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BibTeX records: Jae Woong Jeong
@article{DBLP:journals/dt/JeongKO19, author = {Jae Woong Jeong and Jennifer Kitchen and Sule Ozev}, title = {On-Chip {RF} Phased Array Characterization with DC-Only Measurements for In-Field Calibration}, journal = {{IEEE} Des. Test}, volume = {36}, number = {3}, pages = {117--125}, year = {2019}, url = {https://doi.org/10.1109/MDAT.2019.2899054}, doi = {10.1109/MDAT.2019.2899054}, timestamp = {Fri, 13 Mar 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/dt/JeongKO19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/todaes/JeongNSMKO17, author = {Jae Woong Jeong and Vishwanath Natarajan and Shreyas Sen and T. M. Mak and Jennifer Kitchen and Sule Ozev}, title = {A Comprehensive {BIST} Solution for Polar Transceivers Using On-Chip Resources}, journal = {{ACM} Trans. Design Autom. Electr. Syst.}, volume = {23}, number = {1}, pages = {2:1--2:21}, year = {2017}, url = {https://doi.org/10.1145/3084689}, doi = {10.1145/3084689}, timestamp = {Tue, 06 Nov 2018 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/todaes/JeongNSMKO17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/JeongYWO17, author = {Jae Woong Jeong and Ender Yilmaz and LeRoy Winemberg and Sule Ozev}, title = {Built-in self-test for stability measurement of low dropout regulator}, booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017}, pages = {1--9}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.1109/TEST.2017.8242033}, doi = {10.1109/TEST.2017.8242033}, timestamp = {Wed, 16 Oct 2019 14:14:52 +0200}, biburl = {https://dblp.org/rec/conf/itc/JeongYWO17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc-asia/InceYJWO17, author = {Mehmet Ince and Ender Yilmaz and Jae Woong Jeong and LeRoy Winemberg and Sule Ozev}, title = {Evaluation of loop transfer function based dynamic testing of LDOs}, booktitle = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017}, pages = {14--19}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.1109/ITC-ASIA.2017.8097102}, doi = {10.1109/ITC-ASIA.2017.8097102}, timestamp = {Mon, 09 Aug 2021 14:54:04 +0200}, biburl = {https://dblp.org/rec/conf/itc-asia/InceYJWO17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/mue/JeongJ17, author = {Jae{-}Yun Jeong and Jae Woong Jeong}, editor = {James Jong Hyuk Park and Shu{-}Ching Chen and Kim{-}Kwang Raymond Choo}, title = {Advanced Data Communication Framework for Cloud Computing from {CDMI}}, booktitle = {Advanced Multimedia and Ubiquitous Engineering - MUE/FutureTech 2017, Seoul, Korea, 22-24 May 2017}, series = {Lecture Notes in Electrical Engineering}, volume = {448}, pages = {18--23}, year = {2017}, url = {https://doi.org/10.1007/978-981-10-5041-1\_4}, doi = {10.1007/978-981-10-5041-1\_4}, timestamp = {Wed, 22 Jul 2020 12:38:11 +0200}, biburl = {https://dblp.org/rec/conf/mue/JeongJ17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/mue/ShimJ17, author = {Min{-}Gyu Shim and Jae Woong Jeong}, editor = {James Jong Hyuk Park and Shu{-}Ching Chen and Kim{-}Kwang Raymond Choo}, title = {A Study of {AI} Based E-learning System and Application}, booktitle = {Advanced Multimedia and Ubiquitous Engineering - MUE/FutureTech 2017, Seoul, Korea, 22-24 May 2017}, series = {Lecture Notes in Electrical Engineering}, volume = {448}, pages = {24--30}, year = {2017}, url = {https://doi.org/10.1007/978-981-10-5041-1\_5}, doi = {10.1007/978-981-10-5041-1\_5}, timestamp = {Wed, 22 Jul 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/mue/ShimJ17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/mue/LeeJ17, author = {Junhak Lee and Jae Woong Jeong}, editor = {James Jong Hyuk Park and Shu{-}Ching Chen and Kim{-}Kwang Raymond Choo}, title = {A Study on the Serious Issues in the Practice of Information Security in {IT:} With a Focus on Ransomware}, booktitle = {Advanced Multimedia and Ubiquitous Engineering - MUE/FutureTech 2017, Seoul, Korea, 22-24 May 2017}, series = {Lecture Notes in Electrical Engineering}, volume = {448}, pages = {31--36}, year = {2017}, url = {https://doi.org/10.1007/978-981-10-5041-1\_6}, doi = {10.1007/978-981-10-5041-1\_6}, timestamp = {Wed, 22 Jul 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/mue/LeeJ17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/tvlsi/JeongNKO16, author = {Jae Woong Jeong and Afsaneh Nassery and Jennifer N. Kitchen and Sule Ozev}, title = {Built-In Self-Test and Digital Calibration of Zero-IF {RF} Transceivers}, journal = {{IEEE} Trans. Very Large Scale Integr. Syst.}, volume = {24}, number = {6}, pages = {2286--2298}, year = {2016}, url = {https://doi.org/10.1109/TVLSI.2015.2506547}, doi = {10.1109/TVLSI.2015.2506547}, timestamp = {Wed, 11 Mar 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/tvlsi/JeongNKO16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/JeongKO16, author = {Jae Woong Jeong and Jennifer Kitchen and Sule Ozev}, title = {Process independent gain measurement with low overhead via {BIST/DUT} co-design}, booktitle = {34th {IEEE} {VLSI} Test Symposium, {VTS} 2016, Las Vegas, NV, USA, April 25-27, 2016}, pages = {1--6}, publisher = {{IEEE} Computer Society}, year = {2016}, url = {https://doi.org/10.1109/VTS.2016.7477284}, doi = {10.1109/VTS.2016.7477284}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vts/JeongKO16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ets/JeongKO15, author = {Jae Woong Jeong and Jennifer Kitchen and Sule Ozev}, title = {Robust amplitude measurement for {RF} {BIST} applications}, booktitle = {20th {IEEE} European Test Symposium, {ETS} 2015, Cluj-Napoca, Romania, 25-29 May, 2015}, pages = {1--6}, publisher = {{IEEE}}, year = {2015}, url = {https://doi.org/10.1109/ETS.2015.7138762}, doi = {10.1109/ETS.2015.7138762}, timestamp = {Wed, 16 Oct 2019 14:14:53 +0200}, biburl = {https://dblp.org/rec/conf/ets/JeongKO15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/JeongKO15, author = {Jae Woong Jeong and Jennifer Kitchen and Sule Ozev}, title = {A self-compensating built-in self-test solution for {RF} phased array mismatch}, booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA, USA, October 6-8, 2015}, pages = {1--9}, publisher = {{IEEE}}, year = {2015}, url = {https://doi.org/10.1109/TEST.2015.7342414}, doi = {10.1109/TEST.2015.7342414}, timestamp = {Wed, 16 Oct 2019 14:14:52 +0200}, biburl = {https://dblp.org/rec/conf/itc/JeongKO15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/date/JeongOSNS14, author = {Jae Woong Jeong and Sule Ozev and Shreyas Sen and Vishwanath Natarajan and Mustapha Slamani}, editor = {Gerhard P. Fettweis and Wolfgang Nebel}, title = {Built-in self-test and characterization of polar transmitter parameters in the loop-back mode}, booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition, {DATE} 2014, Dresden, Germany, March 24-28, 2014}, pages = {1--6}, publisher = {European Design and Automation Association}, year = {2014}, url = {https://doi.org/10.7873/DATE.2014.382}, doi = {10.7873/DATE.2014.382}, timestamp = {Wed, 16 Oct 2019 14:14:53 +0200}, biburl = {https://dblp.org/rec/conf/date/JeongOSNS14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/JeongOTC14, author = {Jae Woong Jeong and Sule Ozev and Friedrich Taenzler and Hui{-}Chuan Chao}, title = {Development and empirical verification of an accuracy model for the power down leakage tests}, booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April 13-17, 2014}, pages = {1--6}, publisher = {{IEEE} Computer Society}, year = {2014}, url = {https://doi.org/10.1109/VTS.2014.6818786}, doi = {10.1109/VTS.2014.6818786}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vts/JeongOTC14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/NasseryJO13, author = {Afsaneh Nassery and Jae Woong Jeong and Sule Ozev}, title = {Zero-overhead self test and calibration of {RF} transceivers}, booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA, USA, September 6-13, 2013}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2013}, url = {https://doi.org/10.1109/TEST.2013.6651921}, doi = {10.1109/TEST.2013.6651921}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/NasseryJO13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/JeongOSM13, author = {Jae Woong Jeong and Sule Ozev and Shreyas Sen and T. M. Mak}, title = {Measurement of envelope/phase path delay skew and envelope path bandwidth in polar transmitters}, booktitle = {31st {IEEE} {VLSI} Test Symposium, {VTS} 2013, Berkeley, CA, USA, April 29 - May 2, 2013}, pages = {1--6}, publisher = {{IEEE} Computer Society}, year = {2013}, url = {https://doi.org/10.1109/VTS.2013.6548888}, doi = {10.1109/VTS.2013.6548888}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vts/JeongOSM13.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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