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ORCIDBibTeX records: Yasuo Sato
@article{DBLP:journals/tcad/MayugaSI20,
author = {Gian Mayuga and
Yasuo Sato and
Michiko Inoue},
title = {Highly Reliable Memory Architecture Using Adaptive Combination of
Proactive Aging-Aware In-Field Self-Repair and {ECC}},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {39},
number = {8},
pages = {1688--1698},
year = {2020},
url = {https://doi.org/10.1109/TCAD.2019.2925365},
doi = {10.1109/TCAD.2019.2925365},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/MayugaSI20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tetc/KatoWSKW20,
author = {Takaaki Kato and
Senling Wang and
Yasuo Sato and
Seiji Kajihara and
Xiaoqing Wen},
title = {A Flexible Scan-in Power Control Method in Logic {BIST} and Its Evaluation
with {TEG} Chips},
journal = {{IEEE} Trans. Emerg. Top. Comput.},
volume = {8},
number = {3},
pages = {591--601},
year = {2020},
url = {https://doi.org/10.1109/TETC.2017.2767070},
doi = {10.1109/TETC.2017.2767070},
timestamp = {Sat, 19 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tetc/KatoWSKW20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/MiyakeSK19,
author = {Yousuke Miyake and
Yasuo Sato and
Seiji Kajihara},
title = {A Selection Method of Ring Oscillators for An On-Chip Digital Temperature
And Voltage Sensor},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2019, Tokyo,
Japan, September 3-5, 2019},
pages = {13--18},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC-Asia.2019.00016},
doi = {10.1109/ITC-ASIA.2019.00016},
timestamp = {Fri, 27 Dec 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc-asia/MiyakeSK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/prdc/MiyakeSK19,
author = {Yousuke Miyake and
Yasuo Sato and
Seiji Kajihara},
title = {On-Chip Delay Measurement for In-Field Test of FPGAs},
booktitle = {24th {IEEE} Pacific Rim International Symposium on Dependable Computing,
{PRDC} 2019, Kyoto, Japan, December 1-3, 2019},
pages = {130--137},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/PRDC47002.2019.00043},
doi = {10.1109/PRDC47002.2019.00043},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/prdc/MiyakeSK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/OshimaKWSK18,
author = {Shigeyuki Oshima and
Takaaki Kato and
Senling Wang and
Yasuo Sato and
Seiji Kajihara},
title = {On Flip-Flop Selection for Multi-cycle Scan Test with Partial Observation
in Logic {BIST}},
booktitle = {27th {IEEE} Asian Test Symposium, {ATS} 2018, Hefei, China, October
15-18, 2018},
pages = {30--35},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ATS.2018.00017},
doi = {10.1109/ATS.2018.00017},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/OshimaKWSK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/NishimiSKN18,
author = {Takeru Nishimi and
Yasuo Sato and
Seiji Kajihara and
Yoshiyuki Nakamura},
title = {Good Die Prediction Modelling from Limited Test Items},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2018, Harbin,
China, August 15-17, 2018},
pages = {115--120},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ITC-Asia.2018.00030},
doi = {10.1109/ITC-ASIA.2018.00030},
timestamp = {Mon, 09 Aug 2021 14:54:04 +0200},
biburl = {https://dblp.org/rec/conf/itc-asia/NishimiSKN18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/MiyakeSK17,
author = {Yousuke Miyake and
Yasuo Sato and
Seiji Kajihara},
title = {On the effects of real time and contiguous measurement with a digital
temperature and voltage sensor},
booktitle = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
September 13-15, 2017},
pages = {125--130},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ITC-ASIA.2017.8097126},
doi = {10.1109/ITC-ASIA.2017.8097126},
timestamp = {Mon, 09 Aug 2021 14:54:04 +0200},
biburl = {https://dblp.org/rec/conf/itc-asia/MiyakeSK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/MayugaYYSI16,
author = {Gian Mayuga and
Yuta Yamato and
Tomokazu Yoneda and
Yasuo Sato and
Michiko Inoue},
title = {Reliability-Enhanced ECC-Based Memory Architecture Using In-Field
Self-Repair},
journal = {{IEICE} Trans. Inf. Syst.},
volume = {99-D},
number = {10},
pages = {2591--2599},
year = {2016},
url = {https://doi.org/10.1587/transinf.2015EDP7408},
doi = {10.1587/TRANSINF.2015EDP7408},
timestamp = {Sat, 11 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ieicet/MayugaYYSI16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/MiyakeSKM16,
author = {Yousuke Miyake and
Yasuo Sato and
Seiji Kajihara and
Yukiya Miura},
title = {Temperature and Voltage Measurement for Field Test Using an Aging-Tolerant
Monitor},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {24},
number = {11},
pages = {3282--3295},
year = {2016},
url = {https://doi.org/10.1109/TVLSI.2016.2540654},
doi = {10.1109/TVLSI.2016.2540654},
timestamp = {Wed, 11 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tvlsi/MiyakeSKM16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KatoWSKW16,
author = {Takaaki Kato and
Senling Wang and
Yasuo Sato and
Seiji Kajihara and
Xiaoqing Wen},
title = {A Flexible Power Control Method for Right Power Testing of Scan-Based
Logic {BIST}},
booktitle = {25th {IEEE} Asian Test Symposium, {ATS} 2016, Hiroshima, Japan, November
21-24, 2016},
pages = {203--208},
publisher = {{IEEE} Computer Society},
year = {2016},
url = {https://doi.org/10.1109/ATS.2016.59},
doi = {10.1109/ATS.2016.59},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KatoWSKW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/MayugaYYSI16,
author = {Gian Mayuga and
Yuta Yamato and
Tomokazu Yoneda and
Yasuo Sato and
Michiko Inoue},
title = {Reliability enhancement of embedded memory with combination of aging-aware
adaptive in-field self-repair and {ECC}},
booktitle = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
May 23-27, 2016},
pages = {1--2},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/ETS.2016.7519284},
doi = {10.1109/ETS.2016.7519284},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/ets/MayugaYYSI16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jolpe/WangSKT15,
author = {Senling Wang and
Yasuo Sato and
Seiji Kajihara and
Hiroshi Takahashi},
title = {Physical Power Evaluation of Low Power Logic-BIST Scheme Using Test
Element Group Chip},
journal = {J. Low Power Electron.},
volume = {11},
number = {4},
pages = {528--540},
year = {2015},
url = {https://doi.org/10.1166/jolpe.2015.1410},
doi = {10.1166/JOLPE.2015.1410},
timestamp = {Fri, 22 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jolpe/WangSKT15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/MayugaYYIS15,
author = {Gian Mayuga and
Yuta Yamato and
Tomokazu Yoneda and
Michiko Inoue and
Yasuo Sato},
title = {An ECC-based memory architecture with online self-repair capabilities
for reliability enhancement},
booktitle = {20th {IEEE} European Test Symposium, {ETS} 2015, Cluj-Napoca, Romania,
25-29 May, 2015},
pages = {1--6},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/ETS.2015.7138734},
doi = {10.1109/ETS.2015.7138734},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/ets/MayugaYYIS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/TomitaWSKMHGTW14,
author = {Akihiro Tomita and
Xiaoqing Wen and
Yasuo Sato and
Seiji Kajihara and
Kohei Miyase and
Stefan Holst and
Patrick Girard and
Mohammad Tehranipoor and
Laung{-}Terng Wang},
title = {On Achieving Capture Power Safety in At-Speed Scan-Based Logic {BIST}},
journal = {{IEICE} Trans. Inf. Syst.},
volume = {97-D},
number = {10},
pages = {2706--2718},
year = {2014},
url = {https://doi.org/10.1587/transinf.2014EDP7039},
doi = {10.1587/TRANSINF.2014EDP7039},
timestamp = {Sat, 11 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ieicet/TomitaWSKMHGTW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MiyakeSKM14,
author = {Yousuke Miyake and
Yasuo Sato and
Seiji Kajihara and
Yukiya Miura},
title = {Temperature and Voltage Estimation Using Ring-Oscillator-Based Monitor
for Field Test},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {156--161},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.38},
doi = {10.1109/ATS.2014.38},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MiyakeSKM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KajiharaMSM14,
author = {Seiji Kajihara and
Yousuke Miyake and
Yasuo Sato and
Yukiya Miura},
title = {An On-Chip Digital Environment Monitor for Field Test},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {254--257},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.54},
doi = {10.1109/ATS.2014.54},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KajiharaMSM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/prdc/SatoMMK14,
author = {Yasuo Sato and
Masafumi Monden and
Yousuke Miyake and
Seiji Kajihara},
title = {Reduction of NBTI-Induced Degradation on Ring Oscillators in {FPGA}},
booktitle = {20th {IEEE} Pacific Rim International Symposium on Dependable Computing,
{PRDC} 2014, Singapore, November 18-21, 2014},
pages = {59--67},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/PRDC.2014.16},
doi = {10.1109/PRDC.2014.16},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/prdc/SatoMMK14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/WangSKM13,
author = {Senling Wang and
Yasuo Sato and
Seiji Kajihara and
Kohei Miyase},
title = {Scan-Out Power Reduction for Logic {BIST}},
journal = {{IEICE} Trans. Inf. Syst.},
volume = {96-D},
number = {9},
pages = {2012--2020},
year = {2013},
url = {https://doi.org/10.1587/transinf.E96.D.2012},
doi = {10.1587/TRANSINF.E96.D.2012},
timestamp = {Mon, 15 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ieicet/WangSKM13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TomitaWSKGTW13,
author = {Akihiro Tomita and
Xiaoqing Wen and
Yasuo Sato and
Seiji Kajihara and
Patrick Girard and
Mohammad Tehranipoor and
Laung{-}Terng Wang},
title = {On Achieving Capture Power Safety in At-Speed Scan-Based Logic {BIST}},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {19--24},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.14},
doi = {10.1109/ATS.2013.14},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TomitaWSKGTW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SatoK13,
author = {Yasuo Sato and
Seiji Kajihara},
title = {A Stochastic Model for NBTI-Induced {LSI} Degradation in Field},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {183--188},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.42},
doi = {10.1109/ATS.2013.42},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SatoK13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/YiYISKF12,
author = {Hyunbean Yi and
Tomokazu Yoneda and
Michiko Inoue and
Yasuo Sato and
Seiji Kajihara and
Hideo Fujiwara},
title = {A Failure Prediction Strategy for Transistor Aging},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {20},
number = {11},
pages = {1951--1959},
year = {2012},
url = {https://doi.org/10.1109/TVLSI.2011.2165304},
doi = {10.1109/TVLSI.2011.2165304},
timestamp = {Wed, 11 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tvlsi/YiYISKF12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SatoWKMK12,
author = {Yasuo Sato and
Senling Wang and
Takaaki Kato and
Kohei Miyase and
Seiji Kajihara},
title = {Low Power {BIST} for Scan-Shift and Capture Power},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {173--178},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.27},
doi = {10.1109/ATS.2012.27},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SatoWKMK12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WangSMK12,
author = {Senling Wang and
Yasuo Sato and
Kohei Miyase and
Seiji Kajihara},
title = {A Scan-Out Power Reduction Method for Multi-cycle {BIST}},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {272--277},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.50},
doi = {10.1109/ATS.2012.50},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WangSMK12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/MiuraSMK12,
author = {Yukiya Miura and
Yasuo Sato and
Yousuke Miyake and
Seiji Kajihara},
title = {On-chip temperature and voltage measurement for field testing},
booktitle = {17th {IEEE} European Test Symposium, {ETS} 2012, Annecy, France, May
28 - June 1 2012},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ETS.2012.6233035},
doi = {10.1109/ETS.2012.6233035},
timestamp = {Tue, 28 Apr 2020 11:43:43 +0200},
biburl = {https://dblp.org/rec/conf/ets/MiuraSMK12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SatoKYHIMUHSS12,
author = {Yasuo Sato and
Seiji Kajihara and
Tomokazu Yoneda and
Kazumi Hatayama and
Michiko Inoue and
Yukiya Miura and
Satosni Untake and
Takumi Hasegawa and
Motoyuki Sato and
Kotaro Shimamura},
title = {{DART:} Dependable {VLSI} test architecture and its implementation},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401581},
doi = {10.1109/TEST.2012.6401581},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SatoKYHIMUHSS12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SatoYMK11,
author = {Yasuo Sato and
Hisato Yamaguchi and
Makoto Matsuzono and
Seiji Kajihara},
title = {Multi-cycle Test with Partial Observation on Scan-Based {BIST} Structure},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {54--59},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.34},
doi = {10.1109/ATS.2011.34},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SatoYMK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsn/FanRWKS11,
author = {Xiaoxin Fan and
Sudhakar M. Reddy and
Senling Wang and
Seiji Kajihara and
Yasuo Sato},
title = {Genetic algorithm based approach for segmented testing},
booktitle = {{IEEE/IFIP} International Conference on Dependable Systems and Networks
Workshops {(DSN-W} 2011), Hong Kong, China, June 27-30, 2011},
pages = {85--90},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/DSNW.2011.5958841},
doi = {10.1109/DSNW.2011.5958841},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsn/FanRWKS11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/YonedaNISF11,
author = {Tomokazu Yoneda and
Makoto Nakao and
Michiko Inoue and
Yasuo Sato and
Hideo Fujiwara},
title = {Temperature-Variation-Aware Test Pattern Optimization},
booktitle = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27,
2011},
pages = {214},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ETS.2011.45},
doi = {10.1109/ETS.2011.45},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/YonedaNISF11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Sato11,
author = {Yasuo Sato},
title = {Special session: Multifaceted approaches for field reliability},
booktitle = {29th {IEEE} {VLSI} Test Symposium, {VTS} 2011, May 1-5, 2011, Dana
Point, California, {USA}},
pages = {96},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/VTS.2011.5783762},
doi = {10.1109/VTS.2011.5783762},
timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
biburl = {https://dblp.org/rec/conf/vts/Sato11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ipsj/OkuKSMW10,
author = {Shinji Oku and
Seiji Kajihara and
Yasuo Sato and
Kohei Miyase and
Xiaoqing Wen},
title = {On Delay Test Quality for Test Cubes},
journal = {{IPSJ} Trans. Syst. {LSI} Des. Methodol.},
volume = {3},
pages = {283--291},
year = {2010},
url = {https://doi.org/10.2197/ipsjtsldm.3.283},
doi = {10.2197/IPSJTSLDM.3.283},
timestamp = {Tue, 29 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ipsj/OkuKSMW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/Sato10,
author = {Yasuo Sato},
title = {Circuit Failure Prediction by Field Test - {A} New Task of Testing},
booktitle = {25th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} Systems, {DFT} 2010, Kyoto, Japan, October 6-8, 2010},
pages = {69--70},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/DFT.2010.15},
doi = {10.1109/DFT.2010.15},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/Sato10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/NodaKSMWM10,
author = {Mitsumasa Noda and
Seiji Kajihara and
Yasuo Sato and
Kohei Miyase and
Xiaoqing Wen and
Yukiya Miura},
title = {On estimation of NBTI-Induced delay degradation},
booktitle = {15th European Test Symposium, {ETS} 2010, Prague, Czech Republic,
May 24-28, 2010},
pages = {107--111},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ETSYM.2010.5512772},
doi = {10.1109/ETSYM.2010.5512772},
timestamp = {Tue, 28 Apr 2020 11:43:44 +0200},
biburl = {https://dblp.org/rec/conf/ets/NodaKSMWM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/YiYISKF10,
author = {Hyunbean Yi and
Tomokazu Yoneda and
Michiko Inoue and
Yasuo Sato and
Seiji Kajihara and
Hideo Fujiwara},
title = {Aging test strategy and adaptive test scheduling for SoC failure prediction},
booktitle = {16th {IEEE} International On-Line Testing Symposium {(IOLTS} 2010),
5-7 July, 2010, Corfu, Greece},
pages = {21--26},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/IOLTS.2010.5560239},
doi = {10.1109/IOLTS.2010.5560239},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/YiYISKF10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/YonedaISF10,
author = {Tomokazu Yoneda and
Michiko Inoue and
Yasuo Sato and
Hideo Fujiwara},
title = {Thermal-uniformity-aware X-filling to reduce temperature-induced delay
variation for accurate at-speed testing},
booktitle = {28th {IEEE} {VLSI} Test Symposium, {VTS} 2010, April 19-22, 2010,
Santa Cruz, California, {USA}},
pages = {188--193},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/VTS.2010.5469578},
doi = {10.1109/VTS.2010.5469578},
timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
biburl = {https://dblp.org/rec/conf/vts/YonedaISF10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/TakahashiHKTYAS08,
author = {Hiroshi Takahashi and
Yoshinobu Higami and
Shuhei Kadoyama and
Yuzo Takamatsu and
Koji Yamazaki and
Takashi Aikyo and
Yasuo Sato},
title = {Post-BIST Fault Diagnosis for Multiple Faults},
journal = {{IEICE} Trans. Inf. Syst.},
volume = {91-D},
number = {3},
pages = {771--775},
year = {2008},
url = {https://doi.org/10.1093/ietisy/e91-d.3.771},
doi = {10.1093/IETISY/E91-D.3.771},
timestamp = {Sat, 11 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ieicet/TakahashiHKTYAS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KohiyamaRSWZ07,
author = {Yasuharu Kohiyama and
C. P. Ravikumar and
Yasuo Sato and
Laung{-}Terng Wang and
Yervant Zorian},
title = {Next Generation Test, Diagnostics and Yield Challenges for EDA, ATE,
{IP} and Fab - {A} Perspective from All Sides},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {207},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.111},
doi = {10.1109/ATS.2007.111},
timestamp = {Wed, 09 Nov 2022 21:30:34 +0100},
biburl = {https://dblp.org/rec/conf/ats/KohiyamaRSWZ07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/SatoHMTK06,
author = {Yasuo Sato and
Shuji Hamada and
Toshiyuki Maeda and
Atsuo Takatori and
Seiji Kajihara},
title = {A Statistical Quality Model for Delay Testing},
journal = {{IEICE} Trans. Electron.},
volume = {89-C},
number = {3},
pages = {349--355},
year = {2006},
url = {https://doi.org/10.1093/ietele/e89-c.3.349},
doi = {10.1093/IETELE/E89-C.3.349},
timestamp = {Sat, 11 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ieicet/SatoHMTK06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/FukunagaKWMHS06,
author = {Masayasu Fukunaga and
Seiji Kajihara and
Xiaoqing Wen and
Toshiyuki Maeda and
Shuji Hamada and
Yasuo Sato},
editor = {Fumiyasu Hirose},
title = {A dynamic test compaction procedure for high-quality path delay testing},
booktitle = {Proceedings of the 2006 Conference on Asia South Pacific Design Automation:
{ASP-DAC} 2006, Yokohama, Japan, January 24-27, 2006},
pages = {348--353},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ASPDAC.2006.1594707},
doi = {10.1109/ASPDAC.2006.1594707},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/aspdac/FukunagaKWMHS06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LinTWKRKKSHA06,
author = {Xijiang Lin and
Kun{-}Han Tsai and
Chen Wang and
Mark Kassab and
Janusz Rajski and
Takeo Kobayashi and
Randy Klingenberg and
Yasuo Sato and
Shuji Hamada and
Takashi Aikyo},
title = {Timing-Aware {ATPG} for High Quality At-speed Testing of Small Delay
Defects},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {139--146},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.261012},
doi = {10.1109/ATS.2006.261012},
timestamp = {Mon, 07 Nov 2022 17:39:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LinTWKRKKSHA06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/UzzamanTLCHS06,
author = {Anis Uzzaman and
Mick Tegethoff and
Bibo Li and
Kevin McCauley and
Shuji Hamada and
Yasuo Sato},
title = {Not all Delay Tests Are the Same - {SDQL} Model Shows True-Time},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {147--152},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.261013},
doi = {10.1109/ATS.2006.261013},
timestamp = {Wed, 08 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/UzzamanTLCHS06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GoswamiTKKRSWSA06,
author = {Dhiraj Goswami and
Kun{-}Han Tsai and
Mark Kassab and
Takeo Kobayashi and
Janusz Rajski and
Bruce Swanson and
Darryl Walters and
Yasuo Sato and
Toshiharu Asaka and
Takashi Aikyo},
title = {At-Speed Testing with Timing Exceptions and Constraints-Case Studies},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {153--162},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.261014},
doi = {10.1109/ATS.2006.261014},
timestamp = {Mon, 07 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/GoswamiTKKRSWSA06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SatoSSYNS06,
author = {Yasuo Sato and
Kazushi Sugiura and
Reisuke Shimoda and
Yutaka Yoshizawa and
Kenji Norimatsu and
Masaru Sanada},
title = {Defect Diagnosis - Reasoning Methodology},
booktitle = {15th Asian Test Symposium, {ATS} 2006, Fukuoka, Japan, November 20-23,
2006},
pages = {209--214},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/ATS.2006.261022},
doi = {10.1109/ATS.2006.261022},
timestamp = {Mon, 07 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SatoSSYNS06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/TakahashiKHTYAS06,
author = {Hiroshi Takahashi and
Shuhei Kadoyama and
Yoshinobu Higami and
Yuzo Takamatsu and
Koji Yamazaki and
Takashi Aikyo and
Yasuo Sato},
title = {Effective Post-BIST Fault Diagnosis for Multiple Faults},
booktitle = {21th {IEEE} International Symposium on Defect and Fault-Tolerance
in {VLSI} Systems {(DFT} 2006), 4-6 October 2006, Arlington, Virginia,
{USA}},
pages = {401--109},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/DFT.2006.24},
doi = {10.1109/DFT.2006.24},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/TakahashiKHTYAS06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HamadaMTNS06,
author = {Shuji Hamada and
Toshiyuki Maeda and
Atsuo Takatori and
Yasuyuki Noduyama and
Yasuo Sato},
editor = {Scott Davidson and
Anne Gattiker},
title = {Recognition of Sensitized Longest Paths in Transition Delay Test},
booktitle = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
CA, USA, October 22-27, 2006},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/TEST.2006.297622},
doi = {10.1109/TEST.2006.297622},
timestamp = {Tue, 12 Dec 2023 09:46:27 +0100},
biburl = {https://dblp.org/rec/conf/itc/HamadaMTNS06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KajiharaMTWMHS06,
author = {Seiji Kajihara and
Shohei Morishima and
Akane Takuma and
Xiaoqing Wen and
Toshiyuki Maeda and
Shuji Hamada and
Yasuo Sato},
editor = {Scott Davidson and
Anne Gattiker},
title = {A Framework of High-quality Transition Fault {ATPG} for Scan Circuits},
booktitle = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
CA, USA, October 22-27, 2006},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/TEST.2006.297683},
doi = {10.1109/TEST.2006.297683},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/KajiharaMTWMHS06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/SatoHMTK05,
author = {Yasuo Sato and
Shuji Hamada and
Toshiyuki Maeda and
Atsuo Takatori and
Seiji Kajihara},
editor = {Tingao Tang},
title = {Evaluation of the statistical delay quality model},
booktitle = {Proceedings of the 2005 Conference on Asia South Pacific Design Automation,
{ASP-DAC} 2005, Shanghai, China, January 18-21, 2005},
pages = {305--310},
publisher = {{ACM} Press},
year = {2005},
url = {https://doi.org/10.1145/1120725.1120856},
doi = {10.1145/1120725.1120856},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/aspdac/SatoHMTK05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/KajiharaFWMHS05,
author = {Seiji Kajihara and
Masayasu Fukunaga and
Xiaoqing Wen and
Toshiyuki Maeda and
Shuji Hamada and
Yasuo Sato},
editor = {William H. Joyner Jr. and
Grant Martin and
Andrew B. Kahng},
title = {Path delay test compaction with process variation tolerance},
booktitle = {Proceedings of the 42nd Design Automation Conference, {DAC} 2005,
San Diego, CA, USA, June 13-17, 2005},
pages = {845--850},
publisher = {{ACM}},
year = {2005},
url = {https://doi.org/10.1145/1065579.1065802},
doi = {10.1145/1065579.1065802},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/KajiharaFWMHS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SatoHMTNK05,
author = {Yasuo Sato and
Shuji Hamada and
Toshiyuki Maeda and
Atsuo Takatori and
Yasuyuki Nozuyama and
Seiji Kajihara},
title = {Invisible delay quality - {SDQM} model lights up what could not be
seen},
booktitle = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005,
Austin, TX, USA, November 8-10, 2005},
pages = {9},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/TEST.2005.1584088},
doi = {10.1109/TEST.2005.1584088},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SatoHMTNK05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/SatoYYITI04,
author = {Yasuo Sato and
Iwao Yamazaki and
Hiroki Yamanaka and
Toshio Ikeda and
Masahiro Takakura and
Kazuhiko Iwasaki},
title = {Technique to Diagnose Open Defects that Takes Coupling Effects into
Consideration},
journal = {{IEICE} Trans. Inf. Syst.},
volume = {87-D},
number = {9},
pages = {2179--2185},
year = {2004},
url = {http://search.ieice.org/bin/summary.php?id=e87-d\_9\_2179},
timestamp = {Sat, 11 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ieicet/SatoYYITI04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieiceta/SatoSTHN03,
author = {Yasuo Sato and
Motoyuki Sato and
Koki Tsutsumida and
Kazumi Hatayama and
Kazuyuki Nomoto},
title = {{DFT} Timing Design Methodology for Logic {BIST}},
journal = {{IEICE} Trans. Fundam. Electron. Commun. Comput. Sci.},
volume = {86-A},
number = {12},
pages = {3049--3055},
year = {2003},
url = {http://search.ieice.org/bin/summary.php?id=e86-a\_12\_3049},
timestamp = {Tue, 08 Jun 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ieiceta/SatoSTHN03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/SatoSTKHN03,
author = {Yasuo Sato and
Motoyuki Sato and
Koki Tsutsumida and
Masatoshi Kawashima and
Kazumi Hatayama and
Kazuyuki Nomoto},
editor = {Hiroto Yasuura},
title = {{DFT} timing design methodology for at-speed {BIST}},
booktitle = {Proceedings of the 2003 Asia and South Pacific Design Automation Conference,
{ASP-DAC} '03, Kitakyushu, Japan, January 21-24, 2003},
pages = {763--768},
publisher = {{ACM}},
year = {2003},
url = {https://doi.org/10.1145/1119772.1119942},
doi = {10.1145/1119772.1119942},
timestamp = {Thu, 11 Mar 2021 17:04:51 +0100},
biburl = {https://dblp.org/rec/conf/aspdac/SatoSTKHN03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HatayamaNS02,
author = {Kazumi Hatayama and
Michinobu Nakao and
Yasuo Sato},
title = {At-Speed Built-in Test for Logic Circuits with Multiple Clocks},
booktitle = {11th Asian Test Symposium {(ATS} 2002), 18-20 November 2002, Guam,
{USA}},
pages = {292--297},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/ATS.2002.1181726},
doi = {10.1109/ATS.2002.1181726},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HatayamaNS02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SatoYYIT02,
author = {Yasuo Sato and
Iwao Yamazaki and
Hiroki Yamanaka and
Toshio Ikeda and
Masahiro Takakura},
title = {A Persistent Diagnostic Technique for Unstable Defects},
booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
MD, USA, October 7-10, 2002},
pages = {242--249},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/TEST.2002.1041766},
doi = {10.1109/TEST.2002.1041766},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SatoYYIT02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HatayamaNKNSN02,
author = {Kazumi Hatayama and
Michinobu Nakao and
Yoshikazu Kiyoshige and
Koichiro Natsume and
Yasuo Sato and
Takaharu Nagumo},
title = {Application of High-Quality Built-In Test to Industrial Designs},
booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
MD, USA, October 7-10, 2002},
pages = {1003--1012},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/TEST.2002.1041856},
doi = {10.1109/TEST.2002.1041856},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HatayamaNKNSN02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YamazakiYITS01,
author = {Iwao Yamazaki and
Hiroki Yamanaka and
Toshio Ikeda and
Masahiro Takakura and
Yasuo Sato},
title = {An Approach to Improve the Resolution of Defect-Based Diagnosis},
booktitle = {10th Asian Test Symposium {(ATS} 2001), 19-21 November 2001, Kyoto,
Japan},
pages = {123},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/ATS.2001.990270},
doi = {10.1109/ATS.2001.990270},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YamazakiYITS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NakaoKHSN01,
author = {Michinobu Nakao and
Yoshikazu Kiyoshige and
Kazumi Hatayama and
Yasuo Sato and
Takaharu Nagumo},
title = {Test Generation for Multiple-Threshold Gate-Delay Fault Model},
booktitle = {10th Asian Test Symposium {(ATS} 2001), 19-21 November 2001, Kyoto,
Japan},
pages = {244},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/ATS.2001.990290},
doi = {10.1109/ATS.2001.990290},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/NakaoKHSN01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SatoSTIK01,
author = {Yasuo Sato and
Motoyuki Sato and
Koki Tsutsumida and
Toyohito Ikeya and
Masatoshi Kawashima},
title = {A Practical Logic {BIST} for {ASIC} Designs},
booktitle = {10th Asian Test Symposium {(ATS} 2001), 19-21 November 2001, Kyoto,
Japan},
pages = {457},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/ATS.2001.990327},
doi = {10.1109/ATS.2001.990327},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SatoSTIK01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SatoKIYH01,
author = {Yasuo Sato and
Masaki Kohno and
Toshio Ikeda and
Iwao Yamazaki and
Masato Hamamoto},
title = {An evaluation of defect-oriented test: WELL-controlled low voltage
test},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {1059--1067},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966732},
doi = {10.1109/TEST.2001.966732},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SatoKIYH01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SatoINN00,
author = {Yasuo Sato and
Toyohito Ikeya and
Michinobu Nakao and
Takaharu Nagumo},
title = {A {BIST} approach for very deep sub-micron {(VDSM)} defects},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {283--291},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894216},
doi = {10.1109/TEST.2000.894216},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SatoINN00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icdcs/SatoIMF96,
author = {Yasuo Sato and
Michiko Inoue and
Toshimitsu Masuzawa and
Hideo Fujiwara},
title = {A Snapshot Algorithm for Distributed Mobile Systems},
booktitle = {Proceedings of the 16th International Conference on Distributed Computing
Systems, Hong Kong, May 27-30, 1996},
pages = {734--743},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/ICDCS.1996.508026},
doi = {10.1109/ICDCS.1996.508026},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/icdcs/SatoIMF96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/OgawaIMIST91,
author = {Yasushi Ogawa and
Tsutomu Itoh and
Yoshio Miki and
Tatsuki Ishii and
Yasuo Sato and
Reiji Toyoshima},
editor = {A. Richard Newton},
title = {Timing- and Constraint-Oriented Placement for Interconnected LSIs
in Mainframe Design},
booktitle = {Proceedings of the 28th Design Automation Conference, San Francisco,
California, USA, June 17-21, 1991},
pages = {253--258},
publisher = {{ACM}},
year = {1991},
url = {https://doi.org/10.1145/127601.127676},
doi = {10.1145/127601.127676},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/OgawaIMIST91.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icassp/TajimaKS86,
author = {Koji Tajima and
Mitsuo Komura and
Yasuo Sato},
title = {Connected word recognition by overlap and split of reference patterns
and its performance evaluation tests},
booktitle = {{IEEE} International Conference on Acoustics, Speech, and Signal Processing,
{ICASSP} 1986, Tokyo, Japan, April 7-11, 1986},
pages = {1101--1104},
publisher = {{IEEE}},
year = {1986},
url = {https://doi.org/10.1109/ICASSP.1986.1168964},
doi = {10.1109/ICASSP.1986.1168964},
timestamp = {Mon, 09 Aug 2021 14:54:02 +0200},
biburl = {https://dblp.org/rec/conf/icassp/TajimaKS86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icassp/HermanskyFS84,
author = {Hynek Hermansky and
Hiroya Fujisaki and
Yasuo Sato},
title = {Spectral envelope sampling and interpolation in linear predictive
analysis of speech},
booktitle = {{IEEE} International Conference on Acoustics, Speech, and Signal Processing,
{ICASSP} '84, San Diego, California, USA, March 19-21, 1984},
pages = {53--56},
publisher = {{IEEE}},
year = {1984},
url = {https://doi.org/10.1109/ICASSP.1984.1172421},
doi = {10.1109/ICASSP.1984.1172421},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/icassp/HermanskyFS84.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icassp/FujisakiHIS84,
author = {Hiroya Fujisaki and
Keikichi Hirose and
Tomohiro Inoue and
Yasuo Sato},
title = {Automatic recognition of spoken words from a large vocabulary using
syllable templates},
booktitle = {{IEEE} International Conference on Acoustics, Speech, and Signal Processing,
{ICASSP} '84, San Diego, California, USA, March 19-21, 1984},
pages = {605--608},
publisher = {{IEEE}},
year = {1984},
url = {https://doi.org/10.1109/ICASSP.1984.1172816},
doi = {10.1109/ICASSP.1984.1172816},
timestamp = {Fri, 19 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/icassp/FujisakiHIS84.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icassp/HermanskyFS83,
author = {Hynek Hermansky and
Hiroya Fujisaki and
Yasuo Sato},
title = {Analysis and synthesis of speech based on spectral transform linear
predictive method},
booktitle = {{IEEE} International Conference on Acoustics, Speech, and Signal Processing,
{ICASSP} '83, Boston, Massachusetts, USA, April 14-16, 1983},
pages = {777--780},
publisher = {{IEEE}},
year = {1983},
url = {https://doi.org/10.1109/ICASSP.1983.1172025},
doi = {10.1109/ICASSP.1983.1172025},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/icassp/HermanskyFS83.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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