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ORCIDBibTeX records: Shigetaka Kumashiro
@inproceedings{DBLP:conf/irps/KobayashiKNFIKYS23,
author = {Kazutoshi Kobayashi and
Tomoharu Kishita and
Hiroki Nakano and
Jun Furuta and
Mitsuhiko Igarashi and
Shigetaka Kumashiro and
Michitarou Yabuuchi and
Hironori Sakamoto},
title = {Ultra Long-term Measurement Results of BTI-induced Aging Degradation
on 7-nm Ring Oscillators},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
CA, USA, March 26-30, 2023},
pages = {1--7},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/IRPS48203.2023.10117873},
doi = {10.1109/IRPS48203.2023.10117873},
timestamp = {Wed, 24 May 2023 09:43:44 +0200},
biburl = {https://dblp.org/rec/conf/irps/KobayashiKNFIKYS23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/KumashiroKHK20,
author = {Shigetaka Kumashiro and
Tatsuya Kamei and
Akira Hiroki and
Kazutoshi Kobayashi},
title = {An Efficient and Accurate Time Step Control Method for Power Device
Transient Simulation Utilizing Dominant Time Constant Approximation},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {39},
number = {2},
pages = {451--463},
year = {2020},
url = {https://doi.org/10.1109/TCAD.2018.2889673},
doi = {10.1109/TCAD.2018.2889673},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/KumashiroKHK20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/TakayaBOTYSKMN13,
author = {Satoshi Takaya and
Yoji Bando and
Toru Ohkawa and
Toshiharu Takaramoto and
Toshio Yamada and
Masaaki Souda and
Shigetaka Kumashiro and
Tohru Mogami and
Makoto Nagata},
title = {Measurements and Simulation of Sensitivity of Differential-Pair Transistors
against Substrate Voltage Variation},
journal = {{IEICE} Trans. Electron.},
volume = {96-C},
number = {6},
pages = {884--893},
year = {2013},
url = {https://doi.org/10.1587/transele.E96.C.884},
doi = {10.1587/TRANSELE.E96.C.884},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/ieicet/TakayaBOTYSKMN13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/Kumashiro13,
author = {Shigetaka Kumashiro},
title = {A predictable compact model for non-monotonous Vth-Pelgrom plot of
long channel halo-implanted transistors},
booktitle = {International Symposium on Quality Electronic Design, {ISQED} 2013,
Santa Clara, CA, USA, March 4-6, 2013},
pages = {391--397},
publisher = {{IEEE}},
year = {2013},
url = {https://doi.org/10.1109/ISQED.2013.6523641},
doi = {10.1109/ISQED.2013.6523641},
timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
biburl = {https://dblp.org/rec/conf/isqed/Kumashiro13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/BandoTOTYSKMN12,
author = {Yoji Bando and
Satoshi Takaya and
Toru Ohkawa and
Toshiharu Takaramoto and
Toshio Yamada and
Masaaki Souda and
Shigetaka Kumashiro and
Tohru Mogami and
Makoto Nagata},
title = {On-Chip In-Place Measurements of V\({}_{\mbox{th}}\) and Signal/Substrate
Response of Differential Pair Transistors},
journal = {{IEICE} Trans. Electron.},
volume = {95-C},
number = {1},
pages = {137--145},
year = {2012},
url = {https://doi.org/10.1587/transele.E95.C.137},
doi = {10.1587/TRANSELE.E95.C.137},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/ieicet/BandoTOTYSKMN12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/SakamotoKSWM12,
author = {Hironori Sakamoto and
Shigetaka Kumashiro and
Shigeo Sato and
Naoki Wakita and
Tohru Mogami},
editor = {Keith A. Bowman and
Kamesh V. Gadepally and
Pallab Chatterjee and
Mark M. Budnik and
Lalitha Immaneni},
title = {HiSIM-RP: {A} reverse-profiling based 1\({}^{\mbox{st}}\) principles
compact {MOSFET} model and its application to variability analysis
of 90nm and 40nm {CMOS}},
booktitle = {Thirteenth International Symposium on Quality Electronic Design, {ISQED}
2012, Santa Clara, CA, USA, March 19-21, 2012},
pages = {553--560},
publisher = {{IEEE}},
year = {2012},
url = {https://doi.org/10.1109/ISQED.2012.6187548},
doi = {10.1109/ISQED.2012.6187548},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/isqed/SakamotoKSWM12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/BandoTOTYSKMN11,
author = {Yoji Bando and
Satoshi Takaya and
Toru Ohkawa and
Toshiharu Takaramoto and
Toshio Yamada and
Masaaki Souda and
Shigetaka Kumashiro and
Tohru Mogami and
Makoto Nagata},
title = {A Continuous-Time Waveform Monitoring Technique for On-Chip Power
Noise Measurements in {VLSI} Circuits},
journal = {{IEICE} Trans. Electron.},
volume = {94-C},
number = {4},
pages = {495--503},
year = {2011},
url = {https://doi.org/10.1587/transele.E94.C.495},
doi = {10.1587/TRANSELE.E94.C.495},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/ieicet/BandoTOTYSKMN11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/SoudaBTOTYKMN11,
author = {Masaaki Souda and
Yoji Bando and
Satoshi Takaya and
Toru Ohkawa and
Toshiharu Takaramoto and
Toshio Yamada and
Shigetaka Kumashiro and
Tohru Mogami and
Makoto Nagata},
title = {On-Chip Single Tone Pseudo-Noise Generator for Analog {IP} Noise Tolerance
Measurement},
journal = {{IEICE} Trans. Electron.},
volume = {94-C},
number = {6},
pages = {1024--1031},
year = {2011},
url = {https://doi.org/10.1587/transele.E94.C.1024},
doi = {10.1587/TRANSELE.E94.C.1024},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/ieicet/SoudaBTOTYKMN11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/isqed/TakayaBOTYSKMN11,
author = {Satoshi Takaya and
Yoji Bando and
Toru Ohkawa and
Toshiharu Takaramoto and
Toshio Yamada and
Masaaki Souda and
Shigetaka Kumashiro and
Tohru Mogami and
Makoto Nagata},
title = {Accurate analysis of substrate sensitivity of active transistors in
an analog circuit},
booktitle = {Proceedings of the 12th International Symposium on Quality Electronic
Design, {ISQED} 2011, Santa Clara, California, USA, 14-16 March 2011},
pages = {56--61},
publisher = {{IEEE}},
year = {2011},
url = {https://doi.org/10.1109/ISQED.2011.5770703},
doi = {10.1109/ISQED.2011.5770703},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/isqed/TakayaBOTYSKMN11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/YamadaSYIKKK10,
author = {Kenta Yamada and
Toshiyuki Syo and
Hisao Yoshimura and
Masaru Ito and
Tatsuya Kunikiyo and
Toshiki Kanamoto and
Shigetaka Kumashiro},
title = {Exhaustive and Systematic Accuracy Verification and Enhancement of
{STI} Stress Compact Model for General Realistic Layout Patterns},
journal = {{IEICE} Trans. Electron.},
volume = {93-C},
number = {8},
pages = {1349--1358},
year = {2010},
url = {https://doi.org/10.1587/transele.E93.C.1349},
doi = {10.1587/TRANSELE.E93.C.1349},
timestamp = {Sat, 11 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ieicet/YamadaSYIKKK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/YamadaSANMK08,
author = {Kenta Yamada and
Takashi Sato and
Shuhei Amakawa and
Noriaki Nakayama and
Kazuya Masu and
Shigetaka Kumashiro},
title = {Layout-Aware Compact Model of {MOSFET} Characteristics Variations
Induced by {STI} Stress},
journal = {{IEICE} Trans. Electron.},
volume = {91-C},
number = {7},
pages = {1142--1150},
year = {2008},
url = {https://doi.org/10.1093/ietele/e91-c.7.1142},
doi = {10.1093/IETELE/E91-C.7.1142},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ieicet/YamadaSANMK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mcs/EzakiNTSSMMOITKM08,
author = {Tatsuya Ezaki and
Dondee Navarro and
Youichi Takeda and
Norio Sadachika and
Gaku Suzuki and
Mitiko Miura{-}Mattausch and
Hans J{\"{u}}rgen Mattausch and
Tatsuya Ohguro and
Takahiro Iizuka and
Masahiko Taguchi and
Shigetaka Kumashiro and
Shunsuke Miyamoto},
title = {Non-quasi-static approach with surface-potential-based {MOSFET} model
HiSIM for {RF} circuit simulations},
journal = {Math. Comput. Simul.},
volume = {79},
number = {4},
pages = {1096--1106},
year = {2008},
url = {https://doi.org/10.1016/j.matcom.2007.10.008},
doi = {10.1016/J.MATCOM.2007.10.008},
timestamp = {Wed, 04 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mcs/EzakiNTSSMMOITKM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/MatsumotoUHKMMOKYYN05,
author = {Shizunori Matsumoto and
Hiroaki Ueno and
Satoshi Hosokawa and
Toshihiko Kitamura and
Mitiko Miura{-}Mattausch and
Hans J{\"{u}}rgen Mattausch and
Tatsuya Ohguro and
Shigetaka Kumashiro and
Tetsuya Yamaguchi and
Kyoji Yamashita and
Noriaki Nakayama},
title = {1/\emph{f}-Noise Characteristics in 100 nm-MOSFETs and Its Modeling
for Circuit Simulation},
journal = {{IEICE} Trans. Electron.},
volume = {88-C},
number = {2},
pages = {247--254},
year = {2005},
url = {https://doi.org/10.1093/ietele/E88-C.2.247},
doi = {10.1093/IETELE/E88-C.2.247},
timestamp = {Sat, 11 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ieicet/MatsumotoUHKMMOKYYN05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieicet/NavarroMSHUMMKYYN05,
author = {Dondee Navarro and
Takeshi Mizoguchi and
Masami Suetake and
Kazuya Hisamitsu and
Hiroaki Ueno and
Mitiko Miura{-}Mattausch and
Hans J{\"{u}}rgen Mattausch and
Shigetaka Kumashiro and
Tetsuya Yamaguchi and
Kyoji Yamashita and
Noriaki Nakayama},
title = {A Compact Model of the Pinch-off Region of 100 nm MOSFETs Based on
the Surface-Potential},
journal = {{IEICE} Trans. Electron.},
volume = {88-C},
number = {5},
pages = {1079--1086},
year = {2005},
url = {https://doi.org/10.1093/ietele/e88-c.5.1079},
doi = {10.1093/IETELE/E88-C.5.1079},
timestamp = {Sat, 11 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ieicet/NavarroMSHUMMKYYN05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/cicc/TakedaNCMMOITKM05,
author = {Youichi Takeda and
Dondee Navarro and
Shingo Chiba and
Mitiko Miura{-}Mattausch and
Hans J{\"{u}}rgen Mattausch and
Tatsuya Ohguro and
Takahiro Iizuka and
Masahiko Taguchi and
Shigetaka Kumashiro and
Shunsuke Miyamoto},
title = {{MOSFET} harmonic distortion analysis up to the non-quasi-static frequency
regime},
booktitle = {Proceedings of the {IEEE} 2005 Custom Integrated Circuits Conference,
{CICC} 2005, DoubleTree Hotel, San Jose, California, USA, September
18-21, 2005},
pages = {827--830},
publisher = {{IEEE}},
year = {2005},
url = {https://doi.org/10.1109/CICC.2005.1568797},
doi = {10.1109/CICC.2005.1568797},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/cicc/TakedaNCMMOITKM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/HisamitsuUTKMMKYYN03,
author = {Kazuya Hisamitsu and
Hiroaki Ueno and
Masayasu Tanaka and
Daisuke Kitamaru and
Mitiko Miura{-}Mattausch and
Hans J{\"{u}}rgen Mattausch and
Shigetaka Kumashiro and
Tetsuya Yamaguchi and
Kyoji Yamashita and
Noriaki Nakayama},
editor = {Hiroto Yasuura},
title = {Temperature-independence-point properties for 0.1{\(\mu\)}m-scale
pocket-implant technologies and the impact on circuit design},
booktitle = {Proceedings of the 2003 Asia and South Pacific Design Automation Conference,
{ASP-DAC} '03, Kitakyushu, Japan, January 21-24, 2003},
pages = {179--183},
publisher = {{ACM}},
year = {2003},
url = {https://doi.org/10.1145/1119772.1119807},
doi = {10.1145/1119772.1119807},
timestamp = {Thu, 11 Mar 2021 17:04:51 +0100},
biburl = {https://dblp.org/rec/conf/aspdac/HisamitsuUTKMMKYYN03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/ieiceta/Miura-Mattausch02,
author = {Mitiko Miura{-}Mattausch and
Hiroaki Ueno and
Hans J{\"{u}}rgen Mattausch and
Shigetaka Kumashiro and
Tetsuya Yamaguchi and
Kyoji Yamashita and
Noriaki Nakayama},
title = {Circuit Simulation Models for Coming {MOSFET} Generations},
journal = {{IEICE} Trans. Fundam. Electron. Commun. Comput. Sci.},
volume = {85-A},
number = {4},
pages = {740--748},
year = {2002},
url = {http://search.ieice.org/bin/summary.php?id=e85-a\_4\_740},
timestamp = {Wed, 09 Jun 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/ieiceta/Miura-Mattausch02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/MiyawakiMMOSMKYYN01,
author = {D. Miyawaki and
Shizunori Matsumoto and
Hans J{\"{u}}rgen Mattausch and
S. Ooshiro and
Masami Suetake and
Mitiko Miura{-}Mattausch and
Shigetaka Kumashiro and
Tetsuya Yamaguchi and
Kyoji Yamashita and
Noriaki Nakayama},
editor = {Satoshi Goto},
title = {Correlation method of circuit-performance and technology fluctuations
for improved design reliability},
booktitle = {Proceedings of {ASP-DAC} 2001, Asia and South Pacific Design Automation
Conference 2001, January 30-February 2, 2001, Yokohama, Japan},
pages = {39--44},
publisher = {{ACM}},
year = {2001},
url = {https://doi.org/10.1145/370155.370260},
doi = {10.1145/370155.370260},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/aspdac/MiyawakiMMOSMKYYN01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/cicc/MatsumotoMOTMKY01,
author = {Shizunori Matsumoto and
Hans J{\"{u}}rgen Mattausch and
S. Ooshiro and
Y. Tatsumi and
Mitiko Miura{-}Mattausch and
Shigetaka Kumashiro and
Terufumi Yamaguchi and
Kyoji Yamashita and
Noriaki Nakayama},
title = {Test-circuit-based extraction of inter- and intra-chip MOSFET-performance
variations for analog-design reliability},
booktitle = {Proceedings of the {IEEE} 2001 Custom Integrated Circuits Conference,
{CICC} 2001, San Diego, CA, USA, May 6-9, 2001},
pages = {357--360},
publisher = {{IEEE}},
year = {2001},
url = {https://doi.org/10.1109/CICC.2001.929801},
doi = {10.1109/CICC.2001.929801},
timestamp = {Mon, 10 Oct 2022 09:13:22 +0200},
biburl = {https://dblp.org/rec/conf/cicc/MatsumotoMOTMKY01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/KumashiroRS93,
author = {Shigetaka Kumashiro and
Ronald A. Rohrer and
Andrzej J. Strojwas},
title = {Asymptotic waveform evaluation for transient analysis of 3-D interconnect
structures},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {12},
number = {7},
pages = {988--996},
year = {1993},
url = {https://doi.org/10.1109/43.238035},
doi = {10.1109/43.238035},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/KumashiroRS93.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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