BibTeX records: Byoungkwan Jeong

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@article{DBLP:journals/jssc/LeeLALPCJYCYJJKKJNHSCKCJPYK11,
  author       = {Changhyuk Lee and
                  Sok{-}Kyu Lee and
                  Sunghoon Ahn and
                  Jinhaeng Lee and
                  Wonsun Park and
                  Yongdeok Cho and
                  Chaekyu Jang and
                  Chulwoo Yang and
                  Sanghwa Chung and
                  In{-}Suk Yun and
                  Byoungin Joo and
                  Byoungkwan Jeong and
                  Jeeyul Kim and
                  Jeakwan Kwon and
                  Hyunjong Jin and
                  Yujong Noh and
                  Jooyun Ha and
                  Moonsoo Sung and
                  Daeil Choi and
                  Sanghwan Kim and
                  Jeawon Choi and
                  Taeho Jeon and
                  Heejoung Park and
                  Joong{-}Seob Yang and
                  Yo{-}Hwan Koh},
  title        = {A 32-Gb {MLC} {NAND} Flash Memory With Vth Endurance Enhancing Schemes
                  in 32 nm {CMOS}},
  journal      = {{IEEE} J. Solid State Circuits},
  volume       = {46},
  number       = {1},
  pages        = {97--106},
  year         = {2011},
  url          = {https://doi.org/10.1109/JSSC.2010.2084450},
  doi          = {10.1109/JSSC.2010.2084450},
  timestamp    = {Sun, 30 Aug 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jssc/LeeLALPCJYCYJJKKJNHSCKCJPYK11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/isscc/LeeLALPCJYCYJJKKJNHSCKCJYK10,
  author       = {Changhyuk Lee and
                  Sok{-}Kyu Lee and
                  Sunghoon Ahn and
                  Jinhaeng Lee and
                  Wonsun Park and
                  Yongdeok Cho and
                  Chaekyu Jang and
                  Chulwoo Yang and
                  Sanghwa Chung and
                  In{-}Suk Yun and
                  Byoungin Joo and
                  Byoungkwan Jeong and
                  Jeeyul Kim and
                  Jeakwan Kwon and
                  Hyunjong Jin and
                  Yujong Noh and
                  Jooyun Ha and
                  Moonsoo Sung and
                  Daeil Choi and
                  Sanghwan Kim and
                  Jeawon Choi and
                  Taeho Jeon and
                  Joong{-}Seob Yang and
                  Yo{-}Hwan Koh},
  title        = {A 32Gb {MLC} NAND-flash memory with Vth-endurance-enhancing schemes
                  in 32nm {CMOS}},
  booktitle    = {{IEEE} International Solid-State Circuits Conference, {ISSCC} 2010,
                  Digest of Technical Papers, San Francisco, CA, USA, 7-11 February,
                  2010},
  pages        = {446--447},
  publisher    = {{IEEE}},
  year         = {2010},
  url          = {https://doi.org/10.1109/ISSCC.2010.5433932},
  doi          = {10.1109/ISSCC.2010.5433932},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/isscc/LeeLALPCJYCYJJKKJNHSCKCJYK10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}