BibTeX records: Ankur Shukla

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@article{DBLP:journals/apjor/ChatterjeeS17,
  author    = {Subhashis Chatterjee and
               Ankur Shukla},
  title     = {An Ideal Software Release Policy for an Improved Software Reliability
               Growth Model Incorporating Imperfect Debugging with Fault Removal
               Efficiency and Change Point},
  journal   = {{APJOR}},
  volume    = {34},
  number    = {3},
  pages     = {1--21},
  year      = {2017},
  url       = {https://doi.org/10.1142/S0217595917400176},
  doi       = {10.1142/S0217595917400176},
  timestamp = {Tue, 11 Jul 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/journals/apjor/ChatterjeeS17},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@article{DBLP:journals/jsw/ChatterjeeS16,
  author    = {Subhashis Chatterjee and
               Ankur Shukla},
  title     = {Effect of Test Coverage and Change Point on Software Reliability Growth
               Based on Time Variable Fault Detection Probability},
  journal   = {{JSW}},
  volume    = {11},
  number    = {1},
  pages     = {110--117},
  year      = {2016},
  url       = {https://doi.org/10.17706/jsw.11.1.110-117},
  doi       = {10.17706/jsw.11.1.110-117},
  timestamp = {Thu, 18 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/journals/jsw/ChatterjeeS16},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/date/DattaWSGCMN16,
  author    = {Ayan Datta and
               James D. Warnock and
               Ankur Shukla and
               Saurabh Gupta and
               Yiu H. Chan and
               Karthik Mohan and
               Charudhattan Nagarajan},
  title     = {Design-synthesis co-optimisation using skewed and tapered gates},
  booktitle = {2016 Design, Automation {\&} Test in Europe Conference {\&}
               Exhibition, {DATE} 2016, Dresden, Germany, March 14-18, 2016},
  pages     = {1144--1147},
  year      = {2016},
  crossref  = {DBLP:conf/date/2016},
  url       = {http://ieeexplore.ieee.org/document/7459482/},
  timestamp = {Sun, 30 Apr 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/date/DattaWSGCMN16},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/date/2016,
  editor    = {Luca Fanucci and
               J{\"{u}}rgen Teich},
  title     = {2016 Design, Automation {\&} Test in Europe Conference {\&}
               Exhibition, {DATE} 2016, Dresden, Germany, March 14-18, 2016},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7454909},
  isbn      = {978-3-9815-3707-9},
  timestamp = {Tue, 03 May 2016 10:06:49 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/date/2016},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
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