BibTeX records: Nagesh Tamarapalli

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@inproceedings{DBLP:conf/vlsid/TamarapalliVK15,
  author       = {Nagesh Tamarapalli and
                  Prashanth Vallur and
                  Sachin Kulkarni},
  title        = {Tutorial {T5:} High Performance Low Power Designs - Challenges and
                  Best practices in Design, Verification and Test},
  booktitle    = {28th International Conference on {VLSI} Design, {VLSID} 2015, Bangalore,
                  India, January 3-7, 2015},
  pages        = {10--11},
  publisher    = {{IEEE} Computer Society},
  year         = {2015},
  url          = {https://doi.org/10.1109/VLSID.2015.113},
  doi          = {10.1109/VLSID.2015.113},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/TamarapalliVK15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vlsid/ShuklaLPMYT14,
  author       = {Rahul Shukla and
                  Phong Loi and
                  Ken Pham and
                  Arie Margulis and
                  Kathy Yang and
                  Nagesh Tamarapalli},
  title        = {Application of Test-View Modeling to Hierarchical {ATPG}},
  booktitle    = {2014 27th International Conference on {VLSI} Design, {VLSID} 2014,
                  and 2014 13th International Conference on Embedded Systems, Mumbai,
                  India, January 5-9, 2014},
  pages        = {110--115},
  publisher    = {{IEEE} Computer Society},
  year         = {2014},
  url          = {https://doi.org/10.1109/VLSID.2014.26},
  doi          = {10.1109/VLSID.2014.26},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/ShuklaLPMYT14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vlsid/MishraFSTKM13,
  author       = {Prabhat Mishra and
                  Masahiro Fujita and
                  Virendra Singh and
                  Nagesh Tamarapalli and
                  Sharad Kumar and
                  Rajesh Mittal},
  title        = {Tutorial {T10:} Post - Silicon Validation, Debug and Diagnosis},
  booktitle    = {26th International Conference on {VLSI} Design and 12th International
                  Conference on Embedded Systems, Pune, India, January 5-10, 2013},
  publisher    = {{IEEE} Computer Society},
  year         = {2013},
  url          = {https://doi.org/10.1109/VLSID.2013.145},
  doi          = {10.1109/VLSID.2013.145},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/MishraFSTKM13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vlsid/VenkataramanT12,
  author       = {Srikanth Venkataraman and
                  Nagesh Tamarapalli},
  editor       = {Vishwani D. Agrawal and
                  Srimat T. Chakradhar},
  title        = {Tutorial {T3:} DFM, DFT, Silicon Debug and Diagnosis - The Loop to
                  Ensure Product Yield},
  booktitle    = {25th International Conference on {VLSI} Design, Hyderabad, India,
                  January 7-11, 2012},
  pages        = {16--17},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/VLSID.2012.30},
  doi          = {10.1109/VLSID.2012.30},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/VenkataramanT12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vlsid/VenkataramanT08,
  author       = {Srikanth Venkataraman and
                  Nagesh Tamarapalli},
  title        = {{DFM} / {DFT} / SiliconDebug / Diagnosis},
  booktitle    = {21st International Conference on {VLSI} Design {(VLSI} Design 2008),
                  4-8 January 2008, Hyderabad, India},
  pages        = {5--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2008},
  url          = {https://doi.org/10.1109/VLSI.2008.129},
  doi          = {10.1109/VLSI.2008.129},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/VenkataramanT08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/LeiningerKFTCKY06,
  author       = {Andreas Leininger and
                  Ajay Khoche and
                  Martin Fischer and
                  Nagesh Tamarapalli and
                  Wu{-}Tung Cheng and
                  Randy Klingenberg and
                  Wu Yang},
  title        = {The Next Step in Volume Scan Diagnosis: Standard Fail Data Format},
  booktitle    = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
                  2006},
  pages        = {360--368},
  publisher    = {{IEEE}},
  year         = {2006},
  url          = {https://doi.org/10.1109/ATS.2006.260956},
  doi          = {10.1109/ATS.2006.260956},
  timestamp    = {Mon, 07 Nov 2022 17:39:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/LeiningerKFTCKY06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/HuangCTRKHC06,
  author       = {Yu Huang and
                  Wu{-}Tung Cheng and
                  Nagesh Tamarapalli and
                  Janusz Rajski and
                  Randy Klingenberg and
                  Will Hsu and
                  Yuan{-}Shih Chen},
  editor       = {Scott Davidson and
                  Anne Gattiker},
  title        = {Diagnosis with Limited Failure Information},
  booktitle    = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
                  CA, USA, October 22-27, 2006},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/TEST.2006.297660},
  doi          = {10.1109/TEST.2006.297660},
  timestamp    = {Tue, 12 Dec 2023 09:46:27 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HuangCTRKHC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/KeimTTSRSB06,
  author       = {Martin Keim and
                  Nagesh Tamarapalli and
                  Huaxing Tang and
                  Manish Sharma and
                  Janusz Rajski and
                  Chris Schuermyer and
                  Brady Benware},
  editor       = {Scott Davidson and
                  Anne Gattiker},
  title        = {A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware
                  Diagnosis},
  booktitle    = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
                  CA, USA, October 22-27, 2006},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/TEST.2006.297715},
  doi          = {10.1109/TEST.2006.297715},
  timestamp    = {Wed, 24 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/KeimTTSRSB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/TendolkarBSPGKCBTTA06,
  author       = {Nandu Tendolkar and
                  Dawit Belete and
                  Bill Schwarz and
                  Bob Podnar and
                  Akshay Gupta and
                  Steve Karako and
                  Wu{-}Tung Cheng and
                  Alex Babin and
                  Kun{-}Han Tsai and
                  Nagesh Tamarapalli and
                  Greg Aldrich},
  editor       = {Scott Davidson and
                  Anne Gattiker},
  title        = {Improving Transition Fault Test Pattern Quality through At-Speed Diagnosis},
  booktitle    = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
                  CA, USA, October 22-27, 2006},
  pages        = {1--9},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/TEST.2006.297623},
  doi          = {10.1109/TEST.2006.297623},
  timestamp    = {Wed, 24 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/TendolkarBSPGKCBTTA06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vlsid/AbercrombieKTV06,
  author       = {David Abercrombie and
                  Bernd Koenemann and
                  Nagesh Tamarapalli and
                  Srikanth Venkataraman},
  title        = {DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product
                  Yield},
  booktitle    = {19th International Conference on {VLSI} Design {(VLSI} Design 2006),
                  3-7 January 2006, Hyderabad, India},
  pages        = {14},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/VLSID.2006.73},
  doi          = {10.1109/VLSID.2006.73},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/AbercrombieKTV06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Tamarapalli05,
  author       = {Nagesh Tamarapalli},
  title        = {Achieving higher yield through diagnosis},
  booktitle    = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005,
                  Austin, TX, USA, November 8-10, 2005},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/TEST.2005.1584128},
  doi          = {10.1109/TEST.2005.1584128},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Tamarapalli05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/LeiningerMCTYT05,
  author       = {Andreas Leininger and
                  Peter Muhmenthaler and
                  Wu{-}Tung Cheng and
                  Nagesh Tamarapalli and
                  Wu Yang and
                  Kun{-}Han Hans Tsai},
  title        = {Compression mode diagnosis enables high volume monitoring diagnosis
                  flow},
  booktitle    = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005,
                  Austin, TX, USA, November 8-10, 2005},
  pages        = {10},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/TEST.2005.1583972},
  doi          = {10.1109/TEST.2005.1583972},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/LeiningerMCTYT05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/ChengTHTR04,
  author       = {Wu{-}Tung Cheng and
                  Kun{-}Han Tsai and
                  Yu Huang and
                  Nagesh Tamarapalli and
                  Janusz Rajski},
  title        = {Compactor Independent Direct Diagnosis},
  booktitle    = {13th Asian Test Symposium {(ATS} 2004), 15-17 November 2004, Kenting,
                  Taiwan},
  pages        = {204--209},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/ATS.2004.32},
  doi          = {10.1109/ATS.2004.32},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/ChengTHTR04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/dt/LinPRRRST03,
  author       = {Xijiang Lin and
                  Ron Press and
                  Janusz Rajski and
                  Paul Reuter and
                  Thomas Rinderknecht and
                  Bruce Swanson and
                  Nagesh Tamarapalli},
  title        = {High-Frequency, At-Speed Scan Testing},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {5},
  pages        = {17--25},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1232252},
  doi          = {10.1109/MDT.2003.1232252},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/LinPRRRST03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/dt/RajskiKMTTQ03,
  author       = {Janusz Rajski and
                  Mark Kassab and
                  Nilanjan Mukherjee and
                  Nagesh Tamarapalli and
                  Jerzy Tyszer and
                  Jun Qian},
  title        = {Embedded Deterministic Test for Low-Cost Manufacturing},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {5},
  pages        = {58--66},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1232257},
  doi          = {10.1109/MDT.2003.1232257},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/RajskiKMTTQ03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/BenwareSRMKTTR03,
  author       = {Brady Benware and
                  Chris Schuermyer and
                  Sreenevasan Ranganathan and
                  Robert Madge and
                  Prabhu Krishnamurthy and
                  Nagesh Tamarapalli and
                  Kun{-}Han Tsai and
                  Janusz Rajski},
  title        = {Impact of Multiple-Detect Test Patterns on Product Quality},
  booktitle    = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
                  Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
                  NC, {USA}},
  pages        = {1031--1040},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/TEST.2003.1271091},
  doi          = {10.1109/TEST.2003.1271091},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/BenwareSRMKTTR03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/PoehlBAMTKMR03,
  author       = {Frank Poehl and
                  Matthias Beck and
                  Ralf Arnold and
                  Peter Muhmenthaler and
                  Nagesh Tamarapalli and
                  Mark Kassab and
                  Nilanjan Mukherjee and
                  Janusz Rajski},
  title        = {Industrial Experience with Adoption of {EDT} for Low-Cost Test without
                  Concessions},
  booktitle    = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
                  Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
                  NC, {USA}},
  pages        = {1211--1220},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/TEST.2003.1271110},
  doi          = {10.1109/TEST.2003.1271110},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/PoehlBAMTKMR03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/RajkiTKMTTHTMEQ02,
  author       = {Janusz Rajski and
                  Jerzy Tyszer and
                  Mark Kassab and
                  Nilanjan Mukherjee and
                  Rob Thompson and
                  Kun{-}Han Tsai and
                  Andre Hertwig and
                  Nagesh Tamarapalli and
                  Grzegorz Mrugalski and
                  Geir Eide and
                  Jun Qian},
  title        = {Embedded Deterministic Test for Low-Cost Manufacturing Test},
  booktitle    = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
                  MD, USA, October 7-10, 2002},
  pages        = {301--310},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/TEST.2002.1041773},
  doi          = {10.1109/TEST.2002.1041773},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/RajkiTKMTTHTMEQ02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tcad/RajskiTT00,
  author       = {Janusz Rajski and
                  Nagesh Tamarapalli and
                  Jerzy Tyszer},
  title        = {Automated synthesis of phase shifters for built-in self-testapplications},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {19},
  number       = {10},
  pages        = {1175--1188},
  year         = {2000},
  url          = {https://doi.org/10.1109/43.875312},
  doi          = {10.1109/43.875312},
  timestamp    = {Thu, 24 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/RajskiTT00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/HetheringtonFTKHR99,
  author       = {Graham Hetherington and
                  Tony Fryars and
                  Nagesh Tamarapalli and
                  Mark Kassab and
                  Abu S. M. Hassan and
                  Janusz Rajski},
  title        = {Logic {BIST} for large industrial designs: real issues and case studies},
  booktitle    = {Proceedings {IEEE} International Test Conference 1999, Atlantic City,
                  NJ, USA, 27-30 September 1999},
  pages        = {358--367},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/TEST.1999.805650},
  doi          = {10.1109/TEST.1999.805650},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HetheringtonFTKHR99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/RajskiTT98,
  author       = {Janusz Rajski and
                  Nagesh Tamarapalli and
                  Jerzy Tyszer},
  title        = {Automated synthesis of large phase shifters for built-in self-test},
  booktitle    = {Proceedings {IEEE} International Test Conference 1998, Washington,
                  DC, USA, October 18-22, 1998},
  pages        = {1047--1056},
  publisher    = {{IEEE} Computer Society},
  year         = {1998},
  url          = {https://doi.org/10.1109/TEST.1998.743303},
  doi          = {10.1109/TEST.1998.743303},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/RajskiTT98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/TamarapalliR96,
  author       = {Nagesh Tamarapalli and
                  Janusz Rajski},
  title        = {Constructive Multi-Phase Test Point Insertion for Scan-Based {BIST}},
  booktitle    = {Proceedings {IEEE} International Test Conference 1996, Test and Design
                  Validity, Washington, DC, USA, October 20-25, 1996},
  pages        = {649--658},
  publisher    = {{IEEE} Computer Society},
  year         = {1996},
  url          = {https://doi.org/10.1109/TEST.1996.557122},
  doi          = {10.1109/TEST.1996.557122},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/TamarapalliR96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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