Microelectronics Journal, Volume 35
Volume 35, Number 1, January 2004
3rd Ibero American workshop on Nanostructures for applications to Micro and Optoelectronics
M. E. Mora-Ramos
: Valence band states in diamond p-delta-doped quantum wells.
Volume 35, Number 2, February 2004
Chantal Khan Malek
, Volker Saile
: Applications of LIGA technology to precision manufacturing of high-aspect-ratio micro-components and -systems: a review.
Volume 35, Number 3, March 2004
6Th International Seminar on Power Semiconductors
: Advanced power semiconductors and ICs for DC/DC converter applications.
, Josef Lutz
: Possibilities and limits of axial lifetime control by radiation induced centers in fast recovery diodes.
Volume 35, Number 4, April 2004
Advanced Materials and Devices for Large Area Electronics
, Hoi-Sing Kwok
: High-performance polycrystalline silicon thin-film transistor technology using low-temperature metal-induced unilateral crystallization.
Volume 35, Number 5, May 2004
: Electrical characterisation of SiON/n-Si structures for MOS VLSI electronics.
: Low-cost, on-line self-testing of processor cores based on embedded software routines.
M. R. Kitchin
: An empirical pseudopotential-based description of carrier scattering by LO phonons in semiconductor heterostructures.
Volume 35, Number 6, June 2004
3rd International workshop on Electromagnetic compatibility of Integrated circuits
: Electromagnetic compatibility of integrated circuits.
Ross M. Carlton
: An overview of standards in electromagnetic compatibility for integrated circuits.
: IBIS and ICEM interaction.
: Influence of the power supply on the radiated electromagnetic emission of integrated circuits.
Volume 35, Number 7, July 2004
, F. G. Shi
, B. Zhao
, J. Yota
: Effect of deposition methods on dielectric breakdown strength of PECVD low-k carbon doped silicon dioxide dielectric thin films.
Volume 35, Number 8, August 2004
: Semiconductors: Data Handbook: Otfried Madelung (Ed.); Springer, ISBN 3-540-40488-0.
: Epitaxy of Nanostructures: V.A. Shchulin, N.N. Ledenstov, D. Bimberg (Eds.); Springer, ISBN 3-540-40488-0.
: X-ray Scattering from Semiconductors (2nd Edition): Paul F. Fewster; Imperial College Press, ISBN: 1-86094-360-8.
Volume 35, Number 9, September 2004
: Mechanisms of nanooxidation of Si(100) from atomic force microscopy.
Volume 35, Number 10, October 2004
, Ali Shakouri
: Thermal measurements of active semiconductor micro-structures acquired through the substrate using near IR thermoreflectance.
: Electro-thermal chaotic oscillations of paralleled bipolar transistors.
Volume 35, Number 11, November 2004
: A counter-based pseudo-exhaustive pattern generator for BIST applications.
Volume 35, Number 12, December 2004