Volume 28, Number 1, February 2012

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  Yanjing Ou, Di Wen, Zhang Wu, Michael B. C. Khoo: A comparison study on effectiveness and robustness of control charts for monitoring process mean and variance. 3-17
• 
  Ying Zhang, Philippe Castagliola, Zhang Wu, Michael B. C. Khoo: The variable sampling interval X̄ chart with estimated parameters. 19-34
• 
  Wenny Chandra, Dennis K. J. Lin: Parameter calibration and inadequacy modeling in a computer experiment. 35-46
• 
  Tashi P. Erdmann, Jeroen de Mast: Assessment of binary inspection with a hybrid measurand. 47-57
• 
  Kimberly F. Sellers: A generalized statistical control chart for over- or under-dispersed data. 59-65
• 
  Haifeng Li, Min Zeng, Minyan Lu, Xuan Hu, Zhen Li: Adaboosting-based dynamic weighted combination of software reliability growth models. 67-84
• 
  Francesco Zammori, Roberto Gabbrielli: ANP/RPN: a multi criteria evaluation of the Risk Priority Number. 85-104
• 
  P. C. Wang, R. Dennis Cook: Analysis and efficient 2^{k - 1} designs for experiments in blocks of size two. 105-113

• 
  John S. Lawson, Sheldon Henderson, Jenifer Peterson: Model-robust choice experiments: discussion and case study. 115-122

• 
  Y. H. Dovoedo, S. Chakraborti: Boxplot-based phase I control charts for time between events. 123-130

Volume 28, Number 2, March 2012

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  Shashibhushan B. Mahadik: Variable sampling interval hotelling's T² charts with runs rules for switching between sampling interval lengths. 131-140
• 
  Isis Didier Lins, Márcio das Chagas Moura, Enrico Zio, Enrique López Droguett: A particle swarm-optimized support vector machine for reliability prediction. 141-158
• 
  Giovanni Celano, Philippe Castagliola, Enrico Trovato, Sergio Fichera: The economic performance of the Shewhart t chart. 159-180
• 
  Shuguang He, Wandi Huang, William H. Woodall: CUSUM charts for monitoring a zero-inflated poisson process. 181-192
• 
  S. K. Khilare, D. T. Shirke: Nonparametric Synthetic Control Charts for Process Variation. 193-202
• 
  Gracia Toubia-Stucky, Haitao Liao, Janet M. Twomey: A Sequential Bayesian Cumulative Conformance Count Approach to Deterioration Detection in High Yield Processes. 203-214
• 
  Yan Li, Xiaolong Pu: On the Performance of Two-sided Control Charts for Short Production Runs. 215-232
• 
  Francis Pascual, Shuo Li: Monitoring the Weibull Shape Parameter by Control Charts for the Sample Range of Type II Censored Data. 233-246

Volume 28, Number 3, April 2012

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  Gregory L. Boylan, Byung Rae Cho: The Normal Probability Plot as a Tool for Understanding Data: A Shape Analysis from the Perspective of Skewness, Kurtosis, and Variability. 249-264
• 
  Jihong Yan, Dingguo Hua, Xing Wang, Xin Li: Sustainable Manufacturing Oriented Prognosis for Facility Reuse Combining ANN and Reliability. 265-277
• 
  Saddam Akber Abbasi, Arden Miller: On Proper Choice of Variability Control Chart for Normal and Non-normal Processes. 279-296
• 
  Hong-Zhong Huang, Hua Zhang, Yanfeng Li: A New Ordering Method of Basic Events in Fault Tree Analysis. 297-305
• 
  Chin-Sen Lin, Sunny Kao, Long-Sheng Chen: A Proactive Operational Framework for Business Continuity in the Semiconductor Industry. 307-320
• 
  Zhiguo Li, Shiyu Zhou, Crispian Sievenpiper, Suresh Choubey: Statistical Monitoring of Time-to-Failure Data Using Rank Tests. 321-333
• 
  A. Mukherjee, S. Chakraborti: A Distribution-free Control Chart for the Joint Monitoring of Location and Scale. 335-352
• 
  Jinsuk Lee, Rong Pan: Bayesian Analysis of Step-Stress Accelerated Life Test with Exponential Distribution. 353-361

• 
  Hadjadj Aoul Elias, Lakehal Abdelaziz: Combined Anomalies Prediction Using the Bayesian Theory. 363-367

Volume 28, Number 4, June 2012

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  K. K. Jose, Jane A. Luke: Confidence Intervals for Process Capability Indices for the Unbalanced One-Way Random Effect ANOVA Model. 371-375
• 
  Su-Fen Yang, Tsung-Chi Cheng, Ying-Chao Hung, Smiley W. Cheng: A New Chart for Monitoring Service Process Mean. 377-386
• 
  Michelle Mancenido, Erniel Barrios: An AR-Sieve Bootstrap Control Chart for Autocorrelated Process Data. 387-395
• 
  Shervin Asadzadeh, Abdollah Aghaie: Improving the Product Reliability in Multistage Manufacturing and Service Operations. 397-407
• 
  Chia-Ling Yen, Jyh-Jen Horng Shiau, Arthur B. Yeh: Effective Control Charts for Monitoring Multivariate Process Dispersion. 409-426
• 
  Yihai He, Kai Mi, Chunhui Wu: A New Statistical High-Quality Process Monitoring Method: The Counted Number Between Omega-Event Control Charts. 427-436
• 
  Rassoul Noorossana, Shekary A. Maryam: Monitoring Two Dependent Process Steps Using Special Variable Sample Sizes and Sampling Intervals Cause-Selecting Control Charts. 437-453
• 
  Haisong Deng, Wenze Shao, Yizhong Ma, Zhuihui Wei: Bayesian Metamodeling for Computer Experiments Using the Gaussian Kriging Models. 455-466
• 
  M. Perakis, E. Xekalaki: On the Implementation of the Principal Component Analysis-Based Approach in Measuring Process Capability. 467-480

• 
  Ingrid Tano, Kerstin Vännman: Comparing Confidence Intervals for Multivariate Process Capability Indices. 481-495

Volume 28, Number 5, July 2012

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  Alessandro Di Bucchianico, Henry Wynn: The ENBIS-11 Quality and Reliability Engineering International Special Issue. 498-499
• 
  Ron S. Kenett, Moshe Pollak: On Assessing the Performance of Sequential Procedures for Detecting a Change. 500-507
• 
  Véronique M. Gomes, Ana C. Pereira, Pedro M. Saraiva, Marco S. Reis: Development of Generalized Platforms for the Analysis of Complex Datasets. 508-523
• 
  John Sheil, Dermot Hale: The 'Democratisation' of Statistics: Parastatisticians in Manufacturing. 524-534
• 
  I. Reid, J. Smyth-Renshaw: Exploring the Fundamentals of Root Cause Analysis: Are We Asking the Right Questions in Defining the Problem? 535-545
• 
  Rainer Göb, David Baillie: Sampling for Nonconformities and Other Issues in the Forthcoming Revision of ISO 2859-2. 546-562
• 
  Lluís Marco-Almagro, Xavier Tort-Martorell: Statistical Methods in Kansei Engineering: a Case of Statistical Engineering. 563-573

Volume 28, Number 6, October 2012

• 
  B. Alkali: Evaluation of Generalised Proportional Intensities Models with Application to the Maintenance of Gas Turbines. 577-584

• 
  Adiel Teixeira de Almeida: Multicriteria Model for Selection of Preventive Maintenance Intervals. 585-593
• 
  Majid Bazrafshan, Tayebeh Hajjari: Diagnosing Maintenance System Problems: Theory and a Case Study. 594-603
• 
  Stuart A. Bell, David F. Percy: Modelling Uncertainty in Preventive Maintenance Scheduling. 604-615
• 
  Richard L. Bovey, E. T. Senalp: Suggesting and Justifying Model Updates for Improved Troubleshooting. 616-623
• 
  Phuc Do Van, Christophe Bérenguer: Condition-Based Maintenance with Imperfect Preventive Repairs for a Deteriorating Production System. 624-633
• 
  Renyan Jiang: A General Proportional Model and Modelling Procedure. 634-647
• 
  Xiaofei Lu, Wenbin Wang, Hongbing Yang, Ming J. Zuo, Dong-Hua Zhou: Optimizing the Periodic Inspection Interval for a 1-out-of-2 Cold Standby System Using the Delay-Time Concept. 648-662
• 
  Artur Akbarov, Shaomin Wu: Warranty Claim Forecasting Based On Weighted Maximum Likelihood Estimation. 663-669

Volume 28, Number 7, November 2012

• 
  Amirhossein Amiri, Saeed Allahyari: Change Point Estimation Methods for Control Chart Postsignal Diagnostics: A Literature Review. 673-685

• 
  Philippe Castagliola, Ying Zhang, Antonio Costa, Petros E. Maravelakis: The Variable Sample Size X¯ Chart with Estimated Parameters. 687-699
• 
  Nuno Ricardo Costa, João Lourenço, Zulema Lopes Pereira: Multiresponse Optimization and Pareto Frontiers. 701-712
• 
  Dae-Heung Jang, Christine M. Anderson-Cook, Youngil Kim: Three-Dimensional Quantile Plots and Dynamic Quantile Plots of the Prediction Variance for Response Surface Designs. 713-723
• 
  Wai Chung Yeong, Michael B. C. Khoo, Zhang Wu, Philippe Castagliola: Economically Optimum Design of a Synthetic X¯ Chart. 725-741
• 
  Gejza Dohnal: Delay in Statistical Control of Systems with Wear. 743-750
• 
  Alireza Faraz, Cédric Heuchenne, Erwin Saniga: Optimal T² Control Chart with a Double Sampling Scheme - An Alternative to the MEWMA Chart. 751-760
• 
  Ali A. Ismail, S. E. Abu-Youssef: A Goodness of Fit Approach to the Class of Life Distributions with Unknown Age. 761-766
• 
  Adam Pintar, Christine M. Anderson-Cook, Huaiqing Wu: Model Selection for Good Estimation and Prediction over a User-Specified Covariate Distribution for Linear Models under the Frequentist Paradigm. 767-782

• 
  Rui Jiang, Michael Jong Kim, Viliam Makis: Maximum Likelihood Estimation for a Hidden Semi-Markov Model with Multivariate Observations. 783-791

Volume 28, Number 8, December 2012

• 
  Aarnout Brombacher: Statistics: an important mathematical tool or a political instrument. 793

• 
  Shaomin Wu: Warranty Data Analysis: A Review. 795-805

• 
  Emese Vágó, Sándor Kemény: Random Effects Model for Attribute Gauge R&R. 807-823
• 
  Jingqiang Lin, Jiwu Jing, Peng Liu: Evaluating Intrusion-Tolerant Certification Authority Systems. 825-841
• 
  Mehdi Davoodi, Seyed Taghi Akhavan Niaki: Estimating the Step-Change Time of the Location Parameter in Multistage Processes Using MLE. 843-855
• 
  Yanting Li, Fugee Tsung: Multiple Attribute Control Charts with False Discovery Rate Control. 857-871
• 
  Aarnout Brombacher, Eva Hopma, Ashwin Ittoo, Yuan Lu, Ilse Luyk, Laura Maruster, Joel Ribeiro, Ton Weijters, Hans Wortmann: Improving Product Quality and Reliability with Customer Experience Data. 873-886
• 
  Sara Lorén, Thomas Svensson: Second Moment Reliability Evaluation vs. Monte Carlo Simulations for Weld Fatigue Strength. 887-896
• 
  Jong In Park, Norman Kim, Suk Joo Bae: A Genetic-Based Iterative Quantile Regression Algorithm for Analyzing Fatigue Curves. 897-909
• 
  Vijay Rathod, Om Prakash Yadav, Ajay Pal Singh Rathore, Rakesh Jain: Reliability-Based Design Optimization Considering Probabilistic Degradation Behavior. 911-923
• 
  Majid Jalili, Mahdi Bashiri, Amirhossein Amiri: A New Multivariate Process Capability Index Under Both Unilateral and Bilateral Quality Characteristics. 925-941
• 
  M. Xie, T. N. Goh, P. P. Deng: Circle Chart for Monitoring of Periodic Measurements. 943-948
• 
  Yi-Hua Tina Wang, Longcheen Huwang: On the Monitoring of Simple Linear Berkson Profiles. 949-965
• 
  Fadel M. Megahed, Lee J. Wells, Jaime A. Camelio, William H. Woodall: A Spatiotemporal Method for the Monitoring of Image Data. 967-980

• 
  Xintao Xia: Reliability Analysis of Zero-Failure Data with Poor Information. 981-990

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