BibTeX records: Stefan Stadler

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@article{DBLP:journals/mr/LeeJSMN05,
  author       = {Yung{-}Huei Lee and
                  Steve Jacobs and
                  Stefan Stadler and
                  Neal R. Mielke and
                  Ramez Nachman},
  title        = {The impact of {PMOST} bias-temperature degradation on logic circuit
                  reliability performance},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {1},
  pages        = {107--114},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2004.05.027},
  doi          = {10.1016/J.MICROREL.2004.05.027},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LeeJSMN05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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