BibTeX records: Mayuri Kunchwar

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@article{DBLP:journals/mr/KunchwarSG07,
  author       = {Mayuri Kunchwar and
                  Reza Sedaghat and
                  Vadim Geurkov},
  title        = {Dynamic behavior of resistive faults in nanometer technology},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {12},
  pages        = {2141--2146},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.01.081},
  doi          = {10.1016/J.MICROREL.2007.01.081},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/KunchwarSG07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/SedaghatKAJ06,
  author       = {Reza Sedaghat and
                  Mayuri Kunchwar and
                  Raha Abedi and
                  M. Reza Javaheri},
  title        = {Transistor-level to gate-level comprehensive fault synthesis for n-input
                  primitive gates},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {12},
  pages        = {2149--2158},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.12.005},
  doi          = {10.1016/J.MICROREL.2005.12.005},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SedaghatKAJ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}