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BibTeX records: Yasuo Nara
@article{DBLP:journals/ieicet/PeiMHMIN07, author = {Yanli Pei and Hideki Murakami and Seiichiro Higashi and Seiichi Miyazaki and Seiji Inumiya and Yasuo Nara}, title = {Evaluation of Dielectric Reliability of Ultrathin HfSiO\({}_{\mbox{x}}\)N\({}_{\mbox{y}}\) in Metal-Gate Capacitors}, journal = {{IEICE} Trans. Electron.}, volume = {90-C}, number = {5}, pages = {962--967}, year = {2007}, url = {https://doi.org/10.1093/ietele/e90-c.5.962}, doi = {10.1093/IETELE/E90-C.5.962}, timestamp = {Sat, 11 Apr 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/ieicet/PeiMHMIN07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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