BibTeX records: Jürgen Schlöffel

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@article{DBLP:journals/jssc/VivetTLSBBDLPDC17,
  author       = {Pascal Vivet and
                  Yvain Thonnart and
                  Romain Lemaire and
                  Cristiano Santos and
                  Edith Beign{\'{e}} and
                  Christian Bernard and
                  Florian Darve and
                  Didier Lattard and
                  Ivan Miro Panades and
                  Denis Dutoit and
                  Fabien Clermidy and
                  S{\'{e}}verine Cheramy and
                  Abbas Sheibanyrad and
                  Fr{\'{e}}d{\'{e}}ric P{\'{e}}trot and
                  Eric Flamand and
                  Jean Michailos and
                  Alexandre Arriordaz and
                  Lee Wang and
                  Juergen Schloeffel},
  title        = {A 4 {\texttimes} 4 {\texttimes} 2 Homogeneous Scalable 3D Network-on-Chip
                  Circuit With 326 MFlit/s 0.66 pJ/b Robust and Fault Tolerant Asynchronous
                  3D Links},
  journal      = {{IEEE} J. Solid State Circuits},
  volume       = {52},
  number       = {1},
  pages        = {33--49},
  year         = {2017},
  url          = {https://doi.org/10.1109/JSSC.2016.2611497},
  doi          = {10.1109/JSSC.2016.2611497},
  timestamp    = {Sun, 30 Aug 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jssc/VivetTLSBBDLPDC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/DuruptVS16,
  author       = {Jean Durupt and
                  Pascal Vivet and
                  Juergen Schloeffel},
  title        = {{IJTAG} supported 3D {DFT} using chiplet-footprints for testing multi-chips
                  active interposer system},
  booktitle    = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
                  May 23-27, 2016},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ETS.2016.7519310},
  doi          = {10.1109/ETS.2016.7519310},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/DuruptVS16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isvlsi/FkihVFRNS15,
  author       = {Yassine Fkih and
                  Pascal Vivet and
                  Marie{-}Lise Flottes and
                  Bruno Rouzeyre and
                  Giorgio Di Natale and
                  Juergen Schloeffel},
  title        = {3D {DFT} Challenges and Solutions},
  booktitle    = {2015 {IEEE} Computer Society Annual Symposium on VLSI, {ISVLSI} 2015,
                  Montpellier, France, July 8-10, 2015},
  pages        = {603--608},
  publisher    = {{IEEE} Computer Society},
  year         = {2015},
  url          = {https://doi.org/10.1109/ISVLSI.2015.11},
  doi          = {10.1109/ISVLSI.2015.11},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/isvlsi/FkihVFRNS15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/HapkeRGRRHKSF14,
  author       = {Friedrich Hapke and
                  Wilfried Redemund and
                  Andreas Glowatz and
                  Janusz Rajski and
                  Michael Reese and
                  Marek Hustava and
                  Martin Keim and
                  Juergen Schloeffel and
                  Anja Fast},
  title        = {Cell-Aware Test},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {33},
  number       = {9},
  pages        = {1396--1409},
  year         = {2014},
  url          = {https://doi.org/10.1109/TCAD.2014.2323216},
  doi          = {10.1109/TCAD.2014.2323216},
  timestamp    = {Thu, 24 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/HapkeRGRRHKSF14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/HapkeABBSGPBMPSRGFR14,
  author       = {Friedrich Hapke and
                  Ralf Arnold and
                  Matthias Beck and
                  M. Baby and
                  S. Straehle and
                  J. F. Goncalves and
                  A. Panait and
                  R. Behr and
                  Gwenol{\'{e}} Maugard and
                  A. Prashanthi and
                  Juergen Schloeffel and
                  Wilfried Redemund and
                  Andreas Glowatz and
                  Anja Fast and
                  Janusz Rajski},
  editor       = {Giorgio Di Natale},
  title        = {Cell-aware experiences in a high-quality automotive test suite},
  booktitle    = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
                  May 26-30, 2014},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2014},
  url          = {https://doi.org/10.1109/ETS.2014.6847814},
  doi          = {10.1109/ETS.2014.6847814},
  timestamp    = {Wed, 21 Apr 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/HapkeABBSGPBMPSRGFR14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isvlsi/FkihVRFNS14,
  author       = {Yassine Fkih and
                  Pascal Vivet and
                  Bruno Rouzeyre and
                  Marie{-}Lise Flottes and
                  Giorgio Di Natale and
                  Juergen Schloeffel},
  title        = {2D to 3D Test Pattern Retargeting Using {IEEE} {P1687} Based 3D {DFT}
                  Architectures},
  booktitle    = {{IEEE} Computer Society Annual Symposium on VLSI, {ISVLSI} 2014, Tampa,
                  FL, USA, July 9-11, 2014},
  pages        = {386--391},
  publisher    = {{IEEE} Computer Society},
  year         = {2014},
  url          = {https://doi.org/10.1109/ISVLSI.2014.83},
  doi          = {10.1109/ISVLSI.2014.83},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/isvlsi/FkihVRFNS14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/HapkeS12,
  author       = {Friedrich Hapke and
                  J{\"{u}}rgen Schl{\"{o}}ffel},
  title        = {Introduction to the defect-oriented cell-aware test methodology for
                  significant reduction of {DPPM} rates},
  booktitle    = {17th {IEEE} European Test Symposium, {ETS} 2012, Annecy, France, May
                  28 - June 1 2012},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/ETS.2012.6233046},
  doi          = {10.1109/ETS.2012.6233046},
  timestamp    = {Tue, 28 Apr 2020 11:43:43 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/HapkeS12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HapkeRRORRGSR12,
  author       = {Friedrich Hapke and
                  Michael Reese and
                  Jason Rivers and
                  A. Over and
                  V. Ravikumar and
                  Wilfried Redemund and
                  Andreas Glowatz and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Janusz Rajski},
  title        = {Cell-aware Production test results from a 32-nm notebook processor},
  booktitle    = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
                  USA, November 5-8, 2012},
  pages        = {1--9},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/TEST.2012.6401533},
  doi          = {10.1109/TEST.2012.6401533},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HapkeRRORRGSR12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HapkeSRGRRRR11,
  author       = {Friedrich Hapke and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Wilfried Redemund and
                  Andreas Glowatz and
                  Janusz Rajski and
                  Michael Reese and
                  J. Rearick and
                  Jason Rivers},
  editor       = {Bill Eklow and
                  R. D. (Shawn) Blanton},
  title        = {Cell-aware analysis for small-delay effects and production test results
                  from different fault models},
  booktitle    = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
                  USA, September 20-22, 2011},
  pages        = {1--8},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/TEST.2011.6139151},
  doi          = {10.1109/TEST.2011.6139151},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HapkeSRGRRRR11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/EggersglussFGHSD10,
  author       = {Stephan Eggersgl{\"{u}}{\ss} and
                  G{\"{o}}rschwin Fey and
                  Andreas Glowatz and
                  Friedrich Hapke and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Rolf Drechsler},
  title        = {{MONSOON:} SAT-Based {ATPG} for Path Delay Faults Using Multiple-Valued
                  Logics},
  journal      = {J. Electron. Test.},
  volume       = {26},
  number       = {3},
  pages        = {307--322},
  year         = {2010},
  url          = {https://doi.org/10.1007/s10836-010-5146-y},
  doi          = {10.1007/S10836-010-5146-Y},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/EggersglussFGHSD10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/TilleEKSD10,
  author       = {Daniel Tille and
                  Stephan Eggersgl{\"{u}}{\ss} and
                  Rene Krenz{-}Baath and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Rolf Drechsler},
  title        = {Improving {CNF} representations in SAT-based {ATPG} for industrial
                  circuits using BDDs},
  booktitle    = {15th European Test Symposium, {ETS} 2010, Prague, Czech Republic,
                  May 24-28, 2010},
  pages        = {176--181},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/ETSYM.2010.5512763},
  doi          = {10.1109/ETSYM.2010.5512763},
  timestamp    = {Tue, 28 Apr 2020 11:43:44 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/TilleEKSD10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HapkeRSKGWHE10,
  author       = {Friedrich Hapke and
                  Wilfried Redemund and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Rene Krenz{-}Baath and
                  Andreas Glowatz and
                  Michael Wittke and
                  Hamidreza Hashempour and
                  Stefan Eichenberger},
  editor       = {Ron Press and
                  Erik H. Volkerink},
  title        = {Defect-oriented cell-internal testing},
  booktitle    = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
                  USA, November 2-4, 2010},
  pages        = {285--294},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/TEST.2010.5699229},
  doi          = {10.1109/TEST.2010.5699229},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HapkeRSKGWHE10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/it/DrechslerEFST09,
  author       = {Rolf Drechsler and
                  Stephan Eggersgl{\"{u}}{\ss} and
                  G{\"{o}}rschwin Fey and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Daniel Tille},
  title        = {Effiziente Erf{\"{u}}llbarkeitsalgorithmen f{\"{u}}r die
                  Generierung von Testmustern (Efficient Satisfiability Solving Algorithms
                  for Test Pattern Generation)},
  journal      = {it Inf. Technol.},
  volume       = {51},
  number       = {2},
  pages        = {102--111},
  year         = {2009},
  url          = {https://doi.org/10.1524/itit.2009.0529},
  doi          = {10.1524/ITIT.2009.0529},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/it/DrechslerEFST09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/todaes/EngelkeBRSBP09,
  author       = {Piet Engelke and
                  Bernd Becker and
                  Michel Renovell and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Bettina Braitling and
                  Ilia Polian},
  title        = {{SUPERB:} Simulator utilizing parallel evaluation of resistive bridges},
  journal      = {{ACM} Trans. Design Autom. Electr. Syst.},
  volume       = {14},
  number       = {4},
  pages        = {56:1--56:21},
  year         = {2009},
  url          = {https://doi.org/10.1145/1562514.1596831},
  doi          = {10.1145/1562514.1596831},
  timestamp    = {Tue, 21 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/todaes/EngelkeBRSBP09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HapkeKGSHEHA09,
  author       = {Friedrich Hapke and
                  Rene Krenz{-}Baath and
                  Andreas Glowatz and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Hamidreza Hashempour and
                  Stefan Eichenberger and
                  Camelia Hora and
                  Dan Adolfsson},
  editor       = {Gordon W. Roberts and
                  Bill Eklow},
  title        = {Defect-oriented cell-aware {ATPG} and fault simulation for industrial
                  cell libraries and designs},
  booktitle    = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
                  USA, November 1-6, 2009},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/TEST.2009.5355741},
  doi          = {10.1109/TEST.2009.5355741},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HapkeKGSHEHA09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HakmiHWSHG09,
  author       = {Abdul Wahid Hakmi and
                  Stefan Holst and
                  Hans{-}Joachim Wunderlich and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Friedrich Hapke and
                  Andreas Glowatz},
  title        = {Restrict Encoding for Mixed-Mode {BIST}},
  booktitle    = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
                  Cruz, California, {USA}},
  pages        = {179--184},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/VTS.2009.43},
  doi          = {10.1109/VTS.2009.43},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/HakmiHWSHG09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/DrechslerEFGHST08,
  author       = {Rolf Drechsler and
                  Stephan Eggersgl{\"{u}}{\ss} and
                  G{\"{o}}rschwin Fey and
                  Andreas Glowatz and
                  Friedrich Hapke and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Daniel Tille},
  title        = {On Acceleration of SAT-Based {ATPG} for Industrial Designs},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {27},
  number       = {7},
  pages        = {1329--1333},
  year         = {2008},
  url          = {https://doi.org/10.1109/TCAD.2008.923107},
  doi          = {10.1109/TCAD.2008.923107},
  timestamp    = {Thu, 24 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/DrechslerEFGHST08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/EngelkePSB08,
  author       = {Piet Engelke and
                  Ilia Polian and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Bernd Becker},
  editor       = {Donatella Sciuto},
  title        = {Resistive Bridging Fault Simulation of Industrial Circuits},
  booktitle    = {Design, Automation and Test in Europe, {DATE} 2008, Munich, Germany,
                  March 10-14, 2008},
  pages        = {628--633},
  publisher    = {{ACM}},
  year         = {2008},
  url          = {https://doi.org/10.1109/DATE.2008.4484747},
  doi          = {10.1109/DATE.2008.4484747},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/date/EngelkePSB08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/iet-cdt/GhermanWSG07,
  author       = {Valentin Gherman and
                  Hans{-}Joachim Wunderlich and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Michael Garbers},
  title        = {Deterministic logic {BIST} for transition fault testing},
  journal      = {{IET} Comput. Digit. Tech.},
  volume       = {1},
  number       = {3},
  pages        = {180--186},
  year         = {2007},
  url          = {https://doi.org/10.1049/iet-cdt:20060131},
  doi          = {10.1049/IET-CDT:20060131},
  timestamp    = {Tue, 14 Jul 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/iet-cdt/GhermanWSG07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/Krenz-BaathGS07,
  author       = {Rene Krenz{-}Baath and
                  Andreas Glowatz and
                  J{\"{u}}rgen Schl{\"{o}}ffel},
  title        = {Computation and Application of Absolute Dominators in Industrial Designs},
  booktitle    = {12th European Test Symposium, {ETS} 2007, Freiburg, Germany, May 20,
                  2007},
  pages        = {137--144},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/ETS.2007.15},
  doi          = {10.1109/ETS.2007.15},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/Krenz-BaathGS07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/glvlsi/GhermanWMSG07,
  author       = {Valentin Gherman and
                  Hans{-}Joachim Wunderlich and
                  R. D. Mascarenhas and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Michael Garbers},
  editor       = {Hai Zhou and
                  Enrico Macii and
                  Zhiyuan Yan and
                  Yehia Massoud},
  title        = {Synthesis of irregular combinational functions with large don't care
                  sets},
  booktitle    = {Proceedings of the 17th {ACM} Great Lakes Symposium on {VLSI} 2007,
                  Stresa, Lago Maggiore, Italy, March 11-13, 2007},
  pages        = {287--292},
  publisher    = {{ACM}},
  year         = {2007},
  url          = {https://doi.org/10.1145/1228784.1228856},
  doi          = {10.1145/1228784.1228856},
  timestamp    = {Wed, 16 Aug 2023 21:16:32 +0200},
  biburl       = {https://dblp.org/rec/conf/glvlsi/GhermanWMSG07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ismvl/EggersglussTFDGHS07,
  author       = {Stephan Eggersgl{\"{u}}{\ss} and
                  Daniel Tille and
                  G{\"{o}}rschwin Fey and
                  Rolf Drechsler and
                  Andreas Glowatz and
                  Friedrich Hapke and
                  J{\"{u}}rgen Schl{\"{o}}ffel},
  title        = {Experimental Studies on SAT-Based {ATPG} for Gate Delay Faults},
  booktitle    = {37th International Symposium on Multiple-Valued Logic, {ISMVL} 2007,
                  13-16 May 2007, Oslo, Norway},
  pages        = {6},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/ISMVL.2007.21},
  doi          = {10.1109/ISMVL.2007.21},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ismvl/EggersglussTFDGHS07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HakmiWZGHSS07,
  author       = {Abdul Wahid Hakmi and
                  Hans{-}Joachim Wunderlich and
                  Christian G. Zoellin and
                  Andreas Glowatz and
                  Friedrich Hapke and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Laurent Souef},
  editor       = {Jill Sibert and
                  Janusz Rajski},
  title        = {Programmable deterministic Built-In Self-Test},
  booktitle    = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
                  California, USA, October 21-26, 2007},
  pages        = {1--9},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/TEST.2007.4437611},
  doi          = {10.1109/TEST.2007.4437611},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HakmiWZGHSS07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/memocode/EggersglussFDGHS07,
  author       = {Stephan Eggersgl{\"{u}}{\ss} and
                  G{\"{o}}rschwin Fey and
                  Rolf Drechsler and
                  Andreas Glowatz and
                  Friedrich Hapke and
                  J{\"{u}}rgen Schl{\"{o}}ffel},
  title        = {Combining Multi-Valued Logics in SAT-based {ATPG} for Path Delay Faults},
  booktitle    = {5th {ACM} {\&} {IEEE} International Conference on Formal Methods
                  and Models for Co-Design {(MEMOCODE} 2007), May 30 - June 1st, Nice,
                  France},
  pages        = {181--187},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/MEMCOD.2007.371226},
  doi          = {10.1109/MEMCOD.2007.371226},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/memocode/EggersglussFDGHS07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/TangWEPBSHW06,
  author       = {Yuyi Tang and
                  Hans{-}Joachim Wunderlich and
                  Piet Engelke and
                  Ilia Polian and
                  Bernd Becker and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Friedrich Hapke and
                  Michael Wittke},
  title        = {X-masking during logic {BIST} and its impact on defect coverage},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {14},
  number       = {2},
  pages        = {193--202},
  year         = {2006},
  url          = {https://doi.org/10.1109/TVLSI.2005.863742},
  doi          = {10.1109/TVLSI.2005.863742},
  timestamp    = {Tue, 21 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/tvlsi/TangWEPBSHW06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/VrankenGGSH06,
  author       = {Harald P. E. Vranken and
                  Sandeep Kumar Goel and
                  Andreas Glowatz and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Friedrich Hapke},
  editor       = {Ellen Sentovich},
  title        = {Fault detection and diagnosis with parity trees for space compaction
                  of test responses},
  booktitle    = {Proceedings of the 43rd Design Automation Conference, {DAC} 2006,
                  San Francisco, CA, USA, July 24-28, 2006},
  pages        = {1095--1098},
  publisher    = {{ACM}},
  year         = {2006},
  url          = {https://doi.org/10.1145/1146909.1147185},
  doi          = {10.1145/1146909.1147185},
  timestamp    = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dac/VrankenGGSH06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/GhermanWSG06,
  author       = {Valentin Gherman and
                  Hans{-}Joachim Wunderlich and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Michael Garbers},
  title        = {Deterministic Logic {BIST} for Transition Fault Testing},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {123--130},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.12},
  doi          = {10.1109/ETS.2006.12},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/GhermanWSG06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PalitWDAS05,
  author       = {Ajoy Kumar Palit and
                  Lei Wu and
                  Kishore K. Duganapalli and
                  Walter Anheier and
                  J{\"{u}}rgen Schl{\"{o}}ffel},
  title        = {A New, Flexible and Very Accurate Crosstalk Fault Model to Analyze
                  the Effects of Coupling Noise between the Interconnects on Signal
                  Integrity Losses in Deep Submicron Chips},
  booktitle    = {14th Asian Test Symposium {(ATS} 2005), 18-21 December 2005, Calcutta,
                  India},
  pages        = {22--27},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/ATS.2005.13},
  doi          = {10.1109/ATS.2005.13},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/PalitWDAS05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isvlsi/ShiFDGHS05,
  author       = {Junhao Shi and
                  G{\"{o}}rschwin Fey and
                  Rolf Drechsler and
                  Andreas Glowatz and
                  Friedrich Hapke and
                  J{\"{u}}rgen Schl{\"{o}}ffel},
  title        = {{PASSAT:} Efficient SAT-Based Test Pattern Generation for Industrial
                  Circuits},
  booktitle    = {2005 {IEEE} Computer Society Annual Symposium on {VLSI} {(ISVLSI}
                  2005), New Frontiers in {VLSI} Design, 11-12 May 2005, Tampa, FL,
                  {USA}},
  pages        = {212--217},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/ISVLSI.2005.55},
  doi          = {10.1109/ISVLSI.2005.55},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/isvlsi/ShiFDGHS05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/PalitMAS05,
  author       = {Ajoy Kumar Palit and
                  Volker Meyer and
                  Walter Anheier and
                  J{\"{u}}rgen Schl{\"{o}}ffel},
  title        = {{ABCD} Modeling of Crosstalk Coupling Noise to Analyze the Signal
                  Integrity Losses on the Victim Interconnect in {DSM} Chips},
  booktitle    = {18th International Conference on {VLSI} Design {(VLSI} Design 2005),
                  with the 4th International Conference on Embedded Systems Design,
                  3-7 January 2005, Kolkata, India},
  pages        = {354--359},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/ICVD.2005.40},
  doi          = {10.1109/ICVD.2005.40},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/PalitMAS05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HakmiWGGS05,
  author       = {Abdul Wahid Hakmi and
                  Hans{-}Joachim Wunderlich and
                  Valentin Gherman and
                  Michael Garbers and
                  J{\"{u}}rgen Schl{\"{o}}ffel},
  title        = {Implementing a Scheme for External Deterministic Self-Test},
  booktitle    = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
                  Springs, CA, {USA}},
  pages        = {101--106},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/VTS.2005.50},
  doi          = {10.1109/VTS.2005.50},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/HakmiWGGS05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/PalitMAS04,
  author       = {Ajoy Kumar Palit and
                  Volker Meyer and
                  Walter Anheier and
                  J{\"{u}}rgen Schl{\"{o}}ffel},
  title        = {Modeling and Analysis of Crosstalk Coupling Effect on the Victim Interconnect
                  Using the {ABCD} Network Model},
  booktitle    = {19th {IEEE} International Symposium on Defect and Fault-Tolerance
                  in {VLSI} Systems {(DFT} 2004), 10-13 October 2004, Cannes, France,
                  Proceedings},
  pages        = {174--182},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.ieeecomputersociety.org/10.1109/DFT.2004.38},
  doi          = {10.1109/DFT.2004.38},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/PalitMAS04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/patmos/HerrmannBSS00,
  author       = {Andreas Herrmann and
                  Erich Barke and
                  Mathias Silvant and
                  J{\"{u}}rgen Schl{\"{o}}ffel},
  editor       = {Dimitrios Soudris and
                  Peter Pirsch and
                  Erich Barke},
  title        = {{PARCOURS} - Substrate Crosstalk Analysis for Complex Mixed-Signal-Circuits},
  booktitle    = {Integrated Circuit Design, Power and Timing Modeling, Optimization
                  and Simulation, 10th International Workshop, {PATMOS} 2000, G{\"{o}}ttingen,
                  Germany, September 13-15, 2000, Proceedings},
  series       = {Lecture Notes in Computer Science},
  volume       = {1918},
  pages        = {306--315},
  publisher    = {Springer},
  year         = {2000},
  url          = {https://doi.org/10.1007/3-540-45373-3\_32},
  doi          = {10.1007/3-540-45373-3\_32},
  timestamp    = {Tue, 14 May 2019 10:00:54 +0200},
  biburl       = {https://dblp.org/rec/conf/patmos/HerrmannBSS00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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