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BibTeX records: Darren Aaberge
@inproceedings{DBLP:conf/vts/AabergeMDBDH05, author = {Darren Aaberge and Ken Mockler and Dieu Van Dinh and Raoul Belleau and Tim Donovan and Reid Hewlitt}, title = {Meeting the Test Challenges of the 1 Gbps Parallel RapidIO Interface with New Automatic Test Equipment Capabilities}, booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm Springs, CA, {USA}}, pages = {75--84}, publisher = {{IEEE} Computer Society}, year = {2005}, url = {https://doi.org/10.1109/VTS.2005.55}, doi = {10.1109/VTS.2005.55}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vts/AabergeMDBDH05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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