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BibTeX records: Mayuri Kunchwar
@article{DBLP:journals/mr/KunchwarSG07, author = {Mayuri Kunchwar and Reza Sedaghat and Vadim Geurkov}, title = {Dynamic behavior of resistive faults in nanometer technology}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2141--2146}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.081}, doi = {10.1016/J.MICROREL.2007.01.081}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KunchwarSG07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SedaghatKAJ06, author = {Reza Sedaghat and Mayuri Kunchwar and Raha Abedi and M. Reza Javaheri}, title = {Transistor-level to gate-level comprehensive fault synthesis for n-input primitive gates}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {2149--2158}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.12.005}, doi = {10.1016/J.MICROREL.2005.12.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SedaghatKAJ06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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