BibTeX records: Heiko Ehrenberg

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@inproceedings{DBLP:conf/vts/PortolanKRE23,
  author       = {Michele Portolan and
                  Martin Keim and
                  Jeff Rearick and
                  Heiko Ehrenberg},
  title        = {Refreshing the {JTAG} Family},
  booktitle    = {41st {IEEE} {VLSI} Test Symposium, {VTS} 2023, San Diego, CA, USA,
                  April 24-26, 2023},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/VTS56346.2023.10140015},
  doi          = {10.1109/VTS56346.2023.10140015},
  timestamp    = {Fri, 09 Jun 2023 15:18:15 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/PortolanKRE23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/EhrenbergR11,
  author       = {Heiko Ehrenberg and
                  Bob Russell},
  editor       = {Bill Eklow and
                  R. D. (Shawn) Blanton},
  title        = {{IEEE} Std 1581 - {A} standardized test access methodology for memory
                  devices},
  booktitle    = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
                  USA, September 20-22, 2011},
  pages        = {1--9},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/TEST.2011.6139141},
  doi          = {10.1109/TEST.2011.6139141},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/EhrenbergR11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Ehrenberg09,
  author       = {Heiko Ehrenberg},
  editor       = {Gordon W. Roberts and
                  Bill Eklow},
  title        = {Test Mode Entry and Exit Methods for {IEEE} {P1581} compliant devices},
  booktitle    = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
                  USA, November 1-6, 2009},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/TEST.2009.5355636},
  doi          = {10.1109/TEST.2009.5355636},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Ehrenberg09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Ehrenberg08,
  author       = {Heiko Ehrenberg},
  editor       = {Douglas Young and
                  Nur A. Touba},
  title        = {{IEEE} {P1581} drastically simplifies connectivity test for memory
                  devices},
  booktitle    = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
                  California, USA, October 26-31, 2008},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2008},
  url          = {https://doi.org/10.1109/TEST.2008.4700681},
  doi          = {10.1109/TEST.2008.4700681},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Ehrenberg08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Ehrenberg07,
  author       = {Heiko Ehrenberg},
  editor       = {Jill Sibert and
                  Janusz Rajski},
  title        = {{IEEE} {P1581} can solve your board level memory cluster test problems},
  booktitle    = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
                  California, USA, October 21-26, 2007},
  pages        = {1--9},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/TEST.2007.4437625},
  doi          = {10.1109/TEST.2007.4437625},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Ehrenberg07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Ehrenberg06,
  author       = {Heiko Ehrenberg},
  editor       = {Scott Davidson and
                  Anne Gattiker},
  title        = {{IEEE} {P1581} - Getting More Board Test Out of Boundary Scan},
  booktitle    = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
                  CA, USA, October 22-27, 2006},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/TEST.2006.297707},
  doi          = {10.1109/TEST.2006.297707},
  timestamp    = {Tue, 12 Dec 2023 09:46:27 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Ehrenberg06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/SuparjoLCE06,
  author       = {Bambang Suparjo and
                  Adam W. Ley and
                  Adam Cron and
                  Heiko Ehrenberg},
  editor       = {Scott Davidson and
                  Anne Gattiker},
  title        = {Analog Boundary-Scan Description Language {(ABSDL)} for Mixed-Signal
                  Board Test},
  booktitle    = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
                  CA, USA, October 22-27, 2006},
  pages        = {1--9},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/TEST.2006.297708},
  doi          = {10.1109/TEST.2006.297708},
  timestamp    = {Wed, 24 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/SuparjoLCE06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}