BibTeX records: Sandeep K. Gupta

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@article{DBLP:journals/jsac/CordeiroFGPSS09,
  author       = {Carlos Cordeiro and
                  Romano Fantacci and
                  Sandeep K. Gupta and
                  Joseph A. Paradiso and
                  Asim Smailagic and
                  Mani B. Srivastava},
  title        = {Body Area Networking: Technology and Applications},
  journal      = {{IEEE} J. Sel. Areas Commun.},
  volume       = {27},
  number       = {1},
  pages        = {1--4},
  year         = {2009},
  url          = {https://doi.org/10.1109/JSAC.2009.090101},
  doi          = {10.1109/JSAC.2009.090101},
  timestamp    = {Tue, 01 Feb 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/jsac/CordeiroFGPSS09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/iccd/CheungG07,
  author       = {Hugo Cheung and
                  Sandeep K. Gupta},
  title        = {Accurate modeling and fault simulation of Byzantine resistive bridges},
  booktitle    = {25th International Conference on Computer Design, {ICCD} 2007, 7-10
                  October 2007, Lake Tahoe, CA, USA, Proceedings},
  pages        = {347--353},
  publisher    = {{IEEE}},
  year         = {2007},
  url          = {https://doi.org/10.1109/ICCD.2007.4601923},
  doi          = {10.1109/ICCD.2007.4601923},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iccd/CheungG07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/ShahidiG07,
  author       = {Shideh Shahidi and
                  Sandeep K. Gupta},
  editor       = {Jill Sibert and
                  Janusz Rajski},
  title        = {{ERTG:} {A} test generator for error-rate testing},
  booktitle    = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
                  California, USA, October 21-26, 2007},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/TEST.2007.4437638},
  doi          = {10.1109/TEST.2007.4437638},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/ShahidiG07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/ShahidiG06,
  author       = {Shideh Shahidi and
                  Sandeep K. Gupta},
  editor       = {Scott Davidson and
                  Anne Gattiker},
  title        = {Estimating Error Rate during Self-Test via One's Counting},
  booktitle    = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
                  CA, USA, October 22-27, 2006},
  pages        = {1--9},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/TEST.2006.297636},
  doi          = {10.1109/TEST.2006.297636},
  timestamp    = {Tue, 12 Dec 2023 09:46:27 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/ShahidiG06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tcad/ChenG98,
  author       = {Chih{-}Ang Chen and
                  Sandeep K. Gupta},
  title        = {Efficient {BIST} {TPG} design and test set compaction via input reduction},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {17},
  number       = {8},
  pages        = {692--705},
  year         = {1998},
  url          = {https://doi.org/10.1109/43.712101},
  doi          = {10.1109/43.712101},
  timestamp    = {Thu, 24 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/ChenG98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/iccd/ChenG98,
  author       = {Chih{-}Ang Chen and
                  Sandeep K. Gupta},
  title        = {Efficient {BIST} {TPG} design and test set compaction for delay testing
                  via input reduction},
  booktitle    = {International Conference on Computer Design: {VLSI} in Computers and
                  Processors, {ICCD} 1998, Proceedings, 5-7 October, 1998, Austin, TX,
                  {USA}},
  pages        = {32--39},
  publisher    = {{IEEE} Computer Society},
  year         = {1998},
  url          = {https://doi.org/10.1109/ICCD.1998.727020},
  doi          = {10.1109/ICCD.1998.727020},
  timestamp    = {Wed, 17 Apr 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/iccd/ChenG98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tcad/ChenG96,
  author       = {Chih{-}Ang Chen and
                  Sandeep K. Gupta},
  title        = {Design of efficient {BIST} test pattern generators for delay testing},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {15},
  number       = {12},
  pages        = {1568--1575},
  year         = {1996},
  url          = {https://doi.org/10.1109/43.552090},
  doi          = {10.1109/43.552090},
  timestamp    = {Thu, 24 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/ChenG96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/CheungG96,
  author       = {Hugo Cheung and
                  Sandeep K. Gupta},
  title        = {A {BIST} Methodology for Comprehensive Testing of {RAM} with Reduced
                  Heat Dissipation},
  booktitle    = {Proceedings {IEEE} International Test Conference 1996, Test and Design
                  Validity, Washington, DC, USA, October 20-25, 1996},
  pages        = {386--395},
  publisher    = {{IEEE} Computer Society},
  year         = {1996},
  url          = {https://doi.org/10.1109/TEST.1996.557026},
  doi          = {10.1109/TEST.1996.557026},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/CheungG96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tc/LempelG95,
  author       = {Mody Lempel and
                  Sandeep K. Gupta},
  title        = {Zero Aliasing for Modeled Faults},
  journal      = {{IEEE} Trans. Computers},
  volume       = {44},
  number       = {11},
  pages        = {1283--1295},
  year         = {1995},
  url          = {https://doi.org/10.1109/12.475124},
  doi          = {10.1109/12.475124},
  timestamp    = {Sat, 20 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tc/LempelG95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/ChenG95,
  author       = {Chih{-}Ang Chen and
                  Sandeep K. Gupta},
  title        = {A Methodology to Design Efficient {BIST} Test Pattern Generators},
  booktitle    = {Proceedings {IEEE} International Test Conference 1995, Driving Down
                  the Cost of Test, Washington, DC, USA, October 21-25, 1995},
  pages        = {814--823},
  publisher    = {{IEEE} Computer Society},
  year         = {1995},
  url          = {https://doi.org/10.1109/TEST.1995.529913},
  doi          = {10.1109/TEST.1995.529913},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/ChenG95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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