Volume 3, Number 1, January 1984
A. M. Mazzone,
G. Rocca:
Three-Dimensional Monte Carlo Simulations--Part I: Implanted Profiles for Dopants in Submicron Device.
64-71
John K. Ousterhout:
Corner Stitching: A Data-Structuring Technique for VLSI Layout Tools.
87-100
Dileep A. Divekar:
DC Statistical Circuit Analysis for Bipolar IC's Using Parameter Correlations-An Experimental Example.
101-103
Volume 3, Number 2, April 1984
E. Barke:
A Network Comparison Algorithm for Layout Verification of Integrated Circuits.
135-141
Volume 3, Number 3, July 1984
John P. Hayes:
Fault Modeling for Digital MOS Integrated Circuits.
200-208
Volume 3, Number 4, October 1984