Stop the war!Остановите войну!
for scientists:
default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDBibTeX records: Takeomi Tamesada
@inproceedings{DBLP:conf/delta/HashizumeNYTM06,
author = {Masaki Hashizume and
Tomomi Nishida and
Hiroyuki Yotsuyanagi and
Takeomi Tamesada and
Yukiya Miura},
title = {Current Testable Design of Resistor String DACs},
booktitle = {Third {IEEE} International Workshop on Electronic Design, Test and
Applications {(DELTA} 2006), 17-19 January 2006, Kuala Lumpur, Malaysia},
pages = {197--200},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/DELTA.2006.28},
doi = {10.1109/DELTA.2006.28},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/delta/HashizumeNYTM06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iscas/HashizumeIYT05,
author = {Masaki Hashizume and
Masahiro Ichimiya and
Hiroyuki Yotsuyanagi and
Takeomi Tamesada},
title = {Electric field for detecting open leads in {CMOS} logic circuits by
supply current testing},
booktitle = {International Symposium on Circuits and Systems {(ISCAS} 2005), 23-26
May 2005, Kobe, Japan},
pages = {2995--2998},
publisher = {{IEEE}},
year = {2005},
url = {https://doi.org/10.1109/ISCAS.2005.1465257},
doi = {10.1109/ISCAS.2005.1465257},
timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
biburl = {https://dblp.org/rec/conf/iscas/HashizumeIYT05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/YotsuyanagiHT04,
author = {Hiroyuki Yotsuyanagi and
Masaki Hashizume and
Takeomi Tamesada},
title = {Test Sequence Generation for Test Time Reduction of {IDDQ} Testing},
journal = {{IEICE} Trans. Inf. Syst.},
volume = {87-D},
number = {3},
pages = {537--543},
year = {2004},
url = {http://search.ieice.org/bin/summary.php?id=e87-d\_3\_537},
timestamp = {Sat, 11 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ieicet/YotsuyanagiHT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/HashizumeYT04,
author = {Masaki Hashizume and
Hiroyuki Yotsuyanagi and
Takeomi Tamesada},
title = {Identification and Frequency Estimation of Feedback Bridging Faults
Generating Logical Oscillation in {CMOS} Circuits},
journal = {{IEICE} Trans. Inf. Syst.},
volume = {87-D},
number = {3},
pages = {571--579},
year = {2004},
url = {http://search.ieice.org/bin/summary.php?id=e87-d\_3\_571},
timestamp = {Sat, 11 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ieicet/HashizumeYT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/scjapan/IchimiyaHYT04,
author = {Masahiro Ichimiya and
Masaki Hashizume and
Hiroyuki Yotsuyanagi and
Takeomi Tamesada},
title = {A test circuit for pin shorts generating oscillation in {CMOS} logic
circuits},
journal = {Syst. Comput. Jpn.},
volume = {35},
number = {13},
pages = {10--20},
year = {2004},
url = {https://doi.org/10.1002/scj.10604},
doi = {10.1002/SCJ.10604},
timestamp = {Wed, 13 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/scjapan/IchimiyaHYT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HashizumeYYTKMT04,
author = {Masaki Hashizume and
Daisuke Yoneda and
Hiroyuki Yotsuyanagi and
Tetsuo Tada and
Takeshi Koyama and
Ikuro Morita and
Takeomi Tamesada},
title = {I{\_}DDQ Test Method Based on Wavelet Transformation for Noisy Current
Measurement Environment},
booktitle = {13th Asian Test Symposium {(ATS} 2004), 15-17 November 2004, Kenting,
Taiwan},
pages = {112--117},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/ATS.2004.50},
doi = {10.1109/ATS.2004.50},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HashizumeYYTKMT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/delta/HashizumeAYT04,
author = {Masaki Hashizume and
Tetsuo Akita and
Hiroyuki Yotsuyanagi and
Takeomi Tamesada},
title = {{CMOS} Open Fault Detection by Appearance Time of Switching Supply
Current},
booktitle = {2nd {IEEE} International Workshop on Electronic Design, Test and Applications
{(DELTA} 2004), 28-30 January 2004, Perth, Australia},
pages = {183--188},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/DELTA.2004.10036},
doi = {10.1109/DELTA.2004.10036},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/delta/HashizumeAYT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/delta/TsukimotoHYT04,
author = {Isao Tsukimoto and
Masaki Hashizume and
Hiroyuki Yotsuyanagi and
Takeomi Tamesada},
title = {Practical Fault Coverage of Supply Current Tests for Bipolar ICs},
booktitle = {2nd {IEEE} International Workshop on Electronic Design, Test and Applications
{(DELTA} 2004), 28-30 January 2004, Perth, Australia},
pages = {189--194},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/DELTA.2004.10035},
doi = {10.1109/DELTA.2004.10035},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/delta/TsukimotoHYT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/delta/EzakiHYT04,
author = {Daisuke Ezaki and
Masaki Hashizume and
Hiroyuki Yotsuyanagi and
Takeomi Tamesada},
title = {A Power Supply Circuit Recycling Charge in Adiabatic Dynamic {CMOS}
Logic Circuits},
booktitle = {2nd {IEEE} International Workshop on Electronic Design, Test and Applications
{(DELTA} 2004), 28-30 January 2004, Perth, Australia},
pages = {306--311},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/DELTA.2004.10022},
doi = {10.1109/DELTA.2004.10022},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/delta/EzakiHYT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HashizumeTYTMK03,
author = {Masaki Hashizume and
Teppei Takeda and
Hiroyuki Yotsuyanagi and
Takeomi Tamesada and
Yukiya Miura and
Kozo Kinoshita},
title = {A {BIST} Circuit for {IDDQ} Tests},
booktitle = {12th Asian Test Symposium {(ATS} 2003), 17-19 November 2003, Xian,
China},
pages = {390--395},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/ATS.2003.1250843},
doi = {10.1109/ATS.2003.1250843},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HashizumeTYTMK03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YotsuyanagiHT02,
author = {Hiroyuki Yotsuyanagi and
Masaki Hashizume and
Takeomi Tamesada},
title = {Test Time Reduction for {I} {DDQ} Testing by Arranging Test Vectors},
booktitle = {11th Asian Test Symposium {(ATS} 2002), 18-20 November 2002, Guam,
{USA}},
pages = {423--428},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/ATS.2002.1181748},
doi = {10.1109/ATS.2002.1181748},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YotsuyanagiHT02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/delta/YotsuyanagiHIIT02,
author = {Hiroyuki Yotsuyanagi and
Masaki Hashizume and
Taisuke Iwakiri and
Masahiro Ichimiya and
Takeomi Tamesada},
title = {Random Pattern Testability of the Open Defect Detection Method using
Application of Time-variable Electric Field},
booktitle = {1st {IEEE} International Workshop on Electronic Design, Test and Applications
{(DELTA} 2002), 29-31 January 2002, Christchurch, New Zealand},
pages = {387--391},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/DELTA.2002.994656},
doi = {10.1109/DELTA.2002.994656},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/delta/YotsuyanagiHIIT02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/delta/HashizumeSYT02,
author = {Masaki Hashizume and
Masashi Sato and
Hiroyuki Yotsuyanagi and
Takeomi Tamesada},
title = {Power Supply Circuit for High Speed Operation of Adiabatic Dynamic
{CMOS} Logic Circuits},
booktitle = {1st {IEEE} International Workshop on Electronic Design, Test and Applications
{(DELTA} 2002), 29-31 January 2002, Christchurch, New Zealand},
pages = {459--461},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/DELTA.2002.994673},
doi = {10.1109/DELTA.2002.994673},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/delta/HashizumeSYT02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YotsuyanagiHHT01,
author = {Hiroyuki Yotsuyanagi and
Shinsuke Hata and
Masaki Hashizume and
Takeomi Tamesada},
title = {Sequential Redundancy Removal Using Test Generation and Multiple Unreachable
States},
booktitle = {10th Asian Test Symposium {(ATS} 2001), 19-21 November 2001, Kyoto,
Japan},
pages = {23},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/ATS.2001.990253},
doi = {10.1109/ATS.2001.990253},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YotsuyanagiHHT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HashizumeIYT01,
author = {Masaki Hashizume and
Masahiro Ichimiya and
Hiroyuki Yotsuyanagi and
Takeomi Tamesada},
title = {{CMOS} Open Defect Detection Based on Supply Current in Time-Variable
Electric Field and Supply Voltage Application},
booktitle = {10th Asian Test Symposium {(ATS} 2001), 19-21 November 2001, Kyoto,
Japan},
pages = {117--122},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/ATS.2001.990269},
doi = {10.1109/ATS.2001.990269},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HashizumeIYT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/HashizumeIYT01,
author = {Masaki Hashizume and
Masahiro Ichimiya and
Hiroyuki Yotsuyanagi and
Takeomi Tamesada},
editor = {Wolfgang Nebel and
Ahmed Jerraya},
title = {{CMOS} open defect detection by supply current test},
booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe,
{DATE} 2001, Munich, Germany, March 12-16, 2001},
pages = {509},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/DATE.2001.915071},
doi = {10.1109/DATE.2001.915071},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/HashizumeIYT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/YotsuyanagiHIIT01,
author = {Hiroyuki Yotsuyanagi and
Masaki Hashizume and
Taisuke Iwakiri and
Masahiro Ichimiya and
Takeomi Tamesada},
title = {Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable
Electric Field},
booktitle = {16th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2001), 24-26 October 2001, San Francisco,
CA, USA, Proceedings},
pages = {287},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/DFTVS.2001.966781},
doi = {10.1109/DFTVS.2001.966781},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/YotsuyanagiHIIT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HashizumeYITT00,
author = {Masaki Hashizume and
Hiroyuki Yotsuyanagi and
Masahiro Ichimiya and
Takeomi Tamesada and
Masashi Takeda},
title = {High speed {IDDQ} test and its testability for process variation},
booktitle = {9th Asian Test Symposium {(ATS} 2000), 4-6 December 2000, Taipei,
Taiwan},
pages = {344--349},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/ATS.2000.893647},
doi = {10.1109/ATS.2000.893647},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HashizumeYITT00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/HashizumeYTT00,
author = {Masaki Hashizume and
Hiroyuki Yotsuyanagi and
Takeomi Tamesada and
Masashi Takeda},
title = {Testability Analysis of {IDDQ} Testing with Large Threshold Value},
booktitle = {15th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2000), 25-27 October 2000, Yamanashi, Japan,
Proceedings},
pages = {367--375},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/DFTVS.2000.887177},
doi = {10.1109/DFTVS.2000.887177},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/HashizumeYTT00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HashizumeYT99,
author = {Masaki Hashizume and
Hiroyuki Yotsuyanagi and
Takeomi Tamesada},
title = {Identification of Feedback Bridging Faults with Oscillation},
booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
China},
pages = {25},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/ATS.1999.810725},
doi = {10.1109/ATS.1999.810725},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HashizumeYT99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HashizumeMITK98,
author = {Masaki Hashizume and
Yukiya Miura and
Masahiro Ichimiya and
Takeomi Tamesada and
Kozo Kinoshita},
title = {A High-Speed {IDDQ} Sensor for Low-Voltage ICs},
booktitle = {7th Asian Test Symposium {(ATS} '98), 2-4 December 1998, Singapore},
pages = {327},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/ATS.1998.741634},
doi = {10.1109/ATS.1998.741634},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HashizumeMITK98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HashizumeKT97,
author = {Masaki Hashizume and
Toshimasa Kuchii and
Takeomi Tamesada},
title = {Supply Current Test for Unit-to-unit Variations of Electrical Characteristics
in Gates},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {372--377},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643985},
doi = {10.1109/ATS.1997.643985},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HashizumeKT97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KuchiiHT96,
author = {Toshimasa Kuchii and
Masaki Hashizume and
Takeomi Tamesada},
title = {Algorithmic Test Generation for Supply Current Testing of {TTL} Combinational
Circuits},
booktitle = {5th Asian Test Symposium {(ATS} '96), November 20-22, 1996, Hsinchu,
Taiwan},
pages = {171--176},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/ATS.1996.555155},
doi = {10.1109/ATS.1996.555155},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KuchiiHT96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iscas/HashizumeTS94,
author = {Masaki Hashizume and
Takeomi Tamesada and
Akio Sakamoto},
title = {A Maximum Clique Derivation Algorithm for Simplification of Incompletely
Specified Machines},
booktitle = {1994 {IEEE} International Symposium on Circuits and Systems, {ISCAS}
1994, London, England, UK, May 30 - June 2, 1994},
pages = {193--196},
publisher = {{IEEE}},
year = {1994},
url = {https://doi.org/10.1109/ISCAS.1994.408788},
doi = {10.1109/ISCAS.1994.408788},
timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
biburl = {https://dblp.org/rec/conf/iscas/HashizumeTS94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccd/HashizumeTN90,
author = {Masaki Hashizume and
Takeomi Tamesada and
Koji Nii},
title = {A parameter adjustment method for analog circuits based on convex
fuzzy decision using constraints of satisfactory level},
booktitle = {Proceedings of the 1990 {IEEE} International Conference on Computer
Design: {VLSI} in Computers and Processors, {ICCD} 1990, Cambridge,
MA, USA, 17-19 September, 1990},
pages = {24--28},
publisher = {{IEEE} Computer Society},
year = {1990},
url = {https://doi.org/10.1109/ICCD.1990.130151},
doi = {10.1109/ICCD.1990.130151},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccd/HashizumeTN90.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/scjapan/Tamesada89,
author = {Takeomi Tamesada},
title = {High-speed multioperand addition and subtraction using a p-ary representation
with necessary and minimum redundancy},
journal = {Syst. Comput. Jpn.},
volume = {20},
number = {4},
pages = {59--70},
year = {1989},
url = {https://doi.org/10.1002/scj.4690200406},
doi = {10.1002/SCJ.4690200406},
timestamp = {Wed, 13 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/scjapan/Tamesada89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/scjapan/HashizumeYTH89,
author = {Masaki Hashizume and
Hirosuke Yamamoto and
Takeomi Tamesada and
Toshiaki Hanibuti},
title = {Evaluation of a retrieval system using content addressable memory},
journal = {Syst. Comput. Jpn.},
volume = {20},
number = {7},
pages = {1--9},
year = {1989},
url = {https://doi.org/10.1002/scj.4690200701},
doi = {10.1002/SCJ.4690200701},
timestamp = {Wed, 13 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/scjapan/HashizumeYTH89.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/scjapan/Tamesada88,
author = {Takeomi Tamesada},
title = {High-speed addition and subtraction using a minimum redundant p-ary
representation},
journal = {Syst. Comput. Jpn.},
volume = {19},
number = {11},
pages = {33--39},
year = {1988},
url = {https://doi.org/10.1002/scj.4690191104},
doi = {10.1002/SCJ.4690191104},
timestamp = {Wed, 13 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/scjapan/Tamesada88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HashizumeTYK88,
author = {Masaki Hashizume and
Takeomi Tamesada and
Kazuhiro Yamada and
Masaaki Kawakami},
title = {Fault Detection of Combinational Circuits Based on Supply Current},
booktitle = {Proceedings International Test Conference 1988, Washington, D.C.,
USA, September 1988},
pages = {374--380},
publisher = {{IEEE} Computer Society},
year = {1988},
url = {https://doi.org/10.1109/TEST.1988.207824},
doi = {10.1109/TEST.1988.207824},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/itc/HashizumeTYK88.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tc/Tamesada80,
author = {Takeomi Tamesada},
title = {Sequential Machines Having Quasi-Stable States},
journal = {{IEEE} Trans. Computers},
volume = {29},
number = {5},
pages = {405--408},
year = {1980},
url = {https://doi.org/10.1109/TC.1980.1675593},
doi = {10.1109/TC.1980.1675593},
timestamp = {Sat, 20 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tc/Tamesada80.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
a service of 
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
last updated on 2024-04-25 02:22 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
