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ORCIDBibTeX records: Salvador Mir
@inproceedings{DBLP:conf/iscas/MamgainMTB23,
author = {Ankush Mamgain and
Salvador Mir and
Jai Narayan Tripathi and
Manuel J. Barrag{\'{a}}n},
title = {A harmonic cancellation-based high-frequency on-chip sinusoidal signal
generator with calibration using a coarse-fine delay cell},
booktitle = {{IEEE} International Symposium on Circuits and Systems, {ISCAS} 2023,
Monterey, CA, USA, May 21-25, 2023},
pages = {1--5},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ISCAS46773.2023.10181742},
doi = {10.1109/ISCAS46773.2023.10181742},
timestamp = {Mon, 31 Jul 2023 09:04:00 +0200},
biburl = {https://dblp.org/rec/conf/iscas/MamgainMTB23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/MadhvarajMB23,
author = {Manasa Madhvaraj and
Salvador Mir and
Manuel J. Barrag{\'{a}}n},
title = {Special Session: On-chip jitter {BIST} with sub-picosecond resolution
at GHz frequencies},
booktitle = {24th {IEEE} Latin American Test Symposium, {LATS} 2023, Veracruz,
Mexico, March 21-24, 2023},
pages = {1--2},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/LATS58125.2023.10154493},
doi = {10.1109/LATS58125.2023.10154493},
timestamp = {Thu, 29 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/MadhvarajMB23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/MamgainMTB23,
author = {Ankush Mamgain and
Salvador Mir and
Jai Narayan Tripathi and
Manuel J. Barrag{\'{a}}n},
title = {Special Session: {A} high-frequency sinusoidal signal generation using
harmonic cancellation},
booktitle = {24th {IEEE} Latin American Test Symposium, {LATS} 2023, Veracruz,
Mexico, March 21-24, 2023},
pages = {1--2},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/LATS58125.2023.10154502},
doi = {10.1109/LATS58125.2023.10154502},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/MamgainMTB23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/newcas/MamgainMMBT23,
author = {Ankush Mamgain and
Manasa Madhvaraj and
Salvador Mir and
Manuel J. Barrag{\'{a}}n and
Jai Narayan Tripathi},
title = {A sub-picosecond resolution jitter instrument for GHz frequencies
based on a sub-sampling {TDA}},
booktitle = {21st {IEEE} Interregional {NEWCAS} Conference, {NEWCAS} 2023, Edinburgh,
United Kingdom, June 26-28, 2023},
pages = {1--5},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/NEWCAS57931.2023.10198132},
doi = {10.1109/NEWCAS57931.2023.10198132},
timestamp = {Tue, 15 Aug 2023 11:43:59 +0200},
biburl = {https://dblp.org/rec/conf/newcas/MamgainMMBT23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/BrittonMLDBCG23,
author = {Giovani Britton and
Salvador Mir and
Estelle Lauga{-}Larroze and
Benjamin Dormieu and
Quentin Berlingard and
Mika{\"{e}}l Cass{\'{e}} and
Philippe Galy},
title = {Noise modeling using look-up tables and {DC} measurements for cryogenic
applications},
booktitle = {31st {IFIP/IEEE} International Conference on Very Large Scale Integration,
VLSI-SoC 2023, Dubai, United Arab Emirates, October 16-18, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/VLSI-SoC57769.2023.10321896},
doi = {10.1109/VLSI-SOC57769.2023.10321896},
timestamp = {Thu, 07 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsi/BrittonMLDBCG23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MamgainMTB22,
author = {Ankush Mamgain and
Salvador Mir and
Jai Narayan Tripathi and
Manuel J. Barrag{\'{a}}n},
title = {On-chip calibration for high-speed harmonic cancellation-based sinusoidal
signal generators},
booktitle = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
November 21-24, 2022},
pages = {43--48},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ATS56056.2022.00020},
doi = {10.1109/ATS56056.2022.00020},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/MamgainMTB22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/EisenstadtRMGMB22,
author = {William R. Eisenstadt and
Mark Roos and
Devin Morris and
Jos{\'{e}} Luis Gonz{\'{a}}lez{-}Jim{\'{e}}nez and
Christopery Mounet and
Manuel J. Barrag{\'{a}}n and
Gildas L{\'{e}}ger and
Florent Cilici and
Estelle Lauga{-}Larroze and
Salvador Mir and
Sylvain Bourdel and
Marc Margalef{-}Rovira and
Issa Alaji and
Haitham Ghanem and
Guillaume Ducournau and
Christophe Gaqui{\`{e}}re},
title = {Special Session on {RF/5G} Test},
booktitle = {{IEEE} European Test Symposium, {ETS} 2022, Barcelona, Spain, May
23-27, 2022},
pages = {1--9},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ETS54262.2022.9810461},
doi = {10.1109/ETS54262.2022.9810461},
timestamp = {Sun, 17 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/EisenstadtRMGMB22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/MadhvarajMB22,
author = {Manasa Madhvaraj and
Salvador Mir and
Manuel J. Barrag{\'{a}}n},
title = {A self-referenced on-chip jitter {BIST} with sub-picosecond resolution
in 28 nm {FD-SOI} technology},
booktitle = {30th {IFIP/IEEE} 30th International Conference on Very Large Scale
Integration, VLSI-SoC 2022, Patras, Greece, October 3-5, 2022},
pages = {1--6},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VLSI-SoC54400.2022.9939620},
doi = {10.1109/VLSI-SOC54400.2022.9939620},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vlsi/MadhvarajMB22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MangelsdorfMMBI22,
author = {Chris Mangelsdorf and
Manasa Madhvaraj and
Salvador Mir and
Manuel J. Barrag{\'{a}}n and
Daisuke Iimori and
Takayuki Nakatani and
Shogo Katayama and
Gaku Ogihara and
Yujie Zhao and
Jianglin Wei and
Anna Kuwana and
Kentaroh Katoh and
Kazumi Hatayama and
Haruo Kobayashi and
Keno Sato and
Takashi Ishida and
Toshiyuki Okamoto and
Tamotsu Ichikawa},
title = {Innovative Practices Track: Innovative Analog Circuit Testing Technologies},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794191},
doi = {10.1109/VTS52500.2021.9794191},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/MangelsdorfMMBI22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/MamgainBM21,
author = {Ankush Mamgain and
Manuel J. Barrag{\'{a}}n and
Salvador Mir},
title = {Analysis and mitigation of timing inaccuracies in high-frequency on-chip
sinusoidal signal generators based on harmonic cancellation},
booktitle = {26th {IEEE} European Test Symposium, {ETS} 2021, Bruges, Belgium,
May 24-28, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ETS50041.2021.9465424},
doi = {10.1109/ETS50041.2021.9465424},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/MamgainBM21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/BounceurMEB20,
author = {Ahc{\`{e}}ne Bounceur and
Salvador Mir and
Reinhardt Euler and
Kamel Beznia},
title = {Estimation of Analog/RF Parametric Test Metrics Based on a Multivariate
Extreme Value Model},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {39},
number = {5},
pages = {966--976},
year = {2020},
url = {https://doi.org/10.1109/TCAD.2019.2907923},
doi = {10.1109/TCAD.2019.2907923},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/BounceurMEB20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/FeitozaBGM20,
author = {Renato S. Feitoza and
Manuel J. Barrag{\'{a}}n and
Antonio J. Gin{\'{e}}s and
Salvador Mir},
title = {On-chip reduced-code static linearity test of V\({}_{\mbox{cm}}\)-based
switching {SAR} ADCs using an incremental analog-to-digital converter},
booktitle = {{IEEE} European Test Symposium, {ETS} 2020, Tallinn, Estonia, May
25-29, 2020},
pages = {1--2},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ETS48528.2020.9131588},
doi = {10.1109/ETS48528.2020.9131588},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/FeitozaBGM20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/PortolanFTRKBSM20,
author = {Michele Portolan and
R. Silveira Feitoza and
Ghislain Takam Tchendjou and
Vincent Reynaud and
Kalpana Senthamarai Kannan and
Manuel J. Barrag{\'{a}}n and
Emmanuel Simeu and
Paolo Maistri and
Lorena Anghel and
R{\'{e}}gis Leveugle and
Salvador Mir},
title = {A Comprehensive End-to-end Solution for a Secure and Dynamic Mixed-signal
1687 System},
booktitle = {26th {IEEE} International Symposium on On-Line Testing and Robust
System Design, {IOLTS} 2020, Napoli, Italy, July 13-15, 2020},
pages = {1--4},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/IOLTS50870.2020.9159721},
doi = {10.1109/IOLTS50870.2020.9159721},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/PortolanFTRKBSM20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/newcas/FeitozaBGM20,
author = {Renato S. Feitoza and
Manuel J. Barrag{\'{a}}n and
Antonio J. Gin{\'{e}}s and
Salvador Mir},
title = {Static linearity {BIST} for V\({}_{\mbox{cm}}\)-based switching {SAR}
ADCs using a reduced-code measurement technique},
booktitle = {18th {IEEE} International New Circuits and Systems Conference, {NEWCAS}
2020, Montr{\'{e}}al, QC, Canada, June 16-19, 2020},
pages = {295--298},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/NEWCAS49341.2020.9159839},
doi = {10.1109/NEWCAS49341.2020.9159839},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/newcas/FeitozaBGM20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/RenaudDBM19,
author = {Guillaume Renaud and
Mamadou Diallo and
Manuel J. Barrag{\'{a}}n and
Salvador Mir},
title = {Fully Differential 4-V Output Range 14.5-ENOB Stepwise Ramp Stimulus
Generator for On-Chip Static Linearity Test of ADCs},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {27},
number = {2},
pages = {281--293},
year = {2019},
url = {https://doi.org/10.1109/TVLSI.2018.2876976},
doi = {10.1109/TVLSI.2018.2876976},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tvlsi/RenaudDBM19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/BarraganLCLBM19,
author = {Manuel J. Barrag{\'{a}}n and
Gildas L{\'{e}}ger and
Florent Cilici and
Estelle Lauga{-}Larroze and
Sylvain Bourdel and
Salvador Mir},
editor = {J{\"{u}}rgen Teich and
Franco Fummi},
title = {On the use of causal feature selection in the context of machine-learning
indirect test},
booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
{DATE} 2019, Florence, Italy, March 25-29, 2019},
pages = {276--279},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.23919/DATE.2019.8714798},
doi = {10.23919/DATE.2019.8714798},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/BarraganLCLBM19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/MallougBM19,
author = {Hani Malloug and
Manuel J. Barrag{\'{a}}n and
Salvador Mir},
title = {A 52 dB-SFDR 166 MHz sinusoidal signal generator for mixed-signal
{BIST} applications in 28 nm {FDSOI} technology},
booktitle = {24th {IEEE} European Test Symposium, {ETS} 2019, Baden-Baden, Germany,
May 27-31, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ETS.2019.8791532},
doi = {10.1109/ETS.2019.8791532},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/MallougBM19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iscas/CiliciBMLBL19,
author = {Florent Cilici and
Manuel J. Barrag{\'{a}}n and
Salvador Mir and
Estelle Lauga{-}Larroze and
Sylvain Bourdel and
Gildas L{\'{e}}ger},
title = {Yield Recovery of mm-Wave Power Amplifiers using Variable Decoupling
Cells and One-Shot Statistical Calibration},
booktitle = {{IEEE} International Symposium on Circuits and Systems, {ISCAS} 2019,
Sapporo, Japan, May 26-29, 2019},
pages = {1--5},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ISCAS.2019.8702072},
doi = {10.1109/ISCAS.2019.8702072},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iscas/CiliciBMLBL19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/smacd/CiliciLBMLB19,
author = {Florent Cilici and
Gildas L{\'{e}}ger and
Manuel J. Barrag{\'{a}}n and
Salvador Mir and
Estelle Lauga{-}Larroze and
Sylvain Bourdel},
title = {Efficient generation of data sets for one-shot statistical calibration
of RF/mm-wave circuits},
booktitle = {16th International Conference on Synthesis, Modeling, Analysis and
Simulation Methods and Applications to Circuit Design, {SMACD} 2019,
Lausanne, Switzerland, July 15-18, 2019},
pages = {17--20},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/SMACD.2019.8795238},
doi = {10.1109/SMACD.2019.8795238},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/smacd/CiliciLBMLB19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/FeitozaBM19,
author = {Renato S. Feitoza and
Manuel J. Barrag{\'{a}}n and
Salvador Mir},
title = {Reduced-Code Techniques for On-Chip Static Linearity Test of {SAR}
ADCs},
booktitle = {27th {IFIP/IEEE} International Conference on Very Large Scale Integration,
VLSI-SoC 2019, Cuzco, Peru, October 6-9, 2019},
pages = {263--268},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/VLSI-SoC.2019.8920377},
doi = {10.1109/VLSI-SOC.2019.8920377},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vlsi/FeitozaBM19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MallougBM18,
author = {Hani Malloug and
Manuel J. Barrag{\'{a}}n and
Salvador Mir},
title = {Practical Harmonic Cancellation Techniques for the On-Chip Implementation
of Sinusoidal Signal Generators for Mixed-Signal {BIST} Applications},
journal = {J. Electron. Test.},
volume = {34},
number = {3},
pages = {263--279},
year = {2018},
url = {https://doi.org/10.1007/s10836-018-5720-2},
doi = {10.1007/S10836-018-5720-2},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MallougBM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/CiliciBMLB18,
author = {Florent Cilici and
Manuel J. Barrag{\'{a}}n and
Salvador Mir and
Estelle Lauga{-}Larroze and
Sylvain Bourdel},
title = {Assisted test design for non-intrusive machine learning indirect test
of millimeter-wave circuits},
booktitle = {23rd {IEEE} European Test Symposium, {ETS} 2018, Bremen, Germany,
May 28 - June 1, 2018},
pages = {1--6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ETS.2018.8400689},
doi = {10.1109/ETS.2018.8400689},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/CiliciBMLB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/FeitozaBMD18,
author = {Renato S. Feitoza and
Manuel J. Barrag{\'{a}}n and
Salvador Mir and
Daniel Dzahini},
editor = {Dimitris Gizopoulos and
Dan Alexandrescu and
Mihalis Maniatakos and
Panagiota Papavramidou},
title = {Reduced-code static linearity test of {SAR} ADCs using a built-in
incremental {\(\sum\)}{\(\Delta\)} converter},
booktitle = {24th {IEEE} International Symposium on On-Line Testing And Robust
System Design, {IOLTS} 2018, Platja D'Aro, Spain, July 2-4, 2018},
pages = {29--34},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IOLTS.2018.8474180},
doi = {10.1109/IOLTS.2018.8474180},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/FeitozaBMD18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/MallougAMBG17,
author = {Hani Malloug and
Manuel J. Barragan Asian and
Salvador Mir and
Laurent Basteres and
Herv{\'{e}} Le Gall},
title = {Design of a sinusoidal signal generator with calibrated harmonic cancellation
for mixed-signal {BIST} in a 28 nm {FDSOI} technology},
booktitle = {22nd {IEEE} European Test Symposium, {ETS} 2017, Limassol, Cyprus,
May 22-26, 2017},
pages = {1--6},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ETS.2017.7968214},
doi = {10.1109/ETS.2017.7968214},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/ets/MallougAMBG17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/PortolanBAM17,
author = {Michele Portolan and
Manuel J. Barrag{\'{a}}n and
Rshdee Alhakim and
Salvador Mir},
title = {Mixed-signal {BIST} computation offloading using {IEEE} 1687},
booktitle = {22nd {IEEE} European Test Symposium, {ETS} 2017, Limassol, Cyprus,
May 22-26, 2017},
pages = {1--2},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ETS.2017.7968222},
doi = {10.1109/ETS.2017.7968222},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/PortolanBAM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/RenaudMBM17,
author = {Guillaume Renaud and
Marc Margalef{-}Rovira and
Manuel J. Barrag{\'{a}}n and
Salvador Mir},
title = {Analysis of an efficient on-chip servo-loop technique for reduced-code
static linearity test of pipeline ADCs},
booktitle = {35th {IEEE} {VLSI} Test Symposium, {VTS} 2017, Las Vegas, NV, USA,
April 9-12, 2017},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2017},
url = {https://doi.org/10.1109/VTS.2017.7928951},
doi = {10.1109/VTS.2017.7928951},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/RenaudMBM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/BarraganSMGBB16,
author = {Manuel J. Barrag{\'{a}}n and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir and
Herv{\'{e}} Le Gall and
Neha Bhargava and
Ankur Bal},
title = {Practical Simulation Flow for Evaluating Analog/Mixed-Signal Test
Techniques},
journal = {{IEEE} Des. Test},
volume = {33},
number = {6},
pages = {46--54},
year = {2016},
url = {https://doi.org/10.1109/MDAT.2016.2590985},
doi = {10.1109/MDAT.2016.2590985},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/BarraganSMGBB16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RenaudBLSMLN16,
author = {Guillaume Renaud and
Manuel J. Barrag{\'{a}}n and
Asma Laraba and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir and
Herv{\'{e}} Le Gall and
Herv{\'{e}} Naudet},
title = {A 65nm {CMOS} Ramp Generator Design and its Application Towards a
{BIST} Implementation of the Reduced-Code Static Linearity Test Technique
for Pipeline ADCs},
journal = {J. Electron. Test.},
volume = {32},
number = {4},
pages = {407--421},
year = {2016},
url = {https://doi.org/10.1007/s10836-016-5599-8},
doi = {10.1007/S10836-016-5599-8},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/RenaudBLSMLN16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcas/BarraganASDMGBB16,
author = {Manuel J. Barrag{\'{a}}n and
Rshdee Alhakim and
Haralampos{-}G. D. Stratigopoulos and
Matthieu Dubois and
Salvador Mir and
Herv{\'{e}} Le Gall and
Neha Bhargava and
Ankur Bal},
title = {A Fully-Digital {BIST} Wrapper Based on Ternary Test Stimuli for the
Dynamic Test of a 40 nm {CMOS} 18-bit Stereo Audio {\(\Sigma\)}{\(\Delta\)}
{ADC}},
journal = {{IEEE} Trans. Circuits Syst. {I} Regul. Pap.},
volume = {63-I},
number = {11},
pages = {1876--1888},
year = {2016},
url = {https://doi.org/10.1109/TCSI.2016.2602387},
doi = {10.1109/TCSI.2016.2602387},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcas/BarraganASDMGBB16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/DimakosSSMF16,
author = {Athanasios Dimakos and
Haralampos{-}G. D. Stratigopoulos and
Alexandre Siligaris and
Salvador Mir and
Emeric de Foucauld},
editor = {Luca Fanucci and
J{\"{u}}rgen Teich},
title = {Built-in test of millimeter-Wave circuits based on non-intrusive sensors},
booktitle = {2016 Design, Automation {\&} Test in Europe Conference {\&}
Exhibition, {DATE} 2016, Dresden, Germany, March 14-18, 2016},
pages = {505--510},
publisher = {{IEEE}},
year = {2016},
url = {https://ieeexplore.ieee.org/document/7459362/},
timestamp = {Mon, 09 Aug 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/DimakosSSMF16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ei-iss/PastorelliMMT16,
author = {C{\'{e}}dric Pastorelli and
Pascal Mellot and
Salvador Mir and
C{\'{e}}dric Tubert},
editor = {Arnaud Darmont and
Antoine Dupret and
Ralf Widenhorn},
title = {{ADC} Techniques for Optimized Conversion Time in {CMOS} Image Sensors},
booktitle = {Image Sensors and Imaging Systems 2016, {IMSE} 2016, San Francisco,
CA, USA, February 14-18, 2016},
pages = {1--6},
publisher = {Society for Imaging Science and Technology},
year = {2016},
url = {https://doi.org/10.2352/ISSN.2470-1173.2016.12.IMSE-268},
doi = {10.2352/ISSN.2470-1173.2016.12.IMSE-268},
timestamp = {Thu, 27 Jul 2023 16:41:00 +0200},
biburl = {https://dblp.org/rec/conf/ei-iss/PastorelliMMT16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/GinesPLRRBM16,
author = {Antonio J. Gin{\'{e}}s and
Eduardo J. Peral{\'{\i}}as and
Gildas L{\'{e}}ger and
Adoraci{\'{o}}n Rueda and
Guillaume Renaud and
Manuel J. Barrag{\'{a}}n and
Salvador Mir},
title = {Linearity test of high-speed high-performance ADCs using a self-testable
on-chip generator},
booktitle = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
May 23-27, 2016},
pages = {1--6},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/ETS.2016.7519308},
doi = {10.1109/ETS.2016.7519308},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/GinesPLRRBM16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/DimakosSSMF15,
author = {Athanasios Dimakos and
Haralampos{-}G. D. Stratigopoulos and
Alexandre Siligaris and
Salvador Mir and
Emeric de Foucauld},
title = {Parametric Built-In Test for 65nm {RF} {LNA} Using Non-Intrusive Variation-Aware
Sensors},
journal = {J. Electron. Test.},
volume = {31},
number = {4},
pages = {381--394},
year = {2015},
url = {https://doi.org/10.1007/s10836-015-5534-4},
doi = {10.1007/S10836-015-5534-4},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/DimakosSSMF15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcas/LarabaSMN15,
author = {Asma Laraba and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir and
Herv{\'{e}} Naudet},
title = {Exploiting Pipeline {ADC} Properties for a Reduced-Code Linearity
Test Technique},
journal = {{IEEE} Trans. Circuits Syst. {I} Regul. Pap.},
volume = {62-I},
number = {10},
pages = {2391--2400},
year = {2015},
url = {https://doi.org/10.1109/TCSI.2015.2469014},
doi = {10.1109/TCSI.2015.2469014},
timestamp = {Fri, 22 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcas/LarabaSMN15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/todaes/BezniaBEM15,
author = {Kamel Beznia and
Ahc{\`{e}}ne Bounceur and
Reinhardt Euler and
Salvador Mir},
title = {A Tool for Analog/RF {BIST} Evaluation Using Statistical Models of
Circuit Parameters},
journal = {{ACM} Trans. Design Autom. Electr. Syst.},
volume = {20},
number = {2},
pages = {31:1--31:22},
year = {2015},
url = {https://doi.org/10.1145/2699837},
doi = {10.1145/2699837},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/todaes/BezniaBEM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/GallAVMSS15,
author = {Herv{\'{e}} Le Gall and
Rshdee Alhakim and
Miroslav Valka and
Salvador Mir and
Haralampos{-}G. D. Stratigopoulos and
Emmanuel Simeu},
title = {High frequency jitter estimator for SoCs},
booktitle = {20th {IEEE} European Test Symposium, {ETS} 2015, Cluj-Napoca, Romania,
25-29 May, 2015},
pages = {1--6},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/ETS.2015.7138760},
doi = {10.1109/ETS.2015.7138760},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/ets/GallAVMSS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isvlsi/DimakosAASSM15,
author = {Athanasios Dimakos and
Martin Andraud and
Louay Abdallah and
Haralampos{-}G. D. Stratigopoulos and
Emmanuel Simeu and
Salvador Mir},
title = {Test and Calibration of {RF} Circuits Using Built-in Non-intrusive
Sensors},
booktitle = {2015 {IEEE} Computer Society Annual Symposium on VLSI, {ISVLSI} 2015,
Montpellier, France, July 8-10, 2015},
pages = {627},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/ISVLSI.2015.42},
doi = {10.1109/ISVLSI.2015.42},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/isvlsi/DimakosAASSM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StratigopoulosB15,
author = {Haralampos{-}G. D. Stratigopoulos and
Manuel J. Barrag{\'{a}}n and
Salvador Mir and
Herv{\'{e}} Le Gall and
Neha Bhargava and
Ankur Bal},
title = {Evaluation of low-cost mixed-signal test techniques for circuits with
long simulation times},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--7},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342385},
doi = {10.1109/TEST.2015.7342385},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/StratigopoulosB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/FeiMMMMHPVD15,
author = {Richun Fei and
Jocelyn Moreau and
Salvador Mir and
Alexis Marcellin and
C. Mandier and
E. Huss and
G. Palmigiani and
P. Vitrou and
Thomas Droniou},
title = {Horizontal-FPN fault coverage improvement in production test of {CMOS}
imagers},
booktitle = {33rd {IEEE} {VLSI} Test Symposium, {VTS} 2015, Napa, CA, USA, April
27-29, 2015},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2015},
url = {https://doi.org/10.1109/VTS.2015.7116278},
doi = {10.1109/VTS.2015.7116278},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/FeiMMMMHPVD15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/RenaudBMS14,
author = {Guillaume Renaud and
Manuel J. Barrag{\'{a}}n and
Salvador Mir and
Marc Sabut},
title = {On-Chip Implementation of an Integrator-Based Servo-Loop for {ADC}
Static Linearity Test},
booktitle = {23rd {IEEE} Asian Test Symposium, {ATS} 2014, Hangzhou, China, November
16-19, 2014},
pages = {212--217},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/ATS.2014.47},
doi = {10.1109/ATS.2014.47},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/RenaudBMS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/idt/SerhanASM14,
author = {Ayssar Serhan and
Louay Abdallah and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir},
title = {Low-cost {EVM} built-in test of {RF} transceivers},
booktitle = {9th International Design and Test Symposium, {IDT} 2014, Algeries,
Algeria, December 16-18, 2014},
pages = {51--54},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/IDT.2014.7038586},
doi = {10.1109/IDT.2014.7038586},
timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
biburl = {https://dblp.org/rec/conf/idt/SerhanASM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/AndraudDDABCCKKMPRSSS14,
author = {Martin Andraud and
Anthony Deluthault and
Mouhamadou Dieng and
Florence Aza{\"{\i}}s and
Serge Bernard and
Philippe Cauvet and
Mariane Comte and
Thibault Kervaon and
Vincent Kerzerho and
Salvador Mir and
Paul{-}Henri Pugliesi{-}Conti and
Michel Renovell and
Fabien Soulier and
Emmanuel Simeu and
Haralampos{-}G. D. Stratigopoulos},
title = {Solutions for the self-adaptation of communicating systems in operation},
booktitle = {2014 {IEEE} 20th International On-Line Testing Symposium, {IOLTS}
2014, Platja d'Aro, Girona, Spain, July 7-9, 2014},
pages = {234--239},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/IOLTS.2014.6873705},
doi = {10.1109/IOLTS.2014.6873705},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iolts/AndraudDDABCCKKMPRSSS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/mwscas/AltetARGGOSMPAS14,
author = {Josep Altet and
Eduardo Aldrete{-}Vidrio and
Ferran Reverter and
Didac G{\'{o}}mez and
Jos{\'{e}} Luis Gonz{\'{a}}lez and
Marvin Onabajo and
Jos{\'{e}} Silva{-}Mart{\'{\i}}nez and
B. Martineau and
X. Perpi{\~{n}}{\`{a}} and
Louay Abdallah and
Haralampos{-}G. D. Stratigopoulos and
Xavier Aragon{\`{e}}s and
Xavier Jord{\`{a}} and
Miquel Vellveh{\'{\i}} and
Stefan Dilhaire and
Salvador Mir and
Diego Mateo},
title = {Review of temperature sensors as monitors for {RF-MMW} built-in testing
and self-calibration schemes},
booktitle = {{IEEE} 57th International Midwest Symposium on Circuits and Systems,
{MWSCAS} 2014, College Station, TX, USA, August 3-6, 2014},
pages = {1081--1084},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/MWSCAS.2014.6908606},
doi = {10.1109/MWSCAS.2014.6908606},
timestamp = {Mon, 09 Aug 2021 14:54:01 +0200},
biburl = {https://dblp.org/rec/conf/mwscas/AltetARGGOSMPAS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/DuboisSMB14,
author = {Matthieu Dubois and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir and
Manuel J. Barrag{\'{a}}n},
editor = {Lorena Garcia},
title = {Evaluation of digital ternary stimuli for dynamic test of {\(\Sigma\)}{\(\Delta\)}
ADCs},
booktitle = {22nd International Conference on Very Large Scale Integration, VLSI-SoC,
Playa del Carmen, Mexico, October 6-8, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/VLSI-SoC.2014.7004153},
doi = {10.1109/VLSI-SOC.2014.7004153},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vlsi/DuboisSMB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/DuboisSMB14a,
author = {Matthieu Dubois and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir and
Manuel J. Barrag{\'{a}}n},
editor = {Luc Claesen and
Mar{\'{\i}}a Teresa Sanz{-}Pascual and
Ricardo Reis and
Arturo Sarmiento{-}Reyes},
title = {Statistical Evaluation of Digital Techniques for {\textdollar}{\textbackslash}sum{\textbackslash}varDelta{\textdollar}
{ADC} {BIST}},
booktitle = {VLSI-SoC: Internet of Things Foundations - 22nd {IFIP} {WG} 10.5/IEEE
International Conference on Very Large Scale Integration, VLSI-SoC
2014, Playa del Carmen, Mexico, October 6-8, 2014, Revised and Extended
Selected Papers},
series = {{IFIP} Advances in Information and Communication Technology},
volume = {464},
pages = {129--148},
publisher = {Springer},
year = {2014},
url = {https://doi.org/10.1007/978-3-319-25279-7\_8},
doi = {10.1007/978-3-319-25279-7\_8},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vlsi/DuboisSMB14a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/LarabaSMNB13,
author = {Asma Laraba and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir and
Herv{\'{e}} Naudet and
Gerard Bret},
title = {Reduced-Code Linearity Testing of Pipeline ADCs},
journal = {{IEEE} Des. Test},
volume = {30},
number = {6},
pages = {80--88},
year = {2013},
url = {https://doi.org/10.1109/MDAT.2013.2267957},
doi = {10.1109/MDAT.2013.2267957},
timestamp = {Fri, 13 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/dt/LarabaSMNB13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dtis/HuangSAMB13,
author = {Ke Huang and
Haralampos{-}G. D. Stratigopoulos and
Louay Abdallah and
Salvador Mir and
Ahc{\`{e}}ne Bounceur},
title = {Multivariate statistical techniques for analog parametric test metrics
estimation},
booktitle = {Proceedings of the 8th International Conference on Design {\&}
Technology of Integrated Systems in Nanoscale Era, {DTIS} 2013, 26-28
March, 2013, Abu Dhabi, {UAE}},
pages = {6--11},
publisher = {{IEEE}},
year = {2013},
url = {https://doi.org/10.1109/DTIS.2013.6527768},
doi = {10.1109/DTIS.2013.6527768},
timestamp = {Wed, 16 Oct 2019 14:14:56 +0200},
biburl = {https://dblp.org/rec/conf/dtis/HuangSAMB13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dtis/BezniaBME13,
author = {Kamel Beznia and
Ahc{\`{e}}ne Bounceur and
Salvador Mir and
Reinhardt Euler},
title = {Statistical modelling of analog circuits for test metrics computation},
booktitle = {Proceedings of the 8th International Conference on Design {\&}
Technology of Integrated Systems in Nanoscale Era, {DTIS} 2013, 26-28
March, 2013, Abu Dhabi, {UAE}},
pages = {25--29},
publisher = {{IEEE}},
year = {2013},
url = {https://doi.org/10.1109/DTIS.2013.6527772},
doi = {10.1109/DTIS.2013.6527772},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dtis/BezniaBME13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/BentobacheBEKM13,
author = {Mohand Bentobache and
Ahc{\`{e}}ne Bounceur and
Reinhardt Euler and
Yann Kieffer and
Salvador Mir},
title = {Efficient minimization of test frequencies for linear analog circuits},
booktitle = {18th {IEEE} European Test Symposium, {ETS} 2013, Avignon, France,
May 27-30, 2013},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ETS.2013.6569385},
doi = {10.1109/ETS.2013.6569385},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/BentobacheBEKM13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AbdallahSM13,
author = {Louay Abdallah and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir},
title = {True non-intrusive sensors for {RF} built-in test},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651885},
doi = {10.1109/TEST.2013.6651885},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AbdallahSM13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangSM13,
author = {Ke Huang and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir},
title = {Fault modeling and diagnosis for nanometric analog circuits},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651886},
doi = {10.1109/TEST.2013.6651886},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuangSM13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iwasi/FeiMM13,
author = {Richun Fei and
Jocelyn Moreau and
Salvador Mir},
title = {{BIST} of interconnection lines in the pixel matrix of {CMOS} imagers},
booktitle = {5th {IEEE} International Workshop on Advances in Sensors and Interfaces,
{IWASI} 2013, Bari, Italy, June 13-14, 2013},
pages = {174--177},
publisher = {{IEEE}},
year = {2013},
url = {https://doi.org/10.1109/IWASI.2013.6576068},
doi = {10.1109/IWASI.2013.6576068},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/iwasi/FeiMM13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/BentobacheBEKM13,
author = {Mohand Bentobache and
Ahc{\`{e}}ne Bounceur and
Reinhardt Euler and
Yann Kieffer and
Salvador Mir},
editor = {Martin Margala and
Ricardo Augusto da Luz Reis and
Alex Orailoglu and
Luigi Carro and
Lu{\'{\i}}s Miguel Silveira and
H. Fatih Ugurdag},
title = {New techniques for selecting test frequencies for linear analog circuits},
booktitle = {21st {IEEE/IFIP} International Conference on {VLSI} and System-on-Chip,
VLSI-SoC 2013, Istanbul, Turkey, October 7-9, 2013},
pages = {90--95},
publisher = {{IEEE}},
year = {2013},
url = {https://doi.org/10.1109/VLSI-SoC.2013.6673256},
doi = {10.1109/VLSI-SOC.2013.6673256},
timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
biburl = {https://dblp.org/rec/conf/vlsi/BentobacheBEKM13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/BentobacheBEMK13,
author = {Mohand Bentobache and
Ahc{\`{e}}ne Bounceur and
Reinhardt Euler and
Salvador Mir and
Yann Kieffer},
editor = {Alex Orailoglu and
H. Fatih Ugurdag and
Lu{\'{\i}}s Miguel Silveira and
Martin Margala and
Ricardo Reis},
title = {Minimizing Test Frequencies for Linear Analog Circuits: New Models
and Efficient Solution Methods},
booktitle = {VLSI-SoC: At the Crossroads of Emerging Trends - 21st {IFIP} {WG}
10.5/IEEE International Conference on Very Large Scale Integration,
VLSI-SoC 2013, Istanbul, Turkey, October 6-9, 2013, Revised and Extended
Selected Papers},
series = {{IFIP} Advances in Information and Communication Technology},
volume = {461},
pages = {188--207},
publisher = {Springer},
year = {2013},
url = {https://doi.org/10.1007/978-3-319-23799-2\_9},
doi = {10.1007/978-3-319-23799-2\_9},
timestamp = {Thu, 31 Oct 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsi/BentobacheBEMK13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AbdallahSMA13,
author = {Louay Abdallah and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir and
Josep Altet},
title = {Defect-oriented non-intrusive {RF} test using on-chip temperature
sensors},
booktitle = {31st {IEEE} {VLSI} Test Symposium, {VTS} 2013, Berkeley, CA, USA,
April 29 - May 2, 2013},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/VTS.2013.6548889},
doi = {10.1109/VTS.2013.6548889},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AbdallahSMA13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LarabaSMNB13,
author = {Asma Laraba and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir and
Herv{\'{e}} Naudet and
Gerard Bret},
title = {Reduced code linearity testing of pipeline adcs in the presence of
noise},
booktitle = {31st {IEEE} {VLSI} Test Symposium, {VTS} 2013, Berkeley, CA, USA,
April 29 - May 2, 2013},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/VTS.2013.6548913},
doi = {10.1109/VTS.2013.6548913},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LarabaSMNB13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/StratigopoulosM12,
author = {Haralampos{-}G. D. Stratigopoulos and
Salvador Mir},
title = {Adaptive Alternate Analog Test},
journal = {{IEEE} Des. Test Comput.},
volume = {29},
number = {4},
pages = {71--79},
year = {2012},
url = {https://doi.org/10.1109/MDT.2012.2205480},
doi = {10.1109/MDT.2012.2205480},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/StratigopoulosM12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tim/HuangSMHXK12,
author = {Ke Huang and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir and
Camelia Hora and
Yizi Xing and
Bram Kruseman},
title = {Diagnosis of Local Spot Defects in Analog Circuits},
journal = {{IEEE} Trans. Instrum. Meas.},
volume = {61},
number = {10},
pages = {2701--2712},
year = {2012},
url = {https://doi.org/10.1109/TIM.2012.2196390},
doi = {10.1109/TIM.2012.2196390},
timestamp = {Mon, 08 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tim/HuangSMHXK12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/AbdallahSMA12,
author = {Louay Abdallah and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir and
Josep Altet},
editor = {Wolfgang Rosenstiel and
Lothar Thiele},
title = {Testing {RF} circuits with true non-intrusive built-in sensors},
booktitle = {2012 Design, Automation {\&} Test in Europe Conference {\&}
Exhibition, {DATE} 2012, Dresden, Germany, March 12-16, 2012},
pages = {1090--1095},
publisher = {{IEEE}},
year = {2012},
url = {https://doi.org/10.1109/DATE.2012.6176657},
doi = {10.1109/DATE.2012.6176657},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/AbdallahSMA12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/LarabaSMNF12,
author = {Asma Laraba and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir and
Herv{\'{e}} Naudet and
Christophe Forel},
title = {Enhanced reduced code linearity test technique for multi-bit/stage
pipeline ADCs},
booktitle = {17th {IEEE} European Test Symposium, {ETS} 2012, Annecy, France, May
28 - June 1 2012},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ETS.2012.6233009},
doi = {10.1109/ETS.2012.6233009},
timestamp = {Tue, 28 Apr 2020 11:43:43 +0200},
biburl = {https://dblp.org/rec/conf/ets/LarabaSMNF12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icecsys/BezniaBAHME12,
author = {Kamel Beznia and
Ahc{\`{e}}ne Bounceur and
Louay Abdallah and
Ke Huang and
Salvador Mir and
Reinhardt Euler},
title = {Accurate estimation of analog test metrics with extreme circuits},
booktitle = {19th {IEEE} International Conference on Electronics, Circuits and
Systems, {ICECS} 2012, Seville, Spain, December 9-12, 2012},
pages = {272--275},
publisher = {{IEEE}},
year = {2012},
url = {https://doi.org/10.1109/ICECS.2012.6463748},
doi = {10.1109/ICECS.2012.6463748},
timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
biburl = {https://dblp.org/rec/conf/icecsys/BezniaBAHME12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AbdallahSMK12,
author = {Louay Abdallah and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir and
Christophe Kelma},
title = {Experiences with non-intrusive sensors for {RF} built-in test},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401587},
doi = {10.1109/TEST.2012.6401587},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AbdallahSMK12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AkkoucheMSS12,
author = {Nourredine Akkouche and
Salvador Mir and
Emmanuel Simeu and
Mustapha Slamani},
title = {Analog/RF test ordering in the early stages of production testing},
booktitle = {30th {IEEE} {VLSI} Test Symposium, {VTS} 2012, Maui, Hawaii, USA,
23-26 April 2012},
pages = {25--30},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/VTS.2012.6231075},
doi = {10.1109/VTS.2012.6231075},
timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
biburl = {https://dblp.org/rec/conf/vts/AkkoucheMSS12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vlsi/2011socs,
editor = {Salvador Mir and
Chi{-}Ying Tsui and
Ricardo Reis and
Oliver C. S. Choy},
title = {VLSI-SoC: Advanced Research for Systems on Chip - 19th {IFIP} {WG}
10.5/IEEE International Conference on Very Large Scale Integration,
VLSI-SoC 2011, Hong Kong, China, October 3-5, 2011, Revised Selected
Papers},
series = {{IFIP} Advances in Information and Communication Technology},
volume = {379},
publisher = {Springer},
year = {2012},
url = {https://doi.org/10.1007/978-3-642-32770-4},
doi = {10.1007/978-3-642-32770-4},
isbn = {978-3-642-32769-8},
timestamp = {Tue, 22 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vlsi/2011socs.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/AbdallahSMK11,
author = {Louay Abdallah and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir and
Christophe Kelma},
title = {{RF} Front-End Test Using Built-in Sensors},
journal = {{IEEE} Des. Test Comput.},
volume = {28},
number = {6},
pages = {76--84},
year = {2011},
url = {https://doi.org/10.1109/MDT.2011.131},
doi = {10.1109/MDT.2011.131},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/AbdallahSMK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/BounceurMS11,
author = {Ahc{\`{e}}ne Bounceur and
Salvador Mir and
Haralampos{-}G. D. Stratigopoulos},
title = {Estimation of Analog Parametric Test Metrics Using Copulas},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {30},
number = {9},
pages = {1400--1410},
year = {2011},
url = {https://doi.org/10.1109/TCAD.2011.2149522},
doi = {10.1109/TCAD.2011.2149522},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/BounceurMS11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SpyronasiosASM11,
author = {Alexios Spyronasios and
Louay Abdallah and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir},
title = {On Replacing an {RF} Test with an Alternative Measurement: Theory
and a Case Study},
booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
Delhi, India, November 20-23, 2011},
pages = {365--370},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ATS.2011.44},
doi = {10.1109/ATS.2011.44},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SpyronasiosASM11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ecctd/AbdallahSM11,
author = {Louay Abdallah and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir},
title = {Implicit test of high-speed analog circuits using non-intrusive sensors},
booktitle = {20th European Conference on Circuit Theory and Design, {ECCTD} 2011,
Linkoping, Sweden, Aug. 29-31, 2011},
pages = {652},
publisher = {{IEEE}},
year = {2011},
url = {https://doi.org/10.1109/ECCTD.2011.6043627},
doi = {10.1109/ECCTD.2011.6043627},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/ecctd/AbdallahSM11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mj/CenniCMR10,
author = {Fabio Cenni and
Jeremie Cazalbou and
Salvador Mir and
Libor Rufer},
title = {Design of a SAW-based chemical sensor with its microelectronics front-end
interface},
journal = {Microelectron. J.},
volume = {41},
number = {11},
pages = {723--732},
year = {2010},
url = {https://doi.org/10.1016/j.mejo.2010.06.008},
doi = {10.1016/J.MEJO.2010.06.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mj/CenniCMR10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangSM10,
author = {Ke Huang and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir},
title = {Bayesian Fault Diagnosis of {RF} Circuits Using Nonparametric Density
Estimation},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {295--298},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.57},
doi = {10.1109/ATS.2010.57},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuangSM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/HuangSM10,
author = {Ke Huang and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir},
editor = {Giovanni De Micheli and
Bashir M. Al{-}Hashimi and
Wolfgang M{\"{u}}ller and
Enrico Macii},
title = {Fault diagnosis of analog circuits based on machine learning},
booktitle = {Design, Automation and Test in Europe, {DATE} 2010, Dresden, Germany,
March 8-12, 2010},
pages = {1761--1766},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/DATE.2010.5457099},
doi = {10.1109/DATE.2010.5457099},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/date/HuangSM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/delta/RehderMRSN10,
author = {Gustavo Pamplona Rehder and
Salvador Mir and
Libor Rufer and
Emmanuel Simeu and
Hoang Nam Nguyen},
title = {Low Frequency Test for {RF} {MEMS} Switches},
booktitle = {Fifth {IEEE} International Symposium on Electronic Design, Test {\&}
Applications, {DELTA} 2010, Ho Chi Minh City, Vietnam, January 13-15,
2010},
pages = {350--354},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/DELTA.2010.16},
doi = {10.1109/DELTA.2010.16},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/delta/RehderMRSN10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/AbdallahSKM10,
author = {Louay Abdallah and
Haralampos{-}G. D. Stratigopoulos and
Christophe Kelma and
Salvador Mir},
title = {Sensors for built-in alternate {RF} test},
booktitle = {15th European Test Symposium, {ETS} 2010, Prague, Czech Republic,
May 24-28, 2010},
pages = {49--54},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ETSYM.2010.5512783},
doi = {10.1109/ETSYM.2010.5512783},
timestamp = {Tue, 28 Apr 2020 11:43:44 +0200},
biburl = {https://dblp.org/rec/conf/ets/AbdallahSKM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/StratigopoulosMAO10,
author = {Haralampos{-}G. D. Stratigopoulos and
Salvador Mir and
Erkan Acar and
Sule Ozev},
title = {Defect filter for alternate {RF} test},
booktitle = {15th European Test Symposium, {ETS} 2010, Prague, Czech Republic,
May 24-28, 2010},
pages = {265--270},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ETSYM.2010.5512726},
doi = {10.1109/ETSYM.2010.5512726},
timestamp = {Tue, 28 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/StratigopoulosMAO10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/StratigopoulosM10,
author = {Haralampos{-}G. D. Stratigopoulos and
Salvador Mir},
editor = {Louis Scheffer and
Joel R. Phillips and
Alan J. Hu},
title = {Analog test metrics estimates with {PPM} accuracy},
booktitle = {2010 International Conference on Computer-Aided Design, {ICCAD} 2010,
San Jose, CA, USA, November 7-11, 2010},
pages = {241--247},
publisher = {{IEEE}},
year = {2010},
url = {https://doi.org/10.1109/ICCAD.2010.5654165},
doi = {10.1109/ICCAD.2010.5654165},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/StratigopoulosM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/KhereddineASMC10a,
author = {Rafik Khereddine and
Louay Abdallah and
Emmanuel Simeu and
Salvador Mir and
Fabio Cenni},
editor = {Jos{\'{e}} L. Ayala and
David Atienza Alonso and
Ricardo Reis},
title = {Adaptive Logical Control of {RF} {LNA} Performances for Efficient
Energy Consumption},
booktitle = {VLSI-SoC: Forward-Looking Trends in {IC} and Systems Design - 18th
{IFIP} {WG} 10.5/IEEE International Conference on Very Large Scale
Integration, VLSI-SoC 2010, Madrid, Spain, September 27-29, 2010,
Revised Selected Papers},
series = {{IFIP} Advances in Information and Communication Technology},
volume = {373},
pages = {43--68},
publisher = {Springer},
year = {2010},
url = {https://doi.org/10.1007/978-3-642-28566-0\_3},
doi = {10.1007/978-3-642-28566-0\_3},
timestamp = {Tue, 22 Oct 2019 15:21:19 +0200},
biburl = {https://dblp.org/rec/conf/vlsi/KhereddineASMC10a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/KhereddineASMC10,
author = {Rafik Khereddine and
Louay Abdallah and
Emmanuel Simeu and
Salvador Mir and
Fabio Cenni},
title = {Adaptive logical control of {RF} {LNA} performances for efficient
energy consumption},
booktitle = {18th {IEEE/IFIP} VLSI-SoC 2010, {IEEE/IFIP} {WG} 10.5 International
Conference on Very Large Scale Integration of System-on-Chip, Madrid,
Spain, 27-29 September 2010},
pages = {161--166},
publisher = {{IEEE}},
year = {2010},
url = {https://doi.org/10.1109/VLSISOC.2010.5642602},
doi = {10.1109/VLSISOC.2010.5642602},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vlsi/KhereddineASMC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MirSB10,
author = {Salvador Mir and
Haralampos{-}G. D. Stratigopoulos and
Ahc{\`{e}}ne Bounceur},
title = {Density estimation for analog/RF test problem solving},
booktitle = {28th {IEEE} {VLSI} Test Symposium, {VTS} 2010, April 19-22, 2010,
Santa Cruz, California, {USA}},
pages = {41},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/VTS.2010.5469620},
doi = {10.1109/VTS.2010.5469620},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MirSB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AkkoucheMS10,
author = {Nourredine Akkouche and
Salvador Mir and
Emmanuel Simeu},
title = {Ordering of analog specification tests based on parametric defect
level estimation},
booktitle = {28th {IEEE} {VLSI} Test Symposium, {VTS} 2010, April 19-22, 2010,
Santa Cruz, California, {USA}},
pages = {301--306},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/VTS.2010.5469546},
doi = {10.1109/VTS.2010.5469546},
timestamp = {Thu, 25 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/AkkoucheMS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mj/DhayniMRBS09,
author = {Achraf Dhayni and
Salvador Mir and
Libor Rufer and
Ahc{\`{e}}ne Bounceur and
Emmanuel Simeu},
title = {Pseudorandom {BIST} for test and characterization of linear and nonlinear
{MEMS}},
journal = {Microelectron. J.},
volume = {40},
number = {7},
pages = {1054--1061},
year = {2009},
url = {https://doi.org/10.1016/j.mejo.2008.05.012},
doi = {10.1016/J.MEJO.2008.05.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mj/DhayniMRBS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/StratigopoulosMB09,
author = {Haralampos{-}G. D. Stratigopoulos and
Salvador Mir and
Ahc{\`{e}}ne Bounceur},
title = {Evaluation of Analog/RF Test Measurements at the Design Stage},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {28},
number = {4},
pages = {582--590},
year = {2009},
url = {https://doi.org/10.1109/TCAD.2009.2016136},
doi = {10.1109/TCAD.2009.2016136},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/StratigopoulosMB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/StratigopoulosMM09,
author = {Haralampos{-}G. D. Stratigopoulos and
Salvador Mir and
Yiorgos Makris},
editor = {Luca Benini and
Giovanni De Micheli and
Bashir M. Al{-}Hashimi and
Wolfgang M{\"{u}}ller},
title = {Enrichment of limited training sets in machine-learning-based analog/RF
test},
booktitle = {Design, Automation and Test in Europe, {DATE} 2009, Nice, France,
April 20-24, 2009},
pages = {1668--1673},
publisher = {{IEEE}},
year = {2009},
url = {https://doi.org/10.1109/DATE.2009.5090931},
doi = {10.1109/DATE.2009.5090931},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/date/StratigopoulosMM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/StratigopoulosMAO09,
author = {Haralampos{-}G. D. Stratigopoulos and
Salvador Mir and
Erkan Acar and
Sule Ozev},
title = {Defect Filter for Alternate {RF} Test},
booktitle = {14th {IEEE} European Test Symposium, {ETS} 2009, Sevilla, Spain, May
25-29, 2009},
pages = {101--106},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ETS.2009.32},
doi = {10.1109/ETS.2009.32},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/StratigopoulosMAO09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccd/DuboisSM09,
author = {Matthieu Dubois and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir},
title = {Hierarchical parametric test metrics estimation: {A} {\(\Sigma\)}{\(\Delta\)}
converter {BIST} case study},
booktitle = {27th International Conference on Computer Design, {ICCD} 2009, Lake
Tahoe, CA, USA, October 4-7, 2009},
pages = {78--83},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/ICCD.2009.5413173},
doi = {10.1109/ICCD.2009.5413173},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccd/DuboisSM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/pdes/KhereddineSM09,
author = {Rafik Khereddine and
Emmanuel Simeu and
Salvador Mir},
editor = {Vil{\'{e}}m Srovnal},
title = {Parameter identification of {RF} transceiver blocks using regressive
models},
booktitle = {9th {IFAC} Workshop on Programmable Devices and Embedded Systems,
PDeS 2009, Ostrava, Czech Republic, February 10-12, 2009},
pages = {67--72},
publisher = {International Federation of Automatic Control},
year = {2009},
url = {https://doi.org/10.3182/20090210-3-CZ-4002.00017},
doi = {10.3182/20090210-3-CZ-4002.00017},
timestamp = {Tue, 09 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/pdes/KhereddineSM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LizarragaMS09,
author = {Livier Lizarraga and
Salvador Mir and
Gilles Sicard},
title = {Experimental Validation of a {BIST} Techcnique for {CMOS} Active Pixel
Sensors},
booktitle = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
Cruz, California, {USA}},
pages = {189--194},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/VTS.2009.30},
doi = {10.1109/VTS.2009.30},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LizarragaMS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/vlsi/SimeuNCMRK08,
author = {Emmanuel Simeu and
Hoang Nam Nguyen and
Philippe Cauvet and
Salvador Mir and
Libor Rufer and
Rafik Khereddine},
title = {Using Signal Envelope Detection for Online and Offline {RF} {MEMS}
Switch Testing},
journal = {{VLSI} Design},
volume = {2008},
pages = {294014:1--294014:10},
year = {2008},
url = {https://doi.org/10.1155/2008/294014},
doi = {10.1155/2008/294014},
timestamp = {Sat, 24 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/vlsi/SimeuNCMRK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/StratigopoulosTM08,
author = {Haralampos{-}G. D. Stratigopoulos and
Jeanne Tongbong and
Salvador Mir},
editor = {Donatella Sciuto},
title = {A General Method to Evaluate {RF} {BIST} Techniques Based on Non-parametric
Density Estimation},
booktitle = {Design, Automation and Test in Europe, {DATE} 2008, Munich, Germany,
March 10-14, 2008},
pages = {68--73},
publisher = {{ACM}},
year = {2008},
url = {https://doi.org/10.1109/DATE.2008.4484662},
doi = {10.1109/DATE.2008.4484662},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/StratigopoulosTM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BounceurMSR07,
author = {Ahc{\`{e}}ne Bounceur and
Salvador Mir and
Emmanuel Simeu and
Lu{\'{\i}}s Rol{\'{\i}}ndez},
title = {Estimation of Test Metrics for the Optimisation of Analogue Circuit
Testing},
journal = {J. Electron. Test.},
volume = {23},
number = {6},
pages = {471--484},
year = {2007},
url = {https://doi.org/10.1007/s10836-007-5006-6},
doi = {10.1007/S10836-007-5006-6},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/BounceurMSR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChengAMMWW07,
author = {Jacob Abraham and
Salvador Mir and
Yinghua Min and
Jeremy Wang and
Cheng{-}Wen Wu},
title = {Test Education in the Global Economy},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {53},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.110},
doi = {10.1109/ATS.2007.110},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/ChengAMMWW07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LizarragaMS07,
author = {Livier Lizarraga and
Salvador Mir and
Gilles Sicard},
title = {Evaluation of a {BIST} Technique for {CMOS} Imagers},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {378--383},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.62},
doi = {10.1109/ATS.2007.62},
timestamp = {Wed, 09 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LizarragaMS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/TongbongMC07,
author = {Jeanne Tongbong and
Salvador Mir and
Jean{-}Louis Carbon{\'{e}}ro},
editor = {Rudy Lauwereins and
Jan Madsen},
title = {Interactive presentation: Evaluation of test measures for {LNA} production
testing using a multinormal statistical model},
booktitle = {2007 Design, Automation and Test in Europe Conference and Exposition,
{DATE} 2007, Nice, France, April 16-20, 2007},
pages = {731--736},
publisher = {{EDA} Consortium, San Jose, CA, {USA}},
year = {2007},
url = {https://doi.org/10.1109/DATE.2007.364682},
doi = {10.1109/DATE.2007.364682},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/TongbongMC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/SimeuMKN07,
author = {Emmanuel Simeu and
Salvador Mir and
R. Kherreddine and
Hoang Nam Nguyen},
title = {Envelope Detection Based Transition Time Supervision for Online Testing
of {RF} {MEMS} Switches},
booktitle = {13th {IEEE} International On-Line Testing Symposium {(IOLTS} 2007),
8-11 July 2007, Heraklion, Crete, Greece},
pages = {237--243},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/IOLTS.2007.30},
doi = {10.1109/IOLTS.2007.30},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/SimeuMKN07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RolindezMCGC07,
author = {Lu{\'{\i}}s Rol{\'{\i}}ndez and
Salvador Mir and
Jean{-}Louis Carbon{\'{e}}ro and
Dimitri Goguet and
Nabil Chouba},
editor = {Jill Sibert and
Janusz Rajski},
title = {A stereo audio {\(\Sigma\)}{\(\sum\)} {ADC} architecture with embedded
{SNDR} self-test},
booktitle = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
California, USA, October 21-26, 2007},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/TEST.2007.4437653},
doi = {10.1109/TEST.2007.4437653},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RolindezMCGC07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vlsi/2006socs,
editor = {Giovanni De Micheli and
Salvador Mir and
Ricardo Reis},
title = {VLSI-SoC: Research Trends in {VLSI} and Systems on Chip - Fourteenth
International Conference on Very Large Scale Integration of System
on Chip (VLSI-SoC2006), October 16-18, 2006, Nice, France},
series = {{IFIP}},
volume = {249},
publisher = {Springer},
year = {2007},
url = {https://doi.org/10.1007/978-0-387-74909-9},
doi = {10.1007/978-0-387-74909-9},
isbn = {978-0-387-74908-2},
timestamp = {Tue, 22 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vlsi/2006socs.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MirCR06,
author = {Salvador Mir and
Kwang{-}Ting (Tim) Cheng and
Andrew Richardson},
title = {Guest Editorial},
journal = {J. Electron. Test.},
volume = {22},
number = {4-6},
pages = {311},
year = {2006},
url = {https://doi.org/10.1007/s10836-006-9946-z},
doi = {10.1007/S10836-006-9946-Z},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/MirCR06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RolindezMBC06,
author = {Lu{\'{\i}}s Rol{\'{\i}}ndez and
Salvador Mir and
Ahc{\`{e}}ne Bounceur and
Jean{-}Louis Carbon{\'{e}}ro},
title = {A {BIST} Scheme for {SNDR} Testing of SigmaDelta ADCs Using Sine-Wave
Fitting},
journal = {J. Electron. Test.},
volume = {22},
number = {4-6},
pages = {325--335},
year = {2006},
url = {https://doi.org/10.1007/s10836-006-9500-z},
doi = {10.1007/S10836-006-9500-Z},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/RolindezMBC06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mj/MirRD06,
author = {Salvador Mir and
Libor Rufer and
Achraf Dhayni},
title = {Built-in-self-test techniques for {MEMS}},
journal = {Microelectron. J.},
volume = {37},
number = {12},
pages = {1591--1597},
year = {2006},
url = {https://doi.org/10.1016/j.mejo.2006.04.016},
doi = {10.1016/J.MEJO.2006.04.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mj/MirRD06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/DhayniMRB06,
author = {Achraf Dhayni and
Salvador Mir and
Libor Rufer and
Ahc{\`{e}}ne Bounceur},
editor = {Georges G. E. Gielen},
title = {Pseudorandom functional {BIST} for linear and nonlinear {MEMS}},
booktitle = {Proceedings of the Conference on Design, Automation and Test in Europe,
{DATE} 2006, Munich, Germany, March 6-10, 2006},
pages = {664--669},
publisher = {European Design and Automation Association, Leuven, Belgium},
year = {2006},
url = {https://doi.org/10.1109/DATE.2006.244039},
doi = {10.1109/DATE.2006.244039},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/DhayniMRB06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/BounceurMRS06a,
author = {Ahc{\`{e}}ne Bounceur and
Salvador Mir and
Lu{\'{\i}}s Rol{\'{\i}}ndez and
Emmanuel Simeu},
editor = {Giovanni De Micheli and
Salvador Mir and
Ricardo Reis},
title = {{CAT} Platform for Analogue and Mixed-Signal Test Evaluation and Optimization},
booktitle = {VLSI-SoC: Research Trends in {VLSI} and Systems on Chip - Fourteenth
International Conference on Very Large Scale Integration of System
on Chip (VLSI-SoC2006), October 16-18, 2006, Nice, France},
series = {{IFIP}},
volume = {249},
pages = {281--300},
publisher = {Springer},
year = {2006},
url = {https://doi.org/10.1007/978-0-387-74909-9\_16},
doi = {10.1007/978-0-387-74909-9\_16},
timestamp = {Tue, 22 Oct 2019 15:21:19 +0200},
biburl = {https://dblp.org/rec/conf/vlsi/BounceurMRS06a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/BounceurMRS06,
author = {Ahc{\`{e}}ne Bounceur and
Salvador Mir and
Lu{\'{\i}}s Rol{\'{\i}}ndez and
Emmanuel Simeu},
title = {{CAT} platform for analogue and mixed-signal test evaluation and optimization},
booktitle = {{IFIP} VLSI-SoC 2006, {IFIP} {WG} 10.5 International Conference on
Very Large Scale Integration of System-on-Chip, Nice, France, 16-18
October 2006},
pages = {320--325},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/VLSISOC.2006.313254},
doi = {10.1109/VLSISOC.2006.313254},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vlsi/BounceurMRS06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/LizzarragaMSB06,
author = {Livier Lizarraga and
Salvador Mir and
Gilles Sicard and
Ahc{\`{e}}ne Bounceur},
title = {Study of a {BIST} Technique for {CMOS} Active Pixel Sensors},
booktitle = {{IFIP} VLSI-SoC 2006, {IFIP} {WG} 10.5 International Conference on
Very Large Scale Integration of System-on-Chip, Nice, France, 16-18
October 2006},
pages = {326--331},
publisher = {{IEEE}},
year = {2006},
url = {https://doi.org/10.1109/VLSISOC.2006.313255},
doi = {10.1109/VLSISOC.2006.313255},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vlsi/LizzarragaMSB06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/RolindezMBC06,
author = {Lu{\'{\i}}s Rol{\'{\i}}ndez and
Salvador Mir and
Ahc{\`{e}}ne Bounceur and
Jean{-}Louis Carbon{\'{e}}ro},
title = {A {SNDR} {BIST} for Sigma-Delta Analogue-to-Digital Converters},
booktitle = {24th {IEEE} {VLSI} Test Symposium {(VTS} 2006), 30 April - 4 May 2006,
Berkeley, California, {USA}},
pages = {314--319},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/VTS.2006.12},
doi = {10.1109/VTS.2006.12},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/RolindezMBC06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RuferMSD05,
author = {Libor Rufer and
Salvador Mir and
Emmanuel Simeu and
C. Domingues},
title = {On-Chip Pseudorandom {MEMS} Testing},
journal = {J. Electron. Test.},
volume = {21},
number = {3},
pages = {233--241},
year = {2005},
url = {https://doi.org/10.1007/s10836-005-6353-9},
doi = {10.1007/S10836-005-6353-9},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/RuferMSD05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mj/KaminskaSM05,
author = {Bozena Kaminska and
Stephen K. Sunter and
Salvador Mir},
title = {Analog and mixed signal test techniques for {SOC} development},
journal = {Microelectron. J.},
volume = {36},
number = {12},
pages = {1063},
year = {2005},
url = {https://doi.org/10.1016/j.mejo.2005.06.002},
doi = {10.1016/J.MEJO.2005.06.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mj/KaminskaSM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mj/PrenatMVR05,
author = {Guillaume Prenat and
Salvador Mir and
Diego V{\'{a}}zquez and
Lu{\'{\i}}s Rol{\'{\i}}ndez},
title = {A low-cost digital frequency testing approach for mixed-signal devices
using SigmaDelta modulation},
journal = {Microelectron. J.},
volume = {36},
number = {12},
pages = {1080--1090},
year = {2005},
url = {https://doi.org/10.1016/j.mejo.2005.04.062},
doi = {10.1016/J.MEJO.2005.04.062},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mj/PrenatMVR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/KherijiDCM05,
author = {Rabeb Kheriji and
V. Danelon and
Jean{-}Louis Carbon{\'{e}}ro and
Salvador Mir},
title = {Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented
Approach},
booktitle = {2005 Design, Automation and Test in Europe Conference and Exposition
{(DATE} 2005), 7-11 March 2005, Munich, Germany},
pages = {170--171},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/DATE.2005.233},
doi = {10.1109/DATE.2005.233},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/KherijiDCM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/esscirc/MatakiasTAHPM05,
author = {Sotirios Matakias and
Yiorgos Tsiatouhas and
Angela Arapoyanni and
Th. Haniotakis and
Guillaume Prenat and
Salvador Mir},
editor = {Laurent Fesquet and
Andreas Kaiser and
Sorin Cristoloveanu and
Michel Brillou{\"{e}}t},
title = {A built-in I\({}_{\mbox{DDQ}}\) testing circuit},
booktitle = {Proceedings of the 31st European Solid-State Circuits Conference,
{ESSCIRC} 2005, Grenoble, France, 12-16 September 2005},
pages = {471--474},
publisher = {{IEEE}},
year = {2005},
url = {https://doi.org/10.1109/ESSCIR.2005.1541662},
doi = {10.1109/ESSCIR.2005.1541662},
timestamp = {Fri, 28 Apr 2023 15:39:25 +0200},
biburl = {https://dblp.org/rec/conf/esscirc/MatakiasTAHPM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/DhayniMR05,
author = {Achraf Dhayni and
Salvador Mir and
Libor Rufer},
title = {Evaluation of impulse response-based {BIST} techniques for {MEMS}
in the presence of weak nonlinearities},
booktitle = {10th European Test Symposium, {ETS} 2005, Tallinn, Estonia, May 22-25,
2005},
pages = {82--87},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/ETS.2005.21},
doi = {10.1109/ETS.2005.21},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/DhayniMR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsi/DhayniMRB05,
author = {Achraf Dhayni and
Salvador Mir and
Libor Rufer and
Ahc{\`{e}}ne Bounceur},
editor = {Ricardo Augusto da Luz Reis and
Adam Osseiran and
Hans{-}J{\"{o}}rg Pfleiderer},
title = {On-chip Pseudorandom Testing for Linear and Nonlinear {MEMS}},
booktitle = {VLSI-SoC: From Systems To Silicon, Proceedings of {IFIP} {TC} 10,
{WG} 10.5, Thirteenth International Conference on Very Large Scale
Integration of System on Chip (VLSI-SoC 2005), October 17-19, 2005,
Perth, Australia},
series = {{IFIP}},
volume = {240},
pages = {245--266},
publisher = {Springer},
year = {2005},
url = {https://doi.org/10.1007/978-0-387-73661-7\_16},
doi = {10.1007/978-0-387-73661-7\_16},
timestamp = {Tue, 26 Jun 2018 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vlsi/DhayniMRB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/RolindezMPB04,
author = {Lu{\'{\i}}s Rol{\'{\i}}ndez and
Salvador Mir and
Guillaume Prenat and
Ahc{\`{e}}ne Bounceur},
title = {A 0.18 {\(\mathrm{\mu}\)}m {CMOS} Implementation of On-chip Analogue
Test Signal Generation from Digital Test Patterns},
booktitle = {2004 Design, Automation and Test in Europe Conference and Exposition
{(DATE} 2004), 16-20 February 2004, Paris, France},
pages = {706--707},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/DATE.2004.1268939},
doi = {10.1109/DATE.2004.1268939},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/RolindezMPB04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/DhayniMR04,
author = {Achraf Dhayni and
Salvador Mir and
Libor Rufer},
title = {Mems built-in-self-test using {MLS}},
booktitle = {9th European Test Symposium, {ETS} 2004, Ajaccio, France, May 23-26,
2004},
pages = {66--71},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/ETSYM.2004.1347607},
doi = {10.1109/ETSYM.2004.1347607},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/DhayniMR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/socc/MirCRC04,
author = {Salvador Mir and
Beno{\^{\i}}t Charlot and
Libor Rufer and
Bernard Courtois},
title = {On-chip testing of embedded silicon transducers},
booktitle = {Proceedings 2004 {IEEE} International {SOC} Conference, September
12-15, 2004, Hilton Santa Clara, CA, {USA}},
pages = {13--18},
publisher = {{IEEE}},
year = {2004},
url = {https://doi.org/10.1109/SOCC.2004.1362334},
doi = {10.1109/SOCC.2004.1362334},
timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
biburl = {https://dblp.org/rec/conf/socc/MirCRC04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/MirRC04,
author = {Salvador Mir and
Libor Rufer and
Bernard Courtois},
title = {On-chip testing of embedded transducers},
booktitle = {17th International Conference on {VLSI} Design {(VLSI} Design 2004),
with the 3rd International Conference on Embedded Systems Design,
5-9 January 2004, Mumbai, India},
pages = {463},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/ICVD.2004.1260965},
doi = {10.1109/ICVD.2004.1260965},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/MirRC04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mj/RomanMC03,
author = {C. Roman and
Salvador Mir and
Beno{\^{\i}}t Charlot},
title = {Building an analogue fault simulation tool and its application to
{MEMS}},
journal = {Microelectron. J.},
volume = {34},
number = {10},
pages = {897--906},
year = {2003},
url = {https://doi.org/10.1016/S0026-2692(03)00162-9},
doi = {10.1016/S0026-2692(03)00162-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mj/RomanMC03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/MirRDR03,
author = {Salvador Mir and
Lu{\'{\i}}s Rol{\'{\i}}ndez and
Christian Domigues and
Libor Rufer},
editor = {Hiroto Yasuura},
title = {An implementation of memory-based on-chip analogue test signal generation},
booktitle = {Proceedings of the 2003 Asia and South Pacific Design Automation Conference,
{ASP-DAC} '03, Kitakyushu, Japan, January 21-24, 2003},
pages = {663--668},
publisher = {{ACM}},
year = {2003},
url = {https://doi.org/10.1145/1119772.1119921},
doi = {10.1145/1119772.1119921},
timestamp = {Thu, 11 Mar 2021 17:04:51 +0100},
biburl = {https://dblp.org/rec/conf/aspdac/MirRDR03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/NaalSM03,
author = {Mohammad A. Naal and
Emmanuel Simeu and
Salvador Mir},
title = {On-Line Testable Decimation Filter Design for {AMS} Systems},
booktitle = {9th {IEEE} International On-Line Testing Symposium {(IOLTS} 2003),
7-9 July 2003, Kos Island, Greece},
pages = {83--88},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://doi.org/10.1109/OLT.2003.1214371},
doi = {10.1109/OLT.2003.1214371},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/NaalSM03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MirBBKK02,
author = {Salvador Mir and
H. Bederr and
R. D. (Shawn) Blanton and
Hans G. Kerkhoff and
H. J. Klim},
title = {SoCs with MEMS? Can We Include {MEMS} in the SoCs Design and Test
Flow?},
booktitle = {20th {IEEE} {VLSI} Test Symposium {(VTS} 2002), Without Testing It's
a Gamble, 28 April - 2 May 2002, Monterey, CA, {USA}},
pages = {449--450},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/VTS.2002.1011179},
doi = {10.1109/VTS.2002.1011179},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MirBBKK02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/CharlotMPC01,
author = {Beno{\^{\i}}t Charlot and
Salvador Mir and
Fabien Parrain and
Bernard Courtois},
title = {Generation of Electrically Induced Stimuli for {MEMS} Self-Test},
journal = {J. Electron. Test.},
volume = {17},
number = {6},
pages = {459--470},
year = {2001},
url = {https://doi.org/10.1023/A:1012860420235},
doi = {10.1023/A:1012860420235},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/CharlotMPC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/CourtoisMCL01,
author = {Bernard Courtois and
Salvador Mir and
Beno{\^{\i}}t Charlot and
Marcelo Lubaszewski},
title = {An Analog-based Approach for {MEMS} Testing},
booktitle = {2nd Latin American Test Workshop, {LATW} 2001, Cancun, Mexico, February
11-14, 2001},
pages = {200--203},
publisher = {{IEEE}},
year = {2001},
timestamp = {Tue, 25 Jul 2023 13:25:31 +0200},
biburl = {https://dblp.org/rec/conf/latw/CourtoisMCL01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/CharlotMPC01,
author = {Beno{\^{\i}}t Charlot and
Salvador Mir and
Fabien Parrain and
Bernard Courtois},
title = {Electrically Induced Stimuli For {MEMS} Self-Test},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {210--217},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923441},
doi = {10.1109/VTS.2001.923441},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/CharlotMPC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MirCC00,
author = {Salvador Mir and
Beno{\^{\i}}t Charlot and
Bernard Courtois},
title = {Extending Fault-Based Testing to Microelectromechanical Systems},
journal = {J. Electron. Test.},
volume = {16},
number = {3},
pages = {279--288},
year = {2000},
url = {https://doi.org/10.1023/A:1008303717862},
doi = {10.1023/A:1008303717862},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MirCC00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/LubaszewskiMKNC00,
author = {Marcelo Lubaszewski and
Salvador Mir and
Vladimir Kolarik and
C. Nielsen and
Bernard Courtois},
title = {Design of self-checking fully differential circuits and boards},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {8},
number = {2},
pages = {113--128},
year = {2000},
url = {https://doi.org/10.1109/92.831432},
doi = {10.1109/92.831432},
timestamp = {Wed, 11 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tvlsi/LubaszewskiMKNC00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/glvlsi/MirCNCPZCJR00,
author = {Salvador Mir and
Beno{\^{\i}}t Charlot and
Gabriela Nicolescu and
Philippe Coste and
Fabien Parrain and
Nacer{-}Eddine Zergainoh and
Bernard Courtois and
Ahmed Amine Jerraya and
M{\'{a}}rta Rencz},
editor = {Majid Sarrafzadeh and
Prithviraj Banerjee and
Kaushik Roy},
title = {Towards design and validation of mixed-technology SOCs},
booktitle = {Proceedings of the 10th {ACM} Great Lakes Symposium on {VLSI} 2000,
Chicago, Illinois, USA, March 2-4, 2000},
pages = {29--33},
publisher = {{ACM}},
year = {2000},
url = {https://doi.org/10.1145/330855.330950},
doi = {10.1145/330855.330950},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/glvlsi/MirCNCPZCJR00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/MirC99,
author = {Salvador Mir and
Beno{\^{\i}}t Charlot},
title = {On the Integration of Design and Test for Chips Embedding {MEMS}},
journal = {{IEEE} Des. Test Comput.},
volume = {16},
number = {4},
pages = {28--38},
year = {1999},
url = {https://doi.org/10.1109/54.808204},
doi = {10.1109/54.808204},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/MirC99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/MirCC99,
author = {Salvador Mir and
Beno{\^{\i}}t Charlot and
Bernard Courtois},
title = {Extending fault-based testing to microelectromechanical systems},
booktitle = {4th European Test Workshop, {ETW} 1999, Constance, Germany, May 25-28,
1999},
pages = {64--68},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/ETW.1999.804234},
doi = {10.1109/ETW.1999.804234},
timestamp = {Tue, 28 Apr 2020 13:37:50 +0200},
biburl = {https://dblp.org/rec/conf/ets/MirCC99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CharlotMCLC99,
author = {Beno{\^{\i}}t Charlot and
Salvador Mir and
{\'{E}}rika F. Cota and
Marcelo Lubaszewski and
Bernard Courtois},
title = {Fault modeling of suspended thermal {MEMS}},
booktitle = {Proceedings {IEEE} International Test Conference 1999, Atlantic City,
NJ, USA, 27-30 September 1999},
pages = {319--328},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/TEST.1999.805646},
doi = {10.1109/TEST.1999.805646},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CharlotMCLC99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vlsid/CourtoisKMLSRHG99,
author = {Bernard Courtois and
Jean{-}Michel Karam and
Salvador Mir and
Marcelo Lubaszewski and
Vladim{\'{\i}}r Sz{\'{e}}kely and
M{\'{a}}rta Rencz and
Klaus Hofmann and
Manfred Glesner},
title = {Design and Test of MEMs},
booktitle = {12th International Conference on {VLSI} Design {(VLSI} Design 1999),
10-13 January 1999, Goa, India},
pages = {270},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/ICVD.1999.745160},
doi = {10.1109/ICVD.1999.745160},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vlsid/CourtoisKMLSRHG99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/MirRVH98,
author = {Salvador Mir and
Adoraci{\'{o}}n Rueda and
Diego V{\'{a}}zquez and
Jos{\'{e}} Luis Huertas},
editor = {Patrick M. Dewilde and
Franz J. Rammig and
Gerry Musgrave},
title = {Switch-Level Fault Coverage Analysis for Switched-Capacitor Systems},
booktitle = {1998 Design, Automation and Test in Europe {(DATE} '98), February
23-26, 1998, Le Palais des Congr{\`{e}}s de Paris, Paris, France},
pages = {810--814},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/DATE.1998.655951},
doi = {10.1109/DATE.1998.655951},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/MirRVH98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CastillejoVMKC98,
author = {A. Castillejo and
D. Veychard and
Salvador Mir and
Jean{-}Michel Karam and
Bernard Courtois},
title = {Failure mechanisms and fault classes for CMOS-compatible microelectromechanical
systems},
booktitle = {Proceedings {IEEE} International Test Conference 1998, Washington,
DC, USA, October 18-22, 1998},
pages = {541--550},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/TEST.1998.743197},
doi = {10.1109/TEST.1998.743197},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CastillejoVMKC98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/sbcci/RenovellMLB98,
author = {Michel Renovell and
Salvador Mir and
F. Aza{\"{\i}}s M. Lubaszewsk and
Yves Bertrand},
title = {A Built-In Multi-Mode Stimuli Generator for Analogue and Mixed-Signal
Testing},
booktitle = {Proceedings of the 11th Annual Symposium on Integrated Circuits Design,
{SBCCI} 1998, Rio de Janiero, Brazil, September 30 - October 2, 1998},
pages = {175--178},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.ieeecomputersociety.org/10.1109/SBCCI.1998.715435},
doi = {10.1109/SBCCI.1998.715435},
timestamp = {Fri, 27 May 2022 10:20:08 +0200},
biburl = {https://dblp.org/rec/conf/sbcci/RenovellMLB98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/MirROPH97,
author = {Salvador Mir and
Adoraci{\'{o}}n Rueda and
Thomas Olbrich and
Eduardo J. Peral{\'{\i}}as and
Jos{\'{e}} Luis Huertas},
editor = {Ellen J. Yoffa and
Giovanni De Micheli and
Jan M. Rabaey},
title = {{SWITTEST:} Automatic Switch-Level Fault Simulation and Test Evaluation
of Switched-Capacitor Systems},
booktitle = {Proceedings of the 34st Conference on Design Automation, Anaheim,
California, USA, Anaheim Convention Center, June 9-13, 1997},
pages = {281--286},
publisher = {{ACM} Press},
year = {1997},
url = {https://doi.org/10.1145/266021.266099},
doi = {10.1145/266021.266099},
timestamp = {Tue, 06 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/MirROPH97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MirLC96,
author = {Salvador Mir and
Marcelo Lubaszewski and
Bernard Courtois},
title = {Fault-based {ATPG} for linear analog circuits with minimal size multifrequency
test sets},
journal = {J. Electron. Test.},
volume = {9},
number = {1-2},
pages = {43--57},
year = {1996},
url = {https://doi.org/10.1007/BF00137564},
doi = {10.1007/BF00137564},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MirLC96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MirLC96a,
author = {Salvador Mir and
Marcelo Lubaszewski and
Bernard Courtois},
title = {Unified built-in self-test for fully differential analog circuits},
journal = {J. Electron. Test.},
volume = {9},
number = {1-2},
pages = {135--151},
year = {1996},
url = {https://doi.org/10.1007/BF00137570},
doi = {10.1007/BF00137570},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MirLC96a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/MirCLK96,
author = {Salvador Mir and
Bernard Courtois and
Marcelo Lubaszewski and
Vladimir Kolarik},
title = {Automatic Test Generation for Maximal Diagnosis of Linear Analogue
Circuits},
booktitle = {1996 European Design and Test Conference, ED{\&}TC 1996, Paris,
France, March 11-14, 1996},
pages = {254--258},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/EDTC.1996.494157},
doi = {10.1109/EDTC.1996.494157},
timestamp = {Fri, 20 May 2022 15:52:30 +0200},
biburl = {https://dblp.org/rec/conf/date/MirCLK96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/LubaszewskiMP96,
author = {Marcelo Lubaszewski and
Salvador Mir and
Leandro Pulz},
editor = {Rob A. Rutenbar and
Ralph H. J. M. Otten},
title = {{ABILBO:} Analog BuILt-in Block Observer},
booktitle = {Proceedings of the 1996 {IEEE/ACM} International Conference on Computer-Aided
Design, {ICCAD} 1996, San Jose, CA, USA, November 10-14, 1996},
pages = {600--603},
publisher = {{IEEE} Computer Society / {ACM}},
year = {1996},
url = {https://doi.org/10.1109/ICCAD.1996.569917},
doi = {10.1109/ICCAD.1996.569917},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/LubaszewskiMP96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/icecsys/FrancesconiLLM96,
author = {Fabrizio Francesconi and
Valentino Liberali and
Marcelo Lubaszewski and
Salvador Mir},
title = {Design of high-performance band-pass sigma-delta modulator with concurrent
error detection},
booktitle = {Proceedings of Third International Conference on Electronics, Circuits,
and Systems, {ICECS} 1996, Rodos, Greece, October 13-16, 1996},
pages = {1202--1205},
publisher = {{IEEE}},
year = {1996},
url = {https://doi.org/10.1109/ICECS.1996.584641},
doi = {10.1109/ICECS.1996.584641},
timestamp = {Mon, 09 Aug 2021 14:54:04 +0200},
biburl = {https://dblp.org/rec/conf/icecsys/FrancesconiLLM96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/KolarikMLC95,
author = {Vladimir Kolarik and
Salvador Mir and
Marcelo Lubaszewski and
Bernard Courtois},
title = {Analog checkers with absolute and relative tolerances},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {14},
number = {5},
pages = {607--612},
year = {1995},
url = {https://doi.org/10.1109/43.384424},
doi = {10.1109/43.384424},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/KolarikMLC95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/LubaszewskiKMNC95,
author = {Marcelo Lubaszewski and
Vladimir Kolarik and
Salvador Mir and
C. Nielsen and
Bernard Courtois},
title = {Mixed-signal circuits and boards for high safety applications},
booktitle = {1995 European Design and Test Conference, ED{\&}TC 1995, Paris,
France, March 6-9, 1995},
pages = {34--41},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/EDTC.1995.470423},
doi = {10.1109/EDTC.1995.470423},
timestamp = {Fri, 20 May 2022 15:41:46 +0200},
biburl = {https://dblp.org/rec/conf/date/LubaszewskiKMNC95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/eurodac/MirF94,
author = {Salvador Mir and
Nick Filer},
editor = {Jean Mermet},
title = {Re-engineering hardware specifications by exploiting design semantics},
booktitle = {Proceedings EURO-DAC'94, European Design Automation Conference, Grenoble,
France, September 19-22, 1994},
pages = {336--341},
publisher = {{IEEE} Computer Society},
year = {1994},
url = {http://dl.acm.org/citation.cfm?id=198279},
timestamp = {Wed, 29 Mar 2017 16:45:25 +0200},
biburl = {https://dblp.org/rec/conf/eurodac/MirF94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/MirKLNC94,
author = {Salvador Mir and
Vladimir Kolarik and
Marcelo Lubaszewski and
C. Nielsen and
Bernard Courtois},
editor = {Jochen A. G. Jess and
Richard L. Rudell},
title = {Built-in self-test and fault diagnosis of fully differential analogue
circuits},
booktitle = {Proceedings of the 1994 {IEEE/ACM} International Conference on Computer-Aided
Design, {ICCAD} 1994, San Jose, California, USA, November 6-10, 1994},
pages = {486--490},
publisher = {{IEEE} Computer Society / {ACM}},
year = {1994},
url = {https://doi.org/10.1109/ICCAD.1994.629857},
doi = {10.1109/ICCAD.1994.629857},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/MirKLNC94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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