BibTeX records: M. Denais

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@inproceedings{DBLP:conf/patmos/ParthasarathyBGDH07,
  author       = {C. R. Parthasarathy and
                  Alain Bravaix and
                  Chloe Gu{\'{e}}rin and
                  M. Denais and
                  Vincent Huard},
  editor       = {Nadine Az{\'{e}}mard and
                  Lars J. Svensson},
  title        = {Design-In Reliability for 90-65nm {CMOS} Nodes Submitted to Hot-Carriers
                  and {NBTI} Degradation},
  booktitle    = {Integrated Circuit and System Design. Power and Timing Modeling, Optimization
                  and Simulation, 17th International Workshop, {PATMOS} 2007, Gothenburg,
                  Sweden, September 3-5, 2007, Proceedings},
  series       = {Lecture Notes in Computer Science},
  volume       = {4644},
  pages        = {191--200},
  publisher    = {Springer},
  year         = {2007},
  url          = {https://doi.org/10.1007/978-3-540-74442-9\_19},
  doi          = {10.1007/978-3-540-74442-9\_19},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/patmos/ParthasarathyBGDH07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/HuardDP06,
  author       = {Vincent Huard and
                  M. Denais and
                  C. R. Parthasarathy},
  title        = {{NBTI} degradation: From physical mechanisms to modelling},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {1--23},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.02.001},
  doi          = {10.1016/J.MICROREL.2005.02.001},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HuardDP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/ParthasarathyDHRRGPVB06,
  author       = {C. R. Parthasarathy and
                  M. Denais and
                  Vincent Huard and
                  G. Ribes and
                  David Roy and
                  Chloe Gu{\'{e}}rin and
                  F. Perrier and
                  E. Vincent and
                  Alain Bravaix},
  title        = {Designing in reliability in advanced {CMOS} technologies},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {9-11},
  pages        = {1464--1471},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.07.012},
  doi          = {10.1016/J.MICROREL.2006.07.012},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ParthasarathyDHRRGPVB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/HuardDPRPBV05,
  author       = {Vincent Huard and
                  M. Denais and
                  F. Perrier and
                  Nathalie Revil and
                  C. R. Parthasarathy and
                  Alain Bravaix and
                  E. Vincent},
  title        = {A thorough investigation of MOSFETs {NBTI} degradation},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {1},
  pages        = {83--98},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2004.04.027},
  doi          = {10.1016/J.MICROREL.2004.04.027},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/HuardDPRPBV05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/RibesBDRG05,
  author       = {G. Ribes and
                  S. Bruy{\`{e}}re and
                  M. Denais and
                  David Roy and
                  G{\'{e}}rard Ghibaudo},
  title        = {Evidence and modelling current dependence of defect generation probability
                  and its impact on charge to breakdown},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {5-6},
  pages        = {841--844},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2004.11.035},
  doi          = {10.1016/J.MICROREL.2004.11.035},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/RibesBDRG05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/BravaixGDHPPRV05,
  author       = {Alain Bravaix and
                  Didier Goguenheim and
                  M. Denais and
                  Vincent Huard and
                  C. R. Parthasarathy and
                  F. Perrier and
                  Nathalie Revil and
                  E. Vincent},
  title        = {Impacts of the recovery phenomena on the worst-case of damage in {DC/AC}
                  stressed ultra-thin {NO} gate-oxide MOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {9-11},
  pages        = {1370--1375},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.023},
  doi          = {10.1016/J.MICROREL.2005.07.023},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/BravaixGDHPPRV05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/RibesBDMHRG05,
  author       = {G. Ribes and
                  S. Bruy{\`{e}}re and
                  M. Denais and
                  Frederic Monsieur and
                  Vincent Huard and
                  David Roy and
                  G{\'{e}}rard Ghibaudo},
  title        = {Multi-vibrational hydrogen release: Physical origin of T\({}_{\mbox{bd}}\),
                  Q\({}_{\mbox{bd}}\) power-law voltage dependence of oxide breakdown
                  in ultra-thin gate oxides},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {12},
  pages        = {1842--1854},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2005.03.009},
  doi          = {10.1016/J.MICROREL.2005.03.009},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/RibesBDMHRG05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}