BibTeX records: Mitsutaka Niiro

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@article{DBLP:journals/jssc/MorishitaHMTSGN05,
  author       = {Fukashi Morishita and
                  Isamu Hayashi and
                  Hideto Matsuoka and
                  Kazuhiro Takahashi and
                  Kuniyasu Shigeta and
                  Takayuki Gyohten and
                  Mitsutaka Niiro and
                  Hideyuki Noda and
                  Mako Okamoto and
                  Atsushi Hachisuka and
                  Atsushi Amo and
                  Hiroki Shinkawata and
                  Tatsuo Kasaoka and
                  Katsumi Dosaka and
                  Kazutami Arimoto and
                  Kazuyasu Fujishima and
                  Kenji Anami and
                  Tsutomu Yoshihara},
  title        = {A 312-MHz 16-Mb random-cycle embedded {DRAM} macro with a power-down
                  data retention mode for mobile applications},
  journal      = {{IEEE} J. Solid State Circuits},
  volume       = {40},
  number       = {1},
  pages        = {204--212},
  year         = {2005},
  url          = {https://doi.org/10.1109/JSSC.2004.837986},
  doi          = {10.1109/JSSC.2004.837986},
  timestamp    = {Mon, 26 Jun 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jssc/MorishitaHMTSGN05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/jssc/KikukawaTTKSIAT02,
  author       = {Hirohito Kikukawa and
                  Shigeki Tomishima and
                  Takaharu Tsuji and
                  Toshiaki Kawasaki and
                  Shouji Sakamoto and
                  Masatoshi Ishikawa and
                  Wataru Abe and
                  Hiroaki Tanizaki and
                  Hiroshi Kato and
                  Toshitaka Uchikoba and
                  Toshihiro Inokuchi and
                  Manabu Senoh and
                  Yoshifumi Fukushima and
                  Mitsutaka Niiro and
                  Masanao Maruta and
                  Akinori Shibayama and
                  Tsukasa Ooishi and
                  Kazunari Takahashi and
                  Hideto Hidaka},
  title        = {0.13-{\(\mu\)}m 32-Mb/64-Mb embedded {DRAM} core with high efficient
                  redundancy and enhanced testability},
  journal      = {{IEEE} J. Solid State Circuits},
  volume       = {37},
  number       = {7},
  pages        = {932--940},
  year         = {2002},
  url          = {https://doi.org/10.1109/JSSC.2002.1015693},
  doi          = {10.1109/JSSC.2002.1015693},
  timestamp    = {Sat, 09 Apr 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jssc/KikukawaTTKSIAT02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/TomishimaTNMHTG02,
  author       = {Shigeki Tomishima and
                  Hiroaki Tanizaki and
                  Mitsutaka Niiro and
                  Masanao Maruta and
                  Hideto Hidaka and
                  T. Tada and
                  Kenji Gamo},
  title        = {A Variable Drivability {(VD)} Output Buffer for the System In a Package
                  {(SIP)} and High Frequency Wafer Test},
  booktitle    = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
                  MD, USA, October 7-10, 2002},
  pages        = {170--177},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/TEST.2002.1041758},
  doi          = {10.1109/TEST.2002.1041758},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/TomishimaTNMHTG02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/jssc/TomishimaTKIIKT01,
  author       = {Shigeki Tomishima and
                  Takaharu Tsuji and
                  Toshiaki Kawasaki and
                  Masatoshi Ishikawa and
                  Toshihiro Inokuchi and
                  Hiroshi Kato and
                  Hiroaki Tanizaki and
                  Wataru Abe and
                  Akinori Shibayama and
                  Yoshifumi Fukushima and
                  Mitsutaka Niiro and
                  Masanao Maruta and
                  Toshitaka Uchikoba and
                  Manabu Senoh and
                  Shouji Sakamoto and
                  Tsukasa Ooishi and
                  Hirohito Kikukawa and
                  Hideto Hidaka and
                  Kazunari Takahashi},
  title        = {A 1.0-V 230-MHz column access embedded {DRAM} for portable {MPEG}
                  applications},
  journal      = {{IEEE} J. Solid State Circuits},
  volume       = {36},
  number       = {11},
  pages        = {1728--1737},
  year         = {2001},
  url          = {https://doi.org/10.1109/4.962295},
  doi          = {10.1109/4.962295},
  timestamp    = {Sat, 09 Apr 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jssc/TomishimaTKIIKT01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/cicc/OhtaniOKNMH01,
  author       = {Jun Ohtani and
                  Tukasa Ooishi and
                  Tomoya Kawagoe and
                  Mitsutaka Niiro and
                  Masanao Maruta and
                  Hideto Hidaka},
  title        = {A shared built-in self-repair analysis for multiple embedded memories},
  booktitle    = {Proceedings of the {IEEE} 2001 Custom Integrated Circuits Conference,
                  {CICC} 2001, San Diego, CA, USA, May 6-9, 2001},
  pages        = {187--190},
  publisher    = {{IEEE}},
  year         = {2001},
  url          = {https://doi.org/10.1109/CICC.2001.929752},
  doi          = {10.1109/CICC.2001.929752},
  timestamp    = {Mon, 10 Oct 2022 09:13:22 +0200},
  biburl       = {https://dblp.org/rec/conf/cicc/OhtaniOKNMH01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/KawagoeONOHH00,
  author       = {Tomoya Kawagoe and
                  Jun Ohtani and
                  Mitsutaka Niiro and
                  Tukasa Ooishi and
                  Mitsuhiro Hamada and
                  Hideto Hidaka},
  title        = {A built-in self-repair analyzer {(CRESTA)} for embedded DRAMs},
  booktitle    = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
                  NJ, USA, October 2000},
  pages        = {567--574},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.org/10.1109/TEST.2000.894250},
  doi          = {10.1109/TEST.2000.894250},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/KawagoeONOHH00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}