BibTeX records: Shehzad Hasan

• > Home > Persons > Shehzad Hasan

@article{DBLP:journals/access/SadiqH21,
  author       = {Zareen Sadiq and
                  Shehzad Hasan},
  title        = {MemCAM: {A} Hybrid Memristor-CMOS {CAM} Cell for On-Chip Caches},
  journal      = {{IEEE} Access},
  volume       = {9},
  pages        = {21296--21305},
  year         = {2021},
  url          = {https://doi.org/10.1109/ACCESS.2021.3055509},
  doi          = {10.1109/ACCESS.2021.3055509},
  timestamp    = {Tue, 02 Mar 2021 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/access/SadiqH21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/amc/BhargavaH12,
  author       = {R. R. Bhargava and
                  Shehzad Hasan},
  title        = {Mathematical model for crack arrest of an infinite plate weakened
                  by a finite and two semi-infinite cracks},
  journal      = {Appl. Math. Comput.},
  volume       = {218},
  number       = {11},
  pages        = {6576--6584},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.amc.2011.12.054},
  doi          = {10.1016/J.AMC.2011.12.054},
  timestamp    = {Fri, 21 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/amc/BhargavaH12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ddecs/HasanPA10,
  author       = {Shehzad Hasan and
                  Ajoy Kumar Palit and
                  Walter Anheier},
  editor       = {Elena Gramatov{\'{a}} and
                  Zdenek Kot{\'{a}}sek and
                  Andreas Steininger and
                  Heinrich Theodor Vierhaus and
                  Horst Zimmermann},
  title        = {Fault diagnosis of crosstalk induced glitches and delay faults},
  booktitle    = {13th {IEEE} International Symposium on Design and Diagnostics of Electronic
                  Circuits and Systems, {DDECS} 2010, Vienna, Austria, April 14-16,
                  2010},
  pages        = {358--363},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/DDECS.2010.5491753},
  doi          = {10.1109/DDECS.2010.5491753},
  timestamp    = {Tue, 07 May 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ddecs/HasanPA10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vlsid/HasanPA10,
  author       = {Shehzad Hasan and
                  Ajoy Kumar Palit and
                  Walter Anheier},
  title        = {Test Pattern Generation and Compaction for Crosstalk Induced Glitches
                  and Delay Faults},
  booktitle    = {{VLSI} Design 2010: 23rd International Conference on {VLSI} Design,
                  9th International Conference on Embedded Systems, Bangalore, India,
                  3-7 January 2010},
  pages        = {345--350},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/VLSI.Design.2010.30},
  doi          = {10.1109/VLSI.DESIGN.2010.30},
  timestamp    = {Tue, 07 May 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/vlsid/HasanPA10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}