Dmitri Mironov and Raimund Ubar and Jaan Raik}, editor = {Giorgio Di Natale}, title = {Logic simulation and fault collapsing with shared structurally synthesized bdds}, booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany, May 26-30, 2014}, pages = {1--2}, publisher = {{IEEE}}, year = {2014}, url = {https://doi.org/10.1109/ETS.2014.6847825}, doi = {10.1109/ETS.2014.6847825}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ets/MironovUR14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/evoW/GaudesiJRSSTU14, author = {Marco Gaudesi and Maksim Jenihhin and Jaan Raik and Ernesto S{\'{a}}nchez and Giovanni Squillero and Valentin Tihhomirov and Raimund Ubar}, editor = {Anna Isabel Esparcia{-}Alc{\'{a}}zar and Antonio Miguel Mora}, title = {Diagnostic Test Generation for Statistical Bug Localization Using Evolutionary Computation}, booktitle = {Applications of Evolutionary Computation - 17th European Conference, EvoApplications 2014, Granada, Spain, April 23-25, 2014, Revised Selected Papers}, series = {Lecture Notes in Computer Science}, volume = {8602}, pages = {425--436}, publisher = {Springer}, year = {2014}, url = {https://doi.org/10.1007/978-3-662-45523-4\_35}, doi = {10.1007/978-3-662-45523-4\_35}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/evoW/GaudesiJRSSTU14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ewme/JasnetskiUTK14, author = {Artjom Jasnetski and Raimund Ubar and Anton Tsertov and Helena Kruus}, title = {Laboratory framework {TEAM} for investigating the dependability issues of microprocessor systems}, booktitle = {10th European Workshop on Microelectronics Education (EWME), Tallinn, Estonia, May 14-16, 2014}, pages = {80--83}, publisher = {{IEEE}}, year = {2014}, url = {https://doi.org/10.1109/EWME.2014.6877400}, doi = {10.1109/EWME.2014.6877400}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ewme/JasnetskiUTK14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ewme/VierhausSRU14, author = {Heinrich Theodor Vierhaus and Mario Sch{\"{o}}lzel and Jaan Raik and Raimund Ubar}, title = {Advanced technical education in the age of cyber physical systems}, booktitle = {10th European Workshop on Microelectronics Education (EWME), Tallinn, Estonia, May 14-16, 2014}, pages = {193--198}, publisher = {{IEEE}}, year = {2014}, url = {https://doi.org/10.1109/EWME.2014.6877424}, doi = {10.1109/EWME.2014.6877424}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ewme/VierhausSRU14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/idt/UbarMMV14, author = {Raimund Ubar and Mihhail Marenkov and Dmitri Mironov and Vladimir Viies}, title = {Modeling sequential circuits with shared structurally synthesized BDDs}, booktitle = {9th International Design and Test Symposium, {IDT} 2014, Algeries, Algeria, December 16-18, 2014}, pages = {130--135}, publisher = {{IEEE}}, year = {2014}, url = {https://doi.org/10.1109/IDT.2014.7038600}, doi = {10.1109/IDT.2014.7038600}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/idt/UbarMMV14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/KostinRUJVPC14, author = {Sergei Kostin and Jaan Raik and Raimund Ubar and Maksim Jenihhin and Fabian Vargas and Let{\'{\i}}cia Maria Bolzani Poehls and Thiago Santos Copetti}, title = {Hierarchical identification of NBTI-critical gates in nanoscale logic}, booktitle = {15th Latin American Test Workshop - {LATW} 2014, Fortaleza, Brazil, March 12-15, 2014}, pages = {1--6}, publisher = {{IEEE}}, year = {2014}, url = {https://doi.org/10.1109/LATW.2014.6841926}, doi = {10.1109/LATW.2014.6841926}, timestamp = {Fri, 03 Sep 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/KostinRUJVPC14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/UbarTJB14, author = {Raimund Ubar and Anton Tsertov and Artjom Jasnetski and Marina Brik}, title = {Software-based self-test generation for microprocessors with high-level decision diagrams}, booktitle = {15th Latin American Test Workshop - {LATW} 2014, Fortaleza, Brazil, March 12-15, 2014}, pages = {1--6}, publisher = {{IEEE}}, year = {2014}, url = {https://doi.org/10.1109/LATW.2014.6841923}, doi = {10.1109/LATW.2014.6841923}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/UbarTJB14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mam/RaikRCHUJ13, author = {Jaan Raik and Urmas Repinski and Anton Chepurov and Hanno Hantson and Raimund Ubar and Maksim Jenihhin}, title = {Automated design error debug using high-level decision diagrams and mutation operators}, journal = {Microprocess. Microsystems}, volume = {37}, number = {4-5}, pages = {505--513}, year = {2013}, url = {https://doi.org/10.1016/j.micpro.2012.11.004}, doi = {10.1016/J.MICPRO.2012.11.004}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mam/RaikRCHUJ13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/tbe/FridolinKKU13, author = {Ivo Fridolin and Deniss Karai and Sergei Kostin and Raimund Ubar}, title = {Accurate Dialysis Dose Evaluation and Extrapolation Algorithms During Online Optical Dialysis Monitoring}, journal = {{IEEE} Trans. Biomed. Eng.}, volume = {60}, number = {5}, pages = {1371--1377}, year = {2013}, url = {https://doi.org/10.1109/TBME.2012.2234458}, doi = {10.1109/TBME.2012.2234458}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/tbe/FridolinKKU13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dsd/UbarVJRKP13, author = {Raimund Ubar and Fabian Vargas and Maksim Jenihhin and Jaan Raik and Sergei Kostin and Let{\'{\i}}cia Maria Bolzani Poehls}, title = {Identifying NBTI-Critical Paths in Nanoscale Logic}, booktitle = {2013 Euromicro Conference on Digital System Design, {DSD} 2013, Los Alamitos, CA, USA, September 4-6, 2013}, pages = {136--141}, publisher = {{IEEE} Computer Society}, year = {2013}, url = {https://doi.org/10.1109/DSD.2013.23}, doi = {10.1109/DSD.2013.23}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dsd/UbarVJRKP13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dtis/UbarKR13, author = {Raimund Ubar and Sergei Kostin and Jaan Raik}, title = {Synthesis of multiple fault oriented test groups from single fault test sets}, booktitle = {Proceedings of the 8th International Conference on Design {\&} Technology of Integrated Systems in Nanoscale Era, {DTIS} 2013, 26-28 March, 2013, Abu Dhabi, {UAE}}, pages = {98--103}, publisher = {{IEEE}}, year = {2013}, url = {https://doi.org/10.1109/DTIS.2013.6527786}, doi = {10.1109/DTIS.2013.6527786}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dtis/UbarKR13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/TihhomirovTJRU13, author = {Valentin Tihhomirov and Anton Tsepurov and Maksim Jenihhin and Jaan Raik and Raimund Ubar}, title = {Assessment of diagnostic test for automated bug localization}, booktitle = {14th Latin American Test Workshop, {LATW} 2013, Cordoba, Argentina, 3-5 April, 2013}, pages = {1--6}, publisher = {{IEEE} Computer Society}, year = {2013}, url = {https://doi.org/10.1109/LATW.2013.6562665}, doi = {10.1109/LATW.2013.6562665}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/latw/TihhomirovTJRU13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/Ubar13, author = {Raimund Ubar}, title = {Diagnostic modeling of digital systems with low- and high-level decision diagrams}, booktitle = {14th Latin American Test Workshop, {LATW} 2013, Cordoba, Argentina, 3-5 April, 2013}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2013}, url = {https://doi.org/10.1109/LATW.2013.6562656}, doi = {10.1109/LATW.2013.6562656}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/latw/Ubar13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/norchip/GorevUEDRM13, author = {Maksim Gorev and Raimund Ubar and Peeter Ellervee and Sergei Devadze and Jaan Raik and Mart Min}, title = {At-speed self-testing of high-performance pipe-lined processing architectures}, booktitle = {2013 NORCHIP, Vilnius, Lithuania, November 11-12, 2013}, pages = {1--6}, publisher = {{IEEE}}, year = {2013}, url = {https://doi.org/10.1109/NORCHIP.2013.6702000}, doi = {10.1109/NORCHIP.2013.6702000}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/norchip/GorevUEDRM13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/GuarnieriGBPFHRJU12, author = {Valerio Guarnieri and Giuseppe Di Guglielmo and Nicola Bombieri and Graziano Pravadelli and Franco Fummi and Hanno Hantson and Jaan Raik and Maksim Jenihhin and Raimund Ubar}, title = {On the Reuse of {TLM} Mutation Analysis at {RTL}}, journal = {J. Electron. Test.}, volume = {28}, number = {4}, pages = {435--448}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5303-6}, doi = {10.1007/S10836-012-5303-6}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/et/GuarnieriGBPFHRJU12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/ViilukasKRJUF12, author = {Taavi Viilukas and Anton Karputkin and Jaan Raik and Maksim Jenihhin and Raimund Ubar and Hideo Fujiwara}, title = {Identifying Untestable Faults in Sequential Circuits Using Test Path Constraints}, journal = {J. Electron. Test.}, volume = {28}, number = {4}, pages = {511--521}, year = {2012}, url = {https://doi.org/10.1007/s10836-012-5312-5}, doi = {10.1007/S10836-012-5312-5}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/et/ViilukasKRJUF12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ddecs/UbarKR12, author = {Raimund Ubar and Sergei Kostin and Jaan Raik}, editor = {Jaan Raik and Viera Stopjakov{\'{a}} and Heinrich Theodor Vierhaus and Witold A. Pleskacz and Raimund Ubar and Helena Kruus and Maksim Jenihhin}, title = {Multiple stuck-at-fault detection theorem}, booktitle = {{IEEE} 15th International Symposium on Design and Diagnostics of Electronic Circuits {\&} Systems, {DDECS} 2012, Tallinn, Estonia, April 18-20, 2012}, pages = {236--241}, publisher = {{IEEE}}, year = {2012}, url = {https://doi.org/10.1109/DDECS.2012.6219064}, doi = {10.1109/DDECS.2012.6219064}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ddecs/UbarKR12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dsd/UbarKR12, author = {Raimund Ubar and Sergei Kostin and Jaan Raik}, title = {How to Prove that a Circuit is Fault-Free?}, booktitle = {15th Euromicro Conference on Digital System Design, {DSD} 2012, Cesme, Izmir, Turkey, September 5-8, 2012}, pages = {427--430}, publisher = {{IEEE} Computer Society}, year = {2012}, url = {https://doi.org/10.1109/DSD.2012.75}, doi = {10.1109/DSD.2012.75}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dsd/UbarKR12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ets/RepinskiHJRUGPF12, author = {Urmas Repinski and Hanno Hantson and Maksim Jenihhin and Jaan Raik and Raimund Ubar and Giuseppe Di Guglielmo and Graziano Pravadelli and Franco Fummi}, title = {Combining dynamic slicing and mutation operators for {ESL} correction}, booktitle = {17th {IEEE} European Test Symposium, {ETS} 2012, Annecy, France, May 28 - June 1 2012}, pages = {1--6}, publisher = {{IEEE} Computer Society}, year = {2012}, url = {https://doi.org/10.1109/ETS.2012.6233020}, doi = {10.1109/ETS.2012.6233020}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ets/RepinskiHJRUGPF12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/isqed/KarputkinUTR12, author = {Anton Karputkin and Raimund Ubar and Mati Tombak and Jaan Raik}, editor = {Keith A. Bowman and Kamesh V. Gadepally and Pallab Chatterjee and Mark M. Budnik and Lalitha Immaneni}, title = {Automated correction of design errors by edge redirection on High-Level Decision Diagrams}, booktitle = {Thirteenth International Symposium on Quality Electronic Design, {ISQED} 2012, Santa Clara, CA, USA, March 19-21, 2012}, pages = {686--693}, publisher = {{IEEE}}, year = {2012}, url = {https://doi.org/10.1109/ISQED.2012.6187566}, doi = {10.1109/ISQED.2012.6187566}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/isqed/KarputkinUTR12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/HantsonRRJU12, author = {Hanno Hantson and Urmas Repinski and Jaan Raik and Maksim Jenihhin and Raimund Ubar}, title = {Diagnosis and correction of multiple design errors using critical path tracing and mutation analysis}, booktitle = {13th Latin American Test Workshop, {LATW} 2012, Quito, Ecuador, April 10-13, 2012}, pages = {1--6}, publisher = {{IEEE} Computer Society}, year = {2012}, url = {https://doi.org/10.1109/LATW.2012.6261234}, doi = {10.1109/LATW.2012.6261234}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/latw/HantsonRRJU12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/UbarKR12, author = {Raimund Ubar and Sergei Kostin and Jaan Raik}, title = {About robustness of test patterns regarding multiple faults}, booktitle = {13th Latin American Test Workshop, {LATW} 2012, Quito, Ecuador, April 10-13, 2012}, pages = {1--6}, publisher = {{IEEE} Computer Society}, year = {2012}, url = {https://doi.org/10.1109/LATW.2012.6261243}, doi = {10.1109/LATW.2012.6261243}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/latw/UbarKR12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/norchip/UbarIKEO12, author = {Raimund Ubar and Viljar Indus and Oliver Kalmend and Teet Evartson and Elmet Orasson}, title = {Functional Built-In Self-Test for processor cores in SoC}, booktitle = {{NORCHIP} 2012, Copenhagen, Denmark, November 12-13, 2012}, pages = {1--4}, publisher = {{IEEE}}, year = {2012}, url = {https://doi.org/10.1109/NORCHP.2012.6403148}, doi = {10.1109/NORCHP.2012.6403148}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/norchip/UbarIKEO12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@proceedings{DBLP:conf/ddecs/2012, editor = {Jaan Raik and Viera Stopjakov{\'{a}} and Heinrich Theodor Vierhaus and Witold A. Pleskacz and Raimund Ubar and Helena Kruus and Maksim Jenihhin}, title = {{IEEE} 15th International Symposium on Design and Diagnostics of Electronic Circuits {\&} Systems, {DDECS} 2012, Tallinn, Estonia, April 18-20, 2012}, publisher = {{IEEE}}, year = {2012}, url = {https://ieeexplore.ieee.org/xpl/conhome/6213418/proceeding}, isbn = {978-1-4673-1187-8}, timestamp = {Wed, 16 Oct 2019 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ddecs/2012.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/scpe/IvaskDU11, author = {Eero Ivask and Sergei Devadze and Raimund Ubar}, title = {Distributed Fault Simulation with Collaborative Load Balancing for {VLSI} Circuits}, journal = {Scalable Comput. Pract. Exp.}, volume = {12}, number = {1}, year = {2011}, url = {http://www.scpe.org/index.php/scpe/article/view/694}, timestamp = {Wed, 17 Feb 2021 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/scpe/IvaskDU11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/TsertovUJD11, author = {Anton Tsertov and Raimund Ubar and Artur Jutman and Sergei Devadze}, title = {Automatic SoC Level Test Path Synthesis Based on Partial Functional Models}, booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New Delhi, India, November 20-23, 2011}, pages = {532--538}, publisher = {{IEEE} Computer Society}, year = {2011}, url = {https://doi.org/10.1109/ATS.2011.79}, doi = {10.1109/ATS.2011.79}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/TsertovUJD11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ddecs/KostinUR11, author = {Sergei Kostin and Raimund Ubar and Jaan Raik}, editor = {Rolf Kraemer and Adam Pawlak and Andreas Steininger and Mario Sch{\"{o}}lzel and Jaan Raik and Heinrich Theodor Vierhaus}, title = {Defect-oriented module-level fault diagnosis in digital circuits}, booktitle = {14th {IEEE} International Symposium on Design and Diagnostics of Electronic Circuits {\&} Systems, {DDECS} 2011, Cottbus, Germany, April 13-15, 2011}, pages = {81--86}, publisher = {{IEEE} Computer Society}, year = {2011}, url = {https://doi.org/10.1109/DDECS.2011.5783053}, doi = {10.1109/DDECS.2011.5783053}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ddecs/KostinUR11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ddecs/KarputkinUTR11, author = {Anton Karputkin and Raimund Ubar and Mati Tombak and Jaan Raik}, editor = {Rolf Kraemer and Adam Pawlak and Andreas Steininger and Mario Sch{\"{o}}lzel and Jaan Raik and Heinrich Theodor Vierhaus}, title = {Probabilistic equivalence checking based on high-level decision diagrams}, booktitle = {14th {IEEE} International Symposium on Design and Diagnostics of Electronic Circuits {\&} Systems, {DDECS} 2011, Cottbus, Germany, April 13-15, 2011}, pages = {423--428}, publisher = {{IEEE} Computer Society}, year = {2011}, url = {https://doi.org/10.1109/DDECS.2011.5783130}, doi = {10.1109/DDECS.2011.5783130}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ddecs/KarputkinUTR11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/ReinsaluRUE11, author = {Uljana Reinsalu and Jaan Raik and Raimund Ubar and Peeter Ellervee}, title = {Fast {RTL} Fault Simulation Using Decision Diagrams and Bitwise Set Operations}, booktitle = {2011 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2011, Vancouver, BC, Canada, October 3-5, 2011}, pages = {164--170}, publisher = {{IEEE} Computer Society}, year = {2011}, url = {https://doi.org/10.1109/DFT.2011.42}, doi = {10.1109/DFT.2011.42}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dft/ReinsaluRUE11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dsd/TsertovUJD11, author = {Anton Tsertov and Raimund Ubar and Artur Jutman and Sergei Devadze}, title = {SoC and Board Modeling for Processor-Centric Board Testing}, booktitle = {14th Euromicro Conference on Digital System Design, Architectures, Methods and Tools, {DSD} 2011, August 31 - September 2, 2011, Oulu, Finland}, pages = {575--582}, publisher = {{IEEE} Computer Society}, year = {2011}, url = {https://doi.org/10.1109/DSD.2011.79}, doi = {10.1109/DSD.2011.79}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dsd/TsertovUJD11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ets/RaikRJVUF11, author = {Jaan Raik and Anna Rannaste and Maksim Jenihhin and Taavi Viilukas and Raimund Ubar and Hideo Fujiwara}, title = {Constraint-Based Hierarchical Untestability Identification for Synchronous Sequential Circuits}, booktitle = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27, 2011}, pages = {147--152}, publisher = {{IEEE} Computer Society}, year = {2011}, url = {https://doi.org/10.1109/ETS.2011.38}, doi = {10.1109/ETS.2011.38}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ets/RaikRJVUF11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ewdts/ViilukasJRUB11, author = {Taavi Viilukas and Maksim Jenihhin and Jaan Raik and Raimund Ubar and Samary Baranov}, editor = {Vladimir Hahanov and Yervant Zorian}, title = {Automated test bench generation for high-level synthesis flow {ABELITE}}, booktitle = {9th East-West Design {\&} Test Symposium, {EWDTS} 2011, Sevastopol, Ukraine, September 9-12, 2011}, pages = {13--16}, publisher = {{IEEE} Computer Society}, year = {2011}, url = {https://doi.org/10.1109/EWDTS.2011.6116601}, doi = {10.1109/EWDTS.2011.6116601}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ewdts/ViilukasJRUB11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/hldvt/KarputkinUTR11, author = {Anton Karputkin and Raimund Ubar and Mati Tombak and Jaan Raik}, editor = {Zeljko Zilic and Sandeep K. Shukla}, title = {Interactive presentation abstract: Automated correction of design errors by edge redirection on high-level decision diagrams}, booktitle = {2011 {IEEE} International High Level Design Validation and Test Workshop, {HLDVT} 2011, Napa Valley, CA, USA, November 9-11, 2011}, pages = {83}, publisher = {{IEEE} Computer Society}, year = {2011}, url = {https://doi.org/10.1109/HLDVT.2011.6113980}, doi = {10.1109/HLDVT.2011.6113980}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/hldvt/KarputkinUTR11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/GuarnieriBPFHRJ11, author = {Valerio Guarnieri and Nicola Bombieri and Graziano Pravadelli and Franco Fummi and Hanno Hantson and Jaan Raik and Maksim Jenihhin and Raimund Ubar}, title = {Mutation analysis for SystemC designs at {TLM}}, booktitle = {12th Latin American Test Workshop, {LATW} 2011, Beach of Porto de Galinhas, Brazil, March 27-30, 2011}, pages = {1--6}, publisher = {{IEEE}}, year = {2011}, url = {https://doi.org/10.1109/LATW.2011.5985925}, doi = {10.1109/LATW.2011.5985925}, timestamp = {Sun, 06 Aug 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/GuarnieriBPFHRJ11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/date/UbarDRJ10, author = {Raimund Ubar and Sergei Devadze and Jaan Raik and Artur Jutman}, editor = {Giovanni De Micheli and Bashir M. Al{-}Hashimi and Wolfgang M{\"{u}}ller and Enrico Macii}, title = {Parallel X-fault simulation with critical path tracing technique}, booktitle = {Design, Automation and Test in Europe, {DATE} 2010, Dresden, Germany, March 8-12, 2010}, pages = {879--884}, publisher = {{IEEE} Computer Society}, year = {2010}, url = {https://doi.org/10.1109/DATE.2010.5456929}, doi = {10.1109/DATE.2010.5456929}, timestamp = {Wed, 16 Oct 2019 14:14:53 +0200}, biburl = {https://dblp.org/rec/conf/date/UbarDRJ10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ddecs/ViilukasRJUK10, author = {Taavi Viilukas and Jaan Raik and Maksim Jenihhin and Raimund Ubar and Anna Krivenko}, editor = {Elena Gramatov{\'{a}} and Zdenek Kot{\'{a}}sek and Andreas Steininger and Heinrich Theodor Vierhaus and Horst Zimmermann}, title = {Constraint-based test pattern generation at the Register-Transfer Level}, booktitle = {13th {IEEE} International Symposium on Design and Diagnostics of Electronic Circuits and Systems, {DDECS} 2010, Vienna, Austria, April 14-16, 2010}, pages = {352--357}, publisher = {{IEEE} Computer Society}, year = {2010}, url = {https://doi.org/10.1109/DDECS.2010.5491752}, doi = {10.1109/DDECS.2010.5491752}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ddecs/ViilukasRJUK10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/delta/UbarDRJ10, author = {Raimund Ubar and Sergei Devadze and Jaan Raik and Artur Jutman}, title = {Fast Fault Simulation for Extended Class of Faults in Scan Path Circuits}, booktitle = {Fifth {IEEE} International Symposium on Electronic Design, Test {\&} Applications, {DELTA} 2010, Ho Chi Minh City, Vietnam, January 13-15, 2010}, pages = {14--19}, publisher = {{IEEE} Computer Society}, year = {2010}, url = {https://doi.org/10.1109/DELTA.2010.32}, doi = {10.1109/DELTA.2010.32}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/delta/UbarDRJ10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dsd/MironovUDRJ10, author = {Dmitri Mironov and Raimund Ubar and Sergei Devadze and Jaan Raik and Artur Jutman}, editor = {Sebasti{\'{a}}n L{\'{o}}pez}, title = {Structurally Synthesized Multiple Input BDDs for Speeding Up Logic-Level Simulation of Digital Circuits}, booktitle = {13th Euromicro Conference on Digital System Design, Architectures, Methods and Tools, {DSD} 2010, 1-3 September 2010, Lille, France}, pages = {658--663}, publisher = {{IEEE} Computer Society}, year = {2010}, url = {https://doi.org/10.1109/DSD.2010.27}, doi = {10.1109/DSD.2010.27}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dsd/MironovUDRJ10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ewdts/JenihhinRUS10, author = {Maksim Jenihhin and Jaan Raik and Raimund Ubar and Tatjana Shchenova}, title = {An approach for {PSL} assertion coverage analysis with high-level decision diagrams}, booktitle = {2010 East-West Design {\&} Test Symposium, {EWDTS} 2010, St. Petersburg, Russia, September 17-20, 2010}, pages = {13--16}, publisher = {{IEEE} Computer Society}, year = {2010}, url = {https://doi.org/10.1109/EWDTS.2010.5742048}, doi = {10.1109/EWDTS.2010.5742048}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ewdts/JenihhinRUS10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/idc/IvaskDU10, author = {Eero Ivask and Sergei Devadze and Raimund Ubar}, editor = {Mohammed Essaaidi and Michele Malgeri and Costin Badica}, title = {Collaborative Distributed Fault Simulation for Digital Electronic Circuits}, booktitle = {Intelligent Distributed Computing {IV} - Proceedings of the 4th International Symposium on Intelligent Distributed Computing - {IDC} 2010, Tangier, Morocco, September 2010}, volume = {315}, pages = {67--76}, year = {2010}, url = {https://doi.org/10.1007/978-3-642-15211-5\_8}, doi = {10.1007/978-3-642-15211-5\_8}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/idc/IvaskDU10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ifip5-3/IvaskDU10, author = {Eero Ivask and Sergei Devadze and Raimund Ubar}, editor = {{\'{A}}ngel Ortiz Bas and Rub{\'{e}}n Dar{\'{\i}}o Franco and Pedro G{\'{o}}mez{-}Gasquet}, title = {Collaborative Distributed Computing in the Field of Digital Electronics Testing}, booktitle = {Balanced Automation Systems for Future Manufacturing Networks - 9th {IFIP} {WG} 5.5 International Conference, {BASYS} 2010, Valencia, Spain, July 21-23, 2010. Proceedings}, series = {{IFIP} Advances in Information and Communication Technology}, volume = {322}, pages = {145--152}, publisher = {Springer}, year = {2010}, url = {https://doi.org/10.1007/978-3-642-14341-0\_17}, doi = {10.1007/978-3-642-14341-0\_17}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ifip5-3/IvaskDU10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iscas/UbarMRJ10, author = {Raimund Ubar and Dmitri Mironov and Jaan Raik and Artur Jutman}, title = {Fault collapsing with linear complexity in digital circuits}, booktitle = {International Symposium on Circuits and Systems {(ISCAS} 2010), May 30 - June 2, 2010, Paris, France}, pages = {653--656}, publisher = {{IEEE}}, year = {2010}, url = {https://doi.org/10.1109/ISCAS.2010.5537504}, doi = {10.1109/ISCAS.2010.5537504}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/iscas/UbarMRJ10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ism/WuttkeUH10, author = {Heinz{-}Dietrich Wuttke and Raimund Ubar and Karsten Henke}, title = {Remote and Virtual Laboratories in Problem-Based Learning Scenarios}, booktitle = {12th {IEEE} International Symposium on Multimedia, {ISM} 2010, Taichung, Taiwan, December 13-15, 2010}, pages = {377--382}, publisher = {{IEEE} Computer Society}, year = {2010}, url = {https://doi.org/10.1109/ISM.2010.63}, doi = {10.1109/ISM.2010.63}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ism/WuttkeUH10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/isqed/UbarMRJ10, author = {Raimund Ubar and Dmitri Mironov and Jaan Raik and Artur Jutman}, title = {Structural fault collapsing by superposition of BDDs for test generation in digital circuits}, booktitle = {11th International Symposium on Quality of Electronic Design {(ISQED} 2010), 22-24 March 2010, San Jose, CA, {USA}}, pages = {250--257}, publisher = {{IEEE}}, year = {2010}, url = {https://doi.org/10.1109/ISQED.2010.5450451}, doi = {10.1109/ISQED.2010.5450451}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/isqed/UbarMRJ10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/HantsonRJCUGF10, author = {Hanno Hantson and Jaan Raik and Maksim Jenihhin and Anton Chepurov and Raimund Ubar and Giuseppe Di Guglielmo and Franco Fummi}, title = {Mutation analysis with high-level decision diagrams}, booktitle = {11th Latin American Test Workshop, {LATW} 2010, Punta del Este, Uruguay, March 28-30, 2010}, pages = {1--6}, publisher = {{IEEE}}, year = {2010}, url = {https://doi.org/10.1109/LATW.2010.5550336}, doi = {10.1109/LATW.2010.5550336}, timestamp = {Sun, 06 Aug 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/HantsonRJCUGF10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/corr/abs-1008-0063, author = {Yuriy A. Skobtsov and D. E. Ivanov and V. Y. Skobtsov and Raimund Ubar and Jaan Raik}, title = {Evolutionary Approach to Test Generation for Functional {BIST}}, journal = {CoRR}, volume = {abs/1008.0063}, year = {2010}, url = {http://arxiv.org/abs/1008.0063}, eprinttype = {arXiv}, eprint = {1008.0063}, timestamp = {Mon, 13 Aug 2018 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/corr/abs-1008-0063.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/JenihhinRCU09, author = {Maksim Jenihhin and Jaan Raik and Anton Chepurov and Raimund Ubar}, title = {{PSL} Assertion Checking Using Temporally Extended High-Level Decision Diagrams}, journal = {J. Electron. Test.}, volume = {25}, number = {6}, pages = {289--300}, year = {2009}, url = {https://doi.org/10.1007/s10836-009-5116-4}, doi = {10.1007/S10836-009-5116-4}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/et/JenihhinRCU09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/iet-cdt/RaikGU09, author = {Jaan Raik and Vineeth Govind and Raimund Ubar}, title = {Design-for-testability-based external test and diagnosis of mesh-like network-on-a-chips}, journal = {{IET} Comput. Digit. Tech.}, volume = {3}, number = {5}, pages = {476--486}, year = {2009}, url = {https://doi.org/10.1049/iet-cdt.2008.0096}, doi = {10.1049/IET-CDT.2008.0096}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/iet-cdt/RaikGU09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dsd/UbarKR09, author = {Raimund Ubar and Sergei Kostin and Jaan Raik}, editor = {Antonio N{\'{u}}{\~{n}}ez and Pedro P. Carballo}, title = {Block-Level Fault Model-Free Debug and Diagnosis in Digital Systems}, booktitle = {12th Euromicro Conference on Digital System Design, Architectures, Methods and Tools, {DSD} 2009, 27-29 August 2009, Patras, Greece}, pages = {229--232}, publisher = {{IEEE} Computer Society}, year = {2009}, url = {https://doi.org/10.1109/DSD.2009.143}, doi = {10.1109/DSD.2009.143}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dsd/UbarKR09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/icecsys/UbarMRJ09, author = {Raimund Ubar and Dmitri Mironov and Jaan Raik and Artur Jutman}, title = {Structurally synthesized multiple input BDDs for simulation of digital circuits}, booktitle = {16th {IEEE} International Conference on Electronics, Circuits, and Systems, {ICECS} 2009, Yasmine Hammamet, Tunisia, 13-19 December, 2009}, pages = {451--454}, publisher = {{IEEE}}, year = {2009}, url = {https://doi.org/10.1109/ICECS.2009.5410895}, doi = {10.1109/ICECS.2009.5410895}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/icecsys/UbarMRJ09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/DevadzeJAU09, author = {Sergei Devadze and Artur Jutman and Igor Aleksejev and Raimund Ubar}, editor = {Gordon W. Roberts and Bill Eklow}, title = {Fast extended test access via {JTAG} and FPGAs}, booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX, USA, November 1-6, 2009}, pages = {1--7}, publisher = {{IEEE} Computer Society}, year = {2009}, url = {https://doi.org/10.1109/TEST.2009.5355668}, doi = {10.1109/TEST.2009.5355668}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/DevadzeJAU09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/DevadzeJAU09, author = {Sergei Devadze and Artur Jutman and Igor Aleksejev and Raimund Ubar}, title = {Turning {JTAG} inside out for fast extended test access}, booktitle = {10th Latin American Test Workshop, {LATW} 2009, Rio de Janeiro, Brazil, March 2-5, 2009}, pages = {1--6}, publisher = {{IEEE}}, year = {2009}, url = {https://doi.org/10.1109/LATW.2009.4813799}, doi = {10.1109/LATW.2009.4813799}, timestamp = {Sun, 06 Aug 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/DevadzeJAU09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/JenihhinRCRU09, author = {Maksim Jenihhin and Jaan Raik and Anton Chepurov and Uljana Reinsalu and Raimund Ubar}, title = {High-Level Decision Diagrams based coverage metrics for verification and test}, booktitle = {10th Latin American Test Workshop, {LATW} 2009, Rio de Janeiro, Brazil, March 2-5, 2009}, pages = {1--6}, publisher = {{IEEE}}, year = {2009}, url = {https://doi.org/10.1109/LATW.2009.4813792}, doi = {10.1109/LATW.2009.4813792}, timestamp = {Sun, 06 Aug 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/JenihhinRCRU09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/UbarKR09, author = {Raimund Ubar and Sergei Kostin and Jaan Raik}, title = {Investigations of the diagnosibility of digital networks with {BIST}}, booktitle = {10th Latin American Test Workshop, {LATW} 2009, Rio de Janeiro, Brazil, March 2-5, 2009}, pages = {1--6}, publisher = {{IEEE}}, year = {2009}, url = {https://doi.org/10.1109/LATW.2009.4813806}, doi = {10.1109/LATW.2009.4813806}, timestamp = {Sun, 06 Aug 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/UbarKR09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/mse/UbarJRKW09, author = {Raimund Ubar and Artur Jutman and Jaan Raik and Sergei Kostin and Heinz{-}Dietrich Wuttke}, title = {Diagnozer: {A} laboratory tool for teaching research in diagnosis of electronic systems}, booktitle = {{IEEE} International Conference on Microelectronic Systems Education, {MSE} '09, San Francisco, CA, USA, July 25-27, 2009}, pages = {12--15}, publisher = {{IEEE} Computer Society}, year = {2009}, url = {https://doi.org/10.1109/MSE.2009.5270842}, doi = {10.1109/MSE.2009.5270842}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/mse/UbarJRKW09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/iet-cdt/BengtssonKUJP08, author = {Tomas Bengtsson and Shashi Kumar and Raimund Ubar and Artur Jutman and Zebo Peng}, title = {Test methods for crosstalk-induced delay and glitch faults in network-on-chip interconnects implementing asynchronous communication protocols}, journal = {{IET} Comput. Digit. Tech.}, volume = {2}, number = {6}, pages = {445--460}, year = {2008}, url = {https://doi.org/10.1049/iet-cdt:20070048}, doi = {10.1049/IET-CDT:20070048}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/iet-cdt/BengtssonKUJP08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/jsa/RaikUVJ08, author = {Jaan Raik and Raimund Ubar and Taavi Viilukas and Maksim Jenihhin}, title = {Mixed hierarchical-functional fault models for targeting sequential cores}, journal = {J. Syst. Archit.}, volume = {54}, number = {3-4}, pages = {465--477}, year = {2008}, url = {https://doi.org/10.1016/j.sysarc.2007.07.003}, doi = {10.1016/J.SYSARC.2007.07.003}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/jsa/RaikUVJ08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mam/JervanOKU08, author = {Gert Jervan and Elmet Orasson and Helena Kruus and Raimund Ubar}, title = {Hybrid {BIST} optimization using reseeding and test set compaction}, journal = {Microprocess. Microsystems}, volume = {32}, number = {5-6}, pages = {254--262}, year = {2008}, url = {https://doi.org/10.1016/j.micpro.2008.03.007}, doi = {10.1016/J.MICPRO.2008.03.007}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mam/JervanOKU08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mam/UbarKR08, author = {Raimund Ubar and Sergei Kostin and Jaan Raik}, title = {Embedded fault diagnosis in digital systems with {BIST}}, journal = {Microprocess. Microsystems}, volume = {32}, number = {5-6}, pages = {279--287}, year = {2008}, url = {https://doi.org/10.1016/j.micpro.2008.03.006}, doi = {10.1016/J.MICPRO.2008.03.006}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mam/UbarKR08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/aspdac/UbarDRJ08, author = {Raimund Ubar and Sergei Devadze and Jaan Raik and Artur Jutman}, editor = {Chong{-}Min Kyung and Kiyoung Choi and Soonhoi Ha}, title = {Parallel fault backtracing for calculation of fault coverage}, booktitle = {Proceedings of the 13th Asia South Pacific Design Automation Conference, {ASP-DAC} 2008, Seoul, Korea, January 21-24, 2008}, pages = {667--672}, publisher = {{IEEE}}, year = {2008}, url = {https://doi.org/10.1109/ASPDAC.2008.4484035}, doi = {10.1109/ASPDAC.2008.4484035}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/aspdac/UbarDRJ08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/RaikFUK08, author = {Jaan Raik and Hideo Fujiwara and Raimund Ubar and Anna Krivenko}, title = {Untestable Fault Identification in Sequential Circuits Using Model-Checking}, booktitle = {17th {IEEE} Asian Test Symposium, {ATS} 2008, Sapporo, Japan, November 24-27, 2008}, pages = {21--26}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/ATS.2008.22}, doi = {10.1109/ATS.2008.22}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/RaikFUK08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ddecs/RaikRUJE08, author = {Jaan Raik and Uljana Reinsalu and Raimund Ubar and Maksim Jenihhin and Peeter Ellervee}, editor = {Bernd Straube and Milos Drutarovsk{\'{y}} and Michel Renovell and Peter Gramata and M{\'{a}}ria Fischerov{\'{a}}}, title = {Code Coverage Analysis using High-Level Decision Diagrams}, booktitle = {Proceedings of the 11th {IEEE} Workshop on Design {\&} Diagnostics of Electronic Circuits {\&} Systems {(DDECS} 2008), Bratislava, Slovakia, April 16-18, 2008}, pages = {201--206}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/DDECS.2008.4538786}, doi = {10.1109/DDECS.2008.4538786}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ddecs/RaikRUJE08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ddecs/IvaskRU08, author = {Eero Ivask and Jaan Raik and Raimund Ubar}, editor = {Bernd Straube and Milos Drutarovsk{\'{y}} and Michel Renovell and Peter Gramata and M{\'{a}}ria Fischerov{\'{a}}}, title = {Web-Based Framework for Parallel Distributed Test}, booktitle = {Proceedings of the 11th {IEEE} Workshop on Design {\&} Diagnostics of Electronic Circuits {\&} Systems {(DDECS} 2008), Bratislava, Slovakia, April 16-18, 2008}, pages = {271--274}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/DDECS.2008.4538800}, doi = {10.1109/DDECS.2008.4538800}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ddecs/IvaskRU08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ddecs/JutmanTU08, author = {Artur Jutman and Anton Tsertov and Raimund Ubar}, editor = {Bernd Straube and Milos Drutarovsk{\'{y}} and Michel Renovell and Peter Gramata and M{\'{a}}ria Fischerov{\'{a}}}, title = {Calculation of {LFSR} Seed and Polynomial Pair for {BIST} Applications}, booktitle = {Proceedings of the 11th {IEEE} Workshop on Design {\&} Diagnostics of Electronic Circuits {\&} Systems {(DDECS} 2008), Bratislava, Slovakia, April 16-18, 2008}, pages = {275--278}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/DDECS.2008.4538801}, doi = {10.1109/DDECS.2008.4538801}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ddecs/JutmanTU08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/delta/UbarDJRJE08, author = {Raimund Ubar and Sergei Devadze and Maksim Jenihhin and Jaan Raik and Gert Jervan and Peeter Ellervee}, title = {Hierarchical Calculation of Malicious Faults for Evaluating the Fault-Tolerance}, booktitle = {4th {IEEE} International Symposium on Electronic Design, Test and Applications, {DELTA} 2008, Hong Kong, January 23-25, 2008}, pages = {222--227}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/DELTA.2008.60}, doi = {10.1109/DELTA.2008.60}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/delta/UbarDJRJE08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dsd/PleskaczJRRUK08, author = {Witold A. Pleskacz and Maksim Jenihhin and Jaan Raik and Michal Rakowski and Raimund Ubar and Wieslaw Kuzmicz}, editor = {Luca Fanucci}, title = {Hierarchical Analysis of Short Defects between Metal Lines in {CMOS} {IC}}, booktitle = {11th Euromicro Conference on Digital System Design: Architectures, Methods and Tools, {DSD} 2008, Parma, Italy, September 3-5, 2008}, pages = {729--734}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/DSD.2008.98}, doi = {10.1109/DSD.2008.98}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dsd/PleskaczJRRUK08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ets/JenihhinRCU08, author = {Maksim Jenihhin and Jaan Raik and Anton Chepurov and Raimund Ubar}, title = {Temporally Extended High-Level Decision Diagrams for {PSL} Assertions Simulation}, booktitle = {13th European Test Symposium, {ETS} 2008, Verbania, Italy, May 25-29, 2008}, pages = {61--68}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/ETS.2008.22}, doi = {10.1109/ETS.2008.22}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ets/JenihhinRCU08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/icecsys/JutmanARU08, author = {Artur Jutman and Igor Aleksejev and Jaan Raik and Raimund Ubar}, title = {Reseeding using compaction of pre-generated {LFSR} sub-sequences}, booktitle = {15th {IEEE} International Conference on Electronics, Circuits and Systems, {ICECS} 2008, St. Julien's, Malta, August 31 2008-September 3, 2008}, pages = {1290--1295}, publisher = {{IEEE}}, year = {2008}, url = {https://doi.org/10.1109/ICECS.2008.4675096}, doi = {10.1109/ICECS.2008.4675096}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/icecsys/JutmanARU08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/idc/IvaskRU08, author = {Eero Ivask and Jaan Raik and Raimund Ubar}, editor = {Costin Badica and Giuseppe Mangioni and Vincenza Carchiolo and Dumitru Dan Burdescu}, title = {Distributed Approach for Genetic Test Generation in the Field of Digital Electronics}, booktitle = {Intelligent Distributed Computing, Systems and Applications, Proceedings of the 2nd International Symposium on Intelligent Distributed Computing - {IDC} 2008, Catania, Italy, 2008}, series = {Studies in Computational Intelligence}, volume = {162}, pages = {127--136}, publisher = {Springer}, year = {2008}, url = {https://doi.org/10.1007/978-3-540-85257-5\_13}, doi = {10.1007/978-3-540-85257-5\_13}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/idc/IvaskRU08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/iet-cdt/EllerveeRTU07, author = {Peeter Ellervee and Jaan Raik and Kalle Tammem{\"{a}}e and Raimund Ubar}, title = {FPGA-based fault emulation of synchronous sequential circuits}, journal = {{IET} Comput. Digit. Tech.}, volume = {1}, number = {2}, pages = {70--76}, year = {2007}, url = {https://doi.org/10.1049/iet-cdt:20050065}, doi = {10.1049/IET-CDT:20050065}, timestamp = {Tue, 14 Jul 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/iet-cdt/EllerveeRTU07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/ijoe/UbarJKODW07, author = {Raimund Ubar and Artur Jutman and Margus Kruus and Elmet Orasson and Sergei Devadze and Heinz{-}Dietrich Wuttke}, title = {Learning Digital Test and Diagnostics via Internet}, journal = {Int. J. Online Eng.}, volume = {3}, number = {1}, year = {2007}, url = {https://www.online-journals.org/index.php/i-joe/article/view/361}, timestamp = {Wed, 04 Mar 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/ijoe/UbarJKODW07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ddecs/JenihhinRUPR07, author = {Maksim Jenihhin and Jaan Raik and Raimund Ubar and Witold A. Pleskacz and Michal Rakowski}, editor = {Patrick Girard and Andrzej Krasniewski and Elena Gramatov{\'{a}} and Adam Pawlak and Tomasz Garbolino}, title = {Layout to Logic Defect Analysis for Hierarchical Test Generation}, booktitle = {Proceedings of the 10th {IEEE} Workshop on Design {\&} Diagnostics of Electronic Circuits {\&} Systems {(DDECS} 2007), Krak{\'{o}}w, Poland, April 11-13, 2007}, pages = {35--40}, publisher = {{IEEE} Computer Society}, year = {2007}, url = {https://doi.org/10.1109/DDECS.2007.4295251}, doi = {10.1109/DDECS.2007.4295251}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ddecs/JenihhinRUPR07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dsd/JervanOKU07, author = {Gert Jervan and Elmet Orasson and Helena Kruus and Raimund Ubar}, title = {Hybrid {BIST} Optimization Using Reseeding and Test Set Compaction}, booktitle = {Tenth Euromicro Conference on Digital System Design: Architectures, Methods and Tools {(DSD} 2007), 29-31 August 2007, L{\"{u}}beck, Germany}, pages = {596--603}, publisher = {{IEEE} Computer Society}, year = {2007}, url = {https://doi.org/10.1109/DSD.2007.4341529}, doi = {10.1109/DSD.2007.4341529}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dsd/JervanOKU07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dsd/UbarKREL07, author = {Raimund Ubar and Sergei Kostin and Jaan Raik and Teet Evartson and Harri Lensen}, title = {Fault Diagnosis in Integrated Circuits with {BIST}}, booktitle = {Tenth Euromicro Conference on Digital System Design: Architectures, Methods and Tools {(DSD} 2007), 29-31 August 2007, L{\"{u}}beck, Germany}, pages = {604--610}, publisher = {{IEEE} Computer Society}, year = {2007}, url = {https://doi.org/10.1109/DSD.2007.4341530}, doi = {10.1109/DSD.2007.4341530}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dsd/UbarKREL07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dsd/RaikUKK07, author = {Jaan Raik and Raimund Ubar and Anna Krivenko and Margus Kruus}, title = {Hierarchical Identification of Untestable Faults in Sequential Circuits}, booktitle = {Tenth Euromicro Conference on Digital System Design: Architectures, Methods and Tools {(DSD} 2007), 29-31 August 2007, L{\"{u}}beck, Germany}, pages = {668--671}, publisher = {{IEEE} Computer Society}, year = {2007}, url = {https://doi.org/10.1109/DSD.2007.4341539}, doi = {10.1109/DSD.2007.4341539}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/dsd/RaikUKK07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ets/RaikUG07, author = {Jaan Raik and Raimund Ubar and Vineeth Govind}, title = {Test Configurations for Diagnosing Faulty Links in NoC Switches}, booktitle = {12th European Test Symposium, {ETS} 2007, Freiburg, Germany, May 20, 2007}, pages = {29--34}, publisher = {{IEEE} Computer Society}, year = {2007}, url = {https://doi.org/10.1109/ETS.2007.41}, doi = {10.1109/ETS.2007.41}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ets/RaikUG07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ets/UbarDRJ07, author = {Raimund Ubar and Sergei Devadze and Jaan Raik and Artur Jutman}, title = {Ultra Fast Parallel Fault Analysis on Structurally Synthesized BDDs}, booktitle = {12th European Test Symposium, {ETS} 2007, Freiburg, Germany, May 20, 2007}, pages = {131--136}, publisher = {{IEEE} Computer Society}, year = {2007}, url = {https://doi.org/10.1109/ETS.2007.43}, doi = {10.1109/ETS.2007.43}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ets/UbarDRJ07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/sies/JervanKOU07, author = {Gert Jervan and Helena Kruus and Elmet Orasson and Raimund Ubar}, title = {Optimization of Memory-Constrained Hybrid {BIST} for Testing Core-Based Systems}, booktitle = {{IEEE} Second International Symposium on Industrial Embedded Systems, {SIES} 2007, Hotel Costa da Caparica, Lisbon, Portugal, July 4-6, 2007}, pages = {71--77}, publisher = {{IEEE}}, year = {2007}, url = {https://doi.org/10.1109/SIES.2007.4297319}, doi = {10.1109/SIES.2007.4297319}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/sies/JervanKOU07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/jcst/JervanEPUJ06, author = {Gert Jervan and Petru Eles and Zebo Peng and Raimund Ubar and Maksim Jenihhin}, title = {Test Time Minimization for Hybrid {BIST} of Core-Based Systems}, journal = {J. Comput. Sci. Technol.}, volume = {21}, number = {6}, pages = {907--912}, year = {2006}, url = {https://doi.org/10.1007/s11390-006-0907-x}, doi = {10.1007/S11390-006-0907-X}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/jcst/JervanEPUJ06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/RaikGU06, author = {Jaan Raik and Vineeth Govind and Raimund Ubar}, title = {An External Test Approach for Network-on-a-Chip Switches}, booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23, 2006}, pages = {437--442}, publisher = {{IEEE}}, year = {2006}, url = {https://doi.org/10.1109/ATS.2006.260967}, doi = {10.1109/ATS.2006.260967}, timestamp = {Tue, 06 Dec 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/RaikGU06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dsd/RaikUV06, author = {Jaan Raik and Raimund Ubar and Taavi Viilukas}, title = {High-Level Decision Diagram based Fault Models for Targeting FSMs}, booktitle = {Ninth Euromicro Conference on Digital System Design: Architectures, Methods and Tools {(DSD} 2006), 30 August - 1 September 2006, Dubrovnik, Croatia}, pages = {353--358}, publisher = {{IEEE} Computer Society}, year = {2006}, url = {https://doi.org/10.1109/DSD.2006.60}, doi = {10.1109/DSD.2006.60}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dsd/RaikUV06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dsd/BengtssonJKUP06, author = {Tomas Bengtsson and Artur Jutman and Shashi Kumar and Raimund Ubar and Zebo Peng}, title = {Off-Line Testing of Delay Faults in NoC Interconnects}, booktitle = {Ninth Euromicro Conference on Digital System Design: Architectures, Methods and Tools {(DSD} 2006), 30 August - 1 September 2006, Dubrovnik, Croatia}, pages = {677--680}, publisher = {{IEEE} Computer Society}, year = {2006}, url = {https://doi.org/10.1109/DSD.2006.72}, doi = {10.1109/DSD.2006.72}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dsd/BengtssonJKUP06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/PleskaczBWSJU06, author = {Witold A. Pleskacz and Tomasz Borejko and Andrzej Walkanis and Viera Stopjakov{\'{a}} and Artur Jutman and Raimund Ubar}, title = {DefSim: {CMOS} Defects on Chip for Research and Education}, booktitle = {7th Latin American Test Workshop, {LATW} 2006, Buenos Aires, Argentina, March 26-29, 2006}, pages = {74--79}, publisher = {{IEEE}}, year = {2006}, timestamp = {Tue, 05 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/PleskaczBWSJU06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/DevadzeRJU06, author = {Sergei Devadze and Jaan Raik and Artur Jutman and Raimund Ubar}, title = {Fault Simulation with Parallel Critical Path Tracing for Combinatorial Circuits Using Structurally Synthesized BDDs}, booktitle = {7th Latin American Test Workshop, {LATW} 2006, Buenos Aires, Argentina, March 26-29, 2006}, pages = {97--102}, publisher = {{IEEE}}, year = {2006}, timestamp = {Thu, 27 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/latw/DevadzeRJU06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@proceedings{DBLP:conf/ddecs/2006, editor = {Matteo Sonza Reorda and Ondrej Nov{\'{a}}k and Bernd Straube and Hana Kub{\'{a}}tov{\'{a}} and Zdenek Kot{\'{a}}sek and Pavel Kubal{\'{\i}}k and Raimund Ubar and Jir{\'{\i}} Bucek}, title = {Proceedings of the 9th {IEEE} Workshop on Design {\&} Diagnostics of Electronic Circuits {\&} Systems {(DDECS} 2006), Prague, Czech Republic, April 18-21, 2006}, publisher = {{IEEE} Computer Society}, year = {2006}, url = {https://ieeexplore.ieee.org/xpl/conhome/10974/proceeding}, isbn = {1-4244-0185-2}, timestamp = {Wed, 16 Oct 2019 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ddecs/2006.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/RaikNU05, author = {Jaan Raik and Tanel N{\~{o}}mmeots and Raimund Ubar}, title = {A New Testability Calculation Method to Guide {RTL} Test Generation}, journal = {J. Electron. Test.}, volume = {21}, number = {1}, pages = {71--82}, year = {2005}, url = {https://doi.org/10.1007/s10836-005-5288-5}, doi = {10.1007/S10836-005-5288-5}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/et/RaikNU05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dsd/RaikETU05, author = {Jaan Raik and Peeter Ellervee and Valentin Tihhomirov and Raimund Ubar}, title = {Improved Fault Emulation for Synchronous Sequential Circuits}, booktitle = {Eighth Euromicro Symposium on Digital Systems Design {(DSD} 2005), 30 August - 3 September 2005, Porto, Portugal}, pages = {72--78}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/DSD.2005.50}, doi = {10.1109/DSD.2005.50}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dsd/RaikETU05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dsd/SudbrockRUKP05, author = {Joachim Sudbrock and Jaan Raik and Raimund Ubar and Wieslaw Kuzmicz and Witold A. Pleskacz}, title = {Defect-Oriented Test- and Layout-Generation for Standard-Cell {ASIC} Designs}, booktitle = {Eighth Euromicro Symposium on Digital Systems Design {(DSD} 2005), 30 August - 3 September 2005, Porto, Portugal}, pages = {79--82}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/DSD.2005.30}, doi = {10.1109/DSD.2005.30}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dsd/SudbrockRUKP05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dsd/JutmanRUV05, author = {Artur Jutman and Jaan Raik and Raimund Ubar and V. Vislogubov}, title = {An Educational Environment for Digital Testing: Hardware, Tools, and Web-Based Runtime Platform}, booktitle = {Eighth Euromicro Symposium on Digital Systems Design {(DSD} 2005), 30 August - 3 September 2005, Porto, Portugal}, pages = {412--419}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/DSD.2005.15}, doi = {10.1109/DSD.2005.15}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dsd/JutmanRUV05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/edcc/RaikUDJ05, author = {Jaan Raik and Raimund Ubar and Sergei Devadze and Artur Jutman}, editor = {Mario Dal Cin and Mohamed Ka{\^{a}}niche and Andr{\'{a}}s Pataricza}, title = {Efficient Single-Pattern Fault Simulation on Structurally Synthesized BDDs}, booktitle = {Dependable Computing - EDCC-5, 5th European Dependable Computing Conference, Budapest, Hungary, April 20-22, 2005, Proceedings}, series = {Lecture Notes in Computer Science}, volume = {3463}, pages = {332--344}, publisher = {Springer}, year = {2005}, url = {https://doi.org/10.1007/11408901\_25}, doi = {10.1007/11408901\_25}, timestamp = {Tue, 14 May 2019 10:00:54 +0200}, biburl = {https://dblp.org/rec/conf/edcc/RaikUDJ05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ets/UbarSJP05, author = {Raimund Ubar and Tatjana Shchenova and Gert Jervan and Zebo Peng}, title = {Energy minimization for hybrid {BIST} in a system-on-chip test environment}, booktitle = {10th European Test Symposium, {ETS} 2005, Tallinn, Estonia, May 22-25, 2005}, pages = {2--7}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/ETS.2005.16}, doi = {10.1109/ETS.2005.16}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ets/UbarSJP05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ets/RaikUSKP05, author = {Jaan Raik and Raimund Ubar and Joachim Sudbrock and Wieslaw Kuzmicz and Witold A. Pleskacz}, title = {{DOT:} new deterministic defect-oriented {ATPG} tool}, booktitle = {10th European Test Symposium, {ETS} 2005, Tallinn, Estonia, May 22-25, 2005}, pages = {96--101}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/ETS.2005.15}, doi = {10.1109/ETS.2005.15}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ets/RaikUSKP05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/dt/HahanovUM04, author = {Vladimir Hahanov and Raimund Ubar and Subhasish Mitra}, title = {Conference Reports}, journal = {{IEEE} Des. Test Comput.}, volume = {21}, number = {6}, pages = {594--595}, year = {2004}, url = {https://doi.org/10.1109/MDT.2004.82}, doi = {10.1109/MDT.2004.82}, timestamp = {Sun, 17 May 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/dt/HahanovUM04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/compsystech/JutmanSUW04, author = {Artur Jutman and Alexander Sudnitson and Raimund Ubar and Heinz{-}Dietrich Wuttke}, editor = {Kiril Boyanov}, title = {Asynchronous e-learning resources for hardware design issues}, booktitle = {Proceedings of the 5th International Conference on Computer Systems and Technologies, CompSysTech 2004, Rousse, Bulgaria, June 17-18, 2004}, pages = {1--6}, publisher = {{ACM}}, year = {2004}, url = {https://doi.org/10.1145/1050330.1050420}, doi = {10.1145/1050330.1050420}, timestamp = {Tue, 31 May 2022 15:40:03 +0200}, biburl = {https://dblp.org/rec/conf/compsystech/JutmanSUW04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/delta/UbarJ04, author = {Raimund Ubar and Maksim Jenihhin}, title = {Hybrid {BIST} Optimization for Core-based Systems with Test Pattern Broadcasting}, booktitle = {2nd {IEEE} International Workshop on Electronic Design, Test and Applications {(DELTA} 2004), 28-30 January 2004, Perth, Australia}, pages = {3--8}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/DELTA.2004.10057}, doi = {10.1109/DELTA.2004.10057}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/delta/UbarJ04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ifip5-5/IvaskRUS04, author = {Eero Ivask and Jaan Raik and Raimund Ubar and Andr{\'{e}} Schneider}, editor = {Luis M. Camarinha{-}Matos}, title = {Web-Based Environment for Digital Electronics Test Tools}, booktitle = {Virtual Enterprises and Collaborative Networks, {IFIP} 18th World Computer Congress, {TC5} / {WG5.5} - 5th Working Conference on Virtual Enterprises, 22-27 August 2004, Toulouse, France}, series = {{IFIP}}, volume = {149}, pages = {435--442}, publisher = {Kluwer/springer}, year = {2004}, url = {https://doi.org/10.1007/1-4020-8139-1\_46}, doi = {10.1007/1-4020-8139-1\_46}, timestamp = {Sun, 21 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ifip5-5/IvaskRUS04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/dt/HahanovU03, author = {Vladimir Hahanov and Raimund Ubar}, title = {Conference Reports}, journal = {{IEEE} Des. Test Comput.}, volume = {20}, number = {6}, pages = {103}, year = {2003}, timestamp = {Sun, 17 May 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/dt/HahanovU03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/Ubar03, author = {Raimund Ubar}, title = {Design Error Diagnosis with Re-Synthesis in Combinational Circuits}, journal = {J. Electron. Test.}, volume = {19}, number = {1}, pages = {73--82}, year = {2003}, url = {https://doi.org/10.1023/A:1021948013402}, doi = {10.1023/A:1021948013402}, timestamp = {Fri, 11 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/Ubar03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/JervanEPUJ03, author = {Gert Jervan and Petru Eles and Zebo Peng and Raimund Ubar and Maksim Jenihhin}, title = {Test Time Minimization for Hybrid {BIST} of Core-Based Systems}, booktitle = {12th Asian Test Symposium {(ATS} 2003), 17-19 November 2003, Xian, China}, pages = {318--325}, publisher = {{IEEE} Computer Society}, year = {2003}, url = {https://doi.org/10.1109/ATS.2003.1250830}, doi = {10.1109/ATS.2003.1250830}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/JervanEPUJ03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/JervanEPUJ03, author = {Gert Jervan and Petru Eles and Zebo Peng and Raimund Ubar and Maksim Jenihhin}, title = {Hybrid {BIST} Time Minimization for Core-Based Systems with {STUMPS} Architecture}, booktitle = {18th {IEEE} International Symposium on Defect and Fault-Tolerance in {VLSI} Systems {(DFT} 2003), 3-5 November 2003, Boston, MA, USA, Proceedings}, pages = {225}, publisher = {{IEEE} Computer Society}, year = {2003}, url = {https://doi.org/10.1109/DFTVS.2003.1250116}, doi = {10.1109/DFTVS.2003.1250116}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dft/JervanEPUJ03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dsd/HahanovUH03, author = {Vladimir Hahanov and Raimund Ubar and Stanley Hyduke}, title = {Back-Traced Deductive-Parallel Fault Simulation for Digital Systems}, booktitle = {2003 Euromicro Symposium on Digital Systems Design {(DSD} 2003), Architectures, Methods and Tools, 3-5 September 2003, Belek-Antalya, Turkey}, pages = {370--377}, publisher = {{IEEE} Computer Society}, year = {2003}, url = {https://doi.org/10.1109/DSD.2003.1231969}, doi = {10.1109/DSD.2003.1231969}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dsd/HahanovUH03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@incollection{DBLP:books/sp/03/UbarR03, author = {Raimund Ubar and Jaan Raik}, editor = {Axel Jantsch and Hannu Tenhunen}, title = {Testing Strategies for Networks on Chip}, booktitle = {Networks on Chip}, pages = {131--152}, publisher = {Kluwer / Springer}, year = {2003}, url = {https://doi.org/10.1007/0-306-48727-6\_7}, doi = {10.1007/0-306-48727-6\_7}, timestamp = {Thu, 18 Jul 2019 19:46:19 +0200}, biburl = {https://dblp.org/rec/books/sp/03/UbarR03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CibakovaFGKPRU02, author = {T. Cib{\'{a}}kov{\'{a}} and M{\'{a}}ria Fischerov{\'{a}} and Elena Gramatov{\'{a}} and Wieslaw Kuzmicz and Witold A. Pleskacz and Jaan Raik and Raimund Ubar}, title = {Hierarchical test generation for combinational circuits with real defects coverage}, journal = {Microelectron. Reliab.}, volume = {42}, number = {7}, pages = {1141--1149}, year = {2002}, url = {https://doi.org/10.1016/S0026-2714(02)00080-X}, doi = {10.1016/S0026-2714(02)00080-X}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/CibakovaFGKPRU02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/date/SchneiderDIRUMCG02, author = {Andr{\'{e}} Schneider and Karl{-}Heinz Diener and Eero Ivask and Jaan Raik and Raimund Ubar and P. Miklos and T. Cib{\'{a}}kov{\'{a}} and Elena Gramatov{\'{a}}}, title = {Internet-Based Collaborative Test Generation with {MOSCITO}}, booktitle = {2002 Design, Automation and Test in Europe Conference and Exposition {(DATE} 2002), 4-8 March 2002, Paris, France}, pages = {221--226}, publisher = {{IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1109/DATE.2002.998273}, doi = {10.1109/DATE.2002.998273}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/date/SchneiderDIRUMCG02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/delta/UbarRIB02, author = {Raimund Ubar and Jaan Raik and Eero Ivask and Marina Brik}, title = {Multi-Level Fault Simulation of Digital Systems on Decision Diagrams}, booktitle = {1st {IEEE} International Workshop on Electronic Design, Test and Applications {(DELTA} 2002), 29-31 January 2002, Christchurch, New Zealand}, pages = {86--91}, publisher = {{IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1109/DELTA.2002.994594}, doi = {10.1109/DELTA.2002.994594}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/delta/UbarRIB02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dsd/SchneiderDIUGHKP02, author = {Andr{\'{e}} Schneider and Karl{-}Heinz Diener and Eero Ivask and Raimund Ubar and Elena Gramatov{\'{a}} and Thomas Hollstein and Wieslaw Kuzmicz and Zebo Peng}, title = {Integrated Design and Test Generation Under Internet Based Environment {MOSCITO}}, booktitle = {2002 Euromicro Symposium on Digital Systems Design {(DSD} 2002), Systems-on-Chip, 4-6 September 2002, Dortmund, Germany}, pages = {187--195}, publisher = {{IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1109/DSD.2002.1115368}, doi = {10.1109/DSD.2002.1115368}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dsd/SchneiderDIUGHKP02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/icecsys/RaikJU02, author = {Jaan Raik and Artur Jutman and Raimund Ubar}, title = {Fast static compaction of tests composed of independent sequences: basic properties and comparison of methods}, booktitle = {Proceedings of the 2002 9th {IEEE} International Conference on Electronics, Circuits and Systems, {ICECS} 2002, Dubrovnik, Croatia, September 15-18, 2002}, pages = {445--448}, publisher = {{IEEE}}, year = {2002}, url = {https://doi.org/10.1109/ICECS.2002.1046190}, doi = {10.1109/ICECS.2002.1046190}, timestamp = {Mon, 09 Aug 2021 14:54:04 +0200}, biburl = {https://dblp.org/rec/conf/icecsys/RaikJU02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/icecsys/JutmanUHS02, author = {Artur Jutman and Raimund Ubar and Vladimir Hahanov and O. Skvortsova}, title = {Practical works for on-line teaching design and test of digital circuits}, booktitle = {Proceedings of the 2002 9th {IEEE} International Conference on Electronics, Circuits and Systems, {ICECS} 2002, Dubrovnik, Croatia, September 15-18, 2002}, pages = {1223--1226}, publisher = {{IEEE}}, year = {2002}, url = {https://doi.org/10.1109/ICECS.2002.1046474}, doi = {10.1109/ICECS.2002.1046474}, timestamp = {Thu, 21 Jan 2021 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/icecsys/JutmanUHS02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/isqed/JervanPUK02, author = {Gert Jervan and Zebo Peng and Raimund Ubar and Helena Kruus}, title = {A Hybrid {BIST} Architecture and Its Optimization for SoC Testing}, booktitle = {3rd International Symposium on Quality of Electronic Design, {ISQED} 2002, San Jose, CA, USA, March 18-21, 2002}, pages = {273--279}, publisher = {{IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1109/ISQED.2002.996750}, doi = {10.1109/ISQED.2002.996750}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/isqed/JervanPUK02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/Ubar02, author = {Raimund Ubar}, title = {Testability Calculation for Digital Circuits with Decision Diagrams}, booktitle = {3rd Latin American Test Workshop, {LATW} 2002, Montevideo, Uruguay, February 10-13, 2002}, pages = {137--143}, publisher = {{IEEE}}, year = {2002}, timestamp = {Wed, 26 Jul 2023 15:57:25 +0200}, biburl = {https://dblp.org/rec/conf/latw/Ubar02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BlyzniukKKPRU01, author = {Mykola Blyzniuk and Irena Kazymyra and Wieslaw Kuzmicz and Witold A. Pleskacz and Jaan Raik and Raimund Ubar}, title = {Probabilistic analysis of {CMOS} physical defects in {VLSI} circuits for test coverage improvement}, journal = {Microelectron. Reliab.}, volume = {41}, number = {12}, pages = {2023--2040}, year = {2001}, url = {https://doi.org/10.1016/S0026-2714(01)00092-0}, doi = {10.1016/S0026-2714(01)00092-0}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BlyzniukKKPRU01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/date/UbarJP01, author = {Raimund Ubar and Artur Jutman and Zebo Peng}, editor = {Wolfgang Nebel and Ahmed Jerraya}, title = {Timing simulation of digital circuits with binary decision diagrams}, booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe, {DATE} 2001, Munich, Germany, March 12-16, 2001}, pages = {460--466}, publisher = {{IEEE} Computer Society}, year = {2001}, url = {https://doi.org/10.1109/DATE.2001.915063}, doi = {10.1109/DATE.2001.915063}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/date/UbarJP01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dsd/OrassonRUJP01, author = {Elmet Orasson and Rein Raidma and Raimund Ubar and Gert Jervan and Zebo Peng}, title = {Fast Test Cost Calculation for Hybrid {BIST} in Digital Systems}, booktitle = {Euromicro Symposium on Digital Systems Design 2001 (Euro-DSD 2001), 4-6 September 2001, Warsaw, Poland}, pages = {318--325}, publisher = {{IEEE} Computer Society}, year = {2001}, url = {https://doi.org/10.1109/DSD.2001.952315}, doi = {10.1109/DSD.2001.952315}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dsd/OrassonRUJP01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/isqed/KuzmiczPRU01, author = {Wieslaw Kuzmicz and Witold A. Pleskacz and Jaan Raik and Raimund Ubar}, title = {Defect-Oriented Fault Simulation and Test Generation in Digital Circuits}, booktitle = {2nd International Symposium on Quality of Electronic Design {(ISQED} 2001), 26-28 March 2001, San Jose, CA, {USA}}, pages = {365--371}, publisher = {{IEEE} Computer Society}, year = {2001}, url = {https://doi.org/10.1109/ISQED.2001.915257}, doi = {10.1109/ISQED.2001.915257}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/isqed/KuzmiczPRU01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/latw/Ubar01, author = {Raimund Ubar}, title = {Design Error Diagnosis in Scan-Path Designs}, booktitle = {2nd Latin American Test Workshop, {LATW} 2001, Cancun, Mexico, February 11-14, 2001}, pages = {162--168}, publisher = {{IEEE}}, year = {2001}, timestamp = {Tue, 25 Jul 2023 13:25:31 +0200}, biburl = {https://dblp.org/rec/conf/latw/Ubar01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/et/RaikU00, author = {Jaan Raik and Raimund Ubar}, title = {Fast Test Pattern Generation for Sequential Circuits Using Decision Diagram Representations}, journal = {J. Electron. Test.}, volume = {16}, number = {3}, pages = {213--226}, year = {2000}, url = {https://doi.org/10.1023/A:1008335130158}, doi = {10.1023/A:1008335130158}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/et/RaikU00.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/date/MorawiecUR00, author = {Adam Morawiec and Raimund Ubar and Jaan Raik}, editor = {Ivo Bolsens}, title = {Cycle-Based Simulation Algorithms for Digital Systems Using High-Level Decision Diagrams}, booktitle = {2000 Design, Automation and Test in Europe {(DATE} 2000), 27-30 March 2000, Paris, France}, pages = {743}, publisher = {{IEEE} Computer Society / {ACM}}, year = {2000}, url = {https://doi.org/10.1109/DATE.2000.840876}, doi = {10.1109/DATE.2000.840876}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/date/MorawiecUR00.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/JervanPU00, author = {Gert Jervan and Zebo Peng and Raimund Ubar}, title = {Test Cost Minimization for Hybrid Bist}, booktitle = {15th {IEEE} International Symposium on Defect and Fault-Tolerance in {VLSI} Systems {(DFT} 2000), 25-27 October 2000, Yamanashi, Japan, Proceedings}, pages = {283--291}, publisher = {{IEEE} Computer Society}, year = {2000}, url = {https://doi.org/10.1109/DFTVS.2000.887168}, doi = {10.1109/DFTVS.2000.887168}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dft/JervanPU00.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ets/BlyzniukCGKLPRU00, author = {Mykola Blyzniuk and T. Cib{\'{a}}kov{\'{a}} and Elena Gramatov{\'{a}} and Wieslaw Kuzmicz and M. Lobur and Witold A. Pleskacz and Jaan Raik and Raimund Ubar}, title = {Hierarchical defect-oriented fault simulation for digital circuits}, booktitle = {5th European Test Workshop, {ETW} 2000, Cascais, Portugal, May 23-26, 2000}, pages = {69--74}, publisher = {{IEEE} Computer Society}, year = {2000}, url = {https://doi.org/10.1109/ETW.2000.873781}, doi = {10.1109/ETW.2000.873781}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ets/BlyzniukCGKLPRU00.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iscas/UbarRM00, author = {Raimund Ubar and Jaan Raik and Adam Morawiec}, title = {Back-tracing and event-driven techniques in high-level simulation with decision diagrams}, booktitle = {{IEEE} International Symposium on Circuits and Systems, {ISCAS} 2000, Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31 May 2000, Proceedings}, pages = {208--211}, publisher = {{IEEE}}, year = {2000}, url = {https://doi.org/10.1109/ISCAS.2000.857064}, doi = {10.1109/ISCAS.2000.857064}, timestamp = {Fri, 13 Aug 2021 09:26:01 +0200}, biburl = {https://dblp.org/rec/conf/iscas/UbarRM00.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/isqed/UbarR00, author = {Raimund Ubar and Jaan Raik}, title = {Efficient Hierarchical Approach to Test Generation for Digital Systems}, booktitle = {1st International Symposium on Quality of Electronic Design {(ISQED} 2000), 20-22 March 2000, San Jose, CA, {USA}}, pages = {189--196}, publisher = {{IEEE} Computer Society}, year = {2000}, url = {https://doi.org/10.1109/ISQED.2000.838873}, doi = {10.1109/ISQED.2000.838873}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/isqed/UbarR00.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/date/UbarRM99, author = {Raimund Ubar and Jaan Raik and Adam Morawiec}, title = {Cycle-based Simulation with Decision Diagrams}, booktitle = {1999 Design, Automation and Test in Europe {(DATE} '99), 9-12 March 1999, Munich, Germany}, pages = {454--458}, publisher = {{IEEE} Computer Society / {ACM}}, year = {1999}, url = {https://doi.org/10.1109/DATE.1999.761165}, doi = {10.1109/DATE.1999.761165}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/date/UbarRM99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/date/RaikU99, author = {Jaan Raik and Raimund Ubar}, title = {Sequential Circuit Test Generation Using Decision Diagram Models}, booktitle = {1999 Design, Automation and Test in Europe {(DATE} '99), 9-12 March 1999, Munich, Germany}, pages = {736--740}, publisher = {{IEEE} Computer Society / {ACM}}, year = {1999}, url = {https://doi.org/10.1109/DATE.1999.761212}, doi = {10.1109/DATE.1999.761212}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/date/RaikU99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ets/RaikU99, author = {Jaan Raik and Raimund Ubar}, title = {High-level path activation technique to speed up sequential circuit test generation}, booktitle = {4th European Test Workshop, {ETW} 1999, Constance, Germany, May 25-28, 1999}, pages = {84--89}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ETW.1999.804289}, doi = {10.1109/ETW.1999.804289}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ets/RaikU99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ifip10-5/UbarB99, author = {Raimund Ubar and Dominique Borrione}, editor = {L. Miguel Silveira and Srinivas Devadas and Ricardo Augusto da Luz Reis}, title = {Design Error Diagnosis in Digital Circuits without Error Model}, booktitle = {{VLSI:} Systems on a Chip, {IFIP} {TC10/WG10.5} Tenth International Conference on Very Large Scale Integration {(VLSI} '99), December 1-4, 1999, Lisbon, Portugal}, series = {{IFIP} Conference Proceedings}, volume = {162}, pages = {281--292}, publisher = {Kluwer}, year = {1999}, timestamp = {Mon, 14 Oct 2002 13:30:59 +0200}, biburl = {https://dblp.org/rec/conf/ifip10-5/UbarB99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/sbcci/UbarB98, author = {Raimund Ubar and Dominique Borrione}, title = {Generation of Tests for the Localization of Single Gate Design Errors in Combinational Circuits using the Stuck-at Fault Model}, booktitle = {Proceedings of the 11th Annual Symposium on Integrated Circuits Design, {SBCCI} 1998, Rio de Janiero, Brazil, September 30 - October 2, 1998}, pages = {51--54}, publisher = {{IEEE} Computer Society}, year = {1998}, url = {https://doi.ieeecomputersociety.org/10.1109/SBCCI.1998.715409}, doi = {10.1109/SBCCI.1998.715409}, timestamp = {Fri, 27 May 2022 10:20:08 +0200}, biburl = {https://dblp.org/rec/conf/sbcci/UbarB98.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/date/BensoPRRU97, author = {Alfredo Benso and Paolo Prinetto and Maurizio Rebaudengo and Matteo Sonza Reorda and Raimund Ubar}, title = {A new approach to build a low-level malicious fault list starting from high-level description and alternative graphs}, booktitle = {European Design and Test Conference, ED{\&}TC '97, Paris, France, 17-20 March 1997}, pages = {560--565}, publisher = {{IEEE} Computer Society}, year = {1997}, url = {https://doi.org/10.1109/EDTC.1997.582417}, doi = {10.1109/EDTC.1997.582417}, timestamp = {Fri, 20 May 2022 15:59:03 +0200}, biburl = {https://dblp.org/rec/conf/date/BensoPRRU97.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/dft/BensoPRRRU97, author = {Alfredo Benso and Paolo Prinetto and Maurizio Rebaudengo and Matteo Sonza Reorda and Jaan Raik and Raimund Ubar}, title = {Exploiting High-Level Descriptions for Circuits Fault Tolerance Assessments}, booktitle = {1997 Workshop on Defect and Fault-Tolerance in {VLSI} Systems {(DFT} '97), 20-22 October 1997, Paris, France}, pages = {212--217}, publisher = {{IEEE} Computer Society}, year = {1997}, url = {https://doi.org/10.1109/DFTVS.1997.628327}, doi = {10.1109/DFTVS.1997.628327}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/dft/BensoPRRRU97.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/dt/Ubar96, author = {Raimund Ubar}, title = {Test Synthesis with Alternative Graphs}, journal = {{IEEE} Des. Test Comput.}, volume = {13}, number = {1}, pages = {48--57}, year = {1996}, url = {https://doi.org/10.1109/54.485782}, doi = {10.1109/54.485782}, timestamp = {Sun, 17 May 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/dt/Ubar96.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/edcc/UbarB96, author = {Raimund Ubar and Marina Brik}, editor = {Andrzej Hlawiczka and Jo{\~{a}}o Gabriel Silva and Luca Simoncini}, title = {Multi-Level Test Generation and Fault Diagnosis for Finite State Machines}, booktitle = {Dependable Computing - EDCC-2, Second European Dependable Computing Conference, Taormina, Italy, October 2-4, 1996, Proceedings}, series = {Lecture Notes in Computer Science}, volume = {1150}, pages = {264--282}, publisher = {Springer}, year = {1996}, url = {https://doi.org/10.1007/3-540-61772-8\_43}, doi = {10.1007/3-540-61772-8\_43}, timestamp = {Tue, 14 May 2019 10:00:54 +0200}, biburl = {https://dblp.org/rec/conf/edcc/UbarB96.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/edcc/Ubar94, author = {Raimund Ubar}, editor = {Klaus Echtle and Dieter K. Hammer and David Powell}, title = {Test Generation for Digital Systems Based on Alternative Graphs}, booktitle = {Dependable Computing - EDCC-1, First European Dependable Computing Conference, Berlin, Germany, October 4-6, 1994, Proceedings}, series = {Lecture Notes in Computer Science}, volume = {852}, pages = {151--164}, publisher = {Springer}, year = {1994}, url = {https://doi.org/10.1007/3-540-58426-9\_129}, doi = {10.1007/3-540-58426-9\_129}, timestamp = {Tue, 14 May 2019 10:00:54 +0200}, biburl = {https://dblp.org/rec/conf/edcc/Ubar94.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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