Volume 26, Number 1, February 2010
Douglas C. Montgomery: The 25th anniversary volume of Quality and Reliability Engineering International. 1-2
- Jeh-Nan Pan, Chun-Yi Lee: New capability indices for evaluating the performance of multivariate manufacturing processes. 3-15
- Cinzia Mortarino: Duncan's model for X-control charts: sensitivity analysis to input parameters. 17-26
- Om Prakash Yadav, Sunil S. Bhamare, Ajay Pal Singh Rathore: Reliability-based robust design optimization: A multi-objective framework using hybrid quality loss function. 27-41
- Jiujun Zhang, Changliang Zou, Zhaojun Wang: A control chart based on likelihood ratio test for monitoring process mean and variability. 63-73
- Christina A. Hamada, Michael S. Hamada: All-subsets regression under effect heredity restrictions for experimental designs with complex aliasing. 75-81
- Ben Flood, Brett Houlding, Simon P. Wilson, Sergiy Vilkomir: A probability model of system downtime with implications for optimal warranty design. 83-96
- Henrik Spliid: An exponentially weighted moving average control chart for Bernoulli data. 97-113
Volume 26, Number 2, March 2010
- Murat Caner Testik, Doug Montgomery, Aarnout Brombacher: Editorial - ENBIS 8th Annual Meeting. 125-126
- Heidi Arnouts, Peter Goos, Bradley Jones: Design and analysis of industrial strip-plot experiments. 127-136
- Christian Dehlendorff, Murat Kulahci, Klaus K. Andersen: Analysis of computer experiments with multiple noise sources. 137-146
- Hilla Ginsburg, Irad Ben-Gal: Optimization-seeking experimentations: Design of an RL-circuit via the vs-optimality criterion. 147-155
- Elisabeth Viles, Martín Tanco, Inge Isasa, Unai Arteche, Xabier Sagartzazu: Applying Design of Experiments to a lift test rig. 157-165
- Canan Pehlivan, Murat Caner Testik: Impact of model misspecification on the exponential EWMA charts: a robustness study when the time-between-events are not exponential. 177-190
Volume 26, Number 3, April 2010
- Aarnout Brombacher: Reliability engineers and dinosaurs.... 191
- Marion R. Reynolds Jr., Changsoon Park: CUSUM charts for detecting special causes in integrated process control. 199-221
- P. Angelopoulos, H. Evangelaras, Christos Koukouvinos: Analyzing unreplicated 2k factorial designs by examining their projections into k-1 factors. 223-233
- Christopher A. Carolan, John F. Kros, Said E. Said: Economic design of Xbar control charts with continuously variable sampling intervals. 235-245
- Chen-ju Lin, W. L. Pearn: Process selection for higher production yield based on capability index Spk. 247-258
- Søren Bisgaard, Davit Khachatryan: Asymptotic confidence intervals for variograms of stationary time series. 259-265
- Young-Il Kim, Benjamin M. Adams: Multivariate SPC for recipe preservation of batch processes. 267-277
- Sung Won Han, Kwok-Leung Tsui, Bancha Ariyajunya, Seoung Bum Kim: A comparison of CUSUM, EWMA, and temporal scan statistics for detection of increases in poisson rates. 279-289
- Rassoul Noorossana, M. Eyvazian, Amirhossein Amiri, Mahmoud A. Mahmoud: Statistical monitoring of multivariate multiple linear regression profiles in phase I with calibration application. 291-303
- John S. Lawson, Stephen Manortey: Optimal maintenance strategy for Technology-enhanced classrooms: a case study. 305-313
Volume 26, Number 4, June 2010
- Torben Hasenkamp: Engineering Design for Six Sigma - a systematic approach. 317-324
- Yihai He, Xiaoqing Tang, Wenbing Chang: Technical decomposition approach of critical to quality characteristics for Product Design for Six Sigma. 325-339
- Hendry Raharjo, Aarnout Brombacher, T. N. Goh, Bo Bergman: On integrating Kano's model dynamics into QFD for multiple product design. 351-363
- Shilpa Gupta, Murat Kulahci, Douglas C. Montgomery, Connie M. Borror: Analysis of signal-response systems using generalized linear mixed models. 375-385
Volume 26, Number 5, July 2010
- Aarnout Brombacher: Reliability prediction and 'Deepwater Horizon'; lessons learned. 397
- Marcus B. Perry: Identifying the time of polynomial drift in the mean of autocorrelated processes. 399-415
- In-Jun Jeong, Kwang-Jae Kim, Dennis K. J. Lin: Bayesian analysis for weighted mean-squared error in dual response surface optimization. 417-430
- Rachel T. Johnson, Douglas C. Montgomery: Designing experiments for nonlinear models - an introduction. 431-441
- Vijay Kumar Butte, Loon Ching Tang: Multivariate charting techniques: a review and a line-column approach. 443-451
- Marion R. Reynolds Jr., Zachary G. Stoumbos: Robust CUSUM charts for monitoring the process mean and variance. 453-473
- T. N. Goh: An information management paradigm for statistical experiments. 487-494
- Erik Vanhatalo: Multivariate process monitoring of an experimental blast furnace. 495-508
- Amirhossein Amiri, Willis A. Jensen, Reza B. Kazemzadeh: A case study on monitoring polynomial profiles in the automotive industry. 509-520
Volume 26, Number 6, October 2010
- Douglas C. Montgomery: Trouble at Toyota. 521
- Fausto Pedro García Márquez, Isidro Peña García-Pardo: Principal component analysis applied to filtered signals for maintenance management. 523-527
- Chang-Xing Ma, Ming-Yao Ai, L. Y. Chan, T. N. Goh: Three-level and mixed-level orthogonal arrays for lean designs. 529-539
- Zhang Wu, Yafen Liu, Zhen He, Michael B. C. Khoo: A Cumulative Sum scheme for monitoring frequency and size of an event. 541-554
- Guney Ozsan, Murat Caner Testik, Christian H. Weiß: Properties of the exponential EWMA chart with parameter estimation. 555-569
- Bahman Honari, John Donovan, Toby Joyce, Simon Wilson, Eamonn Murphy: Stress test optimization using an integrated production test and field reliability model. 579-592
- Fiorenzo Franceschini, Domenico A. Maisano: A survey of Quality Engineering-Management journals by bibliometric indicators. 593-604
- P. Lantiéri, F. Guérin, R. Hambli: Reliability estimation by ALT when no analytical model holds. 605-613
- Fu-Kwun Wang, Y. F. Cheng: EM algorithm for estimating the Burr XII parameters with multiple censored data. 615-630
- Arthur B. Yeh, Longcheen Huwang, Richard N. McGrath, Zhe Zhang: On monitoring process variance with individual observations. 631-641
Volume 26, Number 7, November 2010
- Jian Liu: Variation reduction for multistage manufacturing processes: a comparison survey of statistical-process-control vs stream-of-variation methodologies. 645-661
- Helen Meyers Bush, Panitarn Chongfuangprinya, Victoria C. P. Chen, Thuntee Sukchotrat, Seoung Bum Kim: Nonparametric multivariate control charts based on a linkage ranking algorithm. 663-675
- Zhiguo Li, Shiyu Zhou, Crispian Sievenpiper, Suresh Choubey: Change detection in the Cox Proportional Hazards models from different reliability data. 677-689
- Ping Jiang, Jae-Hak Lim, Ming J. Zuo, Bo Guo: Reliability estimation in a Weibull lifetime distribution with zero-failure field data. 691-701
- Yong Lei, Dragan Djurdjanovic, Jun Ni: DeviceNet reliability assessment using physical and data link layer parameters. 703-715
- Rajesh Ganesan, Poornima Balakrishna, Lance Sherry: Improving quality of prediction in highly dynamic environments using approximate dynamic programming. 717-732
- Andrew R. Conn, Léa Amandine Deleris, Jonathan R. M. Hosking, Tom Anders Thorstensen: A simulation model for improving the maintenance of high cost systems, with application to an offshore oil installation. 733-748
- O. Arda Vanli, Chuck Zhang, Li-Jen Chen, Kan (Kevin) Wang, Ben Wang: A Bayesian approach for integration of physical and computer experiments for quality improvement in nano-composite manufacturing. 749-764
- Hyun-Jin Kim, Kwang-Jae Kim, Doh-Soon Kwak: A case study on modeling and optimizing photolithography stage of semiconductor fabrication process. 765-774
- Anantanat Kantanyarat, Jionghua (Judy) Jin: Tooling adjustment strategy for acceptable product quality in assembly processes. 775-785
Volume 26, Number 8, December 2010
- Rainer Göb: Ten years of advances in business and industrial statistics. 787
- Henry Wynn, Irena Ograjensek: Is statistics becoming the number one discipline for business and industry? 789-793
- Christian H. Weiß, Martin Atzmüller: EWMA control charts for monitoring binary processes with applications to medical diagnosis data. 795-805
- Claus Weihs, Amor Messaoud, Nils Raabe: Control charts based on models derived from differential equations. 807-816
- Banu Yuksel Ozkaya, Murat Caner Testik: On the expected parts per million nonconforming levels obtained from estimated process capability indices. 817-829
- Tiago J. Rato, Marco S. Reis: Statistical monitoring of control loops performance: an improved historical-data benchmark index. 831-844
- Jan M. Myszewski: Mathematical model of the occurrence of human error in manufacturing processes. 845-851
- Pasquale Erto, Antonio Lanzotti, Antonio Lepore: Wind speed parameter estimation from one-month sample via Bayesian approach. 853-862
- Nikolaus Haselgruber, Karin Mautner, Jan Thiele: Usage space analysis for reliability testing. 877-885
- Silvia Figini, Ron S. Kenett, Silvia Salini: Optimal scaling for risk assessment: merging of operational and financial data. 887-897
- Florian Sobieczky, Gerhard Rappitsch, Ernst Stadlober: Tandem queues for inventory management under random perturbations. 899-907
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last updated on 2013-06-18T214307 by the dblp team