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ORCIDBibTeX records: Jerzy Tyszer
@article{DBLP:journals/dt/RajskiCCEMT24,
author = {Janusz Rajski and
Vivek Chickermane and
Jean{-}Fran{\c{c}}ois C{\^{o}}t{\'{e}} and
Stephan Eggersgl{\"{u}}{\ss} and
Nilanjan Mukherjee and
Jerzy Tyszer},
title = {The Future of Design for Test and Silicon Lifecycle Management},
journal = {{IEEE} Des. Test},
volume = {41},
number = {4},
pages = {35--49},
year = {2024},
url = {https://doi.org/10.1109/MDAT.2023.3335195},
doi = {10.1109/MDAT.2023.3335195},
timestamp = {Fri, 02 Aug 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/RajskiCCEMT24.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/RajskiTTW24,
author = {Janusz Rajski and
Maciej Trawka and
Jerzy Tyszer and
Bartosz Wlodarczak},
title = {H\({}_{\mbox{2}}\)B: Crypto Hash Functions Based on Hybrid Ring Generators},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {43},
number = {2},
pages = {442--455},
year = {2024},
url = {https://doi.org/10.1109/TCAD.2023.3320633},
doi = {10.1109/TCAD.2023.3320633},
timestamp = {Thu, 29 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/RajskiTTW24.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/RajskiTTW23,
author = {Janusz Rajski and
Maciej Trawka and
Jerzy Tyszer and
Bartosz Wlodarczak},
title = {A Lightweight True Random Number Generator for Root of Trust Applications},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {42},
number = {9},
pages = {2815--2825},
year = {2023},
url = {https://doi.org/10.1109/TCAD.2023.3237957},
doi = {10.1109/TCAD.2023.3237957},
timestamp = {Thu, 14 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/RajskiTTW23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MrugalskiRTW23,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer and
Bartosz Wlodarczak},
title = {X-Masking for Deterministic In-System Tests},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {42},
number = {11},
pages = {4260--4269},
year = {2023},
url = {https://doi.org/10.1109/TCAD.2023.3261781},
doi = {10.1109/TCAD.2023.3261781},
timestamp = {Thu, 09 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/MrugalskiRTW23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/EggersglussMRT23,
author = {Stephan Eggersgl{\"{u}}{\ss} and
Sylwester Milewski and
Janusz Rajski and
Jerzy Tyszer},
title = {A New Static Compaction of Deterministic Test Sets},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {31},
number = {4},
pages = {411--420},
year = {2023},
url = {https://doi.org/10.1109/TVLSI.2023.3240246},
doi = {10.1109/TVLSI.2023.3240246},
timestamp = {Sat, 29 Apr 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tvlsi/EggersglussMRT23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/RajskiTTW23,
author = {Janusz Rajski and
Maciej Trawka and
Jerzy Tyszer and
Bartosz Wlodarczak},
title = {Hybrid Ring Generators for In-System Test Applications},
booktitle = {{IEEE} European Test Symposium, {ETS} 2023, Venezia, Italy, May 22-26,
2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ETS56758.2023.10174093},
doi = {10.1109/ETS56758.2023.10174093},
timestamp = {Fri, 14 Jul 2023 22:01:39 +0200},
biburl = {https://dblp.org/rec/conf/ets/RajskiTTW23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/KaczmarekM0PR0T22,
author = {Bartosz Kaczmarek and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Artur Pogiel and
Janusz Rajski and
Lukasz Rybak and
Jerzy Tyszer},
title = {{LBIST} for Automotive ICs With Enhanced Test Generation},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {41},
number = {7},
pages = {2290--2300},
year = {2022},
url = {https://doi.org/10.1109/TCAD.2021.3100741},
doi = {10.1109/TCAD.2021.3100741},
timestamp = {Tue, 28 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/KaczmarekM0PR0T22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/MrugalskiRTW22,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer and
Bartosz Wlodarczak},
title = {X-Masking for In-System Deterministic Test},
booktitle = {{IEEE} European Test Symposium, {ETS} 2022, Barcelona, Spain, May
23-27, 2022},
pages = {1--6},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ETS54262.2022.9810407},
doi = {10.1109/ETS54262.2022.9810407},
timestamp = {Tue, 05 Jul 2022 16:47:06 +0200},
biburl = {https://dblp.org/rec/conf/ets/MrugalskiRTW22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MrugalskiRTW22,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer and
Bartosz Wlodarczak},
title = {{DIST:} Deterministic In-System Test with X-masking},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {20--27},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00008},
doi = {10.1109/ITC50671.2022.00008},
timestamp = {Thu, 05 Jan 2023 13:13:27 +0100},
biburl = {https://dblp.org/rec/conf/itc/MrugalskiRTW22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajskiTTW22,
author = {Janusz Rajski and
Maciej Trawka and
Jerzy Tyszer and
Bartosz Wlodarczak},
title = {Hardware Root of Trust for SSN-basedDFT Ecosystems},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {479--483},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00056},
doi = {10.1109/ITC50671.2022.00056},
timestamp = {Sun, 04 Aug 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/RajskiTTW22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tetc/ChengMMRTT21,
author = {Wu{-}Tung Cheng and
Sylwester Milewski and
Grzegorz Mrugalski and
Janusz Rajski and
Maciej Trawka and
Jerzy Tyszer},
title = {Autonomous Scan Patterns for Laser Voltage Imaging},
journal = {{IEEE} Trans. Emerg. Top. Comput.},
volume = {9},
number = {2},
pages = {680--691},
year = {2021},
url = {https://doi.org/10.1109/TETC.2019.2944590},
doi = {10.1109/TETC.2019.2944590},
timestamp = {Tue, 15 Jun 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tetc/ChengMMRTT21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/MukherjeeTSLMMM21,
author = {Nilanjan Mukherjee and
Daniel Tille and
Mahendar Sapati and
Yingdi Liu and
Jeffrey Mayer and
Sylwester Milewski and
Elham K. Moghaddam and
Janusz Rajski and
Jedrzej Solecki and
Jerzy Tyszer},
title = {Time and Area Optimized Testing of Automotive ICs},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {29},
number = {1},
pages = {76--88},
year = {2021},
url = {https://doi.org/10.1109/TVLSI.2020.3025138},
doi = {10.1109/TVLSI.2020.3025138},
timestamp = {Thu, 11 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tvlsi/MukherjeeTSLMMM21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/LiuMMMRTW21,
author = {Yingdi Liu and
Sylwester Milewski and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer and
Bartosz Wlodarczak},
title = {X-Tolerant Compactor maXpress for In-System Test Applications With
Observation Scan},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {29},
number = {8},
pages = {1553--1566},
year = {2021},
url = {https://doi.org/10.1109/TVLSI.2021.3092421},
doi = {10.1109/TVLSI.2021.3092421},
timestamp = {Thu, 12 Aug 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tvlsi/LiuMMMRTW21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/GrzelakKPRT21,
author = {Bartosz Grzelak and
Martin Keim and
Artur Pogiel and
Janusz Rajski and
Jerzy Tyszer},
title = {Convolutional Compaction-Based {MRAM} Fault Diagnosis},
booktitle = {26th {IEEE} European Test Symposium, {ETS} 2021, Bruges, Belgium,
May 24-28, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ETS50041.2021.9465464},
doi = {10.1109/ETS50041.2021.9465464},
timestamp = {Fri, 02 Jul 2021 14:14:26 +0200},
biburl = {https://dblp.org/rec/conf/ets/GrzelakKPRT21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/EggersglussMRT21,
author = {Stephan Eggersgl{\"{u}}{\ss} and
Sylwester Milewski and
Janusz Rajski and
Jerzy Tyszer},
title = {On Reduction of Deterministic Test Pattern Sets},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {260--267},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00035},
doi = {10.1109/ITC50571.2021.00035},
timestamp = {Mon, 29 Nov 2021 13:19:22 +0100},
biburl = {https://dblp.org/rec/conf/itc/EggersglussMRT21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/ChengMRTT20,
author = {Wu{-}Tung Cheng and
Grzegorz Mrugalski and
Janusz Rajski and
Maciej Trawka and
Jerzy Tyszer},
title = {Scan Integrity Tests for {EDT} Compression},
journal = {{IEEE} Des. Test},
volume = {37},
number = {4},
pages = {21--26},
year = {2020},
url = {https://doi.org/10.1109/MDAT.2020.2968271},
doi = {10.1109/MDAT.2020.2968271},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/ChengMRTT20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/Liu0RRT20,
author = {Yingdi Liu and
Nilanjan Mukherjee and
Janusz Rajski and
Sudhakar M. Reddy and
Jerzy Tyszer},
title = {Deterministic Stellar {BIST} for Automotive ICs},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {39},
number = {8},
pages = {1699--1710},
year = {2020},
url = {https://doi.org/10.1109/TCAD.2019.2925353},
doi = {10.1109/TCAD.2019.2925353},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/Liu0RRT20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/HuangMRTW20,
author = {Yu Huang and
Sylwester Milewski and
Janusz Rajski and
Jerzy Tyszer and
Chen Wang},
title = {Low Cost Hypercompression of Test Data},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {39},
number = {10},
pages = {2964--2975},
year = {2020},
url = {https://doi.org/10.1109/TCAD.2019.2945760},
doi = {10.1109/TCAD.2019.2945760},
timestamp = {Tue, 06 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/HuangMRTW20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/KaczmarekM0RRT20,
author = {Bartosz Kaczmarek and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Lukasz Rybak and
Jerzy Tyszer},
title = {Test Sequence-Optimized {BIST} for Automotive Applications},
booktitle = {{IEEE} European Test Symposium, {ETS} 2020, Tallinn, Estonia, May
25-29, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ETS48528.2020.9131585},
doi = {10.1109/ETS48528.2020.9131585},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/KaczmarekM0RRT20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuMM0RTW20,
author = {Yingdi Liu and
Sylwester Milewski and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer and
Bartosz Wldarczak},
title = {X-Tolerant Tunable Compactor for In-System Test},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325266},
doi = {10.1109/ITC44778.2020.9325266},
timestamp = {Mon, 25 Jan 2021 08:44:58 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuMM0RTW20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MoghaddamMRSTZ19,
author = {Elham K. Moghaddam and
Nilanjan Mukherjee and
Janusz Rajski and
Jedrzej Solecki and
Jerzy Tyszer and
Justyna Zawada},
title = {Logic {BIST} With Capture-Per-Clock Hybrid Test Points},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {38},
number = {6},
pages = {1028--1041},
year = {2019},
url = {https://doi.org/10.1109/TCAD.2018.2834441},
doi = {10.1109/TCAD.2018.2834441},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/MoghaddamMRSTZ19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MukherjeeTTSLMM19,
author = {Nilanjan Mukherjee and
Jerzy Tyszer and
Daniel Tille and
Mahendar Sapati and
Yingdi Liu and
Jeffrey Mayer and
Sylwester Milewski and
Elham K. Moghaddam and
Janusz Rajski and
Jedrzej Solecki},
title = {Test Time and Area Optimized BrST Scheme for Automotive ICs},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000133},
doi = {10.1109/ITC44170.2019.9000133},
timestamp = {Mon, 24 Feb 2020 17:28:46 +0100},
biburl = {https://dblp.org/rec/conf/itc/MukherjeeTTSLMM19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChengMRTT19,
author = {Wu{-}Tung Cheng and
Grzegorz Mrugalski and
Janusz Rajski and
Maciej Trawka and
Jerzy Tyszer},
title = {On Cyclic Scan Integrity Tests for EDT-based Compression},
booktitle = {37th {IEEE} {VLSI} Test Symposium, {VTS} 2019, Monterey, CA, USA,
April 23-25, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/VTS.2019.8758670},
doi = {10.1109/VTS.2019.8758670},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/ChengMRTT19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/ChenMMRTZ18,
author = {Michael Chen and
Elham K. Moghaddam and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer and
Justyna Zawada},
title = {Hardware Protection via Logic Locking Test Points},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {37},
number = {12},
pages = {3020--3030},
year = {2018},
url = {https://doi.org/10.1109/TCAD.2018.2801240},
doi = {10.1109/TCAD.2018.2801240},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/ChenMMRTZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/0005MRT018,
author = {Yu Huang and
Sylwester Milewski and
Janusz Rajski and
Jerzy Tyszer and
Chen Wang},
title = {Hypercompression of Test Patterns},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--9},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624868},
doi = {10.1109/TEST.2018.8624868},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/itc/0005MRT018.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Liu0RRT18,
author = {Yingdi Liu and
Nilanjan Mukherjee and
Janusz Rajski and
Sudhakar M. Reddy and
Jerzy Tyszer},
title = {Deterministic Stellar {BIST} for In-System Automotive Test},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--9},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624872},
doi = {10.1109/TEST.2018.8624872},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Liu0RRT18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajskiTZ18,
author = {Janusz Rajski and
Jerzy Tyszer and
Justyna Zawada},
title = {On New Class of Test Points and Their Applications},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--9},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624900},
doi = {10.1109/TEST.2018.8624900},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajskiTZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LiuRRST18,
author = {Yingdi Liu and
Janusz Rajski and
Sudhakar M. Reddy and
Jedrzej Solecki and
Jerzy Tyszer},
title = {Staggered {ATPG} with capture-per-cycle observation test points},
booktitle = {36th {IEEE} {VLSI} Test Symposium, {VTS} 2018, San Francisco, CA,
USA, April 22-25, 2018},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2018},
url = {https://doi.org/10.1109/VTS.2018.8368647},
doi = {10.1109/VTS.2018.8368647},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LiuRRST18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MrugalskiRRST17,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Lukasz Rybak and
Jedrzej Solecki and
Jerzy Tyszer},
title = {Star-EDT: Deterministic On-Chip Scheme Using Compressed Test Patterns},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {36},
number = {4},
pages = {683--693},
year = {2017},
url = {https://doi.org/10.1109/TCAD.2016.2597214},
doi = {10.1109/TCAD.2016.2597214},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/MrugalskiRRST17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/MrugalskiRSTW17,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Jedrzej Solecki and
Jerzy Tyszer and
Chen Wang},
title = {Trimodal Scan-Based Test Paradigm},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {25},
number = {3},
pages = {1112--1125},
year = {2017},
url = {https://doi.org/10.1109/TVLSI.2016.2608984},
doi = {10.1109/TVLSI.2016.2608984},
timestamp = {Wed, 11 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tvlsi/MrugalskiRSTW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/AceroFLMMPRRTZ17,
author = {Cesar Acero and
Derek Feltham and
Yingdi Liu and
Elham K. Moghaddam and
Nilanjan Mukherjee and
Marek Patyra and
Janusz Rajski and
Sudhakar M. Reddy and
Jerzy Tyszer and
Justyna Zawada},
title = {Embedded Deterministic Test Points},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {25},
number = {10},
pages = {2949--2961},
year = {2017},
url = {https://doi.org/10.1109/TVLSI.2017.2717844},
doi = {10.1109/TVLSI.2017.2717844},
timestamp = {Wed, 11 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tvlsi/AceroFLMMPRRTZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/PogielRT17,
author = {Artur Pogiel and
Janusz Rajski and
Jerzy Tyszer},
title = {{ROM} fault diagnosis for O(n\({}^{\mbox{2}}\)) test algorithms},
booktitle = {22nd {IEEE} European Test Symposium, {ETS} 2017, Limassol, Cyprus,
May 22-26, 2017},
pages = {1--6},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ETS.2017.7968229},
doi = {10.1109/ETS.2017.7968229},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/ets/PogielRT17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MilewskiMRSTZ17,
author = {Sylwester Milewski and
Nilanjan Mukherjee and
Janusz Rajski and
Jedrzej Solecki and
Jerzy Tyszer and
Justyna Zawada},
title = {Full-scan {LBIST} with capture-per-cycle hybrid test points},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--9},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242036},
doi = {10.1109/TEST.2017.8242036},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/itc/MilewskiMRSTZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/AceroFPHMMNRTZ16,
author = {Cesar Acero and
Derek Feltham and
Marek Patyra and
Friedrich Hapke and
Elham K. Moghaddam and
Nilanjan Mukherjee and
Vidya Neerkundar and
Janusz Rajski and
Jerzy Tyszer and
Justyna Zawada},
title = {On New Test Points for Compact Cell-Aware Tests},
journal = {{IEEE} Des. Test},
volume = {33},
number = {6},
pages = {7--14},
year = {2016},
url = {https://doi.org/10.1109/MDAT.2016.2590980},
doi = {10.1109/MDAT.2016.2590980},
timestamp = {Fri, 13 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/dt/AceroFPHMMNRTZ16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MoghaddamMRTZ16,
author = {Elham K. Moghaddam and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer and
Justyna Zawada},
title = {On Test Points Enhancing Hardware Security},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {61--66},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.24},
doi = {10.1109/ATS.2016.24},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MoghaddamMRTZ16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuMMRRT16,
author = {Yingdi Liu and
Elham K. Moghaddam and
Nilanjan Mukherjee and
Sudhakar M. Reddy and
Janusz Rajski and
Jerzy Tyszer},
title = {Minimal area test points for deterministic patterns},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--7},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805825},
doi = {10.1109/TEST.2016.7805825},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/itc/LiuMMRRT16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MoghaddamMRTZ16,
author = {Elham K. Moghaddam and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer and
Justyna Zawada},
title = {Test point insertion in hybrid test compression/LBIST architectures},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805826},
doi = {10.1109/TEST.2016.7805826},
timestamp = {Fri, 02 Mar 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MoghaddamMRTZ16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/0004KMMRRTW15,
author = {Amit Kumar and
Mark Kassab and
Elham K. Moghaddam and
Nilanjan Mukherjee and
Janusz Rajski and
Sudhakar M. Reddy and
Jerzy Tyszer and
Chen Wang},
title = {Isometric Test Data Compression},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {34},
number = {11},
pages = {1847--1859},
year = {2015},
url = {https://doi.org/10.1109/TCAD.2015.2432133},
doi = {10.1109/TCAD.2015.2432133},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/0004KMMRRTW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/ChengDGHJKMMRT15,
author = {Wu{-}Tung Cheng and
Yan Dong and
Grady Giles and
Yu Huang and
Jakub Janicki and
Mark Kassab and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {Scan Test Bandwidth Management for Ultralarge-Scale System-on-Chip
Architectures},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {23},
number = {6},
pages = {1050--1062},
year = {2015},
url = {https://doi.org/10.1109/TVLSI.2014.2332469},
doi = {10.1109/TVLSI.2014.2332469},
timestamp = {Wed, 11 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tvlsi/ChengDGHJKMMRT15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/FilipekMMNRST15,
author = {Michal Filipek and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Benoit Nadeau{-}Dostie and
Janusz Rajski and
Jedrzej Solecki and
Jerzy Tyszer},
title = {Low-Power Programmable {PRPG} With Test Compression Capabilities},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {23},
number = {6},
pages = {1063--1076},
year = {2015},
url = {https://doi.org/10.1109/TVLSI.2014.2332465},
doi = {10.1109/TVLSI.2014.2332465},
timestamp = {Wed, 11 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tvlsi/FilipekMMNRST15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MrugalskiRSTW15,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Jedrzej Solecki and
Jerzy Tyszer and
Chen Wang},
title = {TestExpress - New Time-Effective Scan-Based Deterministic Test Paradigm},
booktitle = {24th {IEEE} Asian Test Symposium, {ATS} 2015, Mumbai, India, November
22-25, 2015},
pages = {19--24},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ATS.2015.11},
doi = {10.1109/ATS.2015.11},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MrugalskiRSTW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/KonukMMRSTZ15,
author = {Haluk Konuk and
Elham K. Moghaddam and
Nilanjan Mukherjee and
Janusz Rajski and
Deepak Solanki and
Jerzy Tyszer and
Justyna Zawada},
title = {Design for low test pattern counts},
booktitle = {Proceedings of the 52nd Annual Design Automation Conference, San Francisco,
CA, USA, June 7-11, 2015},
pages = {136:1--136:6},
publisher = {{ACM}},
year = {2015},
url = {https://doi.org/10.1145/2744769.2744817},
doi = {10.1145/2744769.2744817},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/KonukMMRSTZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AceroFHMMNPRTZ15,
author = {Cesar Acero and
Derek Feltham and
Friedrich Hapke and
Elham K. Moghaddam and
Nilanjan Mukherjee and
Vidya Neerkundar and
Marek Patyra and
Janusz Rajski and
Jerzy Tyszer and
Justyna Zawada},
title = {Embedded deterministic test points for compact cell-aware tests},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--8},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342383},
doi = {10.1109/TEST.2015.7342383},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/itc/AceroFHMMNPRTZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MrugalskiRRST15,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Lukasz Rybak and
Jedrzej Solecki and
Jerzy Tyszer},
title = {A deterministic {BIST} scheme based on EDT-compressed test patterns},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--8},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342398},
doi = {10.1109/TEST.2015.7342398},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/MrugalskiRRST15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/JanickiKMMRT14,
author = {Jakub Janicki and
Mark Kassab and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {Erratum to "Test Time Reduction in {EDT} Bandwidth Management
for SoC Designs"},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {33},
number = {1},
pages = {167},
year = {2014},
url = {https://doi.org/10.1109/TCAD.2013.2292631},
doi = {10.1109/TCAD.2013.2292631},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/JanickiKMMRT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TrawkaMMPRJT14,
author = {Maciej Trawka and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Artur Pogiel and
Janusz Rajski and
Jakub Janicki and
Jerzy Tyszer},
title = {High-Speed Serial Embedded Deterministic Test for System-on-Chip Designs},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {74--80},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.25},
doi = {10.1109/ATS.2014.25},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TrawkaMMPRJT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MilewskiMRT14,
author = {Sylwester Milewski and
Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer},
title = {Low Power Test Compression with Programmable Broadcast-Based Control},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {174--179},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.35},
doi = {10.1109/ATS.2014.35},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MilewskiMRT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/GebalaMMRT14,
author = {Marcin Gebala and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {On Using Implied Values in EDT-based Test Compression},
booktitle = {The 51st Annual Design Automation Conference 2014, {DAC} '14, San
Francisco, CA, USA, June 1-5, 2014},
pages = {11:1--11:6},
publisher = {{ACM}},
year = {2014},
url = {https://doi.org/10.1145/2593069.2593173},
doi = {10.1145/2593069.2593173},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/GebalaMMRT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ddecs/AuPRSTZ14,
author = {Albert Au and
Artur Pogiel and
Janusz Rajski and
Piotr Sydow and
Jerzy Tyszer and
Justyna Zawada},
title = {Quality assurance in memory built-in self-test tools},
booktitle = {17th International Symposium on Design and Diagnostics of Electronic
Circuits {\&} Systems, {DDECS} 2014, Warsaw, Poland, 23-25 April,
2014},
pages = {39--44},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/DDECS.2014.6868760},
doi = {10.1109/DDECS.2014.6868760},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ddecs/AuPRSTZ14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KumarKMMRRTW14,
author = {Amit Kumar and
Mark Kassab and
Elham K. Moghaddam and
Nilanjan Mukherjee and
Janusz Rajski and
Sudhakar M. Reddy and
Jerzy Tyszer and
Chen Wang},
title = {Isometric test compression with low toggling activity},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035293},
doi = {10.1109/TEST.2014.7035293},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KumarKMMRRTW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/CzyszMMRT13,
author = {Dariusz Czysz and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {On Deploying Scan Chains for Data Storage in Test Compression Environment},
journal = {{IEEE} Des. Test},
volume = {30},
number = {1},
pages = {68--76},
year = {2013},
url = {https://doi.org/10.1109/MDT.2012.2184072},
doi = {10.1109/MDT.2012.2184072},
timestamp = {Fri, 13 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/dt/CzyszMMRT13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/JanickiKMMRT13,
author = {Jakub Janicki and
Mark Kassab and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {Test Time Reduction in {EDT} Bandwidth Management for SoC Designs},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {32},
number = {11},
pages = {1776--1786},
year = {2013},
url = {https://doi.org/10.1109/TCAD.2013.2263038},
doi = {10.1109/TCAD.2013.2263038},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/JanickiKMMRT13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/TyszerFMMR13,
author = {Jerzy Tyszer and
Michal Filipek and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski},
title = {New test compression scheme based on low power {BIST}},
booktitle = {18th {IEEE} European Test Symposium, {ETS} 2013, Avignon, France,
May 27-30, 2013},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ETS.2013.6569374},
doi = {10.1109/ETS.2013.6569374},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/TyszerFMMR13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JanickiTCHKMRDG13,
author = {Jakub Janicki and
Jerzy Tyszer and
Wu{-}Tung Cheng and
Yu Huang and
Mark Kassab and
Nilanjan Mukherjee and
Janusz Rajski and
Yan Dong and
Grady Giles},
title = {{EDT} bandwidth management - Practical scenarios for large SoC designs},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651898},
doi = {10.1109/TEST.2013.6651898},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JanickiTCHKMRDG13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajskiT13,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Fault diagnosis of TSV-based interconnects in 3-D stacked designs},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651894},
doi = {10.1109/TEST.2013.6651894},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajskiT13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/JanickiKMMRT12,
author = {Jakub Janicki and
Mark Kassab and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {{EDT} Bandwidth Management in SoC Designs},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {31},
number = {12},
pages = {1894--1907},
year = {2012},
url = {https://doi.org/10.1109/TCAD.2012.2205385},
doi = {10.1109/TCAD.2012.2205385},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/JanickiKMMRT12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/JanickiTMR12,
author = {Jakub Janicki and
Jerzy Tyszer and
Grzegorz Mrugalski and
Janusz Rajski},
title = {Bandwidth-aware test compression logic for SoC designs},
booktitle = {17th {IEEE} European Test Symposium, {ETS} 2012, Annecy, France, May
28 - June 1 2012},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ETS.2012.6233003},
doi = {10.1109/ETS.2012.6233003},
timestamp = {Tue, 28 Apr 2020 11:43:43 +0200},
biburl = {https://dblp.org/rec/conf/ets/JanickiTMR12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CzyszRT12,
author = {Dariusz Czysz and
Janusz Rajski and
Jerzy Tyszer},
title = {Low power test application with selective compaction in {VLSI} designs},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401532},
doi = {10.1109/TEST.2012.6401532},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CzyszRT12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SoleckiTMMR12,
author = {Jedrzej Solecki and
Jerzy Tyszer and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski},
title = {Low power programmable {PRPG} with enhanced fault coverage gradient},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401559},
doi = {10.1109/TEST.2012.6401559},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SoleckiTMMR12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/RajskiTMN12,
author = {Janusz Rajski and
Jerzy Tyszer and
Grzegorz Mrugalski and
Benoit Nadeau{-}Dostie},
title = {Test generator with preselected toggling for low power built-in self-test},
booktitle = {30th {IEEE} {VLSI} Test Symposium, {VTS} 2012, Maui, Hawaii, USA,
23-26 April 2012},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/VTS.2012.6231071},
doi = {10.1109/VTS.2012.6231071},
timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
biburl = {https://dblp.org/rec/conf/vts/RajskiTMN12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/computer/MukherjeeRMPT11,
author = {Nilanjan Mukherjee and
Janusz Rajski and
Grzegorz Mrugalski and
Artur Pogiel and
Jerzy Tyszer},
title = {Ring Generator: An Ultimate Linear Feedback Shift Register},
journal = {Computer},
volume = {44},
number = {6},
pages = {64--71},
year = {2011},
url = {https://doi.org/10.1109/MC.2010.334},
doi = {10.1109/MC.2010.334},
timestamp = {Wed, 12 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/computer/MukherjeeRMPT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BenwareMPRST11,
author = {Brady Benware and
Grzegorz Mrugalski and
Artur Pogiel and
Janusz Rajski and
Jedrzej Solecki and
Jerzy Tyszer},
title = {Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs},
journal = {J. Electron. Test.},
volume = {27},
number = {5},
pages = {599--609},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5243-6},
doi = {10.1007/S10836-011-5243-6},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/BenwareMPRST11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MukherjeePRT11,
author = {Nilanjan Mukherjee and
Artur Pogiel and
Janusz Rajski and
Jerzy Tyszer},
title = {BIST-Based Fault Diagnosis for Read-Only Memories},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {30},
number = {7},
pages = {1072--1085},
year = {2011},
url = {https://doi.org/10.1109/TCAD.2011.2127030},
doi = {10.1109/TCAD.2011.2127030},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/MukherjeePRT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/CzyszMMRST11,
author = {Dariusz Czysz and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Przemyslaw Szczerbicki and
Jerzy Tyszer},
title = {Deterministic Clustering of Incompatible Test Cubes for Higher Power-Aware
{EDT} Compression},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {30},
number = {8},
pages = {1225--1238},
year = {2011},
url = {https://doi.org/10.1109/TCAD.2011.2126574},
doi = {10.1109/TCAD.2011.2126574},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/CzyszMMRST11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FilipekFIMRTT11,
author = {Michal Filipek and
Yoshiaki Fukui and
Hiroyuki Iwata and
Grzegorz Mrugalski and
Janusz Rajski and
Masahiro Takakura and
Jerzy Tyszer},
title = {Low Power Decompressor and {PRPG} with Constant Value Broadcast},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {84--89},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.47},
doi = {10.1109/ATS.2011.47},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FilipekFIMRTT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MrugalskiPMRTU11,
author = {Grzegorz Mrugalski and
Artur Pogiel and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer and
Pawel Urbanek},
title = {Fault Diagnosis in Memory {BIST} Environment with Non-march Tests},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {419--424},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.48},
doi = {10.1109/ATS.2011.48},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MrugalskiPMRTU11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinMMNRT11,
author = {Xijiang Lin and
Elham K. Moghaddam and
Nilanjan Mukherjee and
Benoit Nadeau{-}Dostie and
Janusz Rajski and
Jerzy Tyszer},
title = {Power Aware Embedded Test},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {511--516},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.49},
doi = {10.1109/ATS.2011.49},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinMMNRT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/BenwareMPRST11,
author = {Brady Benware and
Grzegorz Mrugalski and
Artur Pogiel and
Janusz Rajski and
Jedrzej Solecki and
Jerzy Tyszer},
title = {Diagnosis of Failing Scan Cells through Orthogonal Response Compaction},
booktitle = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27,
2011},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ETS.2011.56},
doi = {10.1109/ETS.2011.56},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/BenwareMPRST11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/CzyszMMRT11,
author = {Dariusz Czysz and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {Reduced {ATE} Interface for High Test Data Compression},
booktitle = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27,
2011},
pages = {99--104},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ETS.2011.13},
doi = {10.1109/ETS.2011.13},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/CzyszMMRT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JanickiTDKMMR11,
author = {Jakub Janicki and
Jerzy Tyszer and
Avijit Dutta and
Mark Kassab and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {{EDT} channel bandwidth management in SoC designs with pattern-independent
test access mechanism},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139170},
doi = {10.1109/TEST.2011.6139170},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JanickiTDKMMR11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/CzyszMMRT10,
author = {Dariusz Czysz and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {On Compaction Utilizing Inter and Intra-Correlation of Unknown States},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {29},
number = {1},
pages = {117--126},
year = {2010},
url = {https://doi.org/10.1109/TCAD.2009.2035550},
doi = {10.1109/TCAD.2009.2035550},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/CzyszMMRT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MukherjeePRT10,
author = {Nilanjan Mukherjee and
Artur Pogiel and
Janusz Rajski and
Jerzy Tyszer},
title = {High Volume Diagnosis in Memory {BIST} Based on Compressed Failure
Data},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {29},
number = {3},
pages = {441--453},
year = {2010},
url = {https://doi.org/10.1109/TCAD.2010.2041852},
doi = {10.1109/TCAD.2010.2041852},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/MukherjeePRT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/BenwareMPRST10,
author = {Brady Benware and
Grzegorz Mrugalski and
Artur Pogiel and
Janusz Rajski and
Jedrzej Solecki and
Jerzy Tyszer},
title = {Diagnosis of failing scan cells through orthogonal response compaction},
booktitle = {15th European Test Symposium, {ETS} 2010, Prague, Czech Republic,
May 24-28, 2010},
pages = {221--226},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ETSYM.2010.5512754},
doi = {10.1109/ETSYM.2010.5512754},
timestamp = {Tue, 28 Apr 2020 11:43:44 +0200},
biburl = {https://dblp.org/rec/conf/ets/BenwareMPRST10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KassabMMRJT10,
author = {Mark Kassab and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jakub Janicki and
Jerzy Tyszer},
editor = {Ron Press and
Erik H. Volkerink},
title = {Dynamic channel allocation for higher {EDT} compression in SoC designs},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {265--274},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699227},
doi = {10.1109/TEST.2010.5699227},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KassabMMRJT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CzyszMMRST10,
author = {Dariusz Czysz and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Przemyslaw Szczerbicki and
Jerzy Tyszer},
editor = {Ron Press and
Erik H. Volkerink},
title = {Low power compression of incompatible test cubes},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {704--713},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699274},
doi = {10.1109/TEST.2010.5699274},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CzyszMMRST10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/CzyszKLMRT09,
author = {Dariusz Czysz and
Mark Kassab and
Xijiang Lin and
Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer},
title = {Low-Power Scan Operation in Test Compression Environment},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {28},
number = {11},
pages = {1742--1755},
year = {2009},
url = {https://doi.org/10.1109/TCAD.2009.2030445},
doi = {10.1109/TCAD.2009.2030445},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/CzyszKLMRT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MrugalskiMRCT09,
author = {Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Dariusz Czysz and
Jerzy Tyszer},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Compression based on deterministic vector clustering of incompatible
test cubes},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355555},
doi = {10.1109/TEST.2009.5355555},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MrugalskiMRCT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MukherjeePRT09,
author = {Nilanjan Mukherjee and
Artur Pogiel and
Janusz Rajski and
Jerzy Tyszer},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Fault diagnosis for embedded read-only memories},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355530},
doi = {10.1109/TEST.2009.5355530},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MukherjeePRT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/MukherjeeRT09,
author = {Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {Defect Aware to Power Conscious Tests - The New {DFT} Landscape},
booktitle = {{VLSI} Design 2009: Improving Productivity through Higher Abstraction,
The 22nd International Conference on {VLSI} Design, New Delhi, India,
5-9 January 2009},
pages = {23--25},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VLSI.Design.2009.111},
doi = {10.1109/VLSI.DESIGN.2009.111},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/MukherjeeRT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/MukherjeePRT09,
author = {Nilanjan Mukherjee and
Artur Pogiel and
Janusz Rajski and
Jerzy Tyszer},
title = {High-Speed On-Chip Event Counters for Embedded Systems},
booktitle = {{VLSI} Design 2009: Improving Productivity through Higher Abstraction,
The 22nd International Conference on {VLSI} Design, New Delhi, India,
5-9 January 2009},
pages = {275--280},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VLSI.Design.2009.15},
doi = {10.1109/VLSI.DESIGN.2009.15},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/MukherjeePRT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MrugalskiMRCT09,
author = {Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Dariusz Czysz and
Jerzy Tyszer},
title = {Highly X-Tolerant Selective Compaction of Test Responses},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {245--250},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.11},
doi = {10.1109/VTS.2009.11},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MrugalskiMRCT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/RajskiTMCMK08,
author = {Janusz Rajski and
Jerzy Tyszer and
Grzegorz Mrugalski and
Wu{-}Tung Cheng and
Nilanjan Mukherjee and
Mark Kassab},
title = {X-Press: Two-Stage X-Tolerant Compactor With Programmable Selector},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {27},
number = {1},
pages = {147--159},
year = {2008},
url = {https://doi.org/10.1109/TCAD.2007.907276},
doi = {10.1109/TCAD.2007.907276},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/RajskiTMCMK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/CzyszMRT08,
author = {Dariusz Czysz and
Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer},
title = {Low-Power Test Data Application in {EDT} Environment Through Decompressor
Freeze},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {27},
number = {7},
pages = {1278--1290},
year = {2008},
url = {https://doi.org/10.1109/TCAD.2008.923111},
doi = {10.1109/TCAD.2008.923111},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/CzyszMRT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CzyszKLMRT08,
author = {Dariusz Czysz and
Mark Kassab and
Xijiang Lin and
Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer},
editor = {Douglas Young and
Nur A. Touba},
title = {Low Power Scan Shift and Capture in the {EDT} Environment},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700585},
doi = {10.1109/TEST.2008.4700585},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CzyszKLMRT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MukherjeePRT08,
author = {Nilanjan Mukherjee and
Artur Pogiel and
Janusz Rajski and
Jerzy Tyszer},
editor = {Douglas Young and
Nur A. Touba},
title = {High Throughput Diagnosis via Compression of Failure Data in Embedded
Memory {BIST}},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700554},
doi = {10.1109/TEST.2008.4700554},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MukherjeePRT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/TyszerRMMKCSL07,
author = {Jerzy Tyszer and
Janusz Rajski and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Mark Kassab and
Wu{-}Tung Cheng and
Manish Sharma and
Liyang Lai},
title = {X-Tolerant Compactor with On-Chip Registration and Signature-Based
Diagnosis},
journal = {{IEEE} Des. Test Comput.},
volume = {24},
number = {5},
pages = {476--485},
year = {2007},
url = {https://doi.org/10.1109/MDT.2007.177},
doi = {10.1109/MDT.2007.177},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/TyszerRMMKCSL07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MrugalskiRWPT07,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Chen Wang and
Artur Pogiel and
Jerzy Tyszer},
title = {Isolation of Failing Scan Cells through Convolutional Test Response
Compaction},
journal = {J. Electron. Test.},
volume = {23},
number = {1},
pages = {35--45},
year = {2007},
url = {https://doi.org/10.1007/s10836-006-9524-4},
doi = {10.1007/S10836-006-9524-4},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MrugalskiRWPT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MrugalskiPRT07,
author = {Grzegorz Mrugalski and
Artur Pogiel and
Janusz Rajski and
Jerzy Tyszer},
title = {Fault Diagnosis With Convolutional Compactors},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {26},
number = {8},
pages = {1478--1494},
year = {2007},
url = {https://doi.org/10.1109/TCAD.2007.891361},
doi = {10.1109/TCAD.2007.891361},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/MrugalskiPRT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/MrugalskiRCT07,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Dariusz Czysz and
Jerzy Tyszer},
title = {New Test Data Decompressor for Low Power Applications},
booktitle = {Proceedings of the 44th Design Automation Conference, {DAC} 2007,
San Diego, CA, USA, June 4-8, 2007},
pages = {539--544},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1145/1278480.1278617},
doi = {10.1145/1278480.1278617},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/MrugalskiRCT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/CzyszMRT07,
author = {Dariusz Czysz and
Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer},
title = {Low Power Embedded Deterministic Test},
booktitle = {25th {IEEE} {VLSI} Test Symposium {(VTS} 2007), 6-10 May 2007, Berkeley,
California, {USA}},
pages = {75--83},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/VTS.2007.37},
doi = {10.1109/VTS.2007.37},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/CzyszMRT07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/MrugalskiMRT06,
author = {Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {High Performance Dense Ring Generators},
journal = {{IEEE} Trans. Computers},
volume = {55},
number = {1},
pages = {83--87},
year = {2006},
url = {https://doi.org/10.1109/TC.2006.11},
doi = {10.1109/TC.2006.11},
timestamp = {Fri, 02 Mar 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tc/MrugalskiMRT06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/MrugalskiRT06,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer},
editor = {Ellen Sentovich},
title = {Test response compactor with programmable selector},
booktitle = {Proceedings of the 43rd Design Automation Conference, {DAC} 2006,
San Francisco, CA, USA, July 24-28, 2006},
pages = {1089--1094},
publisher = {{ACM}},
year = {2006},
url = {https://doi.org/10.1145/1146909.1147184},
doi = {10.1145/1146909.1147184},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/MrugalskiRT06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/PogielRT06,
author = {Artur Pogiel and
Janusz Rajski and
Jerzy Tyszer},
title = {Convolutional Compactors with Variable Polynomials},
booktitle = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
2006},
pages = {117--122},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/ETS.2006.11},
doi = {10.1109/ETS.2006.11},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/PogielRT06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajskiTMCMK06,
author = {Janusz Rajski and
Jerzy Tyszer and
Grzegorz Mrugalski and
Wu{-}Tung Cheng and
Nilanjan Mukherjee and
Mark Kassab},
editor = {Scott Davidson and
Anne Gattiker},
title = {X-Press Compactor for 1000x Reduction of Test Data},
booktitle = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
CA, USA, October 22-27, 2006},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/TEST.2006.297643},
doi = {10.1109/TEST.2006.297643},
timestamp = {Tue, 12 Dec 2023 09:46:27 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajskiTMCMK06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/RajskiTWR05,
author = {Janusz Rajski and
Jerzy Tyszer and
Chen Wang and
Sudhakar M. Reddy},
title = {Finite memory test response compactors for embedded test applications},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {24},
number = {4},
pages = {622--634},
year = {2005},
url = {https://doi.org/10.1109/TCAD.2005.844111},
doi = {10.1109/TCAD.2005.844111},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/RajskiTWR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/MrugalskiPRTW05,
author = {Grzegorz Mrugalski and
Artur Pogiel and
Janusz Rajski and
Jerzy Tyszer and
Chen Wang},
title = {Convolutional compaction-driven diagnosis of scan failures},
booktitle = {10th European Test Symposium, {ETS} 2005, Tallinn, Estonia, May 22-25,
2005},
pages = {176--181},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/ETS.2005.11},
doi = {10.1109/ETS.2005.11},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/MrugalskiPRTW05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MrugalskiPRT05,
author = {Grzegorz Mrugalski and
Artur Pogiel and
Janusz Rajski and
Jerzy Tyszer},
title = {Diagnosis with convolutional compactors in presence of unknown states},
booktitle = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005,
Austin, TX, USA, November 8-10, 2005},
pages = {10},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/TEST.2005.1583998},
doi = {10.1109/TEST.2005.1583998},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MrugalskiPRT05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/TangWRRTP05,
author = {Huaxing Tang and
Chen Wang and
Janusz Rajski and
Sudhakar M. Reddy and
Jerzy Tyszer and
Irith Pomeranz},
title = {On Efficient X-Handling Using a Selective Compaction Scheme to Achieve
High Test Response Compaction Ratios},
booktitle = {18th International Conference on {VLSI} Design {(VLSI} Design 2005),
with the 4th International Conference on Embedded Systems Design,
3-7 January 2005, Kolkata, India},
pages = {59--64},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/ICVD.2005.127},
doi = {10.1109/ICVD.2005.127},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/TangWRRTP05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/RajskiT05,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Synthesis of X-Tolerant Convolutional Compactors},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {114--119},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.81},
doi = {10.1109/VTS.2005.81},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/RajskiT05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/RajskiTKM04,
author = {Janusz Rajski and
Jerzy Tyszer and
Mark Kassab and
Nilanjan Mukherjee},
title = {Embedded deterministic test},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {23},
number = {5},
pages = {776--792},
year = {2004},
url = {https://doi.org/10.1109/TCAD.2004.826558},
doi = {10.1109/TCAD.2004.826558},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/RajskiTKM04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MrugalskiRT04,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer},
title = {Ring generators - new devices for embedded test applications},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {23},
number = {9},
pages = {1306--1320},
year = {2004},
url = {https://doi.org/10.1109/TCAD.2004.831584},
doi = {10.1109/TCAD.2004.831584},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/MrugalskiRT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MrugalskiWPTR04,
author = {Grzegorz Mrugalski and
Chen Wang and
Artur Pogiel and
Jerzy Tyszer and
Janusz Rajski},
title = {Fault Diagnosis in Designs with Convolutional Compactors},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {498--507},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386986},
doi = {10.1109/TEST.2004.1386986},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MrugalskiWPTR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/RajskiMTR04,
author = {Janusz Rajski and
Nilanjan Mukherjee and
Jerzy Tyszer and
Thomas Rinderknecht},
title = {Embedded Test for Low Cost Manufacturing},
booktitle = {17th International Conference on {VLSI} Design {(VLSI} Design 2004),
with the 3rd International Conference on Embedded Systems Design,
5-9 January 2004, Mumbai, India},
pages = {21--23},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/ICVD.2004.1260896},
doi = {10.1109/ICVD.2004.1260896},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/RajskiMTR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MrugalskiMRT04,
author = {Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {Planar High Performance Ring Generators},
booktitle = {22nd {IEEE} {VLSI} Test Symposium {(VTS} 2004), 25-29 April 2004,
Napa Valley, CA, {USA}},
pages = {193--198},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/VTEST.2004.1299243},
doi = {10.1109/VTEST.2004.1299243},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MrugalskiMRT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/MrugalskiTR03,
author = {Grzegorz Mrugalski and
Jerzy Tyszer and
Janusz Rajski},
title = {2D Test Sequence Generators},
journal = {{IEEE} Des. Test Comput.},
volume = {20},
number = {1},
pages = {51--59},
year = {2003},
url = {https://doi.org/10.1109/MDT.2003.1173053},
doi = {10.1109/MDT.2003.1173053},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/MrugalskiTR03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/RajskiKMTTQ03,
author = {Janusz Rajski and
Mark Kassab and
Nilanjan Mukherjee and
Nagesh Tamarapalli and
Jerzy Tyszer and
Jun Qian},
title = {Embedded Deterministic Test for Low-Cost Manufacturing},
journal = {{IEEE} Des. Test Comput.},
volume = {20},
number = {5},
pages = {58--66},
year = {2003},
url = {https://doi.org/10.1109/MDT.2003.1232257},
doi = {10.1109/MDT.2003.1232257},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/RajskiKMTTQ03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RajskiT03,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Primitive Polynomials Over {GF(2)} of Degree up to 660 with Uniformly
Distributed Coefficients},
journal = {J. Electron. Test.},
volume = {19},
number = {6},
pages = {645--657},
year = {2003},
url = {https://doi.org/10.1023/A:1027422805851},
doi = {10.1023/A:1027422805851},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/RajskiT03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/WangRPRT03,
author = {Chen Wang and
Sudhakar M. Reddy and
Irith Pomeranz and
Janusz Rajski and
Jerzy Tyszer},
title = {On Compacting Test Response Data Containing Unknown Values},
booktitle = {2003 International Conference on Computer-Aided Design, {ICCAD} 2003,
San Jose, CA, USA, November 9-13, 2003},
pages = {855--862},
publisher = {{IEEE} Computer Society / {ACM}},
year = {2003},
url = {https://doi.ieeecomputersociety.org/10.1109/ICCAD.2003.1257908},
doi = {10.1109/ICCAD.2003.1257908},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/WangRPRT03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccd/RajskiT03,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Test Data Compression and Compaction for Embedded Test of Nanometer
Technology Designs},
booktitle = {21st International Conference on Computer Design {(ICCD} 2003),VLSI
in Computers and Processors, 13-15 October 2003, San Jose, CA, USA,
Proceedings},
pages = {331},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/ICCD.2003.1240915},
doi = {10.1109/ICCD.2003.1240915},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccd/RajskiT03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajskiTWR03,
author = {Janusz Rajski and
Jerzy Tyszer and
Chen Wang and
Sudhakar M. Reddy},
title = {Convolutional Compaction of Test Responses},
booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
NC, {USA}},
pages = {745--754},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/TEST.2003.1270904},
doi = {10.1109/TEST.2003.1270904},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajskiTWR03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MrugalskiRT03,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer},
title = {High Speed Ring Generators and Compactors of Test Data},
booktitle = {21st {IEEE} {VLSI} Test Symposium {(VTS} 2003), 27 April - 1 May 2003,
Napa Valley, CA, {USA}},
pages = {57--62},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/VTEST.2003.1197633},
doi = {10.1109/VTEST.2003.1197633},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MrugalskiRT03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajkiTKMTTHTMEQ02,
author = {Janusz Rajski and
Jerzy Tyszer and
Mark Kassab and
Nilanjan Mukherjee and
Rob Thompson and
Kun{-}Han Tsai and
Andre Hertwig and
Nagesh Tamarapalli and
Grzegorz Mrugalski and
Geir Eide and
Jun Qian},
title = {Embedded Deterministic Test for Low-Cost Manufacturing Test},
booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
MD, USA, October 7-10, 2002},
pages = {301--310},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/TEST.2002.1041773},
doi = {10.1109/TEST.2002.1041773},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajkiTKMTTHTMEQ02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/MukherjeeRT01,
author = {Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {Testing Schemes for {FIR} Filter Structures},
journal = {{IEEE} Trans. Computers},
volume = {50},
number = {7},
pages = {674--688},
year = {2001},
url = {https://doi.org/10.1109/12.936234},
doi = {10.1109/12.936234},
timestamp = {Fri, 02 Mar 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tc/MukherjeeRT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/MrugalskiRT00,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer},
title = {Cellular automata-based test pattern generators with phase shifters},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {19},
number = {8},
pages = {878--893},
year = {2000},
url = {https://doi.org/10.1109/43.856975},
doi = {10.1109/43.856975},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/MrugalskiRT00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/RajskiTT00,
author = {Janusz Rajski and
Nagesh Tamarapalli and
Jerzy Tyszer},
title = {Automated synthesis of phase shifters for built-in self-testapplications},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {19},
number = {10},
pages = {1175--1188},
year = {2000},
url = {https://doi.org/10.1109/43.875312},
doi = {10.1109/43.875312},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/RajskiTT00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MrugalskiTR00,
author = {Grzegorz Mrugalski and
Jerzy Tyszer and
Janusz Rajski},
title = {Linear Independence as Evaluation Criterion for Two-Dimensional Test
Pattern Generators},
booktitle = {18th {IEEE} {VLSI} Test Symposium {(VTS} 2000), 30 April - 4 May 2000,
Montreal, Canada},
pages = {377--388},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/VTEST.2000.843868},
doi = {10.1109/VTEST.2000.843868},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MrugalskiTR00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/cm/RajskiT99,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Testing of telecommunications hardware [Guest Editorial]},
journal = {{IEEE} Commun. Mag.},
volume = {37},
number = {6},
pages = {60--62},
year = {1999},
url = {https://doi.org/10.1109/MCOM.1999.769275},
doi = {10.1109/MCOM.1999.769275},
timestamp = {Tue, 25 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/cm/RajskiT99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/RajskiT99,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Diagnosis of Scan Cells in {BIST} Environment},
journal = {{IEEE} Trans. Computers},
volume = {48},
number = {7},
pages = {724--731},
year = {1999},
url = {https://doi.org/10.1109/12.780879},
doi = {10.1109/12.780879},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/RajskiT99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MrugalskiTR99,
author = {Grzegorz Mrugalski and
Jerzy Tyszer and
Janusz Rajski},
title = {Synthesis of pattern generators based on cellular automata with phase
shifters},
booktitle = {Proceedings {IEEE} International Test Conference 1999, Atlantic City,
NJ, USA, 27-30 September 1999},
pages = {368--377},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/TEST.1999.805651},
doi = {10.1109/TEST.1999.805651},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MrugalskiTR99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/RajskiTP99,
author = {Janusz Rajski and
Jerzy Tyszer and
Sanjay Patel},
title = {Built-In Self-Test for Systems on Silicon},
booktitle = {12th International Conference on {VLSI} Design {(VLSI} Design 1999),
10-13 January 1999, Goa, India},
pages = {609--610},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {http://www.computer.org/csdl/proceedings/vlsid/1999/0013/00/00130609.pdf},
timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
biburl = {https://dblp.org/rec/conf/vlsid/RajskiTP99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/RajskiMT99,
author = {Janusz Rajski and
Grzegorz Mrugalski and
Jerzy Tyszer},
title = {Comparative Study of CA-based PRPGs and LFSRs with Phase Shifters},
booktitle = {17th {IEEE} {VLSI} Test Symposium {(VTS} '99), 25-30 April 1999, San
Diego, CA, {USA}},
pages = {236--245},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/VTEST.1999.766671},
doi = {10.1109/VTEST.1999.766671},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/RajskiMT99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/RajskiTZ98,
author = {Janusz Rajski and
Jerzy Tyszer and
Nadime Zacharia},
title = {Test Data Decompression for Multiple Scan Designs with Boundary Scan},
journal = {{IEEE} Trans. Computers},
volume = {47},
number = {11},
pages = {1188--1200},
year = {1998},
url = {https://doi.org/10.1109/12.736428},
doi = {10.1109/12.736428},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/RajskiTZ98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajskiT98,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Modular logic built-in self-test for {IP} cores},
booktitle = {Proceedings {IEEE} International Test Conference 1998, Washington,
DC, USA, October 18-22, 1998},
pages = {313--321},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/TEST.1998.743169},
doi = {10.1109/TEST.1998.743169},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajskiT98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajskiTT98,
author = {Janusz Rajski and
Nagesh Tamarapalli and
Jerzy Tyszer},
title = {Automated synthesis of large phase shifters for built-in self-test},
booktitle = {Proceedings {IEEE} International Test Conference 1998, Washington,
DC, USA, October 18-22, 1998},
pages = {1047--1056},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/TEST.1998.743303},
doi = {10.1109/TEST.1998.743303},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajskiTT98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/RajskiT98,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Design of Phase Shifters for {BIST} Applications},
booktitle = {16th {IEEE} {VLSI} Test Symposium {(VTS} '98), 28 April - 1 May 1998,
Princeton, NJ, {USA}},
pages = {218--224},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/VTEST.1998.670871},
doi = {10.1109/VTEST.1998.670871},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/RajskiT98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/MukherjeeRT97,
author = {Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {Design of Testable Multipliers for Fixed-Width Data Paths},
journal = {{IEEE} Trans. Computers},
volume = {46},
number = {7},
pages = {795--810},
year = {1997},
url = {https://doi.org/10.1109/12.599900},
doi = {10.1109/12.599900},
timestamp = {Fri, 02 Mar 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tc/MukherjeeRT97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/RadeckaRT97,
author = {Katarzyna Radecka and
Janusz Rajski and
Jerzy Tyszer},
title = {Arithmetic built-in self-test for {DSP} cores},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {16},
number = {11},
pages = {1358--1369},
year = {1997},
url = {https://doi.org/10.1109/43.663825},
doi = {10.1109/43.663825},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/RadeckaRT97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MukherjeeRT97,
author = {Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
title = {Parameterizable Testing Scheme for {FIR} Filters},
booktitle = {Proceedings {IEEE} International Test Conference 1997, Washington,
DC, USA, November 3-5, 1997},
pages = {694--703},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/TEST.1997.639682},
doi = {10.1109/TEST.1997.639682},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MukherjeeRT97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajskiT97,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Fault Diagnosis in Scan-Based {BIST}},
booktitle = {Proceedings {IEEE} International Test Conference 1997, Washington,
DC, USA, November 3-5, 1997},
pages = {894--902},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/TEST.1997.639704},
doi = {10.1109/TEST.1997.639704},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajskiT97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jsac/JajszczykT96,
author = {Andrzej Jajszczyk and
Jerzy Tyszer},
title = {Broadband Time-Division Circuit Switching},
journal = {{IEEE} J. Sel. Areas Commun.},
volume = {14},
number = {2},
pages = {337--345},
year = {1996},
url = {https://doi.org/10.1109/49.481941},
doi = {10.1109/49.481941},
timestamp = {Thu, 02 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jsac/JajszczykT96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/GuptaRT96,
author = {Sanjay Gupta and
Janusz Rajski and
Jerzy Tyszer},
title = {Arithmetic Additive Generators of Pseudo-Exhaustive Test Patterns},
journal = {{IEEE} Trans. Computers},
volume = {45},
number = {8},
pages = {939--949},
year = {1996},
url = {https://doi.org/10.1109/12.536236},
doi = {10.1109/12.536236},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/GuptaRT96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/RajskiT96,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {On Linear Dependencies in Subspaces of LFSR-Generated Sequences},
journal = {{IEEE} Trans. Computers},
volume = {45},
number = {10},
pages = {1212--1216},
year = {1996},
url = {https://doi.org/10.1109/12.543715},
doi = {10.1109/12.543715},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/RajskiT96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/RajskiT96,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Multiplicative Window Generators of Pseudo-random Test Vectors},
booktitle = {1996 European Design and Test Conference, ED{\&}TC 1996, Paris,
France, March 11-14, 1996},
pages = {42--49},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/EDTC.1996.494126},
doi = {10.1109/EDTC.1996.494126},
timestamp = {Fri, 20 May 2022 15:52:30 +0200},
biburl = {https://dblp.org/rec/conf/date/RajskiT96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZachariaRTW96,
author = {Nadime Zacharia and
Janusz Rajski and
Jerzy Tyszer and
John A. Waicukauski},
title = {Two-Dimensional Test Data Decompressor for Multiple Scan Designs},
booktitle = {Proceedings {IEEE} International Test Conference 1996, Test and Design
Validity, Washington, DC, USA, October 20-25, 1996},
pages = {186--194},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/TEST.1996.556961},
doi = {10.1109/TEST.1996.556961},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZachariaRTW96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/KassabMRT95,
author = {Mark Kassab and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
editor = {Bryan Preas},
title = {Software Accelerated Functional Fault Simulation for Data-Path Architectures},
booktitle = {Proceedings of the 32st Conference on Design Automation, San Francisco,
California, USA, Moscone Center, June 12-16, 1995},
pages = {333--338},
publisher = {{ACM} Press},
year = {1995},
url = {https://doi.org/10.1145/217474.217551},
doi = {10.1145/217474.217551},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/KassabMRT95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/MukherjeeRT95,
author = {Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer},
editor = {Richard L. Rudell},
title = {On testable multipliers for fixed-width data path architectures},
booktitle = {Proceedings of the 1995 {IEEE/ACM} International Conference on Computer-Aided
Design, {ICCAD} 1995, San Jose, California, USA, November 5-9, 1995},
pages = {541--547},
publisher = {{IEEE} Computer Society / {ACM}},
year = {1995},
url = {https://doi.org/10.1109/ICCAD.1995.480169},
doi = {10.1109/ICCAD.1995.480169},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/MukherjeeRT95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KassabRT95,
author = {Mark Kassab and
Janusz Rajski and
Jerzy Tyszer},
title = {Hierarchical Functional-Fault Simulation for High-Level Synthesis},
booktitle = {Proceedings {IEEE} International Test Conference 1995, Driving Down
the Cost of Test, Washington, DC, USA, October 21-25, 1995},
pages = {596--605},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/TEST.1995.529888},
doi = {10.1109/TEST.1995.529888},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KassabRT95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MukherjeeKRT95,
author = {Nilanjan Mukherjee and
H. Kassab and
Janusz Rajski and
Jerzy Tyszer},
title = {Arithmetic built-in self test for high-level synthesis},
booktitle = {13th {IEEE} {VLSI} Test Symposium (VTS'95), April 30 - May 3, 1995,
Princeton, New Jersey, {USA}},
pages = {132--139},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/VTEST.1995.512628},
doi = {10.1109/VTEST.1995.512628},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MukherjeeKRT95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ZachariaRT95,
author = {Nadime Zacharia and
Janusz Rajski and
Jerzy Tyszer},
title = {Decompression of test data using variable-length seed LFSRs},
booktitle = {13th {IEEE} {VLSI} Test Symposium (VTS'95), April 30 - May 3, 1995,
Princeton, New Jersey, {USA}},
pages = {426--433},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/VTEST.1995.512670},
doi = {10.1109/VTEST.1995.512670},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ZachariaRT95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/GuptaRT94,
author = {Sanjay Gupta and
Janusz Rajski and
Jerzy Tyszer},
editor = {Jochen A. G. Jess and
Richard L. Rudell},
title = {Test pattern generation based on arithmetic operations},
booktitle = {Proceedings of the 1994 {IEEE/ACM} International Conference on Computer-Aided
Design, {ICCAD} 1994, San Jose, California, USA, November 6-10, 1994},
pages = {117--124},
publisher = {{IEEE} Computer Society / {ACM}},
year = {1994},
url = {https://doi.org/10.1109/ICCAD.1994.629753},
doi = {10.1109/ICCAD.1994.629753},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/GuptaRT94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/RajskiT93,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Accumulator-Based Compaction of Test Responses},
journal = {{IEEE} Trans. Computers},
volume = {42},
number = {6},
pages = {643--650},
year = {1993},
url = {https://doi.org/10.1109/12.277285},
doi = {10.1109/12.277285},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/RajskiT93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/RajskiT93a,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Recursive Pseudoexhaustive Test Pattern Generation},
journal = {{IEEE} Trans. Computers},
volume = {42},
number = {12},
pages = {1517--1521},
year = {1993},
url = {https://doi.org/10.1109/12.260644},
doi = {10.1109/12.260644},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/RajskiT93a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/RajskiT93,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Test responses compaction in accumulators with rotate carry adders},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {12},
number = {4},
pages = {531--539},
year = {1993},
url = {https://doi.org/10.1109/43.229736},
doi = {10.1109/43.229736},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/RajskiT93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcom/Tyszer92,
author = {Jerzy Tyszer},
title = {Testing of three-stage switching networks for coupling faults},
journal = {{IEEE} Trans. Commun.},
volume = {40},
number = {2},
pages = {413--422},
year = {1992},
url = {https://doi.org/10.1109/26.129203},
doi = {10.1109/26.129203},
timestamp = {Tue, 01 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcom/Tyszer92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/RajskiT91,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {On the diagnostic properties of linear feedback shift registers},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {10},
number = {10},
pages = {1316--1322},
year = {1991},
url = {https://doi.org/10.1109/43.88927},
doi = {10.1109/43.88927},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/RajskiT91.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcom/Tyszer91,
author = {Jerzy Tyszer},
title = {Test generation for pattern-sensitive faults in integrated switches},
journal = {{IEEE} Trans. Commun.},
volume = {39},
number = {11},
pages = {1546--1548},
year = {1991},
url = {https://doi.org/10.1109/26.111431},
doi = {10.1109/26.111431},
timestamp = {Tue, 01 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcom/Tyszer91.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcom/Tyszer90,
author = {Jerzy Tyszer},
title = {Interference faults testing for time switches},
journal = {{IEEE} Trans. Commun.},
volume = {38},
number = {7},
pages = {954--958},
year = {1990},
url = {https://doi.org/10.1109/26.57492},
doi = {10.1109/26.57492},
timestamp = {Tue, 01 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcom/Tyszer90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/RajskiTS90,
author = {Janusz Rajski and
Jerzy Tyszer and
Babak Salimi},
title = {On the Diagnostic Resolution of Signature Analysis},
booktitle = {{IEEE/ACM} International Conference on Computer-Aided Design, {ICCAD}
1990, Santa Clara, CA, USA, November 11-15, 1990. Digest of Technical
Papers},
pages = {364--367},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/ICCAD.1990.129926},
doi = {10.1109/ICCAD.1990.129926},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/RajskiTS90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcom/JajszczykT89,
author = {Andrzej Jajszczyk and
Jerzy Tyszer},
title = {Fault diagnosis of digital switching networks},
journal = {{IEEE} Trans. Commun.},
volume = {37},
number = {7},
pages = {732--739},
year = {1989},
url = {https://doi.org/10.1109/26.31165},
doi = {10.1109/26.31165},
timestamp = {Tue, 01 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcom/JajszczykT89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jsa/Tyszer88,
author = {Jerzy Tyszer},
title = {Multiple fault diagnosis for interconnection networks for distributed
systems},
journal = {Microprocess. Microprogramming},
volume = {24},
number = {1-5},
pages = {731--734},
year = {1988},
url = {https://doi.org/10.1016/0165-6074(88)90138-X},
doi = {10.1016/0165-6074(88)90138-X},
timestamp = {Fri, 05 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jsa/Tyszer88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/Tyszer88,
author = {Jerzy Tyszer},
title = {A Multiple Fault-Tolerant Processor Network Architecture for Pipeline
Computing},
journal = {{IEEE} Trans. Computers},
volume = {37},
number = {11},
pages = {1414--1418},
year = {1988},
url = {https://doi.org/10.1109/12.8707},
doi = {10.1109/12.8707},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/Tyszer88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/RajskiT86,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {The Influence of Masking Phenomenon on Coverage Capability of Single
Fault Test Sets in PLA's},
journal = {{IEEE} Trans. Computers},
volume = {35},
number = {1},
pages = {81--85},
year = {1986},
url = {https://doi.org/10.1109/TC.1986.1676665},
doi = {10.1109/TC.1986.1676665},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/RajskiT86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/RajskiT85,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Combinatorial Approach to Multiple Contact Faults Coverage in Programmable
Logic Arrays},
journal = {{IEEE} Trans. Computers},
volume = {34},
number = {6},
pages = {549--553},
year = {1985},
url = {https://doi.org/10.1109/TC.1985.5009407},
doi = {10.1109/TC.1985.5009407},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/RajskiT85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icftcs/RajskiT84,
author = {Janusz Rajski and
Jerzy Tyszer},
editor = {Karl{-}Erwin Gro{\ss}pietsch and
Mario Dal Cin},
title = {The detection of small size multiple faults by single fault test sets
n programmable logic arrays},
booktitle = {Fehlertolerierende Rechensysteme, 2. GI/NTG/GMR-Fachtagung, Bonn,
19.-21. September 1984, Proceedings},
series = {Informatik-Fachberichte},
volume = {84},
pages = {417--425},
publisher = {Springer},
year = {1984},
url = {https://doi.org/10.1007/978-3-642-69698-5\_34},
doi = {10.1007/978-3-642-69698-5\_34},
timestamp = {Wed, 17 May 2017 14:24:33 +0200},
biburl = {https://dblp.org/rec/conf/icftcs/RajskiT84.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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