BibTeX records: Nicholas Imbriglia

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@article{DBLP:journals/todaes/DworakNASIB12,
  author       = {Jennifer Dworak and
                  Kundan Nepal and
                  Nuno Alves and
                  Yiwen Shi and
                  Nicholas Imbriglia and
                  R. Iris Bahar},
  title        = {Using implications to choose tests through suspect fault identification},
  journal      = {{ACM} Trans. Design Autom. Electr. Syst.},
  volume       = {18},
  number       = {1},
  pages        = {14:1--14:19},
  year         = {2012},
  url          = {https://doi.org/10.1145/2390191.2390205},
  doi          = {10.1145/2390191.2390205},
  timestamp    = {Fri, 27 Mar 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/todaes/DworakNASIB12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/AlvesSIDNB11,
  author       = {Nuno Alves and
                  Yiwen Shi and
                  Nicholas Imbriglia and
                  Jennifer Dworak and
                  Kundan Nepal and
                  R. Iris Bahar},
  title        = {Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis},
  booktitle    = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27,
                  2011},
  pages        = {211},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/ETS.2011.59},
  doi          = {10.1109/ETS.2011.59},
  timestamp    = {Mon, 05 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/AlvesSIDNB11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}