BibTeX records: Kenji Hinode

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@article{DBLP:journals/ieicet/NagasawaHSHAFYTT14,
  author       = {Shuichi Nagasawa and
                  Kenji Hinode and
                  Tetsuro Satoh and
                  Mutsuo Hidaka and
                  Hiroyuki Akaike and
                  Akira Fujimaki and
                  Nobuyuki Yoshikawa and
                  Kazuyoshi Takagi and
                  Naofumi Takagi},
  title        = {Nb 9-Layer Fabrication Process for Superconducting Large-Scale {SFQ}
                  Circuits and Its Process Evaluation},
  journal      = {{IEICE} Trans. Electron.},
  volume       = {97-C},
  number       = {3},
  pages        = {132--140},
  year         = {2014},
  url          = {https://doi.org/10.1587/transele.E97.C.132},
  doi          = {10.1587/TRANSELE.E97.C.132},
  timestamp    = {Tue, 29 Dec 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/ieicet/NagasawaHSHAFYTT14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/ieicet/HidakaNHS08,
  author       = {Mutsuo Hidaka and
                  Shuichi Nagasawa and
                  Kenji Hinode and
                  Tetsuro Satoh},
  title        = {Improvements in Fabrication Process for Nb-Based Single Flux Quantum
                  Circuits in Japan},
  journal      = {{IEICE} Trans. Electron.},
  volume       = {91-C},
  number       = {3},
  pages        = {318--324},
  year         = {2008},
  url          = {https://doi.org/10.1093/ietele/e91-c.3.318},
  doi          = {10.1093/IETELE/E91-C.3.318},
  timestamp    = {Mon, 26 Oct 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/ieicet/HidakaNHS08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/isscc/HashimotoNSHSMHYTF08,
  author       = {Yoshihito Hashimoto and
                  Shuichi Nagasawa and
                  Tetsuro Satoh and
                  Kenji Hinode and
                  Hideo Suzuki and
                  Toshiyuki Miyazaki and
                  Mutsuo Hidaka and
                  Nobuyuki Yoshikawa and
                  Hirotaka Terai and
                  Akira Fujimaki},
  title        = {Superconductive Single-Flux-Quantum Circuit/System Technology and
                  40Gb/s Switch System Demonstration},
  booktitle    = {2008 {IEEE} International Solid-State Circuits Conference, {ISSCC}
                  2008, Digest of Technical Papers, San Francisco, CA, USA, February
                  3-7, 2008},
  pages        = {532--533},
  publisher    = {{IEEE}},
  year         = {2008},
  url          = {https://doi.org/10.1109/ISSCC.2008.4523292},
  doi          = {10.1109/ISSCC.2008.4523292},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/isscc/HashimotoNSHSMHYTF08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/TakedaMTOEHK02,
  author       = {Eiji Takeda and
                  Eiichi Murakami and
                  Kazuyoshi Torii and
                  Yutaka Okuyama and
                  Eishi Ebe and
                  Kenji Hinode and
                  Shin'ichiro Kimura},
  title        = {Reliability issues of silicon LSIs facing 100-nm technology node},
  journal      = {Microelectron. Reliab.},
  volume       = {42},
  number       = {4-5},
  pages        = {493--506},
  year         = {2002},
  url          = {https://doi.org/10.1016/S0026-2714(02)00029-X},
  doi          = {10.1016/S0026-2714(02)00029-X},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TakedaMTOEHK02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/pieee/TakedaIKOHHSFS93,
  author       = {Eiji Takeda and
                  Kunihiko Ikuzaki and
                  Hisao Katto and
                  Yuzuru Ohji and
                  Kenji Hinode and
                  Akemi Hamada and
                  Toshiyuki Sakuta and
                  Takahiro Funabiki and
                  Toshio Sasaki},
  title        = {{VLSI} reliability challenges: from device physics to wafer scale
                  systems},
  journal      = {Proc. {IEEE}},
  volume       = {81},
  number       = {5},
  pages        = {653--674},
  year         = {1993},
  url          = {https://doi.org/10.1109/5.220898},
  doi          = {10.1109/5.220898},
  timestamp    = {Mon, 13 Jun 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/pieee/TakedaIKOHHSFS93.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}