BibTeX records: Lloyd W. Massengill

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@inproceedings{DBLP:conf/irps/XiongFMBWF21,
  author       = {Yoni Xiong and
                  Alexandra Feeley and
                  Lloyd W. Massengill and
                  Bharat L. Bhuva and
                  Shi{-}Jie Wen and
                  Rita Fung},
  title        = {Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors
                  at the 7-nm Node},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
                  CA, USA, March 21-25, 2021},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/IRPS46558.2021.9405128},
  doi          = {10.1109/IRPS46558.2021.9405128},
  timestamp    = {Thu, 20 May 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/XiongFMBWF21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/CaoXWFNMB20,
  author       = {Jingchen Cao and
                  Lyuan Xu and
                  Shi{-}Jie Wen and
                  Rita Fung and
                  Balaji Narasimham and
                  Lloyd W. Massengill and
                  Bharat L. Bhuva},
  title        = {Temperature Dependence of Single-Event Transient Pulse Widths for
                  7-nm Bulk FinFET Technology},
  booktitle    = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
                  Dallas, TX, USA, April 28 - May 30, 2020},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IRPS45951.2020.9129254},
  doi          = {10.1109/IRPS45951.2020.9129254},
  timestamp    = {Wed, 20 Jan 2021 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/CaoXWFNMB20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/CaoXBWWNM19,
  author       = {Jingchen Cao and
                  Lyuan Xu and
                  Bharat L. Bhuva and
                  Shi{-}Jie Wen and
                  Richard Wong and
                  Balaji Narasimham and
                  Lloyd W. Massengill},
  title        = {Alpha Particle Soft-Error Rates for {D-FF} Designs in 16-Nm and 7-Nm
                  Bulk FinFET Technologies},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720556},
  doi          = {10.1109/IRPS.2019.8720556},
  timestamp    = {Wed, 21 Jun 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/CaoXBWWNM19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/XuCBCWWM19,
  author       = {Lyuan Xu and
                  Jingchen Cao and
                  Bharat L. Bhuva and
                  Indranil Chatterjee and
                  Shi{-}Jie Wen and
                  Richard Wong and
                  Lloyd W. Massengill},
  title        = {Single-Event Upset Responses of Dual- and Triple-Well {D} Flip-Flop
                  Designs in 7-nm Bulk FinFET Technology},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720514},
  doi          = {10.1109/IRPS.2019.8720514},
  timestamp    = {Wed, 21 Jun 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/XuCBCWWM19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/ZhangJELNMMB18,
  author       = {H. Zhang and
                  H. Jiang and
                  M. R. Eaker and
                  Kurt J. Lezon and
                  Balaji Narasimham and
                  Nihaar N. Mahatme and
                  Lloyd W. Massengill and
                  Bharat L. Bhuva},
  title        = {Evaluation on flip-flop physical unclonable functions in a 14/16-nm
                  bulk FinFET technology},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {1},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353682},
  doi          = {10.1109/IRPS.2018.8353682},
  timestamp    = {Tue, 19 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/ZhangJELNMMB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/JiangZHMKMB18,
  author       = {Hui Jiang and
                  H. Zhang and
                  R. C. Harrington and
                  J. A. Maharrey and
                  J. S. Kauppila and
                  Lloyd W. Massengill and
                  Bharat L. Bhuva},
  title        = {Impact of supply voltage and particle {LET} on the soft error rate
                  of logic circuits},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {4},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353586},
  doi          = {10.1109/IRPS.2018.8353586},
  timestamp    = {Tue, 22 Jan 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/JiangZHMKMB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/JiangZNMB18,
  author       = {H. Jiang and
                  H. Zhang and
                  Balaji Narasimham and
                  Lloyd W. Massengill and
                  Bharat L. Bhuva},
  title        = {Designing soft-error-aware circuits with power and speed optimization},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {5--1},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353692},
  doi          = {10.1109/IRPS.2018.8353692},
  timestamp    = {Tue, 22 Jan 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/JiangZNMB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/TamBMBMAC15,
  author       = {N. Tam and
                  Bharat L. Bhuva and
                  Lloyd W. Massengill and
                  Dennis R. Ball and
                  Michael W. McCurdy and
                  Michael L. Alles and
                  Indranil Chatterjee},
  title        = {Multi-cell soft errors at the 16-nm FinFET technology node},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {4},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112730},
  doi          = {10.1109/IRPS.2015.7112730},
  timestamp    = {Wed, 24 May 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/TamBMBMAC15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/RezzakASKMSB11,
  author       = {Nadia Rezzak and
                  Michael L. Alles and
                  Ronald D. Schrimpf and
                  Sarah Kalemeris and
                  Lloyd W. Massengill and
                  John Sochacki and
                  Hugh J. Barnaby},
  title        = {The sensitivity of radiation-induced leakage to {STI} topology and
                  sidewall doping},
  journal      = {Microelectron. Reliab.},
  volume       = {51},
  number       = {5},
  pages        = {889--894},
  year         = {2011},
  url          = {https://doi.org/10.1016/j.microrel.2010.12.013},
  doi          = {10.1016/J.MICROREL.2010.12.013},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/RezzakASKMSB11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tcas/FlemingOHBM08,
  author       = {Patrick R. Fleming and
                  Brian D. Olson and
                  W. Timothy Holman and
                  Bharat L. Bhuva and
                  Lloyd W. Massengill},
  title        = {Design Technique for Mitigation of Soft Errors in Differential Switched-Capacitor
                  Circuits},
  journal      = {{IEEE} Trans. Circuits Syst. {II} Express Briefs},
  volume       = {55-II},
  number       = {9},
  pages        = {838--842},
  year         = {2008},
  url          = {https://doi.org/10.1109/TCSII.2008.923437},
  doi          = {10.1109/TCSII.2008.923437},
  timestamp    = {Wed, 27 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tcas/FlemingOHBM08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tnn/MassengillM92,
  author       = {Lloyd W. Massengill and
                  David Bryan Mundie},
  title        = {An analog neural hardware implementation using charge-injection multipliers
                  and neutron-specific gain control},
  journal      = {{IEEE} Trans. Neural Networks},
  volume       = {3},
  number       = {3},
  pages        = {354--362},
  year         = {1992},
  url          = {https://doi.org/10.1109/72.129408},
  doi          = {10.1109/72.129408},
  timestamp    = {Sat, 30 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tnn/MassengillM92.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tnn/MundieM91,
  author       = {David Bryan Mundie and
                  Lloyd W. Massengill},
  title        = {Weight decay and resolution effects in feedforward artificial neural
                  networks},
  journal      = {{IEEE} Trans. Neural Networks},
  volume       = {2},
  number       = {1},
  pages        = {168--170},
  year         = {1991},
  url          = {https://doi.org/10.1109/72.80308},
  doi          = {10.1109/72.80308},
  timestamp    = {Wed, 14 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/tnn/MundieM91.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/simulation/MassengillB89,
  author       = {Lloyd W. Massengill and
                  Neal Bengtson},
  title        = {{RSIM:} {A} circuit simulation program for {VLSI} interconnect networks},
  journal      = {Simul.},
  volume       = {52},
  number       = {2},
  pages        = {68--77},
  year         = {1989},
  url          = {https://doi.org/10.1177/003754978905200204},
  doi          = {10.1177/003754978905200204},
  timestamp    = {Mon, 08 Jun 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/simulation/MassengillB89.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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