BibTeX records: Yasuo Nara

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@article{DBLP:journals/ieicet/PeiMHMIN07,
  author       = {Yanli Pei and
                  Hideki Murakami and
                  Seiichiro Higashi and
                  Seiichi Miyazaki and
                  Seiji Inumiya and
                  Yasuo Nara},
  title        = {Evaluation of Dielectric Reliability of Ultrathin HfSiO\({}_{\mbox{x}}\)N\({}_{\mbox{y}}\)
                  in Metal-Gate Capacitors},
  journal      = {{IEICE} Trans. Electron.},
  volume       = {90-C},
  number       = {5},
  pages        = {962--967},
  year         = {2007},
  url          = {https://doi.org/10.1093/ietele/e90-c.5.962},
  doi          = {10.1093/IETELE/E90-C.5.962},
  timestamp    = {Sat, 11 Apr 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/ieicet/PeiMHMIN07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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