BibTeX records: Masanori Kurimoto

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@article{DBLP:journals/todaes/KurimotoMOFKT12,
  author       = {Masanori Kurimoto and
                  Jun Matsushima and
                  Shigeki Ohbayashi and
                  Yoshiaki Fukui and
                  Michio Komoda and
                  Nobuhiro Tsuda},
  title        = {A Yield and Reliability Improvement Methodology Based on Logic Redundant
                  Repair with a Repairable Scan Flip-Flop Designed by Push Rule},
  journal      = {{ACM} Trans. Design Autom. Electr. Syst.},
  volume       = {17},
  number       = {2},
  pages        = {17:1--17:22},
  year         = {2012},
  url          = {https://doi.org/10.1145/2159542.2159549},
  doi          = {10.1145/2159542.2159549},
  timestamp    = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/todaes/KurimotoMOFKT12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/todaes/KurimotoYNHK12,
  author       = {Masanori Kurimoto and
                  Takeshi Yamamoto and
                  Satoshi Nakano and
                  Atsuto Hanami and
                  Hiroyuki Kondo},
  title        = {Verification work reduction methodology in low-power chip implementation},
  journal      = {{ACM} Trans. Design Autom. Electr. Syst.},
  volume       = {18},
  number       = {1},
  pages        = {12:1--12:15},
  year         = {2012},
  url          = {https://doi.org/10.1145/2390191.2390203},
  doi          = {10.1145/2390191.2390203},
  timestamp    = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/todaes/KurimotoYNHK12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/asscc/KurimotoTFSKK11,
  author       = {Masanori Kurimoto and
                  Yasuhiko Takahashi and
                  Yuji Fujiwara and
                  Mamoru Sakugawa and
                  Souichi Kobayashi and
                  Hiroyuki Kondo},
  title        = {System performance and energy consumption improvement methodology
                  by delay adjustable synchronizer},
  booktitle    = {{IEEE} Asian Solid-State Circuits Conference, {A-SSCC} 2011, Jeju,
                  South Korea, November 14-16, 2011},
  pages        = {393--396},
  publisher    = {{IEEE}},
  year         = {2011},
  url          = {https://doi.org/10.1109/ASSCC.2011.6123599},
  doi          = {10.1109/ASSCC.2011.6123599},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/asscc/KurimotoTFSKK11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/todaes/KurimotoSAYOTS10,
  author       = {Masanori Kurimoto and
                  Hiroaki Suzuki and
                  Rei Akiyama and
                  Tadao Yamanaka and
                  Haruyuki Ohkuma and
                  Hidehiro Takata and
                  Hirofumi Shinohara},
  title        = {Phase-adjustable error detection flip-flops with 2-stage hold-driven
                  optimization, slack-based grouping scheme and slack distribution control
                  for dynamic voltage scaling},
  journal      = {{ACM} Trans. Design Autom. Electr. Syst.},
  volume       = {15},
  number       = {2},
  pages        = {17:1--17:17},
  year         = {2010},
  url          = {https://doi.org/10.1145/1698759.1698767},
  doi          = {10.1145/1698759.1698767},
  timestamp    = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/todaes/KurimotoSAYOTS10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/isqed/KurimotoMOF10,
  author       = {Masanori Kurimoto and
                  Jun Matsushima and
                  Shigeki Ohbayashi and
                  Yoshiaki Fukui},
  title        = {A yield improvement methodology based on logic redundant repair with
                  a repairable scan flip-flop designed by push rule},
  booktitle    = {11th International Symposium on Quality of Electronic Design {(ISQED}
                  2010), 22-24 March 2010, San Jose, CA, {USA}},
  pages        = {184--190},
  publisher    = {{IEEE}},
  year         = {2010},
  url          = {https://doi.org/10.1109/ISQED.2010.5450455},
  doi          = {10.1109/ISQED.2010.5450455},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/isqed/KurimotoMOF10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/ieicet/FukazawaKATN09,
  author       = {Mitsuya Fukazawa and
                  Masanori Kurimoto and
                  Rei Akiyama and
                  Hidehiro Takata and
                  Makoto Nagata},
  title        = {Experimental Evaluation of Dynamic Power Supply Noise and Logical
                  Failures in Microprocessor Operations},
  journal      = {{IEICE} Trans. Electron.},
  volume       = {92-C},
  number       = {4},
  pages        = {475--482},
  year         = {2009},
  url          = {https://doi.org/10.1587/transele.E92.C.475},
  doi          = {10.1587/TRANSELE.E92.C.475},
  timestamp    = {Sat, 11 Apr 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/ieicet/FukazawaKATN09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dac/KurimotoSAYOTS08,
  author       = {Masanori Kurimoto and
                  Hiroaki Suzuki and
                  Rei Akiyama and
                  Tadao Yamanaka and
                  Haruyuki Ohkuma and
                  Hidehiro Takata and
                  Hirofumi Shinohara},
  editor       = {Limor Fix},
  title        = {Phase-adjustable error detection flip-flops with 2-stage hold driven
                  optimization and slack based grouping scheme for dynamic voltage scaling},
  booktitle    = {Proceedings of the 45th Design Automation Conference, {DAC} 2008,
                  Anaheim, CA, USA, June 8-13, 2008},
  pages        = {884--889},
  publisher    = {{ACM}},
  year         = {2008},
  url          = {https://doi.org/10.1145/1391469.1391692},
  doi          = {10.1145/1391469.1391692},
  timestamp    = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dac/KurimotoSAYOTS08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/islped/SuzukiKYTMS08,
  author       = {Hiroaki Suzuki and
                  Masanori Kurimoto and
                  Tadao Yamanaka and
                  Hidehiro Takata and
                  Hiroshi Makino and
                  Hirofumi Shinohara},
  editor       = {Vijaykrishnan Narayanan and
                  C. P. Ravikumar and
                  J{\"{o}}rg Henkel and
                  Ali Keshavarzi and
                  Vojin G. Oklobdzija and
                  Barry M. Pangrle},
  title        = {Post-silicon programmed body-biasing platform suppressing device variability
                  in 45 nm {CMOS} technology},
  booktitle    = {Proceedings of the 2008 International Symposium on Low Power Electronics
                  and Design, 2008, Bangalore, India, August 11-13, 2008},
  pages        = {15--20},
  publisher    = {{ACM}},
  year         = {2008},
  url          = {https://doi.org/10.1145/1393921.1393931},
  doi          = {10.1145/1393921.1393931},
  timestamp    = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/islped/SuzukiKYTMS08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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