BibTeX records: Artur Pogiel

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@article{DBLP:journals/tcad/KaczmarekM0PR0T22,
  author       = {Bartosz Kaczmarek and
                  Grzegorz Mrugalski and
                  Nilanjan Mukherjee and
                  Artur Pogiel and
                  Janusz Rajski and
                  Lukasz Rybak and
                  Jerzy Tyszer},
  title        = {{LBIST} for Automotive ICs With Enhanced Test Generation},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {41},
  number       = {7},
  pages        = {2290--2300},
  year         = {2022},
  url          = {https://doi.org/10.1109/TCAD.2021.3100741},
  doi          = {10.1109/TCAD.2021.3100741},
  timestamp    = {Tue, 28 Jun 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/KaczmarekM0PR0T22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/GrzelakKPRT21,
  author       = {Bartosz Grzelak and
                  Martin Keim and
                  Artur Pogiel and
                  Janusz Rajski and
                  Jerzy Tyszer},
  title        = {Convolutional Compaction-Based {MRAM} Fault Diagnosis},
  booktitle    = {26th {IEEE} European Test Symposium, {ETS} 2021, Bruges, Belgium,
                  May 24-28, 2021},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ETS50041.2021.9465464},
  doi          = {10.1109/ETS50041.2021.9465464},
  timestamp    = {Fri, 02 Jul 2021 14:14:26 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/GrzelakKPRT21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/PogielRT17,
  author       = {Artur Pogiel and
                  Janusz Rajski and
                  Jerzy Tyszer},
  title        = {{ROM} fault diagnosis for O(n\({}^{\mbox{2}}\)) test algorithms},
  booktitle    = {22nd {IEEE} European Test Symposium, {ETS} 2017, Limassol, Cyprus,
                  May 22-26, 2017},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ETS.2017.7968229},
  doi          = {10.1109/ETS.2017.7968229},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/PogielRT17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/TrawkaMMPRJT14,
  author       = {Maciej Trawka and
                  Grzegorz Mrugalski and
                  Nilanjan Mukherjee and
                  Artur Pogiel and
                  Janusz Rajski and
                  Jakub Janicki and
                  Jerzy Tyszer},
  title        = {High-Speed Serial Embedded Deterministic Test for System-on-Chip Designs},
  booktitle    = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
                  16-19, 2014},
  pages        = {74--80},
  publisher    = {{IEEE} Computer Society},
  year         = {2014},
  url          = {https://doi.org/10.1109/ATS.2014.25},
  doi          = {10.1109/ATS.2014.25},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/TrawkaMMPRJT14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ddecs/AuPRSTZ14,
  author       = {Albert Au and
                  Artur Pogiel and
                  Janusz Rajski and
                  Piotr Sydow and
                  Jerzy Tyszer and
                  Justyna Zawada},
  title        = {Quality assurance in memory built-in self-test tools},
  booktitle    = {17th International Symposium on Design and Diagnostics of Electronic
                  Circuits {\&} Systems, {DDECS} 2014, Warsaw, Poland, 23-25 April,
                  2014},
  pages        = {39--44},
  publisher    = {{IEEE} Computer Society},
  year         = {2014},
  url          = {https://doi.org/10.1109/DDECS.2014.6868760},
  doi          = {10.1109/DDECS.2014.6868760},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ddecs/AuPRSTZ14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/computer/MukherjeeRMPT11,
  author       = {Nilanjan Mukherjee and
                  Janusz Rajski and
                  Grzegorz Mrugalski and
                  Artur Pogiel and
                  Jerzy Tyszer},
  title        = {Ring Generator: An Ultimate Linear Feedback Shift Register},
  journal      = {Computer},
  volume       = {44},
  number       = {6},
  pages        = {64--71},
  year         = {2011},
  url          = {https://doi.org/10.1109/MC.2010.334},
  doi          = {10.1109/MC.2010.334},
  timestamp    = {Wed, 12 Aug 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/computer/MukherjeeRMPT11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/BenwareMPRST11,
  author       = {Brady Benware and
                  Grzegorz Mrugalski and
                  Artur Pogiel and
                  Janusz Rajski and
                  Jedrzej Solecki and
                  Jerzy Tyszer},
  title        = {Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs},
  journal      = {J. Electron. Test.},
  volume       = {27},
  number       = {5},
  pages        = {599--609},
  year         = {2011},
  url          = {https://doi.org/10.1007/s10836-011-5243-6},
  doi          = {10.1007/S10836-011-5243-6},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/BenwareMPRST11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tcad/MukherjeePRT11,
  author       = {Nilanjan Mukherjee and
                  Artur Pogiel and
                  Janusz Rajski and
                  Jerzy Tyszer},
  title        = {BIST-Based Fault Diagnosis for Read-Only Memories},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {30},
  number       = {7},
  pages        = {1072--1085},
  year         = {2011},
  url          = {https://doi.org/10.1109/TCAD.2011.2127030},
  doi          = {10.1109/TCAD.2011.2127030},
  timestamp    = {Thu, 24 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/MukherjeePRT11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/MrugalskiPMRTU11,
  author       = {Grzegorz Mrugalski and
                  Artur Pogiel and
                  Nilanjan Mukherjee and
                  Janusz Rajski and
                  Jerzy Tyszer and
                  Pawel Urbanek},
  title        = {Fault Diagnosis in Memory {BIST} Environment with Non-march Tests},
  booktitle    = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
                  Delhi, India, November 20-23, 2011},
  pages        = {419--424},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/ATS.2011.48},
  doi          = {10.1109/ATS.2011.48},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/MrugalskiPMRTU11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/BenwareMPRST11,
  author       = {Brady Benware and
                  Grzegorz Mrugalski and
                  Artur Pogiel and
                  Janusz Rajski and
                  Jedrzej Solecki and
                  Jerzy Tyszer},
  title        = {Diagnosis of Failing Scan Cells through Orthogonal Response Compaction},
  booktitle    = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27,
                  2011},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/ETS.2011.56},
  doi          = {10.1109/ETS.2011.56},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/BenwareMPRST11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tcad/MukherjeePRT10,
  author       = {Nilanjan Mukherjee and
                  Artur Pogiel and
                  Janusz Rajski and
                  Jerzy Tyszer},
  title        = {High Volume Diagnosis in Memory {BIST} Based on Compressed Failure
                  Data},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {29},
  number       = {3},
  pages        = {441--453},
  year         = {2010},
  url          = {https://doi.org/10.1109/TCAD.2010.2041852},
  doi          = {10.1109/TCAD.2010.2041852},
  timestamp    = {Thu, 24 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/MukherjeePRT10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/BenwareMPRST10,
  author       = {Brady Benware and
                  Grzegorz Mrugalski and
                  Artur Pogiel and
                  Janusz Rajski and
                  Jedrzej Solecki and
                  Jerzy Tyszer},
  title        = {Diagnosis of failing scan cells through orthogonal response compaction},
  booktitle    = {15th European Test Symposium, {ETS} 2010, Prague, Czech Republic,
                  May 24-28, 2010},
  pages        = {221--226},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/ETSYM.2010.5512754},
  doi          = {10.1109/ETSYM.2010.5512754},
  timestamp    = {Tue, 28 Apr 2020 11:43:44 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/BenwareMPRST10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/MukherjeePRT09,
  author       = {Nilanjan Mukherjee and
                  Artur Pogiel and
                  Janusz Rajski and
                  Jerzy Tyszer},
  editor       = {Gordon W. Roberts and
                  Bill Eklow},
  title        = {Fault diagnosis for embedded read-only memories},
  booktitle    = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
                  USA, November 1-6, 2009},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/TEST.2009.5355530},
  doi          = {10.1109/TEST.2009.5355530},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MukherjeePRT09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vlsid/MukherjeePRT09,
  author       = {Nilanjan Mukherjee and
                  Artur Pogiel and
                  Janusz Rajski and
                  Jerzy Tyszer},
  title        = {High-Speed On-Chip Event Counters for Embedded Systems},
  booktitle    = {{VLSI} Design 2009: Improving Productivity through Higher Abstraction,
                  The 22nd International Conference on {VLSI} Design, New Delhi, India,
                  5-9 January 2009},
  pages        = {275--280},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/VLSI.Design.2009.15},
  doi          = {10.1109/VLSI.DESIGN.2009.15},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/MukherjeePRT09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/MukherjeePRT08,
  author       = {Nilanjan Mukherjee and
                  Artur Pogiel and
                  Janusz Rajski and
                  Jerzy Tyszer},
  editor       = {Douglas Young and
                  Nur A. Touba},
  title        = {High Throughput Diagnosis via Compression of Failure Data in Embedded
                  Memory {BIST}},
  booktitle    = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
                  California, USA, October 26-31, 2008},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2008},
  url          = {https://doi.org/10.1109/TEST.2008.4700554},
  doi          = {10.1109/TEST.2008.4700554},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MukherjeePRT08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/MrugalskiRWPT07,
  author       = {Grzegorz Mrugalski and
                  Janusz Rajski and
                  Chen Wang and
                  Artur Pogiel and
                  Jerzy Tyszer},
  title        = {Isolation of Failing Scan Cells through Convolutional Test Response
                  Compaction},
  journal      = {J. Electron. Test.},
  volume       = {23},
  number       = {1},
  pages        = {35--45},
  year         = {2007},
  url          = {https://doi.org/10.1007/s10836-006-9524-4},
  doi          = {10.1007/S10836-006-9524-4},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/MrugalskiRWPT07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tcad/MrugalskiPRT07,
  author       = {Grzegorz Mrugalski and
                  Artur Pogiel and
                  Janusz Rajski and
                  Jerzy Tyszer},
  title        = {Fault Diagnosis With Convolutional Compactors},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {26},
  number       = {8},
  pages        = {1478--1494},
  year         = {2007},
  url          = {https://doi.org/10.1109/TCAD.2007.891361},
  doi          = {10.1109/TCAD.2007.891361},
  timestamp    = {Thu, 24 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/MrugalskiPRT07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/PogielRT06,
  author       = {Artur Pogiel and
                  Janusz Rajski and
                  Jerzy Tyszer},
  title        = {Convolutional Compactors with Variable Polynomials},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {117--122},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.11},
  doi          = {10.1109/ETS.2006.11},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/PogielRT06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/MrugalskiPRTW05,
  author       = {Grzegorz Mrugalski and
                  Artur Pogiel and
                  Janusz Rajski and
                  Jerzy Tyszer and
                  Chen Wang},
  title        = {Convolutional compaction-driven diagnosis of scan failures},
  booktitle    = {10th European Test Symposium, {ETS} 2005, Tallinn, Estonia, May 22-25,
                  2005},
  pages        = {176--181},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/ETS.2005.11},
  doi          = {10.1109/ETS.2005.11},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/MrugalskiPRTW05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/MrugalskiPRT05,
  author       = {Grzegorz Mrugalski and
                  Artur Pogiel and
                  Janusz Rajski and
                  Jerzy Tyszer},
  title        = {Diagnosis with convolutional compactors in presence of unknown states},
  booktitle    = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005,
                  Austin, TX, USA, November 8-10, 2005},
  pages        = {10},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/TEST.2005.1583998},
  doi          = {10.1109/TEST.2005.1583998},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MrugalskiPRT05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/MrugalskiWPTR04,
  author       = {Grzegorz Mrugalski and
                  Chen Wang and
                  Artur Pogiel and
                  Jerzy Tyszer and
                  Janusz Rajski},
  title        = {Fault Diagnosis in Designs with Convolutional Compactors},
  booktitle    = {Proceedings 2004 International Test Conference {(ITC} 2004), October
                  26-28, 2004, Charlotte, NC, {USA}},
  pages        = {498--507},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/TEST.2004.1386986},
  doi          = {10.1109/TEST.2004.1386986},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MrugalskiWPTR04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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