Stop the war!Остановите войну!
for scientists:
default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDBibTeX records: Martin Keim
@inproceedings{DBLP:conf/date/MamaghaniMYKT23,
author = {Sina Bakhtavari Mamaghani and
Christopher M{\"{u}}nch and
Jongsin Yun and
Martin Keim and
Mehdi Baradaran Tahoori},
title = {Smart Hammering: {A} practical method of pinhole detection in {MRAM}
memories},
booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
{DATE} 2023, Antwerp, Belgium, April 17-19, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.23919/DATE56975.2023.10137267},
doi = {10.23919/DATE56975.2023.10137267},
timestamp = {Wed, 07 Jun 2023 22:08:03 +0200},
biburl = {https://dblp.org/rec/conf/date/MamaghaniMYKT23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DrayGNZRYKSK23,
author = {Cyrille Dray and
Khushal Gelda and
Benoit Nadeau{-}Dostie and
Wei Zou and
Luc Romain and
Jongsin Yun and
Harshitha Kodali and
Lori Schramm and
Martin Keim},
title = {Transitioning eMRAM from Pilot Project to Volume Production},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {82--86},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00021},
doi = {10.1109/ITC51656.2023.00021},
timestamp = {Tue, 09 Jan 2024 17:03:11 +0100},
biburl = {https://dblp.org/rec/conf/itc/DrayGNZRYKSK23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/PortolanKRE23,
author = {Michele Portolan and
Martin Keim and
Jeff Rearick and
Heiko Ehrenberg},
title = {Refreshing the {JTAG} Family},
booktitle = {41st {IEEE} {VLSI} Test Symposium, {VTS} 2023, San Diego, CA, USA,
April 24-26, 2023},
pages = {1--7},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/VTS56346.2023.10140015},
doi = {10.1109/VTS56346.2023.10140015},
timestamp = {Fri, 09 Jun 2023 15:18:15 +0200},
biburl = {https://dblp.org/rec/conf/vts/PortolanKRE23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/CoteFSDLGYKGRPM22,
author = {Jean{-}Fran{\c{c}}ois C{\^{o}}t{\'{e}} and
Jeff Fan and
Sean Shen and
Givargis Danialy and
Marcin Lipinski and
Michael Garbers and
Wu Yang and
Martin Keim and
Andreas Glowatz and
Joe Reynick and
Ayush Patel and
Joanna Michna},
title = {Affordable and Comprehensive Testing of 3-D Stacked Die Devices},
journal = {{IEEE} Des. Test},
volume = {39},
number = {5},
pages = {17--25},
year = {2022},
url = {https://doi.org/10.1109/MDAT.2022.3191016},
doi = {10.1109/MDAT.2022.3191016},
timestamp = {Tue, 18 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/CoteFSDLGYKGRPM22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LaisneCPKSTRZ22,
author = {Michael Laisne and
Alfred L. Crouch and
Michele Portolan and
Martin Keim and
Hans Martin von Staudt and
Bradford G. Van Treuren and
Jeff Rearick and
Songlin Zuo},
title = {{IEEE} {P1687.1:} Extending the Network Boundaries for Test},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {382--390},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00084},
doi = {10.1109/ITC50671.2022.00084},
timestamp = {Thu, 05 Jan 2023 13:13:27 +0100},
biburl = {https://dblp.org/rec/conf/itc/LaisneCPKSTRZ22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MunchYKT22,
author = {Christopher M{\"{u}}nch and
Jongsin Yun and
Martin Keim and
Mehdi B. Tahoori},
title = {MBIST-based Trim-Search Test Time Reduction for {STT-MRAM}},
booktitle = {40th {IEEE} {VLSI} Test Symposium, {VTS} 2022, San Diego, CA, USA,
April 25-27, 2022},
pages = {1--7},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/VTS52500.2021.9794178},
doi = {10.1109/VTS52500.2021.9794178},
timestamp = {Wed, 22 Jun 2022 15:24:48 +0200},
biburl = {https://dblp.org/rec/conf/vts/MunchYKT22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/GrzelakKPRT21,
author = {Bartosz Grzelak and
Martin Keim and
Artur Pogiel and
Janusz Rajski and
Jerzy Tyszer},
title = {Convolutional Compaction-Based {MRAM} Fault Diagnosis},
booktitle = {26th {IEEE} European Test Symposium, {ETS} 2021, Bruges, Belgium,
May 24-28, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ETS50041.2021.9465464},
doi = {10.1109/ETS50041.2021.9465464},
timestamp = {Fri, 02 Jul 2021 14:14:26 +0200},
biburl = {https://dblp.org/rec/conf/ets/GrzelakKPRT21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/MunchYKT21,
author = {Christopher M{\"{u}}nch and
Jongsin Yun and
Martin Keim and
Mehdi B. Tahoori},
title = {MBIST-supported Trim Adjustment to Compensate Thermal Behavior of
{MRAM}},
booktitle = {26th {IEEE} European Test Symposium, {ETS} 2021, Bruges, Belgium,
May 24-28, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ETS50041.2021.9465383},
doi = {10.1109/ETS50041.2021.9465383},
timestamp = {Fri, 02 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/MunchYKT21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/StaudtTRPK21,
author = {Hans Martin von Staudt and
Bradford G. Van Treuren and
Jeff Rearick and
Michele Portolan and
Martin Keim},
title = {Exploring and Comparing {IEEE} {P1687.1} and {IEEE} 1687 Modeling
of Non-TAP Interfaces},
booktitle = {26th {IEEE} European Test Symposium, {ETS} 2021, Bruges, Belgium,
May 24-28, 2021},
pages = {1--10},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ETS50041.2021.9465438},
doi = {10.1109/ETS50041.2021.9465438},
timestamp = {Fri, 02 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/StaudtTRPK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/PortolanRK20,
author = {Michele Portolan and
Jeff Rearick and
Martin Keim},
title = {Linking Chip, Board, and System Test via Standards},
booktitle = {{IEEE} European Test Symposium, {ETS} 2020, Tallinn, Estonia, May
25-29, 2020},
pages = {1--8},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ETS48528.2020.9131595},
doi = {10.1109/ETS48528.2020.9131595},
timestamp = {Wed, 15 Jul 2020 13:23:41 +0200},
biburl = {https://dblp.org/rec/conf/ets/PortolanRK20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/YunNKDB20,
author = {Jongsin Yun and
Benoit Nadeau{-}Dostie and
Martin Keim and
Cyrille Dray and
El Mehdi Boujamaa},
title = {{MBIST} Support for Reliable eMRAM Sensing},
booktitle = {{IEEE} European Test Symposium, {ETS} 2020, Tallinn, Estonia, May
25-29, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ETS48528.2020.9131564},
doi = {10.1109/ETS48528.2020.9131564},
timestamp = {Wed, 15 Jul 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/YunNKDB20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BabyBEPMGCDKS20,
author = {Manu Baby and
Bernd B{\"{u}}ttner and
Piet Engelke and
Ulrike Pfannkuchen and
Reinhard Meier and
Jonathan Gaudet and
Jean{-}Fran{\c{c}}ois C{\^{o}}t{\'{e}} and
Givargis Danialy and
Martin Keim and
Lori Schramm},
title = {{IJTAG} Through a Two-Pin Chip Interface},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325232},
doi = {10.1109/ITC44778.2020.9325232},
timestamp = {Tue, 13 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/BabyBEPMGCDKS20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LaisneCPKSATR20,
author = {Mike Laisne and
Alfred L. Crouch and
Michele Portolan and
Martin Keim and
Hans Martin von Staudt and
M. Abdalwahab and
Bradford G. Van Treuren and
Jeff Rearick},
title = {Modeling Novel Non-JTAG {IEEE} 1687-Like Architectures},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325248},
doi = {10.1109/ITC44778.2020.9325248},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LaisneCPKSATR20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaLQHWMSKHY20,
author = {Haiying Ma and
Ligang Lu and
Haitao Qian and
Jing Han and
Xin Wen and
Fanjin Meng and
Rahul Singhal and
Martin Keim and
Yu Huang and
Wu Yang},
title = {Fast Bring-Up of an {AI} SoC through {IEEE} 1687 Integrating Embedded
TAPs and {IEEE} 1500 Interfaces},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325251},
doi = {10.1109/ITC44778.2020.9325251},
timestamp = {Tue, 29 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/MaLQHWMSKHY20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YunNKSDBG20,
author = {Jongsin Yun and
Benoit Nadeau{-}Dostie and
Martin Keim and
Lori Schramm and
Cyrille Dray and
El Mehdi Boujamaa and
Khushal Gelda},
title = {{MBIST} Supported Multi Step Trim for Reliable eMRAM Sensing},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325218},
doi = {10.1109/ITC44778.2020.9325218},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YunNKSDBG20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/YellapragadaRSR18,
author = {Venkat Yellapragada and
Suresh Raman and
Banadappa Shivaray and
Luc Romain and
Benoit Nadeau{-}Dostie and
Martin Keim and
Jean{-}Francois Cote and
Albert Au and
Giri Podichetty and
Ashok Anbalan},
title = {Implementing Design-for-Test Within a Tile-Based Design Methodology
- Challenges and Solutions},
booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2018, Harbin,
China, August 15-17, 2018},
pages = {43--48},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/ITC-Asia.2018.00018},
doi = {10.1109/ITC-ASIA.2018.00018},
timestamp = {Mon, 09 Aug 2021 14:54:04 +0200},
biburl = {https://dblp.org/rec/conf/itc-asia/YellapragadaRSR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/CasarsaHCSPKCT18,
author = {M. Casarsa and
Gurgen Harutyunyan and
Kaitlyn Chen and
Ramesh Sharma and
Giri Podichetty and
Martin Keim and
Sreejit Chakravarty and
Ramesh C. Tekumalla},
title = {Innovative practices on memory test practice},
booktitle = {36th {IEEE} {VLSI} Test Symposium, {VTS} 2018, San Francisco, CA,
USA, April 22-25, 2018},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2018},
url = {https://doi.org/10.1109/VTS.2018.8368624},
doi = {10.1109/VTS.2018.8368624},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/CasarsaHCSPKCT18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/computer/CrouchLK17,
author = {Al Crouch and
Michael Laisne and
Martin Keim},
title = {Generalizing Access to Instrumentation Embedded in a Semiconductor
Device},
journal = {Computer},
volume = {50},
number = {7},
pages = {92--95},
year = {2017},
url = {https://doi.org/10.1109/MC.2017.186},
doi = {10.1109/MC.2017.186},
timestamp = {Wed, 12 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/computer/CrouchLK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc-asia/AbrahamGCSDNRK17,
author = {Jais Abraham and
Uttam Garg and
Glenn Col{\'{o}}n{-}Bonet and
Ramesh Sharma and
Chennian Di and
Benoit Nadeau{-}Dostie and
Etienne Racine and
Martin Keim},
title = {Adapting an industrial memory {BIST} solution for testing CAMs},
booktitle = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
September 13-15, 2017},
pages = {112--117},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ITC-ASIA.2017.8097123},
doi = {10.1109/ITC-ASIA.2017.8097123},
timestamp = {Mon, 09 Aug 2021 14:54:04 +0200},
biburl = {https://dblp.org/rec/conf/itc-asia/AbrahamGCSDNRK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PayakapanKPYCKD15,
author = {Tassanee Payakapan and
Senwen Kan and
Ken Pham and
Kathy Yang and
Jean{-}Francois Cote and
Martin Keim and
Jennifer Dworak},
title = {A case study: Leverage {IEEE} 1687 based method to automate modeling,
verification, and test access for embedded instruments in a server
processor},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--10},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342407},
doi = {10.1109/TEST.2015.7342407},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PayakapanKPYCKD15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/HapkeRGRRHKSF14,
author = {Friedrich Hapke and
Wilfried Redemund and
Andreas Glowatz and
Janusz Rajski and
Michael Reese and
Marek Hustava and
Martin Keim and
Juergen Schloeffel and
Anja Fast},
title = {Cell-Aware Test},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {33},
number = {9},
pages = {1396--1409},
year = {2014},
url = {https://doi.org/10.1109/TCAD.2014.2323216},
doi = {10.1109/TCAD.2014.2323216},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/HapkeRGRRHKSF14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/birthday/Keim14,
author = {Martin Keim},
editor = {Rolf Drechsler},
title = {Quo Vadis DFT?},
booktitle = {Aspekte der Technischen Informatik - Festschrift zum 60. Geburtstag
von Bernd Becker},
pages = {51--58},
publisher = {MV-Wissenschaft},
year = {2014},
timestamp = {Thu, 04 Jun 2020 17:02:05 +0200},
biburl = {https://dblp.org/rec/conf/birthday/Keim14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Keim13,
author = {Martin Keim},
title = {Thinking About Adopting {IEEE} P1687?},
journal = {{IEEE} Des. Test},
volume = {30},
number = {5},
pages = {36--43},
year = {2013},
url = {https://doi.org/10.1109/MDAT.2013.2278542},
doi = {10.1109/MDAT.2013.2278542},
timestamp = {Fri, 13 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/dt/Keim13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dsd/KeimWMHK13,
author = {Martin Keim and
Tom Waayers and
Richard Morren and
Friedrich Hapke and
Rene Krenz{-}Baath},
title = {Industrial Application of {IEEE} {P1687} for an Automotive Product},
booktitle = {2013 Euromicro Conference on Digital System Design, {DSD} 2013, Los
Alamitos, CA, USA, September 4-6, 2013},
pages = {453--461},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DSD.2013.57},
doi = {10.1109/DSD.2013.57},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dsd/KeimWMHK13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/GuREKQJCL12,
author = {Xinli Gu and
Jeff Rearick and
Bill Eklow and
Martin Keim and
Jun Qian and
Artur Jutman and
Krishnendu Chakrabarty and
Erik Larsson},
title = {Re-using chip level {DFT} at board level},
booktitle = {17th {IEEE} European Test Symposium, {ETS} 2012, Annecy, France, May
28 - June 1 2012},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ETS.2012.6233049},
doi = {10.1109/ETS.2012.6233049},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/GuREKQJCL12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HillebrechtPEBKC08,
author = {Stefan Hillebrecht and
Ilia Polian and
Piet Engelke and
Bernd Becker and
Martin Keim and
Wu{-}Tung Cheng},
editor = {Douglas Young and
Nur A. Touba},
title = {Extraction, Simulation and Test Generation for Interconnect Open Defects
Based on Enhanced Aggressor-Victim Model},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700642},
doi = {10.1109/TEST.2008.4700642},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HillebrechtPEBKC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SharmaBLALKTCTCLM08,
author = {Manish Sharma and
Brady Benware and
Lei Ling and
David Abercrombie and
Lincoln Lee and
Martin Keim and
Huaxing Tang and
Wu{-}Tung Cheng and
Ting{-}Pu Tai and
Yi{-}Jung Chang and
Reinhart Lin and
Albert Mann},
editor = {Douglas Young and
Nur A. Touba},
title = {Efficiently Performing Yield Enhancements by Identifying Dominant
Physical Root Cause from Test Fail Data},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700589},
doi = {10.1109/TEST.2008.4700589},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SharmaBLALKTCTCLM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SpinnerPEBKC08,
author = {Stefan Spinner and
Ilia Polian and
Piet Engelke and
Bernd Becker and
Martin Keim and
Wu{-}Tung Cheng},
title = {Automatic Test Pattern Generation for Interconnect Open Defects},
booktitle = {26th {IEEE} {VLSI} Test Symposium {(VTS} 2008), April 27 - May 1,
2008, San Diego, California, {USA}},
pages = {181--186},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/VTS.2008.30},
doi = {10.1109/VTS.2008.30},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SpinnerPEBKC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YangCHKK07,
author = {Wu Yang and
Wu{-}Tung Cheng and
Yu Huang and
Martin Keim and
Randy Klingenberg},
title = {Scan Diagnosis and Its Successful Industrial Applications},
booktitle = {16th Asian Test Symposium, {ATS} 2007, Beijing, China, October 8-11,
2007},
pages = {215},
publisher = {{IEEE}},
year = {2007},
url = {https://doi.org/10.1109/ATS.2007.99},
doi = {10.1109/ATS.2007.99},
timestamp = {Wed, 09 Nov 2022 21:30:34 +0100},
biburl = {https://dblp.org/rec/conf/ats/YangCHKK07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/TangMRKB07,
author = {Huaxing Tang and
Manish Sharma and
Janusz Rajski and
Martin Keim and
Brady Benware},
title = {Analyzing Volume Diagnosis Results with Statistical Learning for Yield
Improvement},
booktitle = {12th European Test Symposium, {ETS} 2007, Freiburg, Germany, May 20,
2007},
pages = {145--150},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/ETS.2007.11},
doi = {10.1109/ETS.2007.11},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/TangMRKB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SchuermyerPJKRB07,
author = {Chris Schuermyer and
Jewel Pangilinan and
Jay Jahangiri and
Martin Keim and
Janusz Rajski and
Brady Benware},
title = {Silicon Evaluation of Static Alternative Fault Models},
booktitle = {25th {IEEE} {VLSI} Test Symposium {(VTS} 2007), 6-10 May 2007, Berkeley,
California, {USA}},
pages = {265--270},
publisher = {{IEEE} Computer Society},
year = {2007},
url = {https://doi.org/10.1109/VTS.2007.74},
doi = {10.1109/VTS.2007.74},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SchuermyerPJKRB07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KeimTTSRSB06,
author = {Martin Keim and
Nagesh Tamarapalli and
Huaxing Tang and
Manish Sharma and
Janusz Rajski and
Chris Schuermyer and
Brady Benware},
editor = {Scott Davidson and
Anne Gattiker},
title = {A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware
Diagnosis},
booktitle = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
CA, USA, October 22-27, 2006},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/TEST.2006.297715},
doi = {10.1109/TEST.2006.297715},
timestamp = {Tue, 12 Dec 2023 09:46:27 +0100},
biburl = {https://dblp.org/rec/conf/itc/KeimTTSRSB06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BenwareLSKMKKR04,
author = {Brady Benware and
Cam Lu and
John Van Slyke and
Prabhu Krishnamurthy and
Robert Madge and
Martin Keim and
Mark Kassab and
Janusz Rajski},
title = {Affordable and Effective Screening of Delay Defects in ASICs using
the Inline Resistance Fault Model},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1285--1294},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387403},
doi = {10.1109/TEST.2004.1387403},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BenwareLSKMKKR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@phdthesis{DBLP:phd/de/Keim2004,
author = {Martin Keim},
title = {Symbolic methods for testing digital circuits},
school = {University of Freiburg, Freiburg im Breisgau, Germany},
year = {2003},
url = {http://freidok.ub.uni-freiburg.de/volltexte/1248/index.html},
urn = {urn:nbn:de:bsz:25-opus-12489},
timestamp = {Sat, 17 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/phd/de/Keim2004.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/fmsd/KeimDBMM03,
author = {Martin Keim and
Rolf Drechsler and
Bernd Becker and
Michael Martin and
Paul Molitor},
title = {Polynomial Formal Verification of Multipliers},
journal = {Formal Methods Syst. Des.},
volume = {22},
number = {1},
pages = {39--58},
year = {2003},
url = {https://doi.org/10.1023/A:1021752130394},
doi = {10.1023/A:1021752130394},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/fmsd/KeimDBMM03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iolts/PolianKMB02,
author = {Ilia Polian and
Martin Keim and
Nicolai Mallig and
Bernd Becker},
title = {Sequential n -Detection Criteria: Keep It Simple},
booktitle = {8th {IEEE} International On-Line Testing Workshop {(IOLTW} 2002),
8-10 July 2002, Isle of Bendor, France},
pages = {189},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/OLT.2002.1030213},
doi = {10.1109/OLT.2002.1030213},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iolts/PolianKMB02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/KeimDDB01,
author = {Martin Keim and
Nicole Drechsler and
Rolf Drechsler and
Bernd Becker},
title = {Combining GAs and Symbolic Methods for High Quality Tests of Sequential
Circuits},
journal = {J. Electron. Test.},
volume = {17},
number = {1},
pages = {37--51},
year = {2001},
url = {https://doi.org/10.1023/A:1011193725824},
doi = {10.1023/A:1011193725824},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/KeimDDB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/EngelkeBK00,
author = {Piet Engelke and
Bernd Becker and
Martin Keim},
title = {A parameterizable fault simulator for bridging faults},
booktitle = {5th European Test Workshop, {ETW} 2000, Cascais, Portugal, May 23-26,
2000},
pages = {63--68},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/ETW.2000.873780},
doi = {10.1109/ETW.2000.873780},
timestamp = {Tue, 28 Apr 2020 13:03:46 +0200},
biburl = {https://dblp.org/rec/conf/ets/EngelkeBK00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BeckerKK99,
author = {Bernd Becker and
Martin Keim and
Rolf Krieger},
title = {Hybrid Fault Simulation for Synchronous Sequential Circuits},
journal = {J. Electron. Test.},
volume = {15},
number = {3},
pages = {219--238},
year = {1999},
url = {https://doi.org/10.1023/A:1008376522451},
doi = {10.1023/A:1008376522451},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/BeckerKK99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/KeimDB99,
author = {Martin Keim and
Nicole Drechsler and
Bernd Becker},
title = {Combining GAs and Symbolic Methods for High Quality Tests of Sequential
Circuits},
booktitle = {Proceedings of the 1999 Conference on Asia South Pacific Design Automation,
Wanchai, Hong Kong, China, January 18-21, 1999},
pages = {315--318},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/ASPDAC.1999.760022},
doi = {10.1109/ASPDAC.1999.760022},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/aspdac/KeimDB99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/KeimPHB99,
author = {Martin Keim and
Ilia Polian and
Harry Hengster and
Bernd Becker},
title = {A scalable {BIST} architecture for delay faults},
booktitle = {4th European Test Workshop, {ETW} 1999, Constance, Germany, May 25-28,
1999},
pages = {98--103},
publisher = {{IEEE} Computer Society},
year = {1999},
url = {https://doi.org/10.1109/ETW.1999.804299},
doi = {10.1109/ETW.1999.804299},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/KeimPHB99.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ismvl/KeimDDB98,
author = {Martin Keim and
Nicole Drechsler and
Rolf Drechsler and
Bernd Becker},
title = {Test Generation for (Sequential) Multi-Valued Logic Networks based
on Genetic Algorithm},
booktitle = {28th {IEEE} International Symposium on Multiple-Valued Logic, {ISMVL}
1998, Fukuoka, Japan, May 27-29, 1998, Proceedings},
pages = {215--221},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/ISMVL.1998.679435},
doi = {10.1109/ISMVL.1998.679435},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ismvl/KeimDDB98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ismvl/DrechslerKB97,
author = {Rolf Drechsler and
Martin Keim and
Bernd Becker},
title = {Sympathy-MV: Fast Exact Minimization of Fixed Polarity Multi-Valued
Linear Expressions},
booktitle = {27th {IEEE} International Symposium on Multiple-Valued Logic, {ISMVL}
1997, Antigonish, Nova Scotia, Canada, May 28-30, 1997, Proceedings},
pages = {66--74},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ISMVL.1997.601376},
doi = {10.1109/ISMVL.1997.601376},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ismvl/DrechslerKB97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ismvl/DrechslerKB97a,
author = {Rolf Drechsler and
Martin Keim and
Bernd Becker},
title = {Fault Simulation in Sequential Multi-Valued Logic Networks},
booktitle = {27th {IEEE} International Symposium on Multiple-Valued Logic, {ISMVL}
1997, Antigonish, Nova Scotia, Canada, May 28-30, 1997, Proceedings},
pages = {145--152},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ISMVL.1997.601389},
doi = {10.1109/ISMVL.1997.601389},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ismvl/DrechslerKB97a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KeimMBDM97,
author = {Martin Keim and
Michael Martin and
Bernd Becker and
Rolf Drechsler and
Paul Molitor},
title = {Polynomial Formal Verification of Multipliers},
booktitle = {15th {IEEE} {VLSI} Test Symposium (VTS'97), April 27-May 1, 1997,
Monterey, California, {USA}},
pages = {150--157},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/VTEST.1997.599468},
doi = {10.1109/VTEST.1997.599468},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/KeimMBDM97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/OekmenKKB97,
author = {Can {\"{O}}kmen and
Martin Keim and
Rolf Krieger and
Bernd Becker},
title = {On Optimizing BIST-Architecture by Using OBDD-based Approaches and
Genetic Algorithms},
booktitle = {15th {IEEE} {VLSI} Test Symposium (VTS'97), April 27-May 1, 1997,
Monterey, California, {USA}},
pages = {426--433},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/VTEST.1997.600327},
doi = {10.1109/VTEST.1997.600327},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/OekmenKKB97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KeimBS96,
author = {Martin Keim and
Bernd Becker and
Birgitta Stenner},
title = {On the (non-)resetability of synchronous sequential circuits},
booktitle = {14th {IEEE} {VLSI} Test Symposium (VTS'96), April 28 - May 1, 1996,
Princeton, NJ, {USA}},
pages = {240--245},
publisher = {{IEEE} Computer Society},
year = {1996},
url = {https://doi.org/10.1109/VTEST.1996.510863},
doi = {10.1109/VTEST.1996.510863},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/KeimBS96.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dac/KriegerBK95,
author = {Rolf Krieger and
Bernd Becker and
Martin Keim},
editor = {Bryan Preas},
title = {Symbolic Fault Simulation for Sequential Circuits and the Multiple
Observation Time Test Strategy},
booktitle = {Proceedings of the 32st Conference on Design Automation, San Francisco,
California, USA, Moscone Center, June 12-16, 1995},
pages = {339--344},
publisher = {{ACM} Press},
year = {1995},
url = {https://doi.org/10.1145/217474.217552},
doi = {10.1145/217474.217552},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dac/KriegerBK95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KriegerBK94,
author = {Rolf Krieger and
Bernd Becker and
Martin Keim},
title = {A Hybrid Fault Simulator for Synchronous Sequential Circuits},
booktitle = {Proceedings {IEEE} International Test Conference 1994, {TEST:} The
Next 25 Years, Washington, DC, USA, October 2-6, 1994},
pages = {614--623},
publisher = {{IEEE} Computer Society},
year = {1994},
url = {https://doi.org/10.1109/TEST.1994.528006},
doi = {10.1109/TEST.1994.528006},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KriegerBK94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
a service of 
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
last updated on 2024-04-25 01:42 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
