BibTeX records: Michael Laisne

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@inproceedings{DBLP:conf/itc/LaisneCPKSTRZ22,
  author       = {Michael Laisne and
                  Alfred L. Crouch and
                  Michele Portolan and
                  Martin Keim and
                  Hans Martin von Staudt and
                  Bradford G. Van Treuren and
                  Jeff Rearick and
                  Songlin Zuo},
  title        = {{IEEE} {P1687.1:} Extending the Network Boundaries for Test},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
                  September 23-30, 2022},
  pages        = {382--390},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITC50671.2022.00084},
  doi          = {10.1109/ITC50671.2022.00084},
  timestamp    = {Thu, 05 Jan 2023 13:13:27 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/LaisneCPKSTRZ22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/LaisneCPKSATR20,
  author       = {Mike Laisne and
                  Alfred L. Crouch and
                  Michele Portolan and
                  Martin Keim and
                  Hans Martin von Staudt and
                  M. Abdalwahab and
                  Bradford G. Van Treuren and
                  Jeff Rearick},
  title        = {Modeling Novel Non-JTAG {IEEE} 1687-Like Architectures},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
                  USA, November 1-6, 2020},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ITC44778.2020.9325248},
  doi          = {10.1109/ITC44778.2020.9325248},
  timestamp    = {Mon, 25 Jan 2021 08:44:58 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/LaisneCPKSATR20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/StaudtBRL20,
  author       = {Hans Martin von Staudt and
                  Mohamed Anas Benhebibi and
                  Jeff Rearick and
                  Michael Laisne},
  title        = {Industrial Application of {IJTAG} Standards to the Test of Big-A/little-d
                  devices},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
                  USA, November 1-6, 2020},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ITC44778.2020.9325267},
  doi          = {10.1109/ITC44778.2020.9325267},
  timestamp    = {Mon, 25 Jan 2021 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/StaudtBRL20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/computer/CrouchLK17,
  author       = {Al Crouch and
                  Michael Laisne and
                  Martin Keim},
  title        = {Generalizing Access to Instrumentation Embedded in a Semiconductor
                  Device},
  journal      = {Computer},
  volume       = {50},
  number       = {7},
  pages        = {92--95},
  year         = {2017},
  url          = {https://doi.org/10.1109/MC.2017.186},
  doi          = {10.1109/MC.2017.186},
  timestamp    = {Wed, 12 Aug 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/computer/CrouchLK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/LaisneSBE17,
  author       = {Michael Laisne and
                  Hans Martin von Staudt and
                  Sourabh Bhalerao and
                  Mark Eason},
  title        = {Single-pin test control for Big A, little {D} devices},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
                  USA, October 31 - Nov. 2, 2017},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/TEST.2017.8242069},
  doi          = {10.1109/TEST.2017.8242069},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/LaisneSBE17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/DrmanacL11,
  author       = {Dragoljub Gagi Drmanac and
                  Michael Laisne},
  editor       = {Bill Eklow and
                  R. D. (Shawn) Blanton},
  title        = {Wafer probe test cost reduction of an {RF/A} device by automatic testset
                  minimization - {A} case study},
  booktitle    = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
                  USA, September 20-22, 2011},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/TEST.2011.6139143},
  doi          = {10.1109/TEST.2011.6139143},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/DrmanacL11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/Laisne11,
  author       = {Mike Laisne},
  title        = {Advanced methods for leveraging new test standards},
  booktitle    = {29th {IEEE} {VLSI} Test Symposium, {VTS} 2011, May 1-5, 2011, Dana
                  Point, California, {USA}},
  pages        = {97},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/VTS.2011.5783758},
  doi          = {10.1109/VTS.2011.5783758},
  timestamp    = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/Laisne11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/isqed/AdapaFTLCP07,
  author       = {Rajsekhar Adapa and
                  Edward Flanigan and
                  Spyros Tragoudas and
                  Michael Laisne and
                  Hailong Cui and
                  Tsvetomir Petrov},
  title        = {Function-Based Test Generation for (Non-Robust) Path Delay Faults
                  Using the Launch-off-Capture Scan Architecture},
  booktitle    = {8th International Symposium on Quality of Electronic Design {(ISQED}
                  2007), 26-28 March 2007, San Jose, CA, {USA}},
  pages        = {717--722},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/ISQED.2007.81},
  doi          = {10.1109/ISQED.2007.81},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/isqed/AdapaFTLCP07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/LaisneNZPCBSPAS07,
  author       = {Michael Laisne and
                  Triphuong Nguyen and
                  Songlin Zuo and
                  Xiangdong Pan and
                  Hailong Cui and
                  Cher Bai and
                  A. Street and
                  M. Parley and
                  Neetu Agrawal and
                  K. Sundararaman},
  editor       = {Jill Sibert and
                  Janusz Rajski},
  title        = {Verification and debugging of {IDDQ} test of low power chips},
  booktitle    = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
                  California, USA, October 21-26, 2007},
  pages        = {1--7},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/TEST.2007.4437628},
  doi          = {10.1109/TEST.2007.4437628},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/LaisneNZPCBSPAS07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vlsid/FlaniganACLTP07,
  author       = {Edward Flanigan and
                  Rajsekhar Adapa and
                  Hailong Cui and
                  Michael Laisne and
                  Spyros Tragoudas and
                  Tsvetomir Petrov},
  title        = {Function-based {ATPG} for Path Delay Faults using the Launch-Off-Capture
                  Scan Architecture},
  booktitle    = {20th International Conference on {VLSI} Design {(VLSI} Design 2007),
                  Sixth International Conference on Embedded Systems {(ICES} 2007),
                  6-10 January 2007, Bangalore, India},
  pages        = {805--812},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/VLSID.2007.86},
  doi          = {10.1109/VLSID.2007.86},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/FlaniganACLTP07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/PosseCRELBDRC06,
  author       = {Ken Posse and
                  Al Crouch and
                  Jeff Rearick and
                  Bill Eklow and
                  Mike Laisne and
                  Ben Bennetts and
                  Jason Doege and
                  Mike Ricchetti and
                  Jean{-}Francois Cote},
  editor       = {Scott Davidson and
                  Anne Gattiker},
  title        = {{IEEE} {P1687:} Toward Standardized Access of Embedded Instrumentation},
  booktitle    = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
                  CA, USA, October 22-27, 2006},
  pages        = {1--8},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/TEST.2006.297744},
  doi          = {10.1109/TEST.2006.297744},
  timestamp    = {Tue, 12 Dec 2023 09:46:27 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/PosseCRELBDRC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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