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BibTeX records: BethAnn Rainey
@article{DBLP:journals/ibmrd/MannABBBCCCFHHHJLMRMPPRTY03, author = {Randy W. Mann and W. W. (Bill) Abadeer and Matthew J. Breitwisch and O. Bula and Jeff S. Brown and Bryant C. Colwill and Peter E. Cottrell and William T. Crocco Jr. and Stephen S. Furkay and Michael J. Hauser and Terence B. Hook and Dennis Hoyniak and James M. Johnson and Chung Hon Lam and Rebecca D. Mih and J. Rivard and Atsushi Moriwaki and E. Phipps and Christopher S. Putnam and BethAnn Rainey and James J. Toomey and Mohammad Imran Younus}, title = {Ultralow-power {SRAM} technology}, journal = {{IBM} J. Res. Dev.}, volume = {47}, number = {5-6}, pages = {553--566}, year = {2003}, url = {https://doi.org/10.1147/rd.475.0553}, doi = {10.1147/RD.475.0553}, timestamp = {Fri, 13 Mar 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/ibmrd/MannABBBCCCFHHHJLMRMPPRTY03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/cicc/NowakLAKLRBGKF03, author = {Edward J. Nowak and Thomas Ludwig and Ingo Aller and Jakub Kedzierski and M. Leong and BethAnn Rainey and Matthew J. Breitwisch and V. Gemhoefer and Joachim Keinert and David M. Fried}, title = {Scaling beyond the 65 nm node with FinFET-DGCMOS}, booktitle = {Proceedings of the {IEEE} Custom Integrated Circuits Conference, {CICC} 2003, San Jose, CA, USA, September 21 - 24, 2003}, pages = {339--342}, publisher = {{IEEE}}, year = {2003}, url = {https://doi.org/10.1109/CICC.2003.1249415}, doi = {10.1109/CICC.2003.1249415}, timestamp = {Wed, 17 Nov 2021 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/cicc/NowakLAKLRBGKF03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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