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BibTeX records: William A. Davies
@article{DBLP:journals/apin/WeissBTCDSH10, author = {Sholom M. Weiss and Robert J. Baseman and Fateh Tipu and Christopher N. Collins and William A. Davies and Raminderpal Singh and John W. Hopkins}, title = {Rule-based data mining for yield improvement in semiconductor manufacturing}, journal = {Appl. Intell.}, volume = {33}, number = {3}, pages = {318--329}, year = {2010}, url = {https://doi.org/10.1007/s10489-009-0168-9}, doi = {10.1007/S10489-009-0168-9}, timestamp = {Wed, 17 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/apin/WeissBTCDSH10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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