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BibTeX records: Ku-Feng Lin
@inproceedings{DBLP:conf/isscc/LinNSYLCHLLHTANYGSJWJWCWCCWC24, author = {Ku{-}Feng Lin and Hiroki Noguchi and Yi{-}Chun Shih and Perng{-}Fei Yuh and Yuan{-}Jen Lee and Tung{-}Cheng Chang and Sheng{-}Po Huang and Yu{-}Fan Lin and Chun{-}Ying Lee and Yen{-}Hsiang Huang and Jui{-}Che Tsai and Saman Adham and Peter Noel and Ramin Yazdi and Marat Gershoig and YangJae Shin and Vineet Joshi and Ted Wong and Meng{-}Ru Jiang and J. J. Wu and Chun{-}Tai Cheng and Yu{-}Jen Wang and Harry Chuang and Yu{-}Der Chih and Yih Wang and Tsung{-}Yung Jonathan Chang}, title = {15.9 {A} 16nm 16Mb Embedded {STT-MRAM} with a 20ns Write Time, a 10\({}^{\mbox{12}}\) Write Endurance and Integrated Margin-Expansion Schemes}, booktitle = {{IEEE} International Solid-State Circuits Conference, {ISSCC} 2024, San Francisco, CA, USA, February 18-22, 2024}, pages = {292--294}, publisher = {{IEEE}}, year = {2024}, url = {https://doi.org/10.1109/ISSCC49657.2024.10454339}, doi = {10.1109/ISSCC49657.2024.10454339}, timestamp = {Tue, 07 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/isscc/LinNSYLCHLLHTANYGSJWJWCWCCWC24.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/jssc/ShihLCLLCLYYCCC19, author = {Yi{-}Chun Shih and Chia{-}Fu Lee and Yen{-}An Chang and Po{-}Hao Lee and Hon{-}Jarn Lin and Yu{-}Lin Chen and Ku{-}Feng Lin and Ta{-}Ching Yeh and Hung{-}Chang Yu and Harry Chuang and Yu{-}Der Chih and Tsung{-}Yung Jonathan Chang}, title = {Logic Process Compatible 40-nm 16-Mb, Embedded Perpendicular-MRAM With Hybrid-Resistance Reference, Sub- {\textdollar}{\textbackslash}mu{\textdollar} {A} Sensing Resolution, and 17.5-nS Read Access Time}, journal = {{IEEE} J. Solid State Circuits}, volume = {54}, number = {4}, pages = {1029--1038}, year = {2019}, url = {https://doi.org/10.1109/JSSC.2018.2889106}, doi = {10.1109/JSSC.2018.2889106}, timestamp = {Wed, 07 Apr 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/jssc/ShihLCLLCLYYCCC19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vlsic/ShihLCLLCLYYCCC18, author = {Yi{-}Chun Shih and Chia{-}Fu Lee and Yen{-}An Chang and Po{-}Hao Lee and Hon{-}Jarn Lin and Yu{-}Lin Chen and Ku{-}Feng Lin and Ta{-}Ching Yeh and Hung{-}Chang Yu and Harry Chuang and Yu{-}Der Chih and Tsung{-}Yung Jonathan Chang}, title = {Logic Process Compatible 40NM 16MB, Embedded Perpendicular-MRAM with Hybrid-Resistance Reference, Sub-{\(\mu\)}A Sensing Resolution, and 17.5NS Read Access Time}, booktitle = {2018 {IEEE} Symposium on {VLSI} Circuits, Honolulu, HI, USA, June 18-22, 2018}, pages = {79--80}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/VLSIC.2018.8502260}, doi = {10.1109/VLSIC.2018.8502260}, timestamp = {Wed, 07 Apr 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vlsic/ShihLCLLCLYYCCC18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/jssc/ChangWCLYSKLLCC15, author = {Meng{-}Fan Chang and Jui{-}Jen Wu and Tun{-}Fei Chien and Yen{-}Chen Liu and Ting{-}Chin Yang and Wen{-}Chao Shen and Ya{-}Chin King and Chrong Jung Lin and Ku{-}Feng Lin and Yu{-}Der Chih and Tsung{-}Yung Jonathan Chang}, title = {Low VDDmin Swing-Sample-and-Couple Sense Amplifier and Energy-Efficient Self-Boost-Write-Termination Scheme for Embedded ReRAM Macros Against Resistance and Switch-Time Variations}, journal = {{IEEE} J. Solid State Circuits}, volume = {50}, number = {11}, pages = {2786--2795}, year = {2015}, url = {https://doi.org/10.1109/JSSC.2015.2472601}, doi = {10.1109/JSSC.2015.2472601}, timestamp = {Sun, 30 Aug 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/jssc/ChangWCLYSKLLCC15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/isscc/ChangWCLYSKLLCN14, author = {Meng{-}Fan Chang and Jui{-}Jen Wu and Tun{-}Fei Chien and Yen{-}Chen Liu and Ting{-}Chin Yang and Wen{-}Chao Shen and Ya{-}Chin King and Chorng{-}Jung Lin and Ku{-}Feng Lin and Yu{-}Der Chih and Sreedhar Natarajan and Tsung{-}Yung Jonathan Chang}, title = {19.4 embedded 1Mb ReRAM in 28nm {CMOS} with 0.27-to-1V read using swing-sample-and-couple sense amplifier and self-boost-write-termination scheme}, booktitle = {2014 {IEEE} International Conference on Solid-State Circuits Conference, {ISSCC} 2014, Digest of Technical Papers, San Francisco, CA, USA, February 9-13, 2014}, pages = {332--333}, publisher = {{IEEE}}, year = {2014}, url = {https://doi.org/10.1109/ISSCC.2014.6757457}, doi = {10.1109/ISSCC.2014.6757457}, timestamp = {Mon, 09 Aug 2021 14:54:04 +0200}, biburl = {https://dblp.org/rec/conf/isscc/ChangWCLYSKLLCN14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/jssc/ChangSLWKCYCLLCSKKT13, author = {Meng{-}Fan Chang and Shyh{-}Shyuan Sheu and Ku{-}Feng Lin and Che{-}Wei Wu and Chia{-}Chen Kuo and Pi{-}Feng Chiu and Yih{-}Shan Yang and Yu{-}Sheng Chen and Heng{-}Yuan Lee and Chen{-}Hsin Lien and Frederick T. Chen and Keng{-}Li Su and Tzu{-}Kun Ku and Ming{-}Jer Kao and Ming{-}Jinn Tsai}, title = {A High-Speed 7.2-ns Read-Write Random Access 4-Mb Embedded Resistive {RAM} (ReRAM) Macro Using Process-Variation-Tolerant Current-Mode Read Schemes}, journal = {{IEEE} J. Solid State Circuits}, volume = {48}, number = {3}, pages = {878--891}, year = {2013}, url = {https://doi.org/10.1109/JSSC.2012.2230515}, doi = {10.1109/JSSC.2012.2230515}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/jssc/ChangSLWKCYCLLCSKKT13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/jssc/ChangWKSYLSKLC13, author = {Meng{-}Fan Chang and Che{-}Wei Wu and Chia{-}Chen Kuo and Shin{-}Jang Shen and Sue{-}Meng Yang and Ku{-}Feng Lin and Wen{-}Chao Shen and Ya{-}Chin King and Chorng{-}Jung Lin and Yu{-}Der Chih}, title = {A Low-Voltage Bulk-Drain-Driven Read Scheme for Sub-0.5 {V} 4 Mb 65 nm Logic-Process Compatible Embedded Resistive {RAM} (ReRAM) Macro}, journal = {{IEEE} J. Solid State Circuits}, volume = {48}, number = {9}, pages = {2250--2259}, year = {2013}, url = {https://doi.org/10.1109/JSSC.2013.2259713}, doi = {10.1109/JSSC.2013.2259713}, timestamp = {Sun, 30 Aug 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/jssc/ChangWKSYLSKLC13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/isscc/YuLLHCOCNT13, author = {Hung{-}Chang Yu and Kai{-}Chun Lin and Ku{-}Feng Lin and Chin{-}Yi Huang and Yu{-}Der Chih and Tong{-}Chern Ong and Tsung{-}Yung Jonathan Chang and Sreedhar Natarajan and Luan C. Tran}, title = {Cycling endurance optimization scheme for 1Mb {STT-MRAM} in 40nm technology}, booktitle = {2013 {IEEE} International Solid-State Circuits Conference - Digest of Technical Papers, {ISSCC} 2013, San Francisco, CA, USA, February 17-21, 2013}, pages = {224--225}, publisher = {{IEEE}}, year = {2013}, url = {https://doi.org/10.1109/ISSCC.2013.6487710}, doi = {10.1109/ISSCC.2013.6487710}, timestamp = {Wed, 16 Oct 2019 14:14:55 +0200}, biburl = {https://dblp.org/rec/conf/isscc/YuLLHCOCNT13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vlsi-dat/YuLLCN13, author = {Hung{-}Chang Yu and Ku{-}Feng Lin and Kai{-}Chun Lin and Yu{-}Der Chih and Sreedhar Natarajan}, title = {A 180 MHz direct access read 4.6Mb embedded flash in 90nm technology operating under wide range power supply from 2.1V to 3.6V}, booktitle = {2013 International Symposium on {VLSI} Design, Automation, and Test, {VLSI-DAT} 2013, Hsinchu, Taiwan, April 22-24, 2013}, pages = {1--4}, publisher = {{IEEE}}, year = {2013}, url = {https://doi.org/10.1109/VLDI-DAT.2013.6533858}, doi = {10.1109/VLDI-DAT.2013.6533858}, timestamp = {Wed, 16 Oct 2019 14:14:54 +0200}, biburl = {https://dblp.org/rec/conf/vlsi-dat/YuLLCN13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/isscc/ChangWKSLYKLC12, author = {Meng{-}Fan Chang and Che{-}Wei Wu and Chia{-}Chen Kuo and Shin{-}Jang Shen and Ku{-}Feng Lin and Shu{-}Meng Yang and Ya{-}Chin King and Chorng{-}Jung Lin and Yu{-}Der Chih}, title = {A 0.5V 4Mb logic-process compatible embedded resistive {RAM} (ReRAM) in 65nm {CMOS} using low-voltage current-mode sensing scheme with 45ns random read time}, booktitle = {2012 {IEEE} International Solid-State Circuits Conference, {ISSCC} 2012, San Francisco, CA, USA, February 19-23, 2012}, pages = {434--436}, publisher = {{IEEE}}, year = {2012}, url = {https://doi.org/10.1109/ISSCC.2012.6177079}, doi = {10.1109/ISSCC.2012.6177079}, timestamp = {Wed, 16 Oct 2019 14:14:55 +0200}, biburl = {https://dblp.org/rec/conf/isscc/ChangWKSLYKLC12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/isscc/SheuCLWCCKYCLLLGWCSLCWKKT11, author = {Shyh{-}Shyuan Sheu and Meng{-}Fan Chang and Ku{-}Feng Lin and Che{-}Wei Wu and Yu{-}Sheng Chen and Pi{-}Feng Chiu and Chia{-}Chen Kuo and Yih{-}Shan Yang and Pei{-}Chia Chiang and Wen{-}Pin Lin and Che{-}He Lin and Heng{-}Yuan Lee and Peiyi Gu and Sumin Wang and Frederick T. Chen and Keng{-}Li Su and Chen{-}Hsin Lien and Kuo{-}Hsing Cheng and Hsin{-}Tun Wu and Tzu{-}Kun Ku and Ming{-}Jer Kao and Ming{-}Jinn Tsai}, title = {A 4Mb embedded {SLC} resistive-RAM macro with 7.2ns read-write random-access time and 160ns MLC-access capability}, booktitle = {{IEEE} International Solid-State Circuits Conference, {ISSCC} 2011, Digest of Technical Papers, San Francisco, CA, USA, 20-24 February, 2011}, pages = {200--202}, publisher = {{IEEE}}, year = {2011}, url = {https://doi.org/10.1109/ISSCC.2011.5746281}, doi = {10.1109/ISSCC.2011.5746281}, timestamp = {Sun, 25 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/isscc/SheuCLWCCKYCLLLGWCSLCWKKT11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/jssc/ChangYLCCL10, author = {Meng{-}Fan Chang and Shu{-}Meng Yang and Chih{-}Wei Liang and Chih{-}Chyuang Chiang and Pi{-}Feng Chiu and Ku{-}Feng Lin}, title = {Noise-Immune Embedded {NAND-ROM} Using a Dynamic Split Source-Line Scheme for VDDmin and Speed Improvements}, journal = {{IEEE} J. Solid State Circuits}, volume = {45}, number = {10}, pages = {2142--2155}, year = {2010}, url = {https://doi.org/10.1109/JSSC.2010.2060279}, doi = {10.1109/JSSC.2010.2060279}, timestamp = {Sun, 30 Aug 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/jssc/ChangYLCCL10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/isscc/ChangYLCCLCWY10, author = {Meng{-}Fan Chang and Shu{-}Meng Yang and Chih{-}Wei Liang and Chih{-}Chyuang Chiang and Pi{-}Feng Chiu and Ku{-}Feng Lin and Yuan{-}Hua Chu and Wen{-}Chin Wu and Hiroyuki Yamauchi}, title = {A 0.29V embedded {NAND-ROM} in 90nm {CMOS} for ultra-low-voltage applications}, booktitle = {{IEEE} International Solid-State Circuits Conference, {ISSCC} 2010, Digest of Technical Papers, San Francisco, CA, USA, 7-11 February, 2010}, pages = {266--267}, publisher = {{IEEE}}, year = {2010}, url = {https://doi.org/10.1109/ISSCC.2010.5433914}, doi = {10.1109/ISSCC.2010.5433914}, timestamp = {Tue, 07 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/isscc/ChangYLCCLCWY10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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