BibTeX records: Jean-Pierre Landesman

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@article{DBLP:journals/mr/LandesmanLJPLBD15,
  author       = {Jean{-}Pierre Landesman and
                  Christophe Levallois and
                  Juan Jim{\'{e}}nez and
                  Fr{\'{e}}d{\'{e}}ric Pommereau and
                  Yoan L{\'{e}}ger and
                  Alexandre Beck and
                  Thomas Delhaye and
                  Alfredo Torres and
                  Cesare Frigeri and
                  Ahmed Rhallabi},
  title        = {Evidence of chlorine ion penetration in InP/InAsP quantum well structures
                  during dry etching processes and effects of induced-defects on the
                  electronic and structural behaviour},
  journal      = {Microelectron. Reliab.},
  volume       = {55},
  number       = {9-10},
  pages        = {1750--1753},
  year         = {2015},
  url          = {https://doi.org/10.1016/j.microrel.2015.07.029},
  doi          = {10.1016/J.MICROREL.2015.07.029},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/LandesmanLJPLBD15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/LecuyerFLB10,
  author       = {Pascal Lecuyer and
                  H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont and
                  Jean{-}Pierre Landesman and
                  Manoubi Auguste Bahi},
  title        = {Wearout estimation using the Robustness Validation methodology for
                  components in 150 degreeC ambient automotive applications},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {9-11},
  pages        = {1744--1749},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.07.076},
  doi          = {10.1016/J.MICROREL.2010.07.076},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LecuyerFLB10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/AugusteHJAP09,
  author       = {Manoubi Auguste Bahi and
                  H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont and
                  Jean{-}Pierre Landesman and
                  Annabelle Gentil and
                  Pascal Lecuyer},
  title        = {A new methodology for the identification of ball bond degradation
                  during high-temperature aging tests on devices in standard plastic
                  packages},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {9-11},
  pages        = {1273--1277},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2009.07.009},
  doi          = {10.1016/J.MICROREL.2009.07.009},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AugusteHJAP09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/BahiLFL07,
  author       = {Manoubi Auguste Bahi and
                  Pascal Lecuyer and
                  H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont and
                  Jean{-}Pierre Landesman},
  title        = {Sequential environmental stresses tests qualification for automotive
                  components},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {9-11},
  pages        = {1680--1684},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.07.004},
  doi          = {10.1016/J.MICROREL.2007.07.004},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BahiLFL07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mj/BechePGHGLZ06,
  author       = {Bruno B{\^{e}}che and
                  N. Pelletier and
                  Etienne Gaviot and
                  R. Hierle and
                  Antoine Goullet and
                  Jean{-}Pierre Landesman and
                  J. Zyss},
  title        = {Conception of optical integrated circuits on polymers},
  journal      = {Microelectron. J.},
  volume       = {37},
  number       = {5},
  pages        = {421--427},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.mejo.2005.07.003},
  doi          = {10.1016/J.MEJO.2005.07.003},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mj/BechePGHGLZ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}