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ORCIDBibTeX records: Xinli Gu
@article{DBLP:journals/tcad/LiuLCG22,
author = {Mengyun Liu and
Xin Li and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Knowledge Transfer in Board-Level Functional Fault Diagnosis Enabled
by Domain Adaptation},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {41},
number = {3},
pages = {762--775},
year = {2022},
url = {https://doi.org/10.1109/TCAD.2021.3065919},
doi = {10.1109/TCAD.2021.3065919},
timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/LiuLCG22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/PanZ0CG22,
author = {Renjian Pan and
Zhaobo Zhang and
Xin Li and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Unsupervised Two-Stage Root-Cause Analysis for Integrated Systems},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {41},
number = {7},
pages = {2170--2184},
year = {2022},
url = {https://doi.org/10.1109/TCAD.2021.3103818},
doi = {10.1109/TCAD.2021.3103818},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/PanZ0CG22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/PanZLCG21,
author = {Renjian Pan and
Zhaobo Zhang and
Xin Li and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Black-Box Test-Cost Reduction Based on Bayesian Network Models},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {40},
number = {2},
pages = {386--399},
year = {2021},
url = {https://doi.org/10.1109/TCAD.2020.2994257},
doi = {10.1109/TCAD.2020.2994257},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/PanZLCG21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/LiuYLCG21,
author = {Mengyun Liu and
Fangming Ye and
Xin Li and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Board-Level Functional Fault Identification Using Streaming Data},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {40},
number = {9},
pages = {1920--1933},
year = {2021},
url = {https://doi.org/10.1109/TCAD.2020.3031865},
doi = {10.1109/TCAD.2020.3031865},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/LiuYLCG21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/JinZCG20,
author = {Shi Jin and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Hierarchical Symbol-Based Health-Status Analysis Using Time-Series
Data in a Core Router System},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {39},
number = {3},
pages = {700--713},
year = {2020},
url = {https://doi.org/10.1109/TCAD.2018.2890681},
doi = {10.1109/TCAD.2018.2890681},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/JinZCG20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/JinZCG20a,
author = {Shi Jin and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Self-Learning and Efficient Health-Status Analysis for a Core Router
System},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {39},
number = {9},
pages = {1935--1948},
year = {2020},
url = {https://doi.org/10.1109/TCAD.2019.2926506},
doi = {10.1109/TCAD.2019.2926506},
timestamp = {Thu, 02 Sep 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/JinZCG20a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/todaes/LiuPYLCG20,
author = {Mengyun Liu and
Renjian Pan and
Fangming Ye and
Xin Li and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Fine-grained Adaptive Testing Based on Quality Prediction},
journal = {{ACM} Trans. Design Autom. Electr. Syst.},
volume = {25},
number = {5},
pages = {38:1--38:25},
year = {2020},
url = {https://doi.org/10.1145/3385261},
doi = {10.1145/3385261},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/todaes/LiuPYLCG20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PanZLCG20,
author = {Renjian Pan and
Zhaobo Zhang and
Xin Li and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Unsupervised Root-Cause Analysis for Integrated Systems},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325268},
doi = {10.1109/ITC44778.2020.9325268},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PanZLCG20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/JinZCG19,
author = {Shi Jin and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Anomaly Detection and Health-Status Analysis in a Core Router System},
journal = {{IEEE} Des. Test},
volume = {36},
number = {5},
pages = {7--17},
year = {2019},
url = {https://doi.org/10.1109/MDAT.2019.2906108},
doi = {10.1109/MDAT.2019.2906108},
timestamp = {Fri, 17 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/JinZCG19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/JinZCG19,
author = {Shi Jin and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Changepoint-Based Anomaly Detection for Prognostic Diagnosis in a
Core Router System},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {38},
number = {7},
pages = {1331--1344},
year = {2019},
url = {https://doi.org/10.1109/TCAD.2018.2846641},
doi = {10.1109/TCAD.2018.2846641},
timestamp = {Thu, 24 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/tcad/JinZCG19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuLCG19,
author = {Mengyun Liu and
Xin Li and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Knowledge Transfer in Board-Level Functional Fault Identification
using Domain Adaptation},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000172},
doi = {10.1109/ITC44170.2019.9000172},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuLCG19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LiuYLCG19,
author = {Mengyun Liu and
Fangming Ye and
Xin Li and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Board-Level Functional Fault Identification using Streaming Data},
booktitle = {37th {IEEE} {VLSI} Test Symposium, {VTS} 2019, Monterey, CA, USA,
April 23-25, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/VTS.2019.8758599},
doi = {10.1109/VTS.2019.8758599},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LiuYLCG19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/PanZLCG19,
author = {Renjian Pan and
Zhaobo Zhang and
Xin Li and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Black-Box Test-Coverage Analysis and Test-Cost Reduction Based on
a Bayesian Network Model},
booktitle = {37th {IEEE} {VLSI} Test Symposium, {VTS} 2019, Monterey, CA, USA,
April 23-25, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/VTS.2019.8758639},
doi = {10.1109/VTS.2019.8758639},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/PanZLCG19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SokarZRMLRGS19,
author = {Ghada Sokar and
Yassin Zakaria and
Asmaa Rabie and
Kareem Madkour and
Ira Leventhal and
Jochen Rivoir and
Xinli Gu and
Haralampos{-}G. D. Stratigopoulos},
title = {{IP} Session on Machine Learning Applications in {IC} Test-Related
Tasks},
booktitle = {37th {IEEE} {VLSI} Test Symposium, {VTS} 2019, Monterey, CA, USA,
April 23-25, 2019},
pages = {1},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/VTS.2019.8758634},
doi = {10.1109/VTS.2019.8758634},
timestamp = {Thu, 27 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/SokarZRMLRGS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/JinZCG18,
author = {Shi Jin and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Toward Predictive Fault Tolerance in a Core-Router System: Anomaly
Detection Using Correlation-Based Time-Series Analysis},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {37},
number = {10},
pages = {2111--2124},
year = {2018},
url = {https://doi.org/10.1109/TCAD.2017.2775240},
doi = {10.1109/TCAD.2017.2775240},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/JinZCG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iccad/JinZCG18,
author = {Shi Jin and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
editor = {Iris Bahar},
title = {Failure prediction based on anomaly detection for complex core routers},
booktitle = {Proceedings of the International Conference on Computer-Aided Design,
{ICCAD} 2018, San Diego, CA, USA, November 05-08, 2018},
pages = {49},
publisher = {{ACM}},
year = {2018},
url = {https://doi.org/10.1145/3240765.3243476},
doi = {10.1145/3240765.3243476},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iccad/JinZCG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JinZCG18,
author = {Shi Jin and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Self-Learning Health-Status Analysis for a Core Router System},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624712},
doi = {10.1109/TEST.2018.8624712},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JinZCG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuPYLCG18,
author = {Mengyun Liu and
Renjian Pan and
Fangming Ye and
Xin Li and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Fine-Grained Adaptive Testing Based on Quality Prediction},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624891},
doi = {10.1109/TEST.2018.8624891},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuPYLCG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/WangLXZWG17,
author = {Ting Wang and
Yannan Liu and
Qiang Xu and
Zhaobo Zhang and
Zhiyuan Wang and
Xinli Gu},
editor = {David Atienza and
Giorgio Di Natale},
title = {RetroDMR: Troubleshooting non-deterministic faults with retrospective
{DMR}},
booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
{DATE} 2017, Lausanne, Switzerland, March 27-31, 2017},
pages = {638--641},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.23919/DATE.2017.7927066},
doi = {10.23919/DATE.2017.7927066},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/date/WangLXZWG17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/GuanZ0QG17,
author = {Tong Guan and
Zhaobo Zhang and
Wen Dong and
Chunming Qiao and
Xinli Gu},
title = {Data-driven fault diagnosis with missing syndromes imputation for
functional test through conditional specification},
booktitle = {22nd {IEEE} European Test Symposium, {ETS} 2017, Limassol, Cyprus,
May 22-26, 2017},
pages = {1--6},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/ETS.2017.7968232},
doi = {10.1109/ETS.2017.7968232},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/GuanZ0QG17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JinZCG17,
author = {Shi Jin and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Changepoint-based anomaly detection in a core router system},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242043},
doi = {10.1109/TEST.2017.8242043},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JinZCG17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JinZCG17a,
author = {Shi Jin and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Symbol-based health-status analysis in a core router system},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242044},
doi = {10.1109/TEST.2017.8242044},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JinZCG17a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/YeZCG16,
author = {Fangming Ye and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Adaptive Board-Level Functional Fault Diagnosis Using Incremental
Decision Trees},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {35},
number = {2},
pages = {323--336},
year = {2016},
url = {https://doi.org/10.1109/TCAD.2015.2459046},
doi = {10.1109/TCAD.2015.2459046},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/YeZCG16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/JinYZCG16,
author = {Shi Jin and
Fangming Ye and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Efficient Board-Level Functional Fault Diagnosis With Missing Syndromes},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {35},
number = {6},
pages = {985--998},
year = {2016},
url = {https://doi.org/10.1109/TCAD.2015.2481859},
doi = {10.1109/TCAD.2015.2481859},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/JinYZCG16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JinZCG16,
author = {Shi Jin and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Accurate anomaly detection using correlation-based time-series analysis
in a core router system},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805836},
doi = {10.1109/TEST.2016.7805836},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JinZCG16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/YeZCG15,
author = {Fangming Ye and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Information-Theoretic Syndrome Evaluation, Statistical Root-Cause
Analysis, and Correlation-Based Feature Selection for Guiding Board-Level
Fault Diagnosis},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {34},
number = {6},
pages = {1014--1026},
year = {2015},
url = {https://doi.org/10.1109/TCAD.2015.2399438},
doi = {10.1109/TCAD.2015.2399438},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/YeZCG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/YeCZG15,
author = {Fangming Ye and
Krishnendu Chakrabarty and
Zhaobo Zhang and
Xinli Gu},
title = {Self-learning and adaptive board-level functional fault diagnosis},
booktitle = {The 20th Asia and South Pacific Design Automation Conference, {ASP-DAC}
2015, Chiba, Japan, January 19-22, 2015},
pages = {294--301},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/ASPDAC.2015.7059021},
doi = {10.1109/ASPDAC.2015.7059021},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/aspdac/YeCZG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/SunJXZWG15,
author = {Zelong Sun and
Li Jiang and
Qiang Xu and
Zhaobo Zhang and
Zhiyuan Wang and
Xinli Gu},
title = {On test syndrome merging for reasoning-based board-level functional
fault diagnosis},
booktitle = {The 20th Asia and South Pacific Design Automation Conference, {ASP-DAC}
2015, Chiba, Japan, January 19-22, 2015},
pages = {737--742},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/ASPDAC.2015.7059098},
doi = {10.1109/ASPDAC.2015.7059098},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/aspdac/SunJXZWG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/YeCZG14,
author = {Fangming Ye and
Krishnendu Chakrabarty and
Zhaobo Zhang and
Xinli Gu},
title = {Information-Theoretic Framework for Evaluating and Guiding Board-Level
Functional-Fault Diagnosis},
journal = {{IEEE} Des. Test},
volume = {31},
number = {3},
pages = {65--75},
year = {2014},
url = {https://doi.org/10.1109/MDAT.2014.2313080},
doi = {10.1109/MDAT.2014.2313080},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/dt/YeCZG14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/YeZCG14,
author = {Fangming Ye and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Board-Level Functional Fault Diagnosis Using Multikernel Support Vector
Machines and Incremental Learning},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {33},
number = {2},
pages = {279--290},
year = {2014},
url = {https://doi.org/10.1109/TCAD.2013.2287184},
doi = {10.1109/TCAD.2013.2287184},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/YeZCG14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YeZCG14,
author = {Fangming Ye and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Knowledge discovery and knowledge transfer in board-level functional
fault diagnosis},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035335},
doi = {10.1109/TEST.2014.7035335},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YeZCG14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AbrahamGMRRGR14,
author = {Jacob A. Abraham and
Xinli Gu and
Teresa MacLaurin and
Janusz Rajski and
Paul G. Ryan and
Dimitris Gizopoulos and
Matteo Sonza Reorda},
title = {Special session 8B - Panel: In-field testing of SoC devices: Which
solutions by which players?},
booktitle = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
13-17, 2014},
pages = {1--2},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/VTS.2014.6818780},
doi = {10.1109/VTS.2014.6818780},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AbrahamGMRRGR14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/YeZCG13,
author = {Fangming Ye and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Board-Level Functional Fault Diagnosis Using Artificial Neural Networks,
Support-Vector Machines, and Weighted-Majority Voting},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {32},
number = {5},
pages = {723--736},
year = {2013},
url = {https://doi.org/10.1109/TCAD.2012.2234827},
doi = {10.1109/TCAD.2012.2234827},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/YeZCG13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YeJZCG13,
author = {Fangming Ye and
Shi Jin and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Handling Missing Syndromes in Board-Level Functional-Fault Diagnosis},
booktitle = {22nd Asian Test Symposium, {ATS} 2013, Yilan County, Taiwan, November
18-21, 2013},
pages = {73--78},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ATS.2013.22},
doi = {10.1109/ATS.2013.22},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YeJZCG13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/HamdiouiAGHKMOV13,
author = {Said Hamdioui and
Davide Appello and
Arnaud Grasset and
Xinli Gu and
Bram Kruseman and
Riccardo Mariani and
Hermann Obermeir and
Srikanth Venkataraman},
title = {Panel session what is the electronics industry doing to win the battle
against the expected scary failure rates in future technology nodes?},
booktitle = {18th {IEEE} European Test Symposium, {ETS} 2013, Avignon, France,
May 27-30, 2013},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ETS.2013.6569360},
doi = {10.1109/ETS.2013.6569360},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/HamdiouiAGHKMOV13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/YeZCG13,
author = {Fangming Ye and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Information-theoretic syndrome and root-cause analysis for guiding
board-level fault diagnosis},
booktitle = {18th {IEEE} European Test Symposium, {ETS} 2013, Avignon, France,
May 27-30, 2013},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/ETS.2013.6569364},
doi = {10.1109/ETS.2013.6569364},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/YeZCG13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SunJXZWG13,
author = {Zelong Sun and
Li Jiang and
Qiang Xu and
Zhaobo Zhang and
Zhiyuan Wang and
Xinli Gu},
title = {AgentDiag: An agent-assisted diagnostic framework for board-level
functional failures},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651918},
doi = {10.1109/TEST.2013.6651918},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SunJXZWG13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/FangCWG12,
author = {Hongxia Fang and
Krishnendu Chakrabarty and
Zhiyuan Wang and
Xinli Gu},
title = {Reproduction and Detection of Board-Level Functional Failure},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {31},
number = {4},
pages = {630--643},
year = {2012},
url = {https://doi.org/10.1109/TCAD.2011.2175391},
doi = {10.1109/TCAD.2011.2175391},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/FangCWG12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tcad/FangCWG12a,
author = {Hongxia Fang and
Krishnendu Chakrabarty and
Zhiyuan Wang and
Xinli Gu},
title = {Diagnosis of Board-Level Functional Failures Under Uncertainty Using
Dempster-Shafer Theory},
journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
volume = {31},
number = {10},
pages = {1586--1599},
year = {2012},
url = {https://doi.org/10.1109/TCAD.2012.2198884},
doi = {10.1109/TCAD.2012.2198884},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tcad/FangCWG12a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tvlsi/ZhangWGC12,
author = {Zhaobo Zhang and
Zhanglei Wang and
Xinli Gu and
Krishnendu Chakrabarty},
title = {Physical-Defect Modeling and Optimization for Fault-Insertion Test},
journal = {{IEEE} Trans. Very Large Scale Integr. Syst.},
volume = {20},
number = {4},
pages = {723--736},
year = {2012},
url = {https://doi.org/10.1109/TVLSI.2011.2114681},
doi = {10.1109/TVLSI.2011.2114681},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tvlsi/ZhangWGC12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Gu12,
author = {Xinli Gu},
title = {Session Summary {II:} Dependable {VLSI} for Product Reliability},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {67},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.85},
doi = {10.1109/ATS.2012.85},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Gu12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuG012,
author = {Yu Hu and
Xinli Gu and
Xiaowei Li},
title = {In-Field Testing of {NAND} Flash Storage: Why and How?},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {69},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.71},
doi = {10.1109/ATS.2012.71},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuG012.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YeZCG12,
author = {Fangming Ye and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Adaptive Board-Level Functional Fault Diagnosis Using Decision Trees},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {202--207},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.48},
doi = {10.1109/ATS.2012.48},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YeZCG12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YeZCG12a,
author = {Fangming Ye and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Board-Level Functional Fault Diagnosis Using Learning Based on Incremental
Support-Vector Machines},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {208--213},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.49},
doi = {10.1109/ATS.2012.49},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YeZCG12a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Gu12a,
author = {Xinli Gu},
title = {Session Summary {V:} Is Component Interconnection Test Enough for
Board or System Test},
booktitle = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
19-22, 2012},
pages = {270},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ATS.2012.84},
doi = {10.1109/ATS.2012.84},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Gu12a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/GuREKQJCL12,
author = {Xinli Gu and
Jeff Rearick and
Bill Eklow and
Martin Keim and
Jun Qian and
Artur Jutman and
Krishnendu Chakrabarty and
Erik Larsson},
title = {Re-using chip level {DFT} at board level},
booktitle = {17th {IEEE} European Test Symposium, {ETS} 2012, Annecy, France, May
28 - June 1 2012},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ETS.2012.6233049},
doi = {10.1109/ETS.2012.6233049},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/GuREKQJCL12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/ZhangGXWWC12,
author = {Zhaobo Zhang and
Xinli Gu and
Yaohui Xie and
Zhiyuan Wang and
Zhanglei Wang and
Krishnendu Chakrabarty},
title = {Diagnostic system based on support-vector machines for board-level
functional diagnosis},
booktitle = {17th {IEEE} European Test Symposium, {ETS} 2012, Annecy, France, May
28 - June 1 2012},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/ETS.2012.6233029},
doi = {10.1109/ETS.2012.6233029},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/ZhangGXWWC12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Gu12,
author = {Xinli Gu},
title = {Are industrial test problems real problems? {I} thought research has
resolved them all!},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401526},
doi = {10.1109/TEST.2012.6401526},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Gu12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/aspdac/FangWGC11,
author = {Hongxia Fang and
Zhiyuan Wang and
Xinli Gu and
Krishnendu Chakrabarty},
title = {Deterministic test for the reproduction and detection of board-level
functional failures},
booktitle = {Proceedings of the 16th Asia South Pacific Design Automation Conference,
{ASP-DAC} 2011, Yokohama, Japan, January 25-27, 2011},
pages = {491--496},
publisher = {{IEEE}},
year = {2011},
url = {https://doi.org/10.1109/ASPDAC.2011.5722239},
doi = {10.1109/ASPDAC.2011.5722239},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/aspdac/FangWGC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/FangWGC11,
author = {Hongxia Fang and
Zhiyuan Wang and
Xinli Gu and
Krishnendu Chakrabarty},
title = {Ranking of Suspect Faulty Blocks Using Dataflow Analysis and Dempster-Shafer
Theory for the Diagnosis of Board-Level Functional Failures},
booktitle = {16th European Test Symposium, {ETS} 2011, Trondheim, Norway, May 23-27,
2011},
pages = {195--200},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/ETS.2011.23},
doi = {10.1109/ETS.2011.23},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/FangWGC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Gu11,
author = {Xinli Gu},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {The gap: Test challenges in Asia manufacturing field},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139195},
doi = {10.1109/TEST.2011.6139195},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Gu11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhangCWWG11,
author = {Zhaobo Zhang and
Krishnendu Chakrabarty and
Zhanglei Wang and
Zhiyuan Wang and
Xinli Gu},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Smart diagnosis: Efficient board-level diagnosis and repair using
artificial neural networks},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139139},
doi = {10.1109/TEST.2011.6139139},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZhangCWWG11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FangWGC10,
author = {Hongxia Fang and
Zhiyuan Wang and
Xinli Gu and
Krishnendu Chakrabarty},
title = {Mimicking of Functional State Space with Structural Tests for the
Diagnosis of Board-Level Functional Failures},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {421--428},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.78},
doi = {10.1109/ATS.2010.78},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/FangWGC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhangWGC10,
author = {Zhaobo Zhang and
Zhanglei Wang and
Xinli Gu and
Krishnendu Chakrabarty},
title = {Optimization and Selection of Diagnosis-Oriented Fault-Insertion Points
for System Test},
booktitle = {Proceedings of the 19th {IEEE} Asian Test Symposium, {ATS} 2010, 1-4
December 2010, Shanghai, China},
pages = {429--432},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/ATS.2010.79},
doi = {10.1109/ATS.2010.79},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ZhangWGC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhangWGC10,
author = {Zhaobo Zhang and
Zhanglei Wang and
Xinli Gu and
Krishnendu Chakrabarty},
editor = {Ron Press and
Erik H. Volkerink},
title = {Board-level fault diagnosis using an error-flow dictionary},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {485--494},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699251},
doi = {10.1109/TEST.2010.5699251},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZhangWGC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ZhangWGC10,
author = {Zhaobo Zhang and
Zhanglei Wang and
Xinli Gu and
Krishnendu Chakrabarty},
title = {Board-level fault diagnosis using Bayesian inference},
booktitle = {28th {IEEE} {VLSI} Test Symposium, {VTS} 2010, April 19-22, 2010,
Santa Cruz, California, {USA}},
pages = {244--249},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/VTS.2010.5469569},
doi = {10.1109/VTS.2010.5469569},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ZhangWGC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhangWGC09,
author = {Zhaobo Zhang and
Zhanglei Wang and
Xinli Gu and
Krishnendu Chakrabarty},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Physical defect modeling for fault insertion in system reliability
test},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355715},
doi = {10.1109/TEST.2009.5355715},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZhangWGC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/WangWWWJSG08,
author = {Laung{-}Terng Wang and
Xiaoqing Wen and
Shianling Wu and
Zhigang Wang and
Zhigang Jiang and
Boryau Sheu and
Xinli Gu},
title = {VirtualScan: Test Compression Technology Using Combinational Logic
and One-Pass {ATPG}},
journal = {{IEEE} Des. Test Comput.},
volume = {25},
number = {2},
pages = {122--130},
year = {2008},
url = {https://doi.org/10.1109/MDT.2008.56},
doi = {10.1109/MDT.2008.56},
timestamp = {Sun, 17 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/dt/WangWWWJSG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VoWEGLLWJFSG06,
author = {Toai Vo and
Zhiyuan Wang and
Ted Eaton and
Pradipta Ghosh and
Huai Li and
Young Lee and
Weili Wang and
Hong Shin Jun and
Rong Fang and
Dan Singletary and
Xinli Gu},
editor = {Scott Davidson and
Anne Gattiker},
title = {Design for Board and System Level Structural Test and Diagnosis},
booktitle = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
CA, USA, October 22-27, 2006},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2006},
url = {https://doi.org/10.1109/TEST.2006.297631},
doi = {10.1109/TEST.2006.297631},
timestamp = {Tue, 12 Dec 2023 09:46:27 +0100},
biburl = {https://dblp.org/rec/conf/itc/VoWEGLLWJFSG06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ConroyRGE05,
author = {Zoe Conroy and
Geoff Richmond and
Xinli Gu and
Bill Eklow},
title = {A practical perspective on reducing {ASIC} NTFs},
booktitle = {Proceedings 2005 {IEEE} International Test Conference, {ITC} 2005,
Austin, TX, USA, November 8-10, 2005},
pages = {7},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/TEST.2005.1583992},
doi = {10.1109/TEST.2005.1583992},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ConroyRGE05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KimJGC04,
author = {Heon C. Kim and
Hong Shin Jun and
Xinli Gu and
Sung Soo Chung},
title = {At-Speed Interconnect Test and Diagnosis of External Memories on a
System},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {156--162},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386948},
doi = {10.1109/TEST.2004.1386948},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KimJGC04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GuWLETTKR04,
author = {Xinli Gu and
Cyndee Wang and
Abby Lee and
Bill Eklow and
Kun{-}Han Tsai and
Jan Arild Tofte and
Mark Kassab and
Janusz Rajski},
title = {Realizing High Test Quality Goals with Smart Test Resource Usage},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {525--533},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386989},
doi = {10.1109/TEST.2004.1386989},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GuWLETTKR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GuWLKC02,
author = {Xinli Gu and
Weili Wang and
Kevin Li and
Heon C. Kim and
Sung Soo Chung},
title = {Re-Using {DFT} Logic for Functional and Silicon Debugging Test},
booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
MD, USA, October 7-10, 2002},
pages = {648--656},
publisher = {{IEEE} Computer Society},
year = {2002},
url = {https://doi.org/10.1109/TEST.2002.1041816},
doi = {10.1109/TEST.2002.1041816},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GuWLKC02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GuCTTR01,
author = {Xinli Gu and
Sung Soo Chung and
Frank Tsang and
Jan Arild Tofte and
Hamid Rahmanian},
title = {An effort-minimized logic {BIST} implementation method},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {1002--1010},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966725},
doi = {10.1109/TEST.2001.966725},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GuCTTR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HirechBG98,
author = {Mokhtar Hirech and
James Beausang and
Xinli Gu},
title = {A new approach to scan chain reordering using physical design information},
booktitle = {Proceedings {IEEE} International Test Conference 1998, Washington,
DC, USA, October 18-22, 1998},
pages = {348--355},
publisher = {{IEEE} Computer Society},
year = {1998},
url = {https://doi.org/10.1109/TEST.1998.743173},
doi = {10.1109/TEST.1998.743173},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HirechBG98.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/date/GuLKP97,
author = {Xinli Gu and
Erik Larsson and
Krzysztof Kuchcinski and
Zebo Peng},
title = {A controller testability analysis and enhancement technique},
booktitle = {European Design and Test Conference, ED{\&}TC '97, Paris, France,
17-20 March 1997},
pages = {153--157},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/EDTC.1997.582351},
doi = {10.1109/EDTC.1997.582351},
timestamp = {Fri, 20 May 2022 15:59:03 +0200},
biburl = {https://dblp.org/rec/conf/date/GuLKP97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GuKP95,
author = {Xinli Gu and
Krzysztof Kuchcinski and
Zebo Peng},
title = {An Efficient and Economic Partitioning Approach for Testability},
booktitle = {Proceedings {IEEE} International Test Conference 1995, Driving Down
the Cost of Test, Washington, DC, USA, October 21-25, 1995},
pages = {403--412},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/TEST.1995.529866},
doi = {10.1109/TEST.1995.529866},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GuKP95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Gu95,
author = {Xinli Gu},
title = {{RT} level testability-driven partitioning},
booktitle = {13th {IEEE} {VLSI} Test Symposium (VTS'95), April 30 - May 3, 1995,
Princeton, New Jersey, {USA}},
pages = {176--183},
publisher = {{IEEE} Computer Society},
year = {1995},
url = {https://doi.org/10.1109/VTEST.1995.512634},
doi = {10.1109/VTEST.1995.512634},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Gu95.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/eurodac/GuKP94,
author = {Xinli Gu and
Krzysztof Kuchcinski and
Zebo Peng},
editor = {Jean Mermet},
title = {Testability analysis and improvement from {VHDL} behavioral specifications},
booktitle = {Proceedings EURO-DAC'94, European Design Automation Conference, Grenoble,
France, September 19-22, 1994},
pages = {644--649},
publisher = {{IEEE} Computer Society},
year = {1994},
url = {http://dl.acm.org/citation.cfm?id=198345},
timestamp = {Wed, 29 Mar 2017 16:45:25 +0200},
biburl = {https://dblp.org/rec/conf/eurodac/GuKP94.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jsa/GuKP92,
author = {Xinli Gu and
Krzysztof Kuchcinski and
Zebo Peng},
title = {An approach to testability analysis and improvement for {VLSI} systems},
journal = {Microprocess. Microprogramming},
volume = {35},
number = {1-5},
pages = {485--492},
year = {1992},
url = {https://doi.org/10.1016/0165-6074(92)90358-E},
doi = {10.1016/0165-6074(92)90358-E},
timestamp = {Tue, 19 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jsa/GuKP92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jsa/GuKP91,
author = {Xinli Gu and
Krzysztof Kuchcinski and
Zebo Peng},
title = {Testability measure with reconvergent fanout analysis and its applications},
journal = {Microprocessing and Microprogramming},
volume = {32},
number = {1-5},
pages = {835--842},
year = {1991},
url = {https://doi.org/10.1016/0165-6074(91)90446-Z},
doi = {10.1016/0165-6074(91)90446-Z},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/jsa/GuKP91.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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