BibTeX records: Masakazu Okada

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@article{DBLP:journals/ieicet/FujimakiTKTOHTAYNTT14,
  author       = {Akira Fujimaki and
                  Masamitsu Tanaka and
                  Ryo Kasagi and
                  Katsumi Takagi and
                  Masakazu Okada and
                  Yuhi Hayakawa and
                  Kensuke Takata and
                  Hiroyuki Akaike and
                  Nobuyuki Yoshikawa and
                  Shuichi Nagasawa and
                  Kazuyoshi Takagi and
                  Naofumi Takagi},
  title        = {Large-Scale Integrated Circuit Design Based on a Nb Nine-Layer Structure
                  for Reconfigurable Data-Path Processors},
  journal      = {{IEICE} Trans. Electron.},
  volume       = {97-C},
  number       = {3},
  pages        = {157--165},
  year         = {2014},
  url          = {https://doi.org/10.1587/transele.E97.C.157},
  doi          = {10.1587/TRANSELE.E97.C.157},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/ieicet/FujimakiTKTOHTAYNTT14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/ieicet/TanakaKOKTIF14,
  author       = {Masamitsu Tanaka and
                  Atsushi Kitayama and
                  Masakazu Okada and
                  Tomohito Kouketsu and
                  Takumi Takinami and
                  Masato Ito and
                  Akira Fujimaki},
  title        = {High-Speed Operation of 0.25-mV {RSFQ} Arithmetic Logic Unit Based
                  on 10-kA/cm\({}^{\mbox{2}}\) Nb Process Technology},
  journal      = {{IEICE} Trans. Electron.},
  volume       = {97-C},
  number       = {3},
  pages        = {166--172},
  year         = {2014},
  url          = {https://doi.org/10.1587/transele.E97.C.166},
  doi          = {10.1587/TRANSELE.E97.C.166},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/ieicet/TanakaKOKTIF14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/percom/KuzumeO14,
  author       = {Koichi Kuzume and
                  Masakazu Okada},
  title        = {Sensor network system to promote energy conservation realization of
                  energy smart school},
  booktitle    = {2014 {IEEE} International Conference on Pervasive Computing and Communication
                  Workshops, PerCom 2014 Workshops, Budapest, Hungary, March 24-28,
                  2014},
  pages        = {187--190},
  publisher    = {{IEEE} Computer Society},
  year         = {2014},
  url          = {https://doi.org/10.1109/PerComW.2014.6815197},
  doi          = {10.1109/PERCOMW.2014.6815197},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/percom/KuzumeO14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/ieicet/FujiiNMOIKYTYTTMTFAOTTYSS08,
  author       = {Masako Fujii and
                  Koji Nii and
                  Hiroshi Makino and
                  Shigeki Ohbayashi and
                  Motoshige Igarashi and
                  Takeshi Kawamura and
                  Miho Yokota and
                  Nobuhiro Tsuda and
                  Tomoaki Yoshizawa and
                  Toshikazu Tsutsui and
                  Naohiko Takeshita and
                  Naofumi Murata and
                  Tomohiro Tanaka and
                  Takanari Fujiwara and
                  Kyoko Asahina and
                  Masakazu Okada and
                  Kazuo Tomita and
                  Masahiko Takeuchi and
                  Shigehisa Yamamoto and
                  Hiromitsu Sugimoto and
                  Hirofumi Shinohara},
  title        = {A Large-Scale, Flip-Flop {RAM} Imitating a Logic {LSI} for Fast Development
                  of Process Technology},
  journal      = {{IEICE} Trans. Electron.},
  volume       = {91-C},
  number       = {8},
  pages        = {1338--1347},
  year         = {2008},
  url          = {https://doi.org/10.1093/ietele/e91-c.8.1338},
  doi          = {10.1093/IETELE/E91-C.8.1338},
  timestamp    = {Sat, 11 Apr 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/ieicet/FujiiNMOIKYTYTTMTFAOTTYSS08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/jssc/OhbayashiYKOIUY08,
  author       = {Shigeki Ohbayashi and
                  Makoto Yabuuchi and
                  Kazushi Kono and
                  Yuji Oda and
                  Susumu Imaoka and
                  Keiichi Usui and
                  Toshiaki Yonezu and
                  Takeshi Iwamoto and
                  Koji Nii and
                  Yasumasa Tsukamoto and
                  Masashi Arakawa and
                  Takahiro Uchida and
                  Masakazu Okada and
                  Atsushi Ishii and
                  Tsutomu Yoshihara and
                  Hiroshi Makino and
                  Koichiro Ishibashi and
                  Hirofumi Shinohara},
  title        = {A 65 nm Embedded {SRAM} With Wafer Level Burn-In Mode, Leak-Bit Redundancy
                  and Cu E-Trim Fuse for Known Good Die},
  journal      = {{IEEE} J. Solid State Circuits},
  volume       = {43},
  number       = {1},
  pages        = {96--108},
  year         = {2008},
  url          = {https://doi.org/10.1109/JSSC.2007.908004},
  doi          = {10.1109/JSSC.2007.908004},
  timestamp    = {Sun, 30 Aug 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jssc/OhbayashiYKOIUY08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/isscc/OhbayashiYKOIUYINTAUOIMIS07,
  author       = {Shigeki Ohbayashi and
                  Makoto Yabuuchi and
                  Kazushi Kono and
                  Yuji Oda and
                  Susumu Imaoka and
                  Keiichi Usui and
                  Toshiaki Yonezu and
                  Takeshi Iwamoto and
                  Koji Nii and
                  Yasumasa Tsukamoto and
                  Masashi Arakawa and
                  Takahiro Uchida and
                  Masakazu Okada and
                  Atsushi Ishii and
                  Hiroshi Makino and
                  Koichiro Ishibashi and
                  Hirofumi Shinohara},
  title        = {A 65nm Embedded {SRAM} with Wafer-Level Burn-In Mode, Leak-Bit Redundancy
                  and E-Trim Fuse for Known Good Die},
  booktitle    = {2007 {IEEE} International Solid-State Circuits Conference, {ISSCC}
                  2007, Digest of Technical Papers, San Francisco, CA, USA, February
                  11-15, 2007},
  pages        = {488--617},
  publisher    = {{IEEE}},
  year         = {2007},
  url          = {https://doi.org/10.1109/ISSCC.2007.373507},
  doi          = {10.1109/ISSCC.2007.373507},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/isscc/OhbayashiYKOIUYINTAUOIMIS07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/jssc/WatabeATONYA98,
  author       = {Kiyoto Watabe and
                  Hajime Akiyama and
                  Tomohide Terashima and
                  Masakazu Okada and
                  Shinji Nobuto and
                  Masao Yamawaki and
                  Sotoju Asa},
  title        = {An 0.8-{\(\mu\)}m high-voltage {IC} using a newly designed 600-V lateral
                  p-channel dual-action device on {SOI}},
  journal      = {{IEEE} J. Solid State Circuits},
  volume       = {33},
  number       = {9},
  pages        = {1423--1427},
  year         = {1998},
  url          = {https://doi.org/10.1109/4.711342},
  doi          = {10.1109/4.711342},
  timestamp    = {Wed, 06 Jul 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jssc/WatabeATONYA98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}