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BibTeX records: Kenji Kanamitsu
@article{DBLP:journals/ieicet/MatsumotoHTUMKKK11, author = {Chizu Matsumoto and Yuichi Hamamura and Yoshiyuki Tsunoda and Hiroshi Uozaki and Isao Miyazaki and Shiro Kamohara and Yoshiyuki Kaneko and Kenji Kanamitsu}, title = {A New Critical Area Simulation Algorithm and Its Application for Failing Bit Analysis}, journal = {{IEICE} Trans. Electron.}, volume = {94-C}, number = {3}, pages = {353--360}, year = {2011}, url = {https://doi.org/10.1587/transele.E94.C.353}, doi = {10.1587/TRANSELE.E94.C.353}, timestamp = {Sat, 11 Apr 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/ieicet/MatsumotoHTUMKKK11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/ieicet/HamamuraMTKIKFKFNK09, author = {Yuichi Hamamura and Chizu Matsumoto and Yoshiyuki Tsunoda and Koji Kamoda and Yoshio Iwata and Kenji Kanamitsu and Daisuke Fujiki and Fujihiko Kojika and Hiromi Fujita and Yasuo Nakagawa and Shun'ichi Kaneko}, title = {Development of an Enterprise-Wide Yield Management System Using Critical Area Analysis for High-Product-Mix Semiconductor Manufacturing}, journal = {{IEICE} Trans. Electron.}, volume = {92-C}, number = {1}, pages = {144--152}, year = {2009}, url = {https://doi.org/10.1587/transele.E92.C.144}, doi = {10.1587/TRANSELE.E92.C.144}, timestamp = {Sat, 11 Apr 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/ieicet/HamamuraMTKIKFKFNK09.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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