BibTeX records: Peter M. O'Neill

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@inproceedings{DBLP:conf/itc/ONeill08,
  author    = {Peter M. O'Neill},
  title     = {Production Multivariate Outlier Detection Using Principal Components},
  booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
               California, USA, October 26-31, 2008},
  pages     = {1--10},
  year      = {2008},
  crossref  = {DBLP:conf/itc/2008},
  url       = {https://doi.org/10.1109/TEST.2008.4700549},
  doi       = {10.1109/TEST.2008.4700549},
  timestamp = {Wed, 24 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/itc/ONeill08},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@inproceedings{DBLP:conf/itc/ONeill07,
  author    = {Peter M. O'Neill},
  title     = {Statistical test: {A} new paradigm to improve test effectiveness {\&}
               efficiency},
  booktitle = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
               California, USA, October 21-26, 2007},
  pages     = {1--10},
  year      = {2007},
  crossref  = {DBLP:conf/itc/2007},
  url       = {https://doi.org/10.1109/TEST.2007.4437700},
  doi       = {10.1109/TEST.2007.4437700},
  timestamp = {Wed, 24 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/itc/ONeill07},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/itc/2008,
  editor    = {Douglas Young and
               Nur A. Touba},
  title     = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
               California, USA, October 26-31, 2008},
  publisher = {{IEEE} Computer Society},
  year      = {2008},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4690905},
  isbn      = {978-1-4244-2403-0},
  timestamp = {Wed, 26 Aug 2015 09:28:48 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/itc/2008},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/itc/2007,
  editor    = {Jill Sibert and
               Janusz Rajski},
  title     = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
               California, USA, October 21-26, 2007},
  publisher = {{IEEE}},
  year      = {2007},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4437545},
  isbn      = {1-4244-1128-9},
  timestamp = {Tue, 07 Feb 2012 18:07:12 +0100},
  biburl    = {http://dblp.org/rec/bib/conf/itc/2007},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
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