Quality and Reliability Engineering International, Volume 25

Volume 25, Number 1, February 2009

• Aarnout Brombacher:
  Probability... 1
  

• Aylin Koca, Mathias Funk, Evangelos Karapanos, Anne Rozinat, Wil M. P. van der Aalst, Henk Corporaal, Jean-Bernard Martens, Piet van der Putten, A. J. M. M. Weijters, Aarnout Brombacher:
  Soft reliability: an interdisciplinary approach with a user-system focus. 3-20
  
• Yan Li, Xiaolong Pu, Fugee Tsung:
  Adaptive charting schemes based on double sequential probability ratio tests. 21-39
  
• Refik Samet:
  Fault-tolerant procedures for redundant computer systems. 41-68
  
• R. L. Shinde, K. G. Khadse:
  Multivariate process capability using principal component analysis. 69-77
  
• Rassoul Noorossana, Alireza Shadman:
  Estimating the change point of a normal process mean with a monotonic change. 79-90
  
• Xiao Liu, Loon-Ching Tang:
  A sequential constant-stress accelerated life testing scheme and its Bayesian inference. 91-109
  

• Eric M. Monroe, Rong Pan:
  Knowledge-based reliability assessments for time-varying climates. 111-124
  

Volume 25, Number 2, March 2009

• Aarnout Brombacher:
  Designed experiments in industry. 127-128
  

• Rasa Remenyte-Prescott, John D. Andrews:
  An efficient real-time method of analysis for non-coherent fault trees. 129-150
  
• Christian H. Weiß:
  Group inspection of dependent binary processes. 151-165
  
• Pär Johannesson, Thomas Svensson, Leif Samuelsson, Bo Bergman, Jacques de Maré:
  Variation mode and effect analysis: an application to fatigue life prediction. 167-179
  
• A.-B. Shaibu, Byung Rae Cho, Jami Kovach:
  Development of a censored robust design model for time-oriented quality characteristics. 181-197
  
• Tony Halim, Loon-Ching Tang:
  A graphical approach for confidence limits of optimal preventive maintenance cycles. 199-213
  
• Young-Bok Kim, Jung-Sik Hong, Chang-Hoon Lie:
  Economic-statistical design of 2-of-2 and 2-of-3 runs rule scheme. 215-228
  
• Rong Pan:
  A Bayes approach to reliability prediction utilizing data from accelerated life tests and field failure observations. 229-240
  

• Gionata Carmignani:
  Modified QFD and problem-solving techniques integrated approach implementing corrective actions: a case study in an Italian manufacturing plant. 241-252
  

Volume 25, Number 3, April 2009

• Aarnout Brombacher:
  Self Observing Systems: the future of reliability engineering? 253
  

• Gunther Steenackers, Patrick Guillaume, Steve Vanlanduit:
  Robust optimization of an airplane component taking into account the uncertainty of the design parameters. 255-282
  
• Kaibo Wang, Fugee Tsung:
  An adaptive dimension reduction scheme for monitoring feedback-controlled processes. 283-298
  
• Marie Gaudard, Philip Ramsey, Mia Stephens:
  Interactive data mining informs designed experiments. 299-315
  
• Malin Albing:
  Process capability indices for Weibull distributions and upper specification limits. 317-334
  
• Yong Guo, James R. Simpson, Joseph J. Pignatiello Jr.:
  The general balance metric for mixed-level fractional factorial designs. 335-344
  

• J. M. Zhao, S. L. Ho, S. N. Piramanayagam, J. Z. Shi:
  Optimizing tape-burnishing/wiping process of magnetic recording media through Taguchi method. 345-354
  

• Clément Magniez, Aarnout Brombacher, Jeu Schouten:
  The use of reliability-oriented field feedback information for product design improvement: a case study. 355-364
  
• Rachel T. Johnson, Peter A. Parker, Douglas C. Montgomery, Andrew D. Cutler, Paul M. Danehy, Ray D. Rhew:
  Design strategies for response surface models for the study of supersonic combustion. 365-377
  

Volume 25, Number 4, June 2009

• Wayne R. Wesley, James R. Simpson, Peter A. Parker, Joseph J. Pignatiello Jr.:
  Prediction variance and G-criterion location for split-plot designs. 381-395
  

• Yanfen Shang, Kaibo Wang, Fugee Tsung:
  An improved run-to-run process control scheme for categorical observations with misclassification errors. 397-407
  
• M. Lampis, J. D. Andrews:
  Bayesian belief networks for system fault diagnostics. 409-426
  
• J.-C. Ke, Y.-K. Chu, Y.-T. Chung, P. C. Lin:
  Assessing non-normally distributed processes by interval estimation of the incapability index C_pp. 427-437
  
• Imen Kooli, Mohamed Limam:
  Bayesian np control charts with adaptive sample size for finite production runs. 439-448
  
• Yong Guo, James R. Simpson, Joseph J. Pignatiello Jr.:
  Optimal foldover plans for mixed-level fractional factorial designs. 449-466
  
• Eric D. Schoen:
  All orthogonal arrays with 18 runs. 467-480
  
• Christine M. Anderson-Cook, Todd L. Graves, Michael S. Hamada:
  Resource allocation for reliability of a complex system with aging components. 481-494
  

• Burcu Aksoy, Âli Yurdun Orbak:
  Reducing the quantity of reworked parts in a robotic arc welding process. 495-512
  

Volume 25, Number 5, July 2009

• Aarnout Brombacher:
  Health, well-being and the quality of healthcare. 513
  

• Bradley Jones, Rachel T. Johnson:
  Design and analysis for the Gaussian process model. 515-524
  

• Max D. Morris:
  Discussion (1): Jones-Johnson Paper. 525-527
  
• Peter Z. G. Qian, C. F. Jeff Wu:
  Discussion (2): Jones-Johnson Paper. 529-533
  
• Jason L. Loeppky, Brian J. Williams:
  Discussion (3): Jones-Johnson Paper. 535-539
  
• David M. Steinberg:
  Discussion (4): Jones-Johnson Paper. 541-543
  
• William Notz:
  Discussion (5): Jones-Johnson Paper. 545-547
  

• Bradley Jones, Rachel T. Johnson:
  Design and analysis for the Gaussian process model: a Rejoinder. 549-550
  

• Lie-Chien Lin, Tzu-Su Li, Judy P. Kiang:
  A continual improvement framework with integration of CMMI and six-sigma model for auto industry. 551-569
  
• Willis A. Jensen:
  Approximations of tolerance intervals for normally distributed data. 571-580
  
• Marit Schoonhoven, Muhammad Riaz, Ronald J. M. M. Does:
  Design schemes for the &Xmacr; control chart. 581-594
  
• Marcela A. G. Machado, Antonio F. B. Costa, M. A. Rahim:
  The synthetic control chart based on two sample variances for monitoring the covariance matrix. 595-606
  
• Marta A. Freitas, Maria Luíza G. de Toledo, Enrico A. Colosimo, Magda C. Pires:
  Using degradation data to assess reliability: a case study on train wheel degradation. 607-629
  
• Shien-Ping Huang, Chih-Chou Chiu:
  Process monitoring with ICA-based signal extraction technique and CART approach. 631-643
  

Volume 25, Number 6, October 2009

• Douglas Montgomery:
  Computer modelling. 645
  

• Gülsen Aydin Keskin, Coskun Özkan:
  An alternative evaluation of FMEA: Fuzzy ART algorithm. 647-661
  
• Cynthia R. Lovelace, James J. Swain, Hisham Zeinelabdin, Jatinder N. D. Gupta:
  Lower confidence limits for process capability indices C_p and C_pk when data are autocorrelated. 663-700
  
• Chien-Wei Wu, Ming-Hung Shu, Feng-Tsung Cheng:
  Generalized confidence intervals for assessing process capability of multiple production lines. 701-716
  
• Sandra Healy, Michael Wallace, Eamonn Murphy:
  Mathematical modelling of test limits and guardbands. 717-730
  
• M. A. A. Cox:
  A comparison of formulas for the design of cumulative sum control charts. 731-737
  
• A. Syamsundar, Vallayil N. Achutha Naikan:
  Sequential detection of change points for maintained systems using segmented point process models. 739-757
  
• George A. Hazelrigg:
  The Cheshire Cat on engineering design. 759-769
  

Volume 25, Number 7, November 2009

• Aarnout Brombacher:
  Black swans. 771
  

• Elisabeth Topalidou, Stelios Psarakis:
  Review of multinomial and multiattribute quality control charts. 773-804
  

• Michael B. C. Khoo, Min Xie:
  A study of time-between-events control chart for the monitoring of regularly maintained systems. 805-819
  
• Ahmad Ostadsharif Memar, Seyed Taghi Akhavan Niaki:
  New control charts for monitoring covariance matrix with individual observations. 821-838
  
• Gitte B. Windfeldt, Søren Bisgaard:
  Testing for sphericity in phase I control chart applications. 839-849
  
• Shervin Asadzadeh, Abdollah Aghaie, Hamid Shahriari:
  Monitoring dependent process steps using robust cause-selecting control charts. 851-874
  
• Rassoul Noorossana, Abbas Saghaei, Kamran Paynabar, Sara Abdi:
  Identifying the period of a step change in high-yield processes. 875-883
  
• Joseph M. Juarez, Vicka White:
  Validating circuit board Interconnect Stress Test preconditioning processes using statistical model comparisons of accelerated test data. 885-895
  

Volume 25, Number 8, December 2009

• Aarnout Brombacher:
  Telethings. 897
  

• Tom Burr, Michael S. Hamada, Todd L. Graves, S. Myers:
  Augmenting real data with synthetic data: an application in assessing Radio-Isotope identification algorithms. 899-911
  
• Tsai-Hung Fan, Chia-Chen Chang:
  A Bayesian zero-failure reliability demonstration test of high quality electro-explosive devices. 913-920
  
• Martin Leary, Colin Burvill:
  Applicability of published data for fatigue-limited design. 921-932
  
• Lingyun Zhang, Gemai Chen, Philippe Castagliola:
  On t and EWMA t charts for monitoring changes in the process mean. 933-945
  
• Davit Khachatryan, Søren Bisgaard:
  Some results on the variogram in time series analysis. 947-960
  
• Lihui Shi, Changliang Zou, Zhaojun Wang, Kailash C. Kapur:
  A new variable sampling control scheme at fixed times for monitoring the process dispersion. 961-972
  
• Jung-Tai Chen:
  A new approach to setting control limits of cumulative count of conforming charts for high-yield processes. 973-986
  
• Fiorenzo Franceschini, Domenico A. Maisano:
  The Hirsch index in manufacturing and Quality engineering. 987-995
  
• Liang Ye, Ershun Pan, Jianjun Shi:
  Design of regression model-based automatic process control with reduced adjustment frequency. 997-1013
  
• Refik Samet:
  Hardware implementation of fault-tolerance in dual computer systems. 1015-1028
  
• Rodrigo I. Duran, Susan L. Albin:
  Monitoring a fraction with easy and reliable settings of the false alarm rate. 1029-1043
  
• Myrta Rodriguez, Douglas C. Montgomery, Connie M. Borror:
  Generating experimental designs involving control and noise variables using genetic algorithms. 1045-1065
  
• J. K. Sari, M. J. Newby, Aarnout Brombacher, L. C. Tang:
  Bivariate constant stress degradation model: LED lighting system reliability estimation with two-stage modelling. 1067-1084
  
• Tae-Jin Lim, Moonsoo Cho:
  Design of control charts with m-of-m runs rules. 1085-1101
  

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