Volume 4, Number 1, January 1972
: Introduction to special issue on syntactic pattern recognition--part two.
: On the application of formal language and automata theory to pattern recognition.
I. B. Muchnik
: Simulation of process of forming the language for description and analysis of the forms of images.
Volume 4, Number 2, May 1972
Robert S. Ledley
: Introduction to the special issue on fine particle science.
Brian H. Kaye
: Efficient pattern recognition in fine particle science.
C. B. Shelman
: The application of list processing techniques to picture processing.
Volume 4, Number 3, October 1972
John F. Betak
: Measuring two-dimensional complexity: A conceptual structure.
R. M. Bowman
, Eugene S. McVey
: Calculation of multi-category minimum distance classifier recognition error for binomial measurement distributions.
Ronald L. Citrenbaum
: Strategic pattern generation: A solution technique for a class of games.
Volume 4, Number 4, December 1972
, Saburo Tsuji
: Extraction of the line drawing of 3-dimensional objects by sequential illumination from several directions.
Sheldon S. Sandler
: Direct three-dimensional analysis of electron micrograph pictures.
, Peter C. Jurs
: Iterative least squares development of discriminant functions for spectroscopic data analysis by pattern recognition.