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ORCIDBibTeX records: Stanislav Tyaginov
@inproceedings{DBLP:conf/irps/SarazaCanflancaSDTGBK24,
author = {Pablo Saraza{-}Canflanca and
Dishant Sangani and
Javier Diaz{-}Fortuny and
Stanislav Tyaginov and
Georges G. E. Gielen and
Erik Bury and
Ben Kaczer},
title = {Statistical Characterization of Off-State Stress Degradation in Planar
{HKMG} nFETs Using Device Arrays},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2024, Grapevine,
TX, USA, April 14-18, 2024},
pages = {8},
publisher = {{IEEE}},
year = {2024},
url = {https://doi.org/10.1109/IRPS48228.2024.10529367},
doi = {10.1109/IRPS48228.2024.10529367},
timestamp = {Sun, 04 Aug 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/SarazaCanflancaSDTGBK24.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/BuryVFCTVRMDHLK23,
author = {Erik Bury and
Michiel Vandemaele and
Jacopo Franco and
Adrian Chasin and
Stanislav Tyaginov and
A. Vandooren and
Romain Ritzenthaler and
Hans Mertens and
Javier Diaz{-}Fortuny and
N. Horiguchi and
Dimitri Linten and
Ben Kaczer},
title = {Reliability challenges in Forksheet Devices: (Invited Paper)},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
CA, USA, March 26-30, 2023},
pages = {1--8},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/IRPS48203.2023.10118269},
doi = {10.1109/IRPS48203.2023.10118269},
timestamp = {Sun, 04 Aug 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/BuryVFCTVRMDHLK23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/PanarellaKSVSCLTARKA23,
author = {L. Panarella and
Ben Kaczer and
Quentin Smets and
Devin Verreck and
Tom Schram and
Daire Cott and
Dennis Lin and
Stanislav Tyaginov and
I. Asselberghs and
Cesar J. Lockhart de la Rosa and
Gouri Sankar Kar and
Valeri Afanas'ev},
title = {Impact of gate stack processing on the hysteresis of 300 mm integrated
{WS2} FETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
CA, USA, March 26-30, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/IRPS48203.2023.10117803},
doi = {10.1109/IRPS48203.2023.10117803},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/PanarellaKSVSCLTARKA23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/BastosOFTTCDKRC22,
author = {J. P. Bastos and
Barry J. O'Sullivan and
Jacopo Franco and
Stanislav Tyaginov and
Brecht Truijen and
Adrian Vaisman Chasin and
Robin Degraeve and
Ben Kaczer and
Romain Ritzenthaler and
Elena Capogreco and
E. Dentoni Litta and
Alessio Spessot and
Yusuke Higashi and
Y. Yoon and
V. Machkaoutsan and
Pierre Fazan and
N. Horiguchi},
title = {Bias Temperature Instability {(BTI)} of High-Voltage Devices for Memory
Periphery},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
TX, USA, March 27-31, 2022},
pages = {1--6},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IRPS48227.2022.9764547},
doi = {10.1109/IRPS48227.2022.9764547},
timestamp = {Fri, 16 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/BastosOFTTCDKRC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/BuryCKVTFRMWHL22,
author = {Erik Bury and
Adrian Vaisman Chasin and
Ben Kaczer and
Michiel Vandemaele and
Stanislav Tyaginov and
Jacopo Franco and
Romain Ritzenthaler and
Hans Mertens and
Pieter Weckx and
N. Horiguchi and
Dimitri Linten},
title = {Evaluating Forksheet {FET} Reliability Concerns by Experimental Comparison
with Co-integrated Nanosheets},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
TX, USA, March 27-31, 2022},
pages = {5},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IRPS48227.2022.9764526},
doi = {10.1109/IRPS48227.2022.9764526},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/BuryCKVTFRMWHL22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/TyaginovMECBJVG22,
author = {Stanislav Tyaginov and
Alexander Makarov and
Al{-}Moatasem Bellah El{-}Sayed and
Adrian Vaisman Chasin and
Erik Bury and
Markus Jech and
Michiel Vandemaele and
Alexander Grill and
An De Keersgieter and
Mikhail I. Vexler and
Geert Eneman and
Ben Kaczer},
title = {Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier
Degradation in n- and p-Channel Transistors},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
TX, USA, March 27-31, 2022},
pages = {6},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IRPS48227.2022.9764515},
doi = {10.1109/IRPS48227.2022.9764515},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/TyaginovMECBJVG22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/VandemaeleKTBCF22,
author = {Michiel Vandemaele and
Ben Kaczer and
Stanislav Tyaginov and
Erik Bury and
Adrian Vaisman Chasin and
Jacopo Franco and
Alexander Makarov and
Hans Mertens and
Geert Hellings and
Guido Groeseneken},
title = {Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet
and Forksheet FETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
TX, USA, March 27-31, 2022},
pages = {6},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IRPS48227.2022.9764470},
doi = {10.1109/IRPS48227.2022.9764470},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/VandemaeleKTBCF22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/GrillJMBBTPCGWK22,
author = {Alexander Grill and
V. John and
Jakob Michl and
A. Beckers and
Erik Bury and
Stanislav Tyaginov and
Bertrand Parvais and
Adrian Vaisman Chasin and
Tibor Grasser and
Michael Waltl and
Ben Kaczer and
Bogdan Govoreanu},
title = {Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array
with 30k Transistors},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
TX, USA, March 27-31, 2022},
pages = {10},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IRPS48227.2022.9764594},
doi = {10.1109/IRPS48227.2022.9764594},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/GrillJMBBTPCGWK22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/TyaginovAMGVCVH22,
author = {Stanislav Tyaginov and
Aryan Afzalian and
Alexander Makarov and
Alexander Grill and
Michiel Vandemaele and
Maksim Cherenev and
Mikhail I. Vexler and
Geert Hellings and
Ben Kaczer},
title = {On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
TX, USA, March 27-31, 2022},
pages = {11},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IRPS48227.2022.9764568},
doi = {10.1109/IRPS48227.2022.9764568},
timestamp = {Mon, 09 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/TyaginovAMGVCVH22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/VandemaeleKTFDC21,
author = {Michiel Vandemaele and
Ben Kaczer and
Stanislav Tyaginov and
Jacopo Franco and
Robin Degraeve and
Adrian Vaisman Chasin and
Zhicheng Wu and
Erik Bury and
Yang Xiang and
Hans Mertens and
Guido Groeseneken},
title = {The properties, effect and extraction of localized defect profiles
from degraded {FET} characteristics},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405164},
doi = {10.1109/IRPS46558.2021.9405164},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/VandemaeleKTFDC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/WuFTRTVBGLK21,
author = {Zhicheng Wu and
Jacopo Franco and
Brecht Truijen and
Philippe Roussel and
Stanislav Tyaginov and
Michiel Vandemaele and
Erik Bury and
Guido Groeseneken and
Dimitri Linten and
Ben Kaczer},
title = {Physics-based device aging modelling framework for accurate circuit
reliability assessment},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405106},
doi = {10.1109/IRPS46558.2021.9405106},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/WuFTRTVBGLK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/XiangTVWFBTPLK21,
author = {Yang Xiang and
Stanislav Tyaginov and
Michiel Vandemaele and
Zhicheng Wu and
Jacopo Franco and
Erik Bury and
Brecht Truijen and
Bertrand Parvais and
Dimitri Linten and
Ben Kaczer},
title = {A BSIM-Based Predictive Hot-Carrier Aging Compact Model},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--9},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405222},
doi = {10.1109/IRPS46558.2021.9405222},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/XiangTVWFBTPLK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/GrillBMTLGPKWR20,
author = {Alexander Grill and
Erik Bury and
Jakob Michl and
Stanislav Tyaginov and
Dimitri Linten and
Tibor Grasser and
Bertrand Parvais and
Ben Kaczer and
Michael Waltl and
Iuliana P. Radu},
title = {Reliability and Variability of Advanced {CMOS} Devices at Cryogenic
Temperatures},
booktitle = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
Dallas, TX, USA, April 28 - May 30, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/IRPS45951.2020.9128316},
doi = {10.1109/IRPS45951.2020.9128316},
timestamp = {Fri, 24 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/GrillBMTLGPKWR20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/TyaginovGVGHMJL20,
author = {Stanislav Tyaginov and
Alexander Grill and
Michiel Vandemaele and
Tibor Grasser and
Geert Hellings and
Alexander Makarov and
Markus Jech and
Dimitri Linten and
Ben Kaczer},
title = {A Compact Physics Analytical Model for Hot-Carrier Degradation},
booktitle = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
Dallas, TX, USA, April 28 - May 30, 2020},
pages = {1--7},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/IRPS45951.2020.9128327},
doi = {10.1109/IRPS45951.2020.9128327},
timestamp = {Thu, 30 Jul 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/TyaginovGVGHMJL20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/VandemaeleCBTGK20,
author = {Michiel Vandemaele and
Kai{-}Hsin Chuang and
Erik Bury and
Stanislav Tyaginov and
Guido Groeseneken and
Ben Kaczer},
title = {The Influence of Gate Bias on the Anneal of Hot-Carrier Degradation},
booktitle = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
Dallas, TX, USA, April 28 - May 30, 2020},
pages = {1--7},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/IRPS45951.2020.9128218},
doi = {10.1109/IRPS45951.2020.9128218},
timestamp = {Sun, 12 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/VandemaeleCBTGK20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/MakarovLTKRCVHE19,
author = {Alexander Makarov and
Dimitri Linten and
Stanislav Tyaginov and
Ben Kaczer and
Philippe Roussel and
Adrian Vaisman Chasin and
Michiel Vandemaele and
Geert Hellings and
Al{-}Moatasem El{-}Sayed and
Markus Jech and
Tibor Grasser},
title = {Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering
the Impact of Random Traps and Random Dopants},
booktitle = {49th European Solid-State Device Research Conference, {ESSDERC} 2019,
Cracow, Poland, September 23-26, 2019},
pages = {262--265},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ESSDERC.2019.8901721},
doi = {10.1109/ESSDERC.2019.8901721},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/essderc/MakarovLTKRCVHE19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/MakarovKRCGVHEG19,
author = {Alexander Makarov and
Ben Kaczer and
Philippe Roussel and
Adrian Vaisman Chasin and
Alexander Grill and
Michiel Vandemaele and
Geert Hellings and
Al{-}Moatasem El{-}Sayed and
Tibor Grasser and
Dimitri Linten and
Stanislav Tyaginov},
title = {Modeling the Effect of Random Dopants on Hot-Carrier Degradation in
FinFETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
CA, USA, March 31 - April 4, 2019},
pages = {1--7},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/IRPS.2019.8720584},
doi = {10.1109/IRPS.2019.8720584},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/MakarovKRCGVHEG19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/VandemaeleKTSMC19,
author = {Michiel Vandemaele and
Ben Kaczer and
Stanislav Tyaginov and
Zlatan Stanojevic and
Alexander Makarov and
Adrian Vaisman Chasin and
Erik Bury and
Hans Mertens and
Dimitri Linten and
Guido Groeseneken},
title = {Full (V\({}_{\mbox{g}}\), V\({}_{\mbox{d}}\)) Bias Space Modeling
of Hot-Carrier Degradation in Nanowire FETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
CA, USA, March 31 - April 4, 2019},
pages = {1--7},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/IRPS.2019.8720406},
doi = {10.1109/IRPS.2019.8720406},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/VandemaeleKTSMC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/SharmaTRFKMVG16,
author = {Prateek Sharma and
Stanislav Tyaginov and
Stewart E. Rauch and
Jacopo Franco and
Ben Kaczer and
Alexander Makarov and
Mikhail I. Vexler and
Tibor Grasser},
title = {A drift-diffusion-based analytic description of the energy distribution
function for hot-carrier degradation in decananometer nMOSFETs},
booktitle = {46th European Solid-State Device Research Conference, {ESSDERC} 2016,
Lausanne, Switzerland, September 12-15, 2016},
pages = {428--431},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/ESSDERC.2016.7599677},
doi = {10.1109/ESSDERC.2016.7599677},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/essderc/SharmaTRFKMVG16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SharmaTWRREPCG15,
author = {Prateek Sharma and
Stanislav Tyaginov and
Yannick Wimmer and
Florian Rudolf and
Karl Rupp and
Hubert Enichlmair and
J. H. Park and
Hajdin Ceric and
Tibor Grasser},
title = {Comparison of analytic distribution function models for hot-carrier
degradation modeling in nLDMOSFETs},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1427--1432},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.021},
doi = {10.1016/J.MICROREL.2015.06.021},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SharmaTWRREPCG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KaczerFCGRTBWPT15,
author = {Ben Kaczer and
Jacopo Franco and
M. Cho and
Tibor Grasser and
Philippe J. Roussel and
Stanislav Tyaginov and
M. Bina and
Yannick Wimmer and
Luis{-}Miguel Procel and
Lionel Trojman and
Felice Crupi and
Gregory Pitner and
Vamsi Putcha and
Pieter Weckx and
Erik Bury and
Z. Ji and
An De Keersgieter and
Thomas Chiarella and
Naoto Horiguchi and
Guido Groeseneken and
Aaron Thean},
title = {Origins and implications of increased channel hot carrier variability
in nFinFETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
CA, USA, April 19-23, 2015},
pages = {3},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IRPS.2015.7112706},
doi = {10.1109/IRPS.2015.7112706},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/KaczerFCGRTBWPT15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TyaginovSEJPSOCG11,
author = {Stanislav Tyaginov and
Ivan A. Starkov and
Hubert Enichlmair and
C. Jungemann and
Jong Mun Park and
Ehrenfried Seebacher and
R. L. de Orio and
Hajdin Ceric and
Tibor Grasser},
title = {An analytical approach for physical modeling of hot-carrier induced
degradation},
journal = {Microelectron. Reliab.},
volume = {51},
number = {9-11},
pages = {1525--1529},
year = {2011},
url = {https://doi.org/10.1016/j.microrel.2011.07.089},
doi = {10.1016/J.MICROREL.2011.07.089},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TyaginovSEJPSOCG11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TyaginovSTCJCPEKKSMCG10,
author = {Stanislav Tyaginov and
Ivan A. Starkov and
Oliver Triebl and
Johann Cervenka and
C. Jungemann and
Sara Carniello and
Jong Mun Park and
Hubert Enichlmair and
Markus Karner and
Ch. Kernstock and
Ehrenfried Seebacher and
Rainer Minixhofer and
Hajdin Ceric and
Tibor Grasser},
title = {Interface traps density-of-states as a vital component for hot-carrier
degradation modeling},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1267--1272},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.030},
doi = {10.1016/J.MICROREL.2010.07.030},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TyaginovSTCJCPEKKSMCG10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TyaginovSSGG09,
author = {Stanislav Tyaginov and
Viktor Sverdlov and
Ivan A. Starkov and
Wolfgang G{\"{o}}s and
Tibor Grasser},
title = {Impact of O-Si-O bond angle fluctuations on the Si-O bond-breakage
rate},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {998--1002},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.018},
doi = {10.1016/J.MICROREL.2009.06.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TyaginovSSGG09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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