BibTeX records: Daewon Ha

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@inproceedings{DBLP:conf/isscc/SongKRKPPHYDLLK17,
  author    = {Taejoong Song and
               Hoonki Kim and
               Woojin Rim and
               Yongho Kim and
               Sunghyun Park and
               Changnam Park and
               Minsun Hong and
               Giyong Yang and
               Jeongho Do and
               Jinyoung Lim and
               Seungyoung Lee and
               Ingyum Kim and
               Sanghoon Baek and
               Jonghoon Jung and
               Daewon Ha and
               Hyungsoon Jang and
               Taejung Lee and
               Chul{-}Hong Park and
               Bongjae Kwon and
               Hyuntaek Jung and
               Sungwee Cho and
               Yongjae Choo and
               Jaeseung Choi},
  title     = {12.2 {A} 7nm FinFET {SRAM} macro using {EUV} lithography for peripheral
               repair analysis},
  booktitle = {2017 {IEEE} International Solid-State Circuits Conference, {ISSCC}
               2017, San Francisco, CA, USA, February 5-9, 2017},
  pages     = {208--209},
  year      = {2017},
  crossref  = {DBLP:conf/isscc/2017},
  url       = {https://doi.org/10.1109/ISSCC.2017.7870334},
  doi       = {10.1109/ISSCC.2017.7870334},
  timestamp = {Wed, 17 May 2017 01:00:00 +0200},
  biburl    = {http://dblp.org/rec/bib/conf/isscc/SongKRKPPHYDLLK17},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/isscc/2017,
  title     = {2017 {IEEE} International Solid-State Circuits Conference, {ISSCC}
               2017, San Francisco, CA, USA, February 5-9, 2017},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7866667},
  isbn      = {978-1-5090-3758-2},
  timestamp = {Fri, 10 Mar 2017 11:00:31 +0100},
  biburl    = {http://dblp.org/rec/bib/conf/isscc/2017},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
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